JPS61288186A - Scintillator - Google Patents

Scintillator

Info

Publication number
JPS61288186A
JPS61288186A JP12967385A JP12967385A JPS61288186A JP S61288186 A JPS61288186 A JP S61288186A JP 12967385 A JP12967385 A JP 12967385A JP 12967385 A JP12967385 A JP 12967385A JP S61288186 A JPS61288186 A JP S61288186A
Authority
JP
Japan
Prior art keywords
sample
scintillator
image pickup
transmission
scintillation light
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP12967385A
Other languages
Japanese (ja)
Inventor
Shinji Osuga
慎二 大須賀
Hideji Fujiwake
秀司 藤分
Akira Matsumoto
亮 松本
Shoji Okada
昌二 岡田
Masao Miwa
三輪 匡男
Masakatsu Tezuka
雅勝 手塚
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hamamatsu Photonics KK
Original Assignee
Hamamatsu Photonics KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hamamatsu Photonics KK filed Critical Hamamatsu Photonics KK
Priority to JP12967385A priority Critical patent/JPS61288186A/en
Publication of JPS61288186A publication Critical patent/JPS61288186A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To eliminate the influence of the re-reflection, etc. of the scintillation light released to a sample side from a sample surface by forming layer which allows the transmission of radiation from the sample and prohibits the transmission of the light from the sample on the sample side surface. CONSTITUTION:The scintillation light is subjected to image pickup by an image pickup tube 4 of an image pickup device via an image pickup optical system 3 disposed on the opposite side of the sample 2. A metallic layer 1a consisting of aluminum, etc. is deposited by evaporation on one surface of the scintillator 1 to the thickness of the extent at which no influence is exerted to the transmission of the radiation. The scintillation light released to the sample 2 side is reflected uniformly by the surface of the layer 1a on the scintillator side and is returned to the image pickup side without arriving at the sample surface. The scintillation light released toward the optical system 3 side is imaged on a photoelectric surface 4a of the tube 4 by the optical system 3 by which the image is picked up. An image processing technique for uniformly removing the components below the specified level is applied to the image formed in the above-mentioned manner by which the video having the excellent resolution is obtd.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は、放射性物質の定量的な撮像を行うオートラジ
オグラフィの分野等において利用できるシンチレータに
関する。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a scintillator that can be used in the field of autoradiography, etc., which performs quantitative imaging of radioactive substances.

(従来の技術) 従来のオートラジオグラフィの分野で利用されているシ
ンチレータとその使用例等について簡単に説明する。
(Prior Art) A scintillator used in the field of conventional autoradiography and examples of its use will be briefly described.

オートラジオグラフィの分野の観察の対象として■放射
性同位元素RIを含む組織切片、■TLC(Thin 
Layer Chromatograph)プレート、
■放射性同位元素RIを含むゲル等がある。
As objects of observation in the field of autoradiography, ■tissue sections containing the radioisotope RI, ■TLC (Thin
layer chromatography) plate,
■There are gels that contain the radioactive isotope RI.

またシンチレータとしては、液体シンチレータ、例えば
シフエルオキサゾール−2メチルナフタレン(= P 
P O−2methyl naphtahlene)や
、固体シンチレータ、例えばプラスチックシンチレータ
がある。
In addition, as a scintillator, a liquid scintillator, for example, schiferoxazole-2methylnaphthalene (=P
There are solid scintillators, such as plastic scintillators.

液体シンチレータは試料に塗布され、固体シンチレータ
は試料に密着させて使用される。
A liquid scintillator is applied to the sample, and a solid scintillator is used in close contact with the sample.

第2図は試料20に固体シンチレータ10を配置した例
を示す略図である。
FIG. 2 is a schematic diagram showing an example in which a solid scintillator 10 is arranged on a sample 20.

(発明が解決しようとする問題点) 第2図に示すようにシンチレータ10を直接試料20の
表面に密着して配置すると試料20からのβ線によりシ
ンチレータ10内でシンチレーションが起こり光子が放
出される。
(Problem to be Solved by the Invention) When the scintillator 10 is placed directly in close contact with the surface of the sample 20 as shown in FIG. 2, scintillation occurs within the scintillator 10 due to β rays from the sample 20, and photons are emitted. .

試料20側に放出されたシンチレーション光は試料20
面に到達する。
The scintillation light emitted to the sample 20 side
reach the surface.

そして試料20表面の状態により、吸収されたり、反射
散乱させられる。
Depending on the condition of the surface of the sample 20, the light may be absorbed or reflected and scattered.

試料の表面の状態は一様ではなく、試料の表面の色等の
影響を受ける。
The condition of the surface of the sample is not uniform and is affected by the color of the sample surface.

第2図左側(1)に示すように試料の表面が光子を吸収
するような色(状態)であれば、試料側に放出された光
子は試料20の2O2部で吸収され、その光子は観察の
対象にはならない。
If the surface of the sample has a color (state) that absorbs photons, as shown in (1) on the left side of Figure 2, the photons emitted to the sample side will be absorbed by the 2O2 part of the sample 20, and the photons will be observed. is not subject to.

しかし、右側(n)に示すように、試料20の表面20
b部で局部的に反射されたシンチレーション光は、図示
しないカメラ側に反射され、観察側に放出されたシンチ
レーション光に混入されて観察される。
However, as shown on the right (n), the surface 20 of the sample 20
The scintillation light locally reflected at part b is reflected to the camera side (not shown) and is observed while being mixed with the scintillation light emitted to the observation side.

そのために試料中の放射性同位元素R1以外の試料の状
態も撮像されることになり、放射性同位元素の定量の精
度を損なうという問題がある。
Therefore, the state of the sample other than the radioisotope R1 in the sample is also imaged, which poses a problem of impairing the accuracy of quantifying the radioisotope.

本発明の目的は、試料の表面の状態の影響を受けにクク
シて、試料からの放射線に原因するシンチレーション光
のみを取り出すことができるシンチレータを提供するこ
とにある。
An object of the present invention is to provide a scintillator that can extract only scintillation light caused by radiation from a sample, regardless of the influence of the surface condition of the sample.

(問題を解決するための手段) 前記問題を解決するために本発明によるシンチレータは
、試料中の放射性物質の空間的分布を計測する板状のシ
ンチレータにおいて、前記シンチレータの試料側の面に
試料からの放射線の透過を許容し試料からの光の透過を
妨げる層を形成して構成されている。
(Means for Solving the Problem) In order to solve the above problem, the scintillator according to the present invention is a plate-shaped scintillator for measuring the spatial distribution of radioactive substances in a sample, and a scintillator is provided on the surface of the scintillator on the sample side from the sample. It is constructed by forming a layer that allows the transmission of radiation from the sample and blocks the transmission of light from the sample.

(実施例) 以下図面等を参照して本発明をさらに詳しく説明する。(Example) The present invention will be described in more detail below with reference to the drawings and the like.

第1図は本発明によるシンチレータの実施例とその使用
状態を説明するための断面図である。
FIG. 1 is a cross-sectional view for explaining an embodiment of the scintillator according to the present invention and its usage condition.

この実施例によるシンチレータ1は、従来の固体シンチ
レータ10と同様に試料2に密接または近接して使用さ
れる。
The scintillator 1 according to this embodiment is used closely or close to the sample 2 in the same way as the conventional solid scintillator 10.

シンチレーション光は試料2の反対側に配置されている
撮像光学系3を介して撮像装置の撮像管4により、撮像
される。
The scintillation light is imaged by an imaging tube 4 of an imaging device via an imaging optical system 3 disposed on the opposite side of the sample 2.

シンチレータ側として、ポリスチレン97%、p−ター
フェニル2.5%、テトラフェニルブタジェン09.0
3%の固溶体を厚さ1mm程度の板状にしたものを用い
る。
On the scintillator side: 97% polystyrene, 2.5% p-terphenyl, 09.0% tetraphenylbutadiene
A plate made of a 3% solid solution with a thickness of about 1 mm is used.

このシンチレータ1の1面に、放射線の透過に影響を与
えない程度の厚さにアルミニウム等の金属I′W1aを
蒸着する。金属層1aの厚さは数100μg / c 
m 2程度とする。
A metal I'W1a such as aluminum is deposited on one surface of the scintillator 1 to a thickness that does not affect the transmission of radiation. The thickness of the metal layer 1a is several hundred μg/c
It should be about m2.

この実施例では、試料2としてRI標識化合物を含む溶
液をTLCプレートの一端に滴下し、これを展開した物
を用いる。
In this example, a sample 2 is used in which a solution containing an RI labeled compound is dropped onto one end of a TLC plate and developed.

試料2側に放出されたシンチレーション光は、この層1
aのシンチレータ側の面で一様に反射され、撮像側に戻
され、試料面に達っしない。
The scintillation light emitted to the sample 2 side is transmitted through this layer 1.
It is uniformly reflected by the scintillator side surface of a, returns to the imaging side, and does not reach the sample surface.

撮像光学系3の方に放出されたシンチレーション光は撮
像光学系3により撮像管4の光電面4aに結像され撮像
される。
The scintillation light emitted toward the imaging optical system 3 is imaged by the imaging optical system 3 on the photocathode 4a of the imaging tube 4, and is imaged.

このようにして撮像された画像に対して一定レベル以下
の成分を均一に除去するなどの画像処理技術を適用する
ことにより、解像の優れた映像を得ることができる。
By applying image processing techniques such as uniformly removing components below a certain level to images captured in this manner, it is possible to obtain images with excellent resolution.

(発明の効果) 以上詳しく説明したように、本発明によるシンチレータ
は、試料中の放射性物質の空間的分布を計測する板状の
シンチレータにおいて、前記シンチレータの試料側の面
に試料からの放射線の透過を許容し試料からの光の透過
を妨げる層を形成しである。
(Effects of the Invention) As explained in detail above, the scintillator according to the present invention is a plate-shaped scintillator for measuring the spatial distribution of radioactive substances in a sample, in which radiation from the sample passes through the surface of the scintillator on the sample side. A layer is formed that allows light to pass through the sample and blocks the transmission of light from the sample.

したがって、試料側に放出されたシンチレーション光の
試料表面からの再反射等の影響を完全に除去することが
できる。
Therefore, effects such as re-reflection of scintillation light emitted to the sample side from the sample surface can be completely eliminated.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明によるシンチレータおよびその使用状態
を示す断面図である。 第2図は従来のシンチレータのとその使用状態を示す断
面図である。 1・・・シンチレータ 1a・・・放射線の透過を許容し試料からの光の透過を
妨げる層 1b・・・シンチレータ本体 2・・・試料 3・・・撮像光学系 4・・・撮像装置の撮像管 特許出願人  浜松ホトニクス株式会社代理人  弁理
士 井 ノ ロ   壽才1図
FIG. 1 is a sectional view showing a scintillator according to the present invention and its usage state. FIG. 2 is a cross-sectional view of a conventional scintillator and how it is used. 1...Scintillator 1a...Layer 1b that allows the transmission of radiation and blocks the transmission of light from the sample...Scintillator body 2...Sample 3...Imaging optical system 4...Imaging by the imaging device Administrative Patent Applicant: Hamamatsu Photonics Co., Ltd. Agent: Patent Attorney: Inoro Jusai Figure 1

Claims (2)

【特許請求の範囲】[Claims] (1)試料中の放射性物質の空間的分布を計測する板状
のシンチレータにおいて、前記シンチレータの試料側の
面に試料からの放射線の透過を許容し試料からの光の透
過を妨げる層を形成して構成したことを特徴とするシン
チレータ。
(1) In a plate-shaped scintillator that measures the spatial distribution of radioactive substances in a sample, a layer is formed on the surface of the scintillator on the sample side to allow radiation from the sample to pass through and to prevent light from passing through the sample. A scintillator characterized by comprising:
(2)前記試料からの放射線の透過を許容し試料からの
光の透過を妨げる層は、金属の蒸着層で形成され試料に
対面する面が光反射面である特許請求の範囲第1項記載
のシンチレータ。
(2) Claim 1, wherein the layer that allows the transmission of radiation from the sample and prevents the transmission of light from the sample is formed of a vapor-deposited metal layer, and the surface facing the sample is a light-reflecting surface. scintillator.
JP12967385A 1985-06-14 1985-06-14 Scintillator Pending JPS61288186A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP12967385A JPS61288186A (en) 1985-06-14 1985-06-14 Scintillator

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP12967385A JPS61288186A (en) 1985-06-14 1985-06-14 Scintillator

Publications (1)

Publication Number Publication Date
JPS61288186A true JPS61288186A (en) 1986-12-18

Family

ID=15015329

Family Applications (1)

Application Number Title Priority Date Filing Date
JP12967385A Pending JPS61288186A (en) 1985-06-14 1985-06-14 Scintillator

Country Status (1)

Country Link
JP (1) JPS61288186A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011149731A (en) * 2010-01-19 2011-08-04 Toshiba Corp Manufacturing method of plastic scintillator member and radiation detector

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51137477A (en) * 1975-05-23 1976-11-27 Hitachi Medical Corp Scintillator for gamma-ray camera
JPS52131485A (en) * 1976-04-28 1977-11-04 Nippon Toki Kk Element for measuring quantity of radiation
JPS55116286A (en) * 1979-03-02 1980-09-06 Aloka Co Ltd Radiant ray detector
JPS5888685A (en) * 1981-11-24 1983-05-26 Hitachi Chem Co Ltd Radiation detector
JPS59122988A (en) * 1982-12-29 1984-07-16 Shimadzu Corp Radiation measuring element
JPS59150358A (en) * 1983-02-16 1984-08-28 Canon Inc Radiation detector
JPS59222785A (en) * 1983-05-24 1984-12-14 シ−メンス・アクチエンゲゼルシヤフト Optical pipeline for scintillator crystalline aggregate of radiation detector, manufacture thereof and radiation detector

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS51137477A (en) * 1975-05-23 1976-11-27 Hitachi Medical Corp Scintillator for gamma-ray camera
JPS52131485A (en) * 1976-04-28 1977-11-04 Nippon Toki Kk Element for measuring quantity of radiation
JPS55116286A (en) * 1979-03-02 1980-09-06 Aloka Co Ltd Radiant ray detector
JPS5888685A (en) * 1981-11-24 1983-05-26 Hitachi Chem Co Ltd Radiation detector
JPS59122988A (en) * 1982-12-29 1984-07-16 Shimadzu Corp Radiation measuring element
JPS59150358A (en) * 1983-02-16 1984-08-28 Canon Inc Radiation detector
JPS59222785A (en) * 1983-05-24 1984-12-14 シ−メンス・アクチエンゲゼルシヤフト Optical pipeline for scintillator crystalline aggregate of radiation detector, manufacture thereof and radiation detector

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011149731A (en) * 2010-01-19 2011-08-04 Toshiba Corp Manufacturing method of plastic scintillator member and radiation detector

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