JPS6132948A - Transmission-type electron microscope - Google Patents

Transmission-type electron microscope

Info

Publication number
JPS6132948A
JPS6132948A JP15306384A JP15306384A JPS6132948A JP S6132948 A JPS6132948 A JP S6132948A JP 15306384 A JP15306384 A JP 15306384A JP 15306384 A JP15306384 A JP 15306384A JP S6132948 A JPS6132948 A JP S6132948A
Authority
JP
Japan
Prior art keywords
magnification
electron lens
current
current level
multiplying factor
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP15306384A
Other languages
Japanese (ja)
Inventor
Hiroyuki Kobayashi
弘幸 小林
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP15306384A priority Critical patent/JPS6132948A/en
Publication of JPS6132948A publication Critical patent/JPS6132948A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/261Details
    • H01J37/265Controlling the tube; circuit arrangements adapted to a particular application not otherwise provided, e.g. bright-field-dark-field illumination

Abstract

PURPOSE:To control the multiplying factor by controlling the electron lens current according to the current level obtained by interpolating the current level of an electron lens for a corresponding multiplying factor. CONSTITUTION:After the preselected multiplying factor is entered, a microprocessor 18 reads out one of the current levels of electron lenses 2-3 and 5- 9 stored in a memory element 19 and delivers the read current level to one of DA converters 11-17. A magnified image with the preselected multiplying factor can be observed on a fluorescent plate 10 by delivering the current level stored in the memory element 19 as it is to one of the DA converters 13-17. Therefore, it is possible to produce an arbitrary multiplying factor not a predetermined one by interpolating the current level stored in the memory element 19 by using an operator 20 and delivering the interpolation result to the DA converters 13-17.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は、透過形電子顕微鏡に係り、特に倍率制御の改
良に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a transmission electron microscope, and particularly to improvement of magnification control.

〔発明の背景〕[Background of the invention]

従来、透過形電子顕微鏡の倍率は、選択可能な倍率にそ
れぞれ対応する結像レンズの電流値をメモIJ K予め
記憶させておき、倍率選択時の倍率切換信号によってこ
めメモリに記憶している電流値を読出し、この電流値に
対応する電流を結像レンズに出力することにより制御し
ていた(例えば公昭49−22577号)。
Conventionally, the magnification of a transmission electron microscope is determined by storing the current value of the imaging lens corresponding to each selectable magnification in advance in a memo IJK, and then changing the current stored in the memory by the magnification switching signal when the magnification is selected. Control was performed by reading out a value and outputting a current corresponding to this current value to an imaging lens (for example, Publication No. 49-22577).

しかし、このような倍率制御方式では選択可能な倍率の
数を多くすると、メモリ容量を増加させなければならす
2、構成が大きくなるという欠点がある。また、逆に選
択可能な倍率の数がメモリに記憶されている電流値の数
で制限されてしまい、操作者が任意に倍率を設定するこ
とができないという欠点がある。
However, such a magnification control method has the disadvantage that increasing the number of selectable magnifications requires an increase in memory capacity 2 and an increase in the size of the configuration. Furthermore, the number of selectable magnifications is limited by the number of current values stored in the memory, and there is a drawback that the operator cannot arbitrarily set the magnification.

〔発明の目的〕[Purpose of the invention]

本発明の目的は、任意の倍率を設定可能とし、しかも小
容量のメモリで多くの倍率を選択設定し得る透過形電子
顕微鏡を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a transmission electron microscope that can set any magnification and can select and set many magnifications with a small memory.

〔発明の概要〕[Summary of the invention]

本発明は、所定種類の倍率にそれぞれ対応して設定され
ている電子レンズの電流値をもとに補間演算することに
よシ隣り合う倍率の中間の倍率における電子レンズの電
流値を算出し、この電流値によって電子レンズ電流を制
御することによシ、連続的な倍率を設定可能としたもの
である。
The present invention calculates the current value of the electronic lens at an intermediate magnification between adjacent magnifications by performing interpolation calculation based on the current value of the electronic lens set corresponding to each predetermined type of magnification, By controlling the electron lens current using this current value, continuous magnification can be set.

〔発明の実施例〕[Embodiments of the invention]

第1図は、本発明の一実施例を示す構成図であシ、電子
銃1よシ発射された電子線は照射レンズ系2〜3によっ
て収束され、試料4を照射する。
FIG. 1 is a block diagram showing an embodiment of the present invention, in which an electron beam emitted from an electron gun 1 is converged by irradiation lens systems 2 to 3 and irradiates a sample 4.

試料4を透過した電子線は、結像レンズ系5〜9によっ
て拡大され、蛍光板10上に試料の拡大像を形成する。
The electron beam transmitted through the sample 4 is magnified by the imaging lens systems 5 to 9 to form an enlarged image of the sample on the fluorescent screen 10.

各電子レンズ2〜3,5〜9の電流は、DA変換器11
〜17を介してマイクロプロセッサ18によって制御さ
れる。マイクロプロセッサ18は、倍率が選択されると
記憶素子19に記憶されている各電子レンズ2〜3,5
〜9の電流値を読出し、各DA変換器11〜エフに出力
する。このとき、記憶素子19に記憶されている電流値
をそのままDA変換器13〜17に出力すれば、予め選
択設定された倍率での拡大像が蛍光板10上で観察され
る。従って、記憶素子19に記憶されている電流値をも
とに演算素子20を用いて補間演算を施し、その結果を
DA変換器13〜17に出力すれば、予め選択設定され
た倍率ではなく任意の倍率を設定することが可能となる
The current of each electron lens 2 to 3, 5 to 9 is passed through a DA converter 11
-17 by microprocessor 18. When the magnification is selected, the microprocessor 18 selects each of the electronic lenses 2 to 3 and 5 stored in the storage element 19.
The current values of ~9 are read out and output to each DA converter 11~F. At this time, if the current value stored in the memory element 19 is output as is to the DA converters 13 to 17, an enlarged image at a magnification selected and set in advance can be observed on the fluorescent screen 10. Therefore, if an interpolation calculation is performed using the calculation element 20 based on the current value stored in the storage element 19, and the result is output to the DA converters 13 to 17, it is possible to use an arbitrary magnification instead of a pre-selected magnification. It becomes possible to set the magnification of

次に、第2図(a)、 (b)を用いてこの補間演算に
ついて説明する。
Next, this interpolation calculation will be explained using FIGS. 2(a) and 2(b).

第2図(功は予め設定された倍率に対する結像レンズ系
5〜9の電流値を示すものである。図中の黒丸印の点に
対応する電流値が記憶素子19に予め記憶されている。
FIG. 2 shows the current values of the imaging lens systems 5 to 9 for a preset magnification. The current values corresponding to the black circle points in the figure are stored in advance in the storage element 19. .

ここで、倍率Aと倍率Bに注目して考える。第2図(b
)はこの倍率AとBとの間を拡大して示したもので、倍
率Aに対して各結像レンズ5〜9の電流がal−a5、
倍率Bに対してはbl−b5という値で記憶されている
。ここで仮シにこの倍率A、Hの間に新たに倍率Cを設
定しようとすれば、各結像レンズ5〜9の電流値は次の
ような補間演算を施して求めればよい。
Here, we will focus on magnification A and magnification B. Figure 2 (b
) is an enlarged view of the area between the magnifications A and B, and the current of each imaging lens 5 to 9 is shown as al-a5,
For magnification B, the value bl-b5 is stored. If a new magnification C is to be temporarily set between the magnifications A and H, the current value of each of the imaging lenses 5 to 9 can be obtained by performing the following interpolation calculation.

但し、CI=結像レンズの電流値 i=結像レンズの種類(i=1〜5) である。これによシ、倍率Cに対する結像レンズ5〜9
の電流値が求められ、この電流値を結像レンズ5〜9に
流すことによって倍率Cの拡大像を得ることができる。
However, CI=current value of the imaging lens i=type of the imaging lens (i=1 to 5). Accordingly, the imaging lenses 5 to 9 for the magnification C are
The current value is determined, and by passing this current value through the imaging lenses 5 to 9, an enlarged image with a magnification of C can be obtained.

なお、第1式は簡単な一次補間式であるが、複雑な補間
式を用いればさらに倍率の制御精度を上げることができ
る。
Note that although the first equation is a simple linear interpolation equation, the control accuracy of the magnification can be further improved by using a complicated interpolation equation.

〔発明の効果〕〔Effect of the invention〕

以上の説明から明らかなように本発明によれば、任意の
倍率を設定することができるので、連続的な倍率可変が
可能となる。さらに倍率ごとに記憶しなければならない
電子レンズの電流値を補間演算処理によって算出できる
ので、予め設定する倍率の数が少なくて済み、メモリの
記憶容量を少なくできるという効果がある。
As is clear from the above description, according to the present invention, it is possible to set an arbitrary magnification, and thus it is possible to continuously change the magnification. Furthermore, since the current value of the electronic lens, which must be stored for each magnification, can be calculated by interpolation calculation processing, the number of magnifications to be set in advance can be reduced, and the storage capacity of the memory can be reduced.

すなわち、小容量のメモリ構成で多くの倍率を選択設定
することができるという効果がある。
That is, there is an effect that many magnifications can be selected and set with a small memory configuration.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示す構成図、第2図の(a
)、(b)は実施例の基本原理を説明するための電子レ
ンズ電流値と倍率との関係を示す図である。
FIG. 1 is a configuration diagram showing an embodiment of the present invention, and FIG.
) and (b) are diagrams showing the relationship between the electron lens current value and the magnification for explaining the basic principle of the embodiment.

Claims (1)

【特許請求の範囲】[Claims] 1、選択可能な複数の倍率にそれぞれ対応した電子レン
ズの電流値を記憶したメモリ手段と、このメモリ手段に
記憶された電子レンズ電流値のうち選択された倍率に対
応する電子レンズ電流値を読出して電子レンズ電流を制
御する制御手段とを備えた透過形電子顕微鏡において、
隣り合う倍率における電子レンズ電流値を補間演算し、
隣り合う倍率の間における任意の倍率の電子レンズ電流
を算出する補間演算手段を設け、この補間演算手段の演
算結果により電子レンズの電流値を制御するように構成
して成る透過形電子顕微鏡。
1. A memory means storing electron lens current values corresponding to a plurality of selectable magnifications, and reading out an electron lens current value corresponding to the selected magnification from among the electron lens current values stored in the memory means. In a transmission electron microscope equipped with a control means for controlling an electron lens current,
Interpolate the electron lens current values at adjacent magnifications,
A transmission electron microscope comprising an interpolation calculation means for calculating an electron lens current at an arbitrary magnification between adjacent magnifications, and configured to control a current value of the electron lens based on the calculation result of the interpolation calculation means.
JP15306384A 1984-07-25 1984-07-25 Transmission-type electron microscope Pending JPS6132948A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP15306384A JPS6132948A (en) 1984-07-25 1984-07-25 Transmission-type electron microscope

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP15306384A JPS6132948A (en) 1984-07-25 1984-07-25 Transmission-type electron microscope

Publications (1)

Publication Number Publication Date
JPS6132948A true JPS6132948A (en) 1986-02-15

Family

ID=15554170

Family Applications (1)

Application Number Title Priority Date Filing Date
JP15306384A Pending JPS6132948A (en) 1984-07-25 1984-07-25 Transmission-type electron microscope

Country Status (1)

Country Link
JP (1) JPS6132948A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63193446A (en) * 1987-02-06 1988-08-10 Hitachi Ltd Electron beam controller in transmission type electron microscope
JPS63200450A (en) * 1987-02-17 1988-08-18 Nippon Telegr & Teleph Corp <Ntt> Automatic control device of electron beam
JPS63231856A (en) * 1987-03-19 1988-09-27 Jeol Ltd Control method for electron microscope or the like
JP2007026885A (en) * 2005-07-15 2007-02-01 Keyence Corp Magnification observation device, operation method of magnification observation device, magnification observation device operation program, recording medium readable by computer, and recorded equipment

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS495663A (en) * 1972-05-02 1974-01-18
JPS5117638A (en) * 1974-08-02 1976-02-12 Nippon Bunko Kogyo Kk KANSUHATSUSEIKI

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS495663A (en) * 1972-05-02 1974-01-18
JPS5117638A (en) * 1974-08-02 1976-02-12 Nippon Bunko Kogyo Kk KANSUHATSUSEIKI

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63193446A (en) * 1987-02-06 1988-08-10 Hitachi Ltd Electron beam controller in transmission type electron microscope
JPS63200450A (en) * 1987-02-17 1988-08-18 Nippon Telegr & Teleph Corp <Ntt> Automatic control device of electron beam
JPS63231856A (en) * 1987-03-19 1988-09-27 Jeol Ltd Control method for electron microscope or the like
JP2007026885A (en) * 2005-07-15 2007-02-01 Keyence Corp Magnification observation device, operation method of magnification observation device, magnification observation device operation program, recording medium readable by computer, and recorded equipment

Similar Documents

Publication Publication Date Title
CN106982328B (en) Dual-core focusing image sensor, focusing control method thereof and imaging device
DE102007059597A1 (en) An apparatus and method for detecting a component signal with high accuracy
US10893187B2 (en) Dual-core focusing image sensor, control-focusing method therefor, and mobile terminal
JP4617239B2 (en) Image conversion circuit
KR850001970B1 (en) Method for formating a balftone plate
JPH02108375A (en) Method and apparatus for correcting dispersion emission effect in x-ray image
JPS6132948A (en) Transmission-type electron microscope
JP3830304B2 (en) Interpolation method and apparatus
JPH1023442A (en) Signal acquiring method for electronic device using interpolation between values of interpolating points
JPH0654639B2 (en) Electron beam controller for transmission electron microscope
US6208766B1 (en) Process for influencing the quality images furnished by an electronic imaging system
CN113989114A (en) Image reduction processing method and device
JPH03117964A (en) Scanning exposing device
JP4363880B2 (en) Nonlinear processing circuit
JPS61120581A (en) Picture signal processor
US5742852A (en) Photometry system
JP2016220016A (en) Image processing apparatus, imaging apparatus, image processing method, and program
KR20050011241A (en) Noise diminishing apparatus and a method thereof
JP2661739B2 (en) Electron beam exposure method
JP2531610B2 (en) X-ray diagnostic device
JP3706006B2 (en) Imaging apparatus and imaging method
JPH0991414A (en) Image processing unit
JP2004140002A (en) Charged particle beam device
JP2676832B2 (en) Bezier curve approximation circuit
JPH08292764A (en) Signal changeover device