JPS6155377B2 - - Google Patents

Info

Publication number
JPS6155377B2
JPS6155377B2 JP54022916A JP2291679A JPS6155377B2 JP S6155377 B2 JPS6155377 B2 JP S6155377B2 JP 54022916 A JP54022916 A JP 54022916A JP 2291679 A JP2291679 A JP 2291679A JP S6155377 B2 JPS6155377 B2 JP S6155377B2
Authority
JP
Japan
Prior art keywords
projection lens
slit
projection
optical axis
light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP54022916A
Other languages
Japanese (ja)
Other versions
JPS55115013A (en
Inventor
Tetsuo Kobayashi
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
INAMI KK
Original Assignee
INAMI KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by INAMI KK filed Critical INAMI KK
Priority to JP2291679A priority Critical patent/JPS55115013A/en
Publication of JPS55115013A publication Critical patent/JPS55115013A/en
Publication of JPS6155377B2 publication Critical patent/JPS6155377B2/ja
Granted legal-status Critical Current

Links

Classifications

    • AHUMAN NECESSITIES
    • A61MEDICAL OR VETERINARY SCIENCE; HYGIENE
    • A61BDIAGNOSIS; SURGERY; IDENTIFICATION
    • A61B3/00Apparatus for testing the eyes; Instruments for examining the eyes
    • A61B3/10Objective types, i.e. instruments for examining the eyes independent of the patients' perceptions or reactions
    • A61B3/13Ophthalmic microscopes
    • A61B3/135Slit-lamp microscopes

Description

【発明の詳細な説明】 本発明は細隙灯顕微鏡に於けるスリツト投影像
のテイルテイング装置に関するものである。眼球
にスリツト像を投影してその光切断部分を実体顕
微鏡で拡大観察する細隙灯顕微鏡検査は眼科の診
療に於て広く行われているが、眼球に対するスリ
ツト像の投影角度を調整する必要があり各種の投
影角度調整方法と装置が開発されている。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a tailing device for a slit projected image in a slit lamp microscope. Slit-lamp microscopy, in which a slit image is projected onto the eyeball and the light section is magnified and observed using a stereomicroscope, is widely used in ophthalmology, but it is necessary to adjust the projection angle of the slit image relative to the eyeball. Various projection angle adjustment methods and devices have been developed.

しかし、従来のものでは照明系に複雑な動作を
させ、この為複雑な付属装置を必要とするもので
あつた。
However, in the conventional type, the illumination system has to perform complicated operations, and thus requires complicated accessory equipment.

例えば、従来の典型的な投影角度調整装置の一
例を示す第3図について説明すれば、スリツト像
の投影角度を水平位置から仰角投影角度に調整す
るには反射鏡14の位置を実線で示す位置から仮
想線で示す位置まで下降させると共に鉛直光軸1
0との角度を元のθよりθ+αだけ傾斜させ、か
つ投影レンズ8を仮想線で示す位置まで反射鏡と
一定比率の下で移動させなければならなかつた。
For example, referring to FIG. 3 showing an example of a typical conventional projection angle adjustment device, in order to adjust the projection angle of the slit image from a horizontal position to an elevational projection angle, the position of the reflector 14 is shown by a solid line. to the position shown by the imaginary line and vertical optical axis 1.
0 had to be tilted by θ+α from the original θ, and the projection lens 8 had to be moved to the position shown by the imaginary line at a constant ratio to the reflecting mirror.

これに対し本発明では上記の様な複雑な動作や
付属機構を要さず眼球へのスリツト像の投影角度
を容易に調整できるものであり以下図面に基いて
詳述する。
In contrast, in the present invention, the projection angle of the slit image onto the eyeball can be easily adjusted without requiring the above-mentioned complicated operations or attached mechanisms, and will be described in detail below with reference to the drawings.

図面に於て、第1図は本発明の構成を示す説明
図、第2図は第2投影レンズ13の正面図、第3
図は従来の典型的な投影角度調整装置の一例を示
す説明図である。
In the drawings, FIG. 1 is an explanatory diagram showing the configuration of the present invention, FIG. 2 is a front view of the second projection lens 13, and FIG.
The figure is an explanatory diagram showing an example of a typical conventional projection angle adjustment device.

まず従来の一例としての第3図では、照明光源
1からの光はコンデンサーレンズ系2、回転板5
の開口部3、スリツト11、投影レンズ8、反射
鏡14を経て患者眼球9へ光束4を投影してスリ
ツト像を投影させ、その光切断部分を実体顕微鏡
15で拡大観察するものである。
First, in FIG. 3 as an example of the conventional method, light from an illumination light source 1 is passed through a condenser lens system 2 and a rotary plate 5.
A beam of light 4 is projected onto the patient's eyeball 9 through the aperture 3, slit 11, projection lens 8, and reflector 14 to project a slit image, and the section of the light is magnified and observed using a stereomicroscope 15.

患者眼球への水平投影の場合、鉛直光軸10に
対する反射鏡14の角度θは45゜であるが仰角投
影とする為に反射鏡を図中仮想線で示す位置まで
下降させ同時に元の角度θをθ+αだけ仰角度に
応じて傾斜させ、同時に投影レンズ8を仮想線の
位置まで反射鏡と一定比率の下で移動させなけれ
ばならない。
In the case of horizontal projection onto the patient's eyeball, the angle θ of the reflector 14 with respect to the vertical optical axis 10 is 45°, but in order to perform elevation projection, the reflector is lowered to the position shown by the imaginary line in the figure and at the same time returns to the original angle θ. must be tilted by θ+α according to the elevation angle, and at the same time, the projection lens 8 must be moved to the position of the virtual line at a constant ratio to the reflecting mirror.

これに対し第1図に示す本発明装置では次の様
な構成となつている。
In contrast, the apparatus of the present invention shown in FIG. 1 has the following configuration.

照明光源から発した光がコンデンサーレンズ系
2、回転板5の開口部3、ナイフエツヂ7によつ
て形成されたスリツト11、第1投影レンズ8、
反射鏡14、第2投影レンズ13を経て患者眼球
9にスリツト像を投影させ、その光切断部分を実
体顕微鏡15で拡大観察する構成となつている。
第2投影レンズ光軸12が水平投影光軸6に対し
てθを傾斜せる様に第2投影レンズ13を配置
する。図中実線で示した反射鏡の位置より該反射
鏡によつて反射された光束が第2投影レンズ13
によつてスリツト像として患者眼球9に投影され
るとき、その光軸が水平になるような位置にθ
が決定される。
The light emitted from the illumination light source passes through the condenser lens system 2, the opening 3 of the rotating plate 5, the slit 11 formed by the knife edge 7, the first projection lens 8,
A slit image is projected onto the patient's eyeball 9 via a reflecting mirror 14 and a second projection lens 13, and the light section is magnified and observed using a stereomicroscope 15.
The second projection lens 13 is arranged so that the second projection lens optical axis 12 is inclined by θ 2 with respect to the horizontal projection optical axis 6. The light beam reflected by the reflecting mirror from the position of the reflecting mirror indicated by the solid line in the figure is transferred to the second projection lens 13.
When projected onto the patient's eyeball 9 as a slit image by θ2 , the optical axis is horizontal.
is determined.

鉛直光軸10と反射鏡14との角度θは上記
の様に配置した第2投影レンズ13の第2投影レ
ンズ光軸12と該反射鏡によつて反射される光束
が平行となる位置に決定される。
The angle θ 1 between the vertical optical axis 10 and the reflecting mirror 14 is set at a position where the second projection lens optical axis 12 of the second projection lens 13 arranged as described above and the light beam reflected by the reflecting mirror are parallel to each other. It is determined.

そしてθを変えずに反射鏡14を図中仮想線
で示す位置まで下降させてもこの位置での反射光
束も第2投影レンズ光軸12と平行に第2投影レ
ンズ13へ入射される。
Even if the reflecting mirror 14 is lowered to the position shown by the imaginary line in the figure without changing θ1 , the reflected light beam at this position also enters the second projection lens 13 in parallel to the second projection lens optical axis 12.

従つて、図中仮想線で示す反射鏡の位置より反
射された光束4は第2投影レンズ13を経て水平
投影光軸6に対してθ傾斜した仰角投影光軸1
6のスリツト像として患者眼球9へ投影される。
傾斜角θは反射鏡14の下降距離によつて決
定されるので下降距離の調整によつて傾斜角θ
を調整することができる。
Therefore, the light beam 4 reflected from the position of the reflecting mirror indicated by the imaginary line in the figure passes through the second projection lens 13 and forms the elevation projection optical axis 1 which is inclined by θ 3 with respect to the horizontal projection optical axis 6.
6 is projected onto the patient's eyeball 9 as a slit image.
Since the inclination angle θ 3 is determined by the descending distance of the reflector 14, the inclination angle θ 3 can be adjusted by adjusting the descending distance.
3 can be adjusted.

第2投影レンズ13は第2図の正面図に示す様
な形状であるので実体顕微鏡15の双眼観察路を
妨げることはない。
Since the second projection lens 13 has a shape as shown in the front view of FIG. 2, it does not obstruct the binocular observation path of the stereomicroscope 15.

本発明は以上説明した様な構成となつているの
で、従来例の様な複雑な動作と付属機構を要する
ことなく、反射鏡の上下摺動だけで簡単な操作で
患者眼球に対するスリツト像の投影角度を調整で
きる効果がある。
Since the present invention has the above-described configuration, the slit image is projected onto the patient's eyeball with a simple operation by simply sliding the reflector up and down, without requiring complicated movements and attached mechanisms as in the conventional example. It has the effect of being able to adjust the angle.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の構成を示す説明図、第2図は
第2投影レンズ13の正面図、第3図は従来の典
型的な投影角度調整装置の一例を示す説明図であ
る。 1…照明光源、2…コンデンサーレンズ系、3
…開口部、4…照明光束、5…回転板、6…水平
投影光軸、7…ナイフエツヂ、8…第1投影レン
ズ、9…患者眼球、10…鉛直光軸、11…スリ
ツト、12…第2投影レンズ光軸、13…第2投
影レンズ、14…反射鏡、15…実体顕微鏡、1
6…仰角投影光軸。
FIG. 1 is an explanatory diagram showing the configuration of the present invention, FIG. 2 is a front view of the second projection lens 13, and FIG. 3 is an explanatory diagram showing an example of a typical conventional projection angle adjusting device. 1...Illumination light source, 2...Condenser lens system, 3
...Aperture, 4...Illumination light flux, 5...Rotary plate, 6...Horizontal projection optical axis, 7...Knife edge, 8...First projection lens, 9...Patient's eyeball, 10...Vertical optical axis, 11...Slit, 12...Top 2 projection lens optical axis, 13...second projection lens, 14...reflector, 15...stereomicroscope, 1
6... Elevation projection optical axis.

Claims (1)

【特許請求の範囲】[Claims] 1 照明光源からの光がコンデンサーレンズ系、
回転板の開口部、スリツト、第1投影レンズ、反
射鏡、第2投影レンズを経て患者眼球にスリツト
像を投影させ、その光切断部分を実体顕微鏡で拡
大観察する細隙灯顕微鏡に於て、第2投影レンズ
光軸12が水平投影光軸6に対して傾斜せる様に
第2投影レンズ13を配置し、第1投影レンズか
ら反射鏡にて反射された光束が第2投影レンズ光
軸12と平行に第2投影レンズ13へ入射される
ような角度に該反射鏡を上下摺動自在に配置し、
患者眼球に対するスリツト像の焦点が常に同一点
に形成された状態でそのスリツト像の仰角投影を
該反射鏡の上下摺動にて調整し得るように構成し
たことを特徴とする細隙灯顕微鏡に於けるスリツ
ト投影像のテイルテイング装置。
1 The light from the illumination light source is a condenser lens system,
In a slit lamp microscope, a slit image is projected onto the patient's eyeball through an aperture of a rotating plate, a slit, a first projection lens, a reflector, and a second projection lens, and the part where the light is cut is magnified and observed using a stereomicroscope. The second projection lens 13 is arranged so that the second projection lens optical axis 12 is inclined with respect to the horizontal projection optical axis 6, and the light beam reflected from the first projection lens by the reflecting mirror is transmitted to the second projection lens optical axis 12. The reflecting mirror is arranged so as to be vertically slidable at an angle such that the light is incident on the second projection lens 13 parallel to the
A slit lamp microscope characterized in that the slit lamp is configured such that the focal point of the slit image with respect to the patient's eyeball is always formed at the same point, and the elevation angle projection of the slit image can be adjusted by vertically sliding the reflector. A tailing device for slit projected images.
JP2291679A 1979-02-28 1979-02-28 Tilting device of slit projected image in slit-lamp microscope Granted JPS55115013A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2291679A JPS55115013A (en) 1979-02-28 1979-02-28 Tilting device of slit projected image in slit-lamp microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2291679A JPS55115013A (en) 1979-02-28 1979-02-28 Tilting device of slit projected image in slit-lamp microscope

Publications (2)

Publication Number Publication Date
JPS55115013A JPS55115013A (en) 1980-09-04
JPS6155377B2 true JPS6155377B2 (en) 1986-11-27

Family

ID=12095958

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2291679A Granted JPS55115013A (en) 1979-02-28 1979-02-28 Tilting device of slit projected image in slit-lamp microscope

Country Status (1)

Country Link
JP (1) JPS55115013A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0231185U (en) * 1988-08-19 1990-02-27

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS60126136A (en) * 1983-12-10 1985-07-05 興和株式会社 Illuminator in fine gap lamp microscope
EP1410754B1 (en) * 2002-10-16 2006-05-24 Möller-Wedel GmbH Surgical microscope with illumination means

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0231185U (en) * 1988-08-19 1990-02-27

Also Published As

Publication number Publication date
JPS55115013A (en) 1980-09-04

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