JPS615618A - Semiconductor integrated circuit - Google Patents

Semiconductor integrated circuit

Info

Publication number
JPS615618A
JPS615618A JP59127114A JP12711484A JPS615618A JP S615618 A JPS615618 A JP S615618A JP 59127114 A JP59127114 A JP 59127114A JP 12711484 A JP12711484 A JP 12711484A JP S615618 A JPS615618 A JP S615618A
Authority
JP
Japan
Prior art keywords
transistor
circuit
voltage
inverter
input
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59127114A
Other languages
Japanese (ja)
Inventor
Toshiaki Maiwa
真岩 寿昭
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Toshiba Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Toshiba Corp filed Critical Toshiba Corp
Priority to JP59127114A priority Critical patent/JPS615618A/en
Publication of JPS615618A publication Critical patent/JPS615618A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To remove evil influence of a glitch signal, etc., by varying the threshold value voltage of an inverter circuit through a driving circuit which has a bootstrap function according to an input signal voltage or output voltage. CONSTITUTION:An output Out varies from ''0'' to ''1'' in the process of the transition of an input In from ''0'' to ''1''. This signal is received by a transistor (TR) 7 at its gate and a node N11 varies from ''1'' to ''0''. Then, a TR2 decreases in (gm) and the threshold voltage of the inverter I1 decreases. Therefore, ''1'' of the input In is recognized securely. Thus, the circuit threshold voltage of the inverter is varied without being fixed, so the evil influence of the glitch signal, etc., is removed.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明はプートストラップ機能をもった駆動回路として
適するMOS構成の半導体集積回路に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a semiconductor integrated circuit having a MOS configuration suitable as a drive circuit having a Pootstrap function.

〔発明の技術的背景とその問題点〕[Technical background of the invention and its problems]

従来のゲートストラップ機能をもつ駆動回路を第5図に
示す。この回路はMOS トランジスタTrl 〜Tr
y (Trl 、Tr4〜Tr@はNチャネルエンハン
スメント型、  Tr4 yTr3はデゾレッション型
)、キャパシタC1抵抗Rよルなっている。この回路の
動作は、入力信号In′0#レベルから′l“レベルに
なることによって、電流がトランジスタTr3+Tr4
、キar ノ4シタC,トランジスタTr5を通して流
れ、キャパシタCに電荷が蓄積される。トランジスタT
rl +TrlよシなるインバータI、分だけ遅れてノ
ードNlが′Omになると、トランジスタTr@がオフ
してノードN、が電源電圧vcc側に上がシ、ノードN
3がキャノ母シタCの蓄積電正分ぞけノードN!よシミ
圧が高くなるため、トランジスタTr6は3極管動作し
て出力端Outには電源電圧VCCが得られる。一方、
入力信号■ユが0#のときはトランジスタTr5がオン
だから、出力端Outには接地レベルが得られる。この
ようにこの回路は、消費電流を押えたままで出力端Ou
tの電位を、電源電圧VCC〜接地レベルまでフルスイ
ングさせるものである。
FIG. 5 shows a conventional drive circuit with a gate strap function. This circuit is a MOS transistor Trl ~Tr
y (Trl, Tr4 to Tr@ are of N-channel enhancement type, Tr4 and yTr3 are of desolation type), capacitor C1 and resistance R. The operation of this circuit is such that when the input signal In'0# level changes to 'l'' level, the current flows through the transistors Tr3+Tr4.
, ar flows through the capacitor C and the transistor Tr5, and charges are accumulated in the capacitor C. transistor T
When the node Nl becomes 'Om with a delay of inverter I, which is greater than rl + Trl, the transistor Tr@ turns off and the node N goes up to the power supply voltage vcc side.
3 is the node N that separates the accumulated electricity from the mother C! Since the stain pressure becomes high, the transistor Tr6 operates as a triode, and the power supply voltage VCC is obtained at the output terminal Out. on the other hand,
When the input signal ■Y is 0#, the transistor Tr5 is on, so that the ground level is obtained at the output terminal Out. In this way, this circuit can reduce current consumption while keeping the output terminal O
The potential of t is made to swing fully from the power supply voltage VCC to the ground level.

しかしながら第5図の回路には次の(イ)、←)のよう
な問題点があった。(イ)入力信号工、が0”から1#
へ変化する過程で、第6図に示、す如くグリッチ信号(
aが本来の期待される信号波形)が入ると、入カニ。が
低くなるため電流がトランジスタTr3を通して入力■
ユ側へ逃げるため、キャ)4シタCに蓄積される電荷が
不充分となシ、出力端Outの′41”(高)電位が、
電源電圧V。。
However, the circuit shown in FIG. 5 has the following problems (a) and ←). (b) Input signal, from 0” to 1#
In the process of changing to , a glitch signal (
When a (original expected signal waveform) enters, the signal enters. As the current becomes low, the current is input through the transistor Tr3.■
In order to escape to the U side, the '41'' (high) potential of the output terminal Out is
Power supply voltage V. .

からトランジスタTr6のしきい値電圧VTH分低下し
た程度の値となってしまう。これによシこの種の回路を
使用した集積回路の動作スぜ−ドが低下したシ、或いは
出力端Outに充分なVCC電位が得られなくなりたシ
してしまう。(ロ)第5図の回路の前段のアンプの入力
信号の立ち上)/立ち下シ時間の傾斜が長い場合、第5
図の回路のしきい°値電圧近傍で、出力端Outの出力
信号が“1″(高)でもなく0″([3でもない状態が
発生する。これはインバーター!がl”でもなく′0″
でもない信号を出力し、トランジスタTr5がオンでも
なくオフでもないような中間状態となるからである。こ
のとき第5図の回路をデコーダ回路の出力段に使用する
ことで、選択されるメモリセルの相互干渉を発生するこ
とがある。
The value is reduced by the threshold voltage VTH of the transistor Tr6. As a result, the operating speed of an integrated circuit using this type of circuit is lowered, or a sufficient VCC potential cannot be obtained at the output terminal Out. (b) If the slope of the rise/fall time of the input signal of the amplifier at the front stage of the circuit in Figure 5 is long,
Near the threshold voltage of the circuit shown in the figure, a state occurs in which the output signal at the output terminal Out is neither "1" (high) nor 0" ([3). This is because the inverter! ″
This is because the transistor Tr5 is in an intermediate state where it is neither on nor off. At this time, by using the circuit shown in FIG. 5 in the output stage of the decoder circuit, mutual interference between selected memory cells may occur.

前記従来の問題点の発生原因は、インバーター1の回路
しきい値電圧(トランジスタTrt+Tr2の特性βつ
まシgmの比で決まる電圧値)が一定であることによる
ものでおる。
The cause of the above-mentioned conventional problem is that the circuit threshold voltage of the inverter 1 (voltage value determined by the ratio of the characteristics β to gm of the transistors Trt+Tr2) is constant.

〔発明の目的〕[Purpose of the invention]

? 本発明は上記実情に鑑みてなされたもので、プートそト
ラ、f回路のインバータの回路しきい値電圧を入力信号
電圧または出力電圧に応じて変化させることによシ、前
記従来の問題点を改善した半導体集積回路を提供しよう
とするものである。
? The present invention has been made in view of the above-mentioned circumstances, and solves the above-mentioned conventional problems by changing the circuit threshold voltage of the inverter of the puto-sotra/f circuit according to the input signal voltage or output voltage. The present invention aims to provide an improved semiconductor integrated circuit.

〔発明の概要〕[Summary of the invention]

本発明においては、上記プートストラップ回路のインバ
ータの(ロ)路しきい値電圧を変化させるには、例えば
負荷側MOB トランジスタと駆動側MO8トランジス
タで構成されているインバータの負荷側MO8トランジ
スタの相互コンダクタンスgmを、駆動側MO8トラン
ジスタに印加されている入力電圧またはプートストラッ
プ回路出力電圧によシ変化させればよい。即ち入力電圧
が高レベルのときは負荷側MO8トランジスタのgmを
小さく、また入力電圧が低レベルの時は上記gmを大き
くすることである。これによシ上記インバータの否ト、
ランジスタの特性β比で決まる回路しきい値電圧は、入
力電圧が高レベルの時低く、また低レベルのとき高くな
るいわゆるヒステリシス特性をもつことになるものであ
る。
In the present invention, in order to change the threshold voltage of the inverter of the above-mentioned Pootstrap circuit, for example, the mutual conductance of the MO8 transistor on the load side of the inverter, which is composed of the MOB transistor on the load side and the MO8 transistor on the drive side, is changed. gm may be changed depending on the input voltage applied to the drive-side MO8 transistor or the output voltage of the Pootstrap circuit. That is, when the input voltage is at a high level, the gm of the MO8 transistor on the load side is made small, and when the input voltage is at a low level, the gm is made large. This eliminates the need for the above inverter,
The circuit threshold voltage determined by the characteristic β ratio of the transistor has a so-called hysteresis characteristic, which is low when the input voltage is at a high level and high when the input voltage is at a low level.

〔発明の実施例〕[Embodiments of the invention]

以下図面を参照して本発明の詳細な説明する。第1図、
第2図はそれぞれ実施例を示す回路図であるが、これは
第5図のものと対応盲せた場合の例であるから、対応個
所には同一符号を付して説明を省略し、特徴とする点を
説明する。第1図ではエンハンスメン)Nチャネル型M
O8トランジスタTr7、デルッション型MOSトラン
ジスタTrsを電源VCCと接地間に直列接続し、トラ
ンジスタTry @Tr@間をトランジスタ’rr2t
Trlのゲートに接続し、トランジスタTryのf−)
を出力端Outに接続する。
The present invention will be described in detail below with reference to the drawings. Figure 1,
Fig. 2 is a circuit diagram showing each embodiment, but since this is an example in which there is no correspondence with that in Fig. 5, corresponding parts are given the same reference numerals and explanations are omitted. Let me explain the points. In Figure 1, it is enhanced
The O8 transistor Tr7 and the delusion type MOS transistor Trs are connected in series between the power supply VCC and the ground, and the transistor 'rr2t is connected between the transistor Try @Tr@
connected to the gate of Trl and f-) of transistor Try.
Connect to the output terminal Out.

第2図ではエンハンスメン)Nチャネル製MO8トラン
ジスタTr17、デプレッシ、/fflトランジスタT
r111を、電源vccとトランジスタTrl。
In Fig. 2, enhancement transistor) N-channel MO8 transistor Tr17, depressi
r111 is the power supply Vcc and the transistor Trl.

T11間との間に直列接続し、トランジスタTr17*
Tr11間をトランジスタTr!とトランジスタTry
Hのゲートに接続し、トランジスタTr17のゲートを
入力端I!1に接続する。
A transistor Tr17* is connected in series between T11 and T11.
Transistor Tr! between Tr11! and transistor Try
H, and the gate of the transistor Tr17 is connected to the input terminal I! Connect to 1.

第1図の回路にあっては、入力Inが0′″からN1″
になっていく過程で出力OutもN0”から°゛1”に
なっていく。その信号をトランジスタTr7のゲートが
受けて、ノードNllはN1”から′0#になっていく
。するとトランジスタTr2のgmは犬から小になって
いき、イン・々−タI、の回路しきい値電圧は低下する
。従って上記入力Inの“l”を確実に認識するもので
ある。
In the circuit shown in Figure 1, the input In is from 0'' to N1''
In the process of increasing, the output Out also changes from N0'' to °1''. The gate of the transistor Tr7 receives this signal, and the node Nll changes from N1'' to '0#.Then, the gm of the transistor Tr2 decreases from dog to small, and the circuit threshold of the inverter I increases. The value voltage decreases.Therefore, "1" of the input In is reliably recognized.

第2図の回路にあっては、入力へがO”からN1”にガ
っていく過程をトランジスタTrlとTr17が検出す
ることにより、ノードN111の電位が下がる。その電
位をトランジスタTr2のゲートが受けて該トランジス
タTgのgmが低下する。するとインバータIlの回路
しきい値電圧が下がシ、従って上記入力への“1”が確
実に認識されるものである。
In the circuit shown in FIG. 2, the potential of the node N111 decreases as the transistors Trl and Tr17 detect the process in which the input goes from O'' to N1''. The gate of the transistor Tr2 receives this potential, and the gm of the transistor Tg decreases. Then, the circuit threshold voltage of the inverter Il drops, so that the input "1" is reliably recognized.

第1図または第2図の入力グリッチ信号に対する効果は
次の如くである。即ちキャノやシタCにチャージされる
電荷量は、入力信号Inが立ち上がる時の入力In1出
力Out間の電位差により電荷が供給されるが、第3図
の如〈従来(第5図)の回路においては、インパータエ
!の回路しきい値電圧VTHが低層ためグリッチ信。
The effect on the input glitch signal of FIG. 1 or 2 is as follows. In other words, the amount of charge charged to the capacitor and the capacitor C is supplied by the potential difference between the input In1 and the output Out when the input signal In rises. Ha, Impatae! Glitch signal due to low circuit threshold voltage VTH.

号を感知しやすく、出力Outの電圧が低下してしまう
。これに対し本発明の回路では、回路しきい値電圧が高
いためグリッチ信号を感知せず、出力Outの電圧は安
定して■。、まで発生する。
signal is easily sensed, and the voltage of the output Out decreases. On the other hand, in the circuit of the present invention, since the circuit threshold voltage is high, the glitch signal is not sensed, and the voltage of the output Out is stable. , occurs until .

また第1図または第2図の入力信号工。の立ち上多/立
ち下シ時間の傾斜が長い場合の効果は次の如くである。
Also, the input signal construction shown in Figure 1 or Figure 2. The effect when the slope of the rising/falling time is long is as follows.

即ち第4図にも示される如く入力信号■。によシトラン
ジスタTrzのゲート電圧は、入カニ。の逆相で印加さ
れ、インバータIlの回路しきい値電圧がノードNll
またはN1mの電圧変化に追従して変わる。これによシ
第5図の従来方式よりも入力信号InがインバータI。
That is, as shown in FIG. 4, the input signal ■. The gate voltage of the transistor Trz is input. is applied in the opposite phase of the inverter Il, and the circuit threshold voltage of the inverter Il is the node Nll
Or it changes following the voltage change of N1m. This allows the input signal In to be input to the inverter I more than in the conventional system shown in FIG.

の回路しきい値電圧近傍に停滞している時間が短くなる
ため、出力Outは高レベル、低レベルのどちらにもな
らない期間が極少となるものである。
Since the time during which the output voltage remains near the circuit threshold voltage becomes shorter, the period during which the output Out is neither at a high level nor at a low level becomes extremely short.

〔発明の効果〕〔Effect of the invention〕

以上説明した如く本発明によれば、グリ、テ信号に対す
る効果、入力信号の立ち上多/立ち下シ時間の傾斜が長
い場合の効果が著しい半導体集積回路が提供できるもの
である。
As described above, according to the present invention, it is possible to provide a semiconductor integrated circuit which has remarkable effects on green and tea signals and when the slope of the rising/falling time of an input signal is long.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図、第2図は本発明の実施例を示す回路図、第3図
、第4図は同回路の作用を説明するための波形図、第5
図は従来のブートストラップ機能を有した駆動回路図、
第6図はその入力信号波形図である。 Trl+−+Try +Tr17 + TrH−MOS
 )ランゾスタ、C・・・キャパシタ、■!・・・イン
バータ。 出願人代理人  弁理士 鈴 江 武 彦第1図 第2図 第3図 第5図 第6図
1 and 2 are circuit diagrams showing an embodiment of the present invention, FIGS. 3 and 4 are waveform diagrams for explaining the operation of the circuit, and FIG.
The figure shows a drive circuit diagram with a conventional bootstrap function.
FIG. 6 is a diagram of the input signal waveform. Trl+-+Try +Tr17+TrH-MOS
) Lanzosta, C... Capacitor, ■! ...Inverter. Applicant's Representative Patent Attorney Takehiko Suzue Figure 1 Figure 2 Figure 3 Figure 5 Figure 6

Claims (2)

【特許請求の範囲】[Claims] (1)電源間に第1のMOSトランジスタと第2のMO
Sトランジスタを直列接続し、前記第1のMOSトラン
ジスタのソースと入力信号が供給される前記第1のMO
Sトランジスタのゲートとの間にキャパシタを設け、前
記入力信号が供給される入力端子と前記第2のMOSト
ランジスタのゲートとの間にインバータを接続したブー
トストラップ回路と、前記入力端子または第1のトラン
ジスタのソース側電圧を検知し前記インバータの回路し
きい値電圧を変化させる手段とを具備したことを特徴と
する半導体集積回路。
(1) First MOS transistor and second MOS transistor between power supplies
the first MOS in which S transistors are connected in series and the source of the first MOS transistor and the input signal are supplied;
a bootstrap circuit in which a capacitor is provided between the gate of the S transistor and an inverter is connected between the input terminal to which the input signal is supplied and the gate of the second MOS transistor; 1. A semiconductor integrated circuit comprising: means for detecting a source voltage of a transistor and changing a circuit threshold voltage of the inverter.
(2)前記入力信号の電圧が高くなったとき前記インバ
ータの回路しきい値電圧が低くなり、前記入力信号の電
圧が低くなったとき前記インバータの回路しきい値電圧
が高くなることを特徴とする特許請求の範囲第1項に記
載の半導体集積回路。
(2) When the voltage of the input signal becomes high, the circuit threshold voltage of the inverter becomes low, and when the voltage of the input signal becomes low, the circuit threshold voltage of the inverter becomes high. A semiconductor integrated circuit according to claim 1.
JP59127114A 1984-06-20 1984-06-20 Semiconductor integrated circuit Pending JPS615618A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59127114A JPS615618A (en) 1984-06-20 1984-06-20 Semiconductor integrated circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59127114A JPS615618A (en) 1984-06-20 1984-06-20 Semiconductor integrated circuit

Publications (1)

Publication Number Publication Date
JPS615618A true JPS615618A (en) 1986-01-11

Family

ID=14951950

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59127114A Pending JPS615618A (en) 1984-06-20 1984-06-20 Semiconductor integrated circuit

Country Status (1)

Country Link
JP (1) JPS615618A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5369320A (en) * 1992-07-22 1994-11-29 Oki Electric Industry Co., Ltd. Bootstrapped high-speed output buffer
US7954076B2 (en) 2008-05-27 2011-05-31 Fujitsu Limited Transmission delay analyzing apparatus, medium recording transmission delay analyzing program, and transmission delay analyzing method
WO2012029872A1 (en) * 2010-09-02 2012-03-08 シャープ株式会社 Signal processing circuit, inverter circuit, buffer circuit, level shifter, flip-flop, driver circuit, and display device
WO2012029874A1 (en) * 2010-09-02 2012-03-08 シャープ株式会社 Signal processing circuit, inverter circuit, buffer circuit, driver circuit, level shifter, and display device

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5369320A (en) * 1992-07-22 1994-11-29 Oki Electric Industry Co., Ltd. Bootstrapped high-speed output buffer
US7954076B2 (en) 2008-05-27 2011-05-31 Fujitsu Limited Transmission delay analyzing apparatus, medium recording transmission delay analyzing program, and transmission delay analyzing method
WO2012029872A1 (en) * 2010-09-02 2012-03-08 シャープ株式会社 Signal processing circuit, inverter circuit, buffer circuit, level shifter, flip-flop, driver circuit, and display device
WO2012029874A1 (en) * 2010-09-02 2012-03-08 シャープ株式会社 Signal processing circuit, inverter circuit, buffer circuit, driver circuit, level shifter, and display device
CN103155412A (en) * 2010-09-02 2013-06-12 夏普株式会社 Signal processing circuit, inverter circuit, buffer circuit, driver circuit, level shifter, and display device
JPWO2012029874A1 (en) * 2010-09-02 2013-10-31 シャープ株式会社 Signal processing circuit, inverter circuit, buffer circuit, driver circuit, level shifter, display device
US8779809B2 (en) 2010-09-02 2014-07-15 Sharp Kabushiki Kaisha Signal processing circuit, inverter circuit, buffer circuit, level shifter, flip-flop, driver circuit, and display device
US9024681B2 (en) 2010-09-02 2015-05-05 Sharp Kabushiki Kaisha Signal processing circuit, inverter circuit, buffer circuit, driver circuit, level shifter, and display device
CN103155412B (en) * 2010-09-02 2015-12-02 夏普株式会社 Signal processing circuit, inverter circuit, buffer circuit, drive circuit, level shifter, display unit

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