JPS6140071B2 - - Google Patents
Info
- Publication number
- JPS6140071B2 JPS6140071B2 JP15464878A JP15464878A JPS6140071B2 JP S6140071 B2 JPS6140071 B2 JP S6140071B2 JP 15464878 A JP15464878 A JP 15464878A JP 15464878 A JP15464878 A JP 15464878A JP S6140071 B2 JPS6140071 B2 JP S6140071B2
- Authority
- JP
- Japan
- Prior art keywords
- diode
- circuit
- voltage
- output
- failure
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 16
- 239000000758 substrate Substances 0.000 claims description 8
- 230000010363 phase shift Effects 0.000 description 14
- 238000010586 diagram Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 6
- 230000005856 abnormality Effects 0.000 description 2
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- 238000004891 communication Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15464878A JPS5582061A (en) | 1978-12-15 | 1978-12-15 | Detection circuit for diode failure |
| CA000338873A CA1162611A (en) | 1978-12-15 | 1979-10-31 | Diode faults detecting apparatus |
| GB7937835A GB2036983B (en) | 1978-12-15 | 1979-11-01 | Diode faults detecting apparatus |
| US06/097,494 US4346347A (en) | 1978-12-15 | 1979-11-26 | Diode faults detecting apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15464878A JPS5582061A (en) | 1978-12-15 | 1978-12-15 | Detection circuit for diode failure |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5582061A JPS5582061A (en) | 1980-06-20 |
| JPS6140071B2 true JPS6140071B2 (de) | 1986-09-06 |
Family
ID=15588815
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15464878A Granted JPS5582061A (en) | 1978-12-15 | 1978-12-15 | Detection circuit for diode failure |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5582061A (de) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015152353A (ja) * | 2014-02-12 | 2015-08-24 | 株式会社東芝 | 故障検知装置および、それを備える太陽光発電システム |
| CN105425132B (zh) * | 2015-12-10 | 2018-12-18 | 重庆凯西驿电子科技有限公司 | 二极管失效分析装置 |
-
1978
- 1978-12-15 JP JP15464878A patent/JPS5582061A/ja active Granted
Also Published As
| Publication number | Publication date |
|---|---|
| JPS5582061A (en) | 1980-06-20 |
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