JPS6174882U - - Google Patents
Info
- Publication number
- JPS6174882U JPS6174882U JP16005584U JP16005584U JPS6174882U JP S6174882 U JPS6174882 U JP S6174882U JP 16005584 U JP16005584 U JP 16005584U JP 16005584 U JP16005584 U JP 16005584U JP S6174882 U JPS6174882 U JP S6174882U
- Authority
- JP
- Japan
- Prior art keywords
- rotating body
- rotation
- rotates
- test head
- testing device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 3
Landscapes
- Control Of Velocity Or Acceleration (AREA)
- Tests Of Electronic Circuits (AREA)
Description
第１図はこの考案による半導体試験装置の要部
を示す図、第２図及び第３図はそれぞれその変形
例の要部を示す図、第４図は半導体試験装置の概
略を示す図、第５図は従来の半導体試験装置のガ
ススプリングとテストヘツドのモーメントとの関
係を示す図である。
１４：テストヘツド、１６：テストヘツドの回
動軸、１９：ガススプリング、２２：第１回動体
としての歯車、２３：第２回動体としての歯車。
FIG. 1 is a diagram showing the main part of a semiconductor testing device according to this invention, FIGS. 2 and 3 are diagrams showing the main part of a modified example thereof, and FIG. FIG. 5 is a diagram showing the relationship between the gas spring of a conventional semiconductor testing device and the moment of the test head. 14: Test head, 16: Rotating shaft of test head, 19: Gas spring, 22: Gear as first rotating body, 23: Gear as second rotating body.
Claims (1)
試験装置において、上記テストヘツドの回動によ
り回動される第１回動体と、その第１回動体と逆
方向に同期して回動される第２回動体と、これら
第１回動体及び第２回動体にその各回動中心に対
して同一距離隔たつた点に両端が取付けられたガ
ススプリングとを具備し、上記第１回動体及び第
２回動体の各回動中心と上記ガススプリングの両
端取付点とをそれぞれ結ぶ線と、上記第１回動体
及び第２回動体の回動中心を結ぶ線とのなす角度
が、上記これら回動体の回動に拘らず常に互に同
一角度を保持するようにされていることを特徴と
する半導体試験装置。 In a semiconductor testing device configured to rotate a test head, a first rotating body rotates as the test head rotates, and a second rotating body rotates in synchronization with the opposite direction of the first rotating body. and a gas spring having both ends attached to the first rotating body and the second rotating body at points spaced apart from each other by the same distance with respect to the rotation centers of the first rotating body and the second rotating body. The angle formed by the line connecting each rotation center and the attachment point at both ends of the gas spring, and the line connecting the rotation centers of the first rotation body and the second rotation body, is independent of the rotation of these rotation bodies. 1. A semiconductor testing device characterized in that the same angle is always maintained with respect to each other.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16005584U JPS6174882U (en) | 1984-10-22 | 1984-10-22 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16005584U JPS6174882U (en) | 1984-10-22 | 1984-10-22 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS6174882U true JPS6174882U (en) | 1986-05-20 |
Family
ID=30717989
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16005584U Pending JPS6174882U (en) | 1984-10-22 | 1984-10-22 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS6174882U (en) |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5531315U (en) * | 1978-08-18 | 1980-02-29 |
-
1984
- 1984-10-22 JP JP16005584U patent/JPS6174882U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5531315U (en) * | 1978-08-18 | 1980-02-29 |