JPS6135329A - Measuring device for characteristic of display device - Google Patents

Measuring device for characteristic of display device

Info

Publication number
JPS6135329A
JPS6135329A JP15707784A JP15707784A JPS6135329A JP S6135329 A JPS6135329 A JP S6135329A JP 15707784 A JP15707784 A JP 15707784A JP 15707784 A JP15707784 A JP 15707784A JP S6135329 A JPS6135329 A JP S6135329A
Authority
JP
Japan
Prior art keywords
display
display device
data
signal pattern
cells
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15707784A
Other languages
Japanese (ja)
Inventor
Junichi Nagase
純一 長瀬
Tamotsu Ito
保 伊藤
Tsutomu Yoshihara
吉原 勉
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Japan Inc
Original Assignee
Yokogawa Hewlett Packard Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokogawa Hewlett Packard Ltd filed Critical Yokogawa Hewlett Packard Ltd
Priority to JP15707784A priority Critical patent/JPS6135329A/en
Publication of JPS6135329A publication Critical patent/JPS6135329A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Optical Devices Or Fibers (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

PURPOSE:To input measurement data on all cells in a short time even when the display device has many cells and perform necessary processing by providing a photodetection part and moving means, selective energizing means, energizing signal storage means, and data processing means. CONSTITUTION:A signal pattern generation part 2 generates a signal pattern for measurement on the basis of data on a set signal pattern and supplies to an object cell to be measured on the display device 6 which is selected by a switch matrix 4. An XY table 8 moves the photodetection part 10 to the position suitable for the measurement of the selected cell on the display device 6. The output signal of the photodetection part 10 is inputted to a data collecting part 12 with a synchronizing signal in synchronism with the signal pattern and the data processing part 14 performs proper arithmetic processing according to characteristics of the display device 6 and an item to be measured. The operations of those parts are all contolled by a control part 16 and characteristics of all cells on the display device 6 are measured automatically.

Description

【発明の詳細な説明】 〔発明の技術分野〕 本発明は発光ダイオードや液晶等の表示素子が面状に配
置された表示器の特性を高速に自動測定  ′するため
の表示器特性測定装置に関する。
[Detailed Description of the Invention] [Technical Field of the Invention] The present invention relates to a display characteristic measuring device for rapidly and automatically measuring the characteristics of a display device in which display elements such as light emitting diodes and liquid crystals are arranged in a planar manner. .

〔従来技術およびその問題点〕[Prior art and its problems]

発光ダイオードや液晶等の表示素子の輝度あるいは明度
特性を測定するためには一般に以下の様な方法がとられ
ている。
The following methods are generally used to measure the brightness or brightness characteristics of display elements such as light emitting diodes and liquid crystals.

たとえば発光ダイオードの場合、先ず測定しようとする
素子を正確に位置決めされた機械的な取り付は治具に固
定し、電気的な結線を行い、Pli定電流を流して得ら
れた発光をレンズ系で受けて輝度を測定する。この様な
作業を必要とされる素子の夫々について繰り返すことに
より多数の素子の測定を行っていた。
For example, in the case of a light emitting diode, first the device to be measured is accurately positioned and mechanically mounted on a jig, electrical connections are made, and a Pli constant current is passed through the lens system. to measure the brightness. By repeating such operations for each required element, a large number of elements were measured.

一方、表示用の多数の小素子を格子状等に配置した面状
の表示器(以下、この様な表示用の小素子をセルと称す
る)の特P1測定においても、原理的には上述の測定方
法によって全てのセルを測定することは可能である。し
かしながら、今日では極めて多数のセルを設けた表示器
が出現したため、この様な方法は測定のための時間及び
手間が非現実的なまでに増加する。たとえば、200X
200のセルを配置した表示器においてはセルの総数は
40000Bにもなるため、従来の方法ではいくつかの
セルを抽出して測定せざるを得ない。
On the other hand, in the special P1 measurement of a planar display device in which a large number of small display elements are arranged in a grid or the like (hereinafter, such display small elements are referred to as cells), the above-mentioned principles apply. It is possible to measure all cells using the measurement method. However, since displays with a large number of cells have now appeared, such a method requires an impractical increase in the time and effort required for measurement. For example, 200X
In a display device with 200 cells, the total number of cells is 40,000B, so the conventional method has no choice but to extract and measure several cells.

この場合、かくして得られた部分的なデータを統計処理
して全体の特性を推定していた。
In this case, the partial data thus obtained were statistically processed to estimate the overall characteristics.

更に今後もなお表示器上のセル数は増加し続けることが
予想される。従って100000個の中位のセル数の表
示器にも充分に対応することができる表示器特性測定装
置が求められている。
Furthermore, it is expected that the number of cells on a display will continue to increase in the future. Therefore, there is a need for a display characteristic measuring device that can adequately handle displays with a medium number of cells of 100,000.

〔発明の[要〕[Essentials of the invention]

」:述した従来技術の問題点を解消するため、本発明の
表示器特性測定装置においては、複数のセルが面状に配
置された表示器上の個々のセルよりの光を受ける受光部
と、表示器と受光部とを相対的に移動させて表示器上の
任意のセルよりの光を1rII記受光部が受光できる様
にする移動手段と、表示器上の任意のセルを付勢する選
択付勢手段と、選択付勢部がセルを付勢するための信号
パターンを記憶する付勢信号記憶手段と、受光部の出力
データを集録してデータ処理を行う手段とを設けている
。 この様な構成をとることにより、表示器と受光部と
の位置合わせ、セルの選択、選択されたセルの付勢、付
勢されたセルか゛らの光の検出及びこのデータの集録・
処理を全体として関連付けて高スループツトの表示器特
性測定を行う。
”: In order to solve the problems of the prior art described above, the display characteristic measuring device of the present invention includes a light receiving section that receives light from each cell on a display device in which a plurality of cells are arranged in a planar manner. , a moving means for relatively moving the display and the light-receiving section so that the light-receiving section can receive light from any cell on the display; and energizing any cell on the display. A selective energizing means, an energizing signal storage means for storing a signal pattern for the selective energizing section to energize the cells, and a means for collecting output data of the light receiving section and performing data processing are provided. By adopting such a configuration, it is possible to align the display and the light receiving section, select a cell, energize the selected cell, detect light from the energized cell, and collect and collect this data.
Processing is linked as a whole to provide high-throughput measurement of display characteristics.

〔発明の実施例〕[Embodiments of the invention]

以下、図面に基いて本発明の詳細な説明する。 Hereinafter, the present invention will be explained in detail based on the drawings.

第1図は本発明の一実施例の表示器特性測定装置のブロ
ック図である。同図において、信号パターン発生部2は
設定された信号パターンのデータに基いて測定用の信号
パターンを発生し、スイッチ・マトリクス4が選択した
表示器6土の測定されるべきセルへ学える。一方、XY
テーブル8は受光部10を表示器lO上の選択されたセ
ルの測定に適する位置へ移動させる。受光部IOの出力
信号は同期信号により信号パターンと同期してデータ集
tiful12へ取り込まれた後、データ処理部14で
表示器6の特性や測定すべき項目に応じて適宜演算処理
を受ける。これら各部分の動作は皆、制御部16により
管理され、必要な特性測定が自= 3− 動的に表示器6上の全セルに対して行われる様に制御す
る。
FIG. 1 is a block diagram of a display characteristic measuring device according to an embodiment of the present invention. In the figure, a signal pattern generating section 2 generates a signal pattern for measurement based on the set signal pattern data, and the signal pattern can be learned from the cell to be measured on the display 6 selected by the switch matrix 4. On the other hand, XY
The table 8 moves the light receiving section 10 to a position suitable for measuring the selected cell on the display 1O. The output signal of the light receiving section IO is taken into the data collection tiful 12 in synchronization with the signal pattern by a synchronizing signal, and then subjected to appropriate arithmetic processing in the data processing section 14 according to the characteristics of the display 6 and the items to be measured. The operation of each of these parts is managed by the control section 16, and is controlled so that necessary characteristic measurements are automatically and dynamically performed on all cells on the display 6.

以下では第2図ないし第4図を用いて第1図の表示器特
性測定装置の構成及び動作をより詳細に説明する。
The configuration and operation of the display characteristic measuring apparatus shown in FIG. 1 will be explained in more detail below using FIGS. 2 to 4.

第2図は測定に関連する諸信号の流れを説明するための
本表示器特性測定装置のブロック図であり、第1図と同
一の部分は同一の参照番号を与えている。また第3図は
第2図中の諸信号の波形を示している。第4図は本表示
器特性測定装置の動作を示すフローチャートである。
FIG. 2 is a block diagram of the present display characteristic measuring apparatus for explaining the flow of various signals related to measurement, and the same parts as in FIG. 1 are given the same reference numerals. Further, FIG. 3 shows the waveforms of various signals in FIG. 2. FIG. 4 is a flowchart showing the operation of this display characteristic measuring device.

これらの図において、制御部16は先ず信号パターン記
憶部24に以降の測定で発生すべき信号パターンを表す
ディジタル・データを設定する。
In these figures, the control section 16 first sets in the signal pattern storage section 24 digital data representing the signal pattern to be generated in subsequent measurements.

そして、XYテーブル8(第1図)を測定位置に移動さ
せ、スイッチ・マトリクス4(第1図、なお第2図中の
信号径路上からは省略〕を介して信号パターンCを表示
器lOの選択されたセルへ与える。
Then, move the XY table 8 (Fig. 1) to the measurement position, and apply the signal pattern C to the display lO via the switch matrix 4 (Fig. 1, omitted from the signal path in Fig. 2). Give to selected cells.

ディジタル・アナログ変換器26による信号パターンC
の発生にあたっては、先ず制御部16の制御の下でサン
プル−クロック発生部22がサンプル・クロックAを信
号パターン記憶部24へ与えることにより読出されたデ
ィジタル・データBを用いている。
Signal pattern C by digital-to-analog converter 26
To generate the signal, first, under the control of the control section 16, the sample-clock generation section 22 supplies the sample clock A to the signal pattern storage section 24, thereby using the digital data B read out.

選択されたセルからの光(11Il晶等の非発光性素子
の場合はセル面の明度を測定する)により、受光MlO
はこのセルの特性に応じた出力信号りをデータ集録部1
2へ与える。データ集録部12へはまたサンプル・クロ
ックAに基いて高速サンプル・クロック発生部28が発
生した高速サンプル・クロックEが与えられる。これに
よって出力信号りは信号パターンCと対応がつく杜に同
期して充分密にサンプリングされ、ディジタル化された
後、データ集録部12に集録される。この様なサンプリ
ングを行うのは、信号パターンCの力はステップ波形や
ランプ波形等の比較的単純な波形であることが多いのに
対して、出力信号りはセルの過渡応答特性や非線形性等
を反映して複雑な波形になり、またその解析のためには
より細かくサンプリングする必要があるからである。な
お、第1図の同期信号が高速サンプル・クロックEに相
当する。
The light from the selected cell (in the case of a non-luminous element such as 11Il crystal, the brightness of the cell surface is measured), the received MlO
The data acquisition unit 1 outputs an output signal according to the characteristics of this cell.
Give to 2. The data acquisition section 12 is also supplied with a high speed sample clock E generated by a high speed sample clock generation section 28 based on the sample clock A. As a result, the output signal is sampled sufficiently densely in synchronization with the signal pattern C, digitized, and then collected in the data acquisition section 12. This type of sampling is performed because the power of signal pattern C is often a relatively simple waveform such as a step waveform or ramp waveform, whereas the output signal is based on the transient response characteristics of the cell, nonlinearity, etc. This is because the waveform becomes complex, and it is necessary to sample it more precisely in order to analyze it. Note that the synchronization signal in FIG. 1 corresponds to the high-speed sample clock E.

この様にしてデータ集録M12中に集録されたデータは
信号Fとして読出されてデータ処理部14で所要のデー
タ処理が行われる。ここにおいて、まだ測定すべきセル
が残っているか否かを調べ、その結果によってXYテー
ブル位置の移動を行うか終了するかを決める。もちろん
、全セルのデータを得てからデータ処理をしても良い。
The data acquired during the data acquisition M12 in this manner is read out as a signal F, and the data processing section 14 performs necessary data processing. Here, it is checked whether there are any cells left to be measured, and depending on the result, it is determined whether to move the XY table position or not. Of course, data processing may be performed after obtaining data for all cells.

なお、データ処理部14においては集録されたデータを
数(m計算処理する。ここで行われる処理としては通常
OK/NG判定、統計計算等の処理とそのグラフ表示処
理であるが、データ処理自体については本発明の要旨で
はないので、詳細な説明は省略する。
In addition, the data processing unit 14 processes the acquired data by calculating the number (m).The processing performed here usually includes processing such as OK/NG judgment, statistical calculation, and displaying the graph, but the data processing itself Since this is not the gist of the present invention, a detailed explanation will be omitted.

〔発明の効果〕〔Effect of the invention〕

以」:説明した様に、本発明によればセル数が極めて多
い表示器に対しても全セルに関する測定用データを短時
間で取り込んで必要な処理を施すことができるため、製
品評価の確実化等の効果がある。
As explained above, according to the present invention, even for display devices with an extremely large number of cells, it is possible to import measurement data for all cells in a short time and perform the necessary processing, thereby ensuring reliable product evaluation. It has the effect of increasing

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明にかかる表示器特性測定装置のブロック
図、第2図は測定に関連する諸信号の流れを説明するた
めの本表示器特性測定装置のブロック図、第3図は第2
図中の諸信号の波形を示す図、第4図は本表示器特性測
定装置の動作を示すフローチャートである。 2・信号パターン発生部、 4°スイツチ・マトリクス、  6−表示器、8:XY
テーブル、  10 受光部、12、データ集録部、 
 14:データ処理部、16二制御部、 22、サンプル・クロック発生部、 24:信号パターン記憶部、 26、ディジタル・アナログ変換器、 28:高速サンプル・クロック発生部。
FIG. 1 is a block diagram of the display characteristic measuring device according to the present invention, FIG. 2 is a block diagram of the present display characteristic measuring device for explaining the flow of various signals related to measurement, and FIG. 3 is a block diagram of the present display characteristic measuring device.
FIG. 4 is a flowchart showing the operation of the present display characteristic measuring device. 2. Signal pattern generator, 4° switch matrix, 6-display, 8: XY
Table, 10 Light receiving section, 12, Data acquisition section,
14: data processing section, 16 control section, 22: sample clock generation section, 24: signal pattern storage section, 26: digital-to-analog converter, 28: high-speed sample clock generation section.

Claims (1)

【特許請求の範囲】 複数の表示要素が面状に配置された表示器上の個々の表
示要素よりの光を受ける受光部と、前記表示器と受光部
とを相対的に移動させて前記表示器上の任意の表示要素
からの光を前記受光部が受光できる様にする移動手段と
、 前記表示器上の任意の表示要素を付勢する選択付勢手段
と、 前記選択付勢部が前記表示要素を付勢するための信号パ
ターンを記憶する付勢信号記憶手段と、前記受光部の出
力データを集録してデータ処理を行う手段と を設けてなる表示器特性測定装置。
[Scope of Claims] A light-receiving section that receives light from each display element on a display device in which a plurality of display elements are arranged in a planar manner; a moving means that allows the light receiving section to receive light from an arbitrary display element on the display; a selective energizing means that energizes an arbitrary display element on the display; A display characteristic measuring device comprising: energizing signal storage means for storing a signal pattern for energizing a display element; and means for collecting output data of the light receiving section and processing the data.
JP15707784A 1984-07-27 1984-07-27 Measuring device for characteristic of display device Pending JPS6135329A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15707784A JPS6135329A (en) 1984-07-27 1984-07-27 Measuring device for characteristic of display device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15707784A JPS6135329A (en) 1984-07-27 1984-07-27 Measuring device for characteristic of display device

Publications (1)

Publication Number Publication Date
JPS6135329A true JPS6135329A (en) 1986-02-19

Family

ID=15641737

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15707784A Pending JPS6135329A (en) 1984-07-27 1984-07-27 Measuring device for characteristic of display device

Country Status (1)

Country Link
JP (1) JPS6135329A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010101652A (en) * 2008-10-21 2010-05-06 Konica Minolta Sensing Inc Display measuring device
CN103267627A (en) * 2012-12-14 2013-08-28 上海中航光电子有限公司 Display panel flicker tester and flicker degree acquisition method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010101652A (en) * 2008-10-21 2010-05-06 Konica Minolta Sensing Inc Display measuring device
CN103267627A (en) * 2012-12-14 2013-08-28 上海中航光电子有限公司 Display panel flicker tester and flicker degree acquisition method

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