JPS61208140A - Diagnostic control system - Google Patents

Abstract

PURPOSE:To allow blocks except a block where an error occurs to keep on operating by limiting serial scanning operation in one adapter only to the error occurrence part. CONSTITUTION:The adapter 4 is divided into plural function blocks 20-22 and a control circuit 23 supplies a select signal and a shift clock to the necessary function blocks 20-22 on the basis of the signal 43 of a chain select group 1 from a monitoring device 2 or the signal 44 of a chain select group 2 generated from the error detection signal 46 of the function block, thereby scanning the respective blocks individually. Then, one of the group signals 43 and 44 for generating the select signal 45, i.e., signal 43 is selected in initialization and the signal 44 is selected in operation. The group signal 44 is generated by error display flip-flops 31-33 which is set in response to errors of the function blocks 20-22.

Description

[Detailed Description of the Invention] [Summary] The present invention provides a data processing device having a serial scan-in/out function, in which a serial scan operation is performed for each functional block in order to limit the target to the functional block in which an error has occurred and perform diagnosis. A circuit is added to separate the scan chains.

[Industrial application field]

The present invention relates to a diagnostic control system, and in particular, a central processing unit,
The central processing section includes a plurality of adapter sections controlled by the central processing section, and a monitoring device for diagnosing the central processing section and each adapter section.
The present invention relates to a diagnostic control method for a data processing device including a flip-flop capable of serial scan-in/out.

[Conventional technology]

A serial scan chain method is often used as one of the diagnostic methods for data processing devices.

This creates a diagnostic route that serially connects each flip-flop in the device, configures each flip-flop as a shift register during diagnosis, and sends diagnostic data to each flip-flop in this shift register configuration. It is an attempt to explore the location.

Conventionally, in a data processing device having a central processing section and a plurality of adapter sections controlled by the central processing section, diagnostic operations were performed using the circuits of the plurality of adapter sections as one scan chain unit. .

[Problem that the invention seeks to solve]

As mentioned above, conventionally, when an error occurs, the entire circuit of each adapter section is scanned in and out as one scan chain, so the processing time is increased because the adapter sections not related to the error are also shifted. It was a problem.

In addition, even if one adapter includes multiple independent functions and the system can operate even if an error occurs in some of the functions, all functions will be stopped for diagnosis and scan operation will be performed. There was a drawback that it had to be done.

[Means for solving problems]

It includes an adapter section (4, 5), a monitoring device (2) for diagnosing the central processing section (1) and each adapter section (4, 5), (4,5
) The circuit to be diagnosed is divided into functional block units (20 to 22) in a data processing device configured to include scan flip-flops capable of serial scan-in/out. Each functional block unit (20 to 22) has a scan chain (25 to 2
7) and sent from the monitoring device (2), scan chains (25 to 27) within the functional block units (20 to 22).
The function block unit (20 to 22) in which the error has been detected using the external designated selection signal (43) for selecting the function block unit (43) and the error detection signal (46) generated for each function block unit (20 to 22) ) in the scan chain (25
The present invention is characterized by being provided with a circuit (23) for selecting a scan chain (25-27) to perform a serial scan operation based on a self-specified selection signal (44) for selecting a serial scan operation (25-27). do.

[For production]

In order to facilitate diagnosis when an error occurs, the present invention divides the serial scan flip-flops in the adapter into multiple groups (chains), automatically detects errors from the error detection signal of each group, and thereby In diagnosing when an error occurs, it is possible to shorten the time required for diagnosis and to minimize the influence on system operation during diagnosis.

〔Example〕

FIG. 2 shows an example of the configuration of a system to which the present invention is applicable, and specifically shows an example of the configuration of a communication control processing device.

Yanel adapter, 6 is a line support section, 7 is a control section, 8 is a scan control section, 9 is a bus control section, 1O and 11 are line control sections #Q, #1.12 are bus control sections, 13 and 14 are channels Control units #O, #1.15 are common buses, and 16 is a serial scan interface.

FIG. 1 is a circuit block diagram of one embodiment of the adapter 4.5 shown in FIG.

In FIG. 1, 20-22 are circuit blocks 1-n, 2
3 is a control circuit, 24 is an encode circuit, 25-27 are scan chains, 28-30 are chain identification flip-flops, 31-33 are error display flip-flops, 3
4 to 37 are multiplexers (MPX), 38 is a scan-in data signal (line), 39 is a scan-out data signal (line), 40 is a scan mode signal (line), 41 is a shift clock signal (line), 42 is a group Select signal (line), 43 is chain select group 1 signal (line)
, 44 is chain select group 2 signal (line), 45
are each block select signal (line) and a shift clock signal for scanning (line), and 46 is an error detection signal (line) from each block.

When Fig. 1 and Fig. 2 are made to correspond, each block numbered 10.11, 12.13.14, etc. in Fig. 2 corresponds to each functional block (1 to n) 20 to 22 in Fig. 1. .

As shown in FIG. 1, in the present invention, each adapter 4
(5) Divide the inside into a plurality of functional blocks 20 to 22, and chain select group 1 from the monitoring device 2.
Based on the chain select group 2 signal 44 generated from the signal 43 or the error detection signal 46 of each functional block 20-22, the control circuit 23 is configured to supply the select signal and shift clock to the required functional blocks 20-22. ing. This allows the scanning operation of each of the functional blocks 20 to 22 to be performed individually.

Group 1 signal 43 for producing select signal 45
The group select signal 42 determines which of the and group 2 signals 44 to use.When initializing the adapter 4 (5), the group 1 signal 43 is used, and when the system is operating, the group 2 signal 44 is used. Let it be used.

The group signal 44 is an error display flip-flop 3 that is set by an error in each of the functional blocks 20 to 22.
1 to 33 (non-scanning flip-flops). Error display flip-flop 31-3
The reason why 3 is a non-scan flip-flop is to prevent the output of the flip-flop from changing due to the scan operation.Furthermore, after the diagnosis is completed by the scan operation, if the error cause is reset and the scan mode is canceled, these flip-flops are The logical configuration is such that the pool is automatically reset. Note that the scan-in data signal 3
8 and the selection logic of the scan-out data signal 39 (control logic of each multiplexer 34 to 36, etc.) are also controlled by the control circuit 2.
Created in 3.

By doing this, when an error occurs during system operation, the function blocks 20 to 22 in which the error occurred will be
is automatically selected by the chain identification flip-flop 28
.about.30 can be scanned out, the monitoring device 2 can recognize and easily determine which functional blocks 20 to 22 are in error.

Next, a specific example of operation will be explained.

(2) At the time of initialization operation, the multiplexer 37 is controlled by the signal 42, and the chain select group 1 signal is inputted to the control circuit 23, and is also applied to the scan mode signal 40 and the signal 38.

The control circuit 23 receives the chain select group 1 signal 43
For example, when it is identified that the function block (2121) has been specified, the function block (2121) is specified by the signal line 45.
A scan mode signal and a shift related clock signal are sent to 2121. Furthermore, the control circuit 23
By controlling the multiplexers 34 and 36, the initialization data on the scan-in data signal line 38 is transferred to the function block (2).
21. At the beginning of the initialization data, there is unique chain identification data for identifying the functional block (2121), and this data is sequentially set to the chain identification flip-flop 29 via a flip-flop (not shown). , a shift clock is supplied.Other flip-flops (not shown) constituting the scan chain are set to predetermined values.In this way, the initialization operation is sequentially performed for each functional block. Ru.

Note that in addition to information for individually specifying each functional block, information for specifying all functional blocks at once can also be placed on the chain select group 1 signal line 43. In this case, the same operation as in the conventional example is performed.

■ During system operation For example, if an error occurs in the functional block (2121) and the error display flip-flop 32 is set, the error occurrence is transmitted to the monitoring device 2 via a path not shown.In response, the monitoring device 2 , scan mode signal 4
0 and a shift clock signal 41 to the control circuit 23.

On the other hand, during the error system operation from each of the functional blocks 20 to 22, the chain select group 2 signal, which is the output of the encode circuit 24, is selected by the multiplexer 37 under the control of the group select signal 42.

When the control circuit 23 receives the chain select group 2 signal, it decodes it and sends an order scan mode signal and a shift clock signal to the functional block (2) 21 via the signal line 45. Furthermore, the control circuit 23 is sent out from the functional block (2) 21. ! Multiplexer 36 is controlled so that serial scan-out data is output onto scan-out data signal line 39. As a result, the monitoring device 2 detects the function block (2) in which the error occurred.
21, it becomes possible to automatically read scanout data including chain identification data.

Note that if an error occurs in multiple functional blocks 20 to 22 at the same time, the control circuit 23 decodes the chain select group 2 signal and selects the functional blocks 20 to 22 according to a preset priority order. Select one by one.

〔Effect of the invention〕

According to the present invention, by limiting the serial scan operation within one adapter to only the part where the error occurs, it is possible to shorten the time required for the serial scan operation, and at the same time, it is possible to continue the operation of blocks other than the block where the error has occurred. System reliability will be improved.

[Brief explanation of drawings]

FIG. 1 is a circuit block diagram of one embodiment according to the present invention, and FIG.
The figure shows an example of the configuration of a system to which the present invention is applied. In FIG. 1, 20 to 22 are functional blocks 1 to n, 2.
3 is a control circuit, 24 is an encode circuit, 25-27 are scan chains, 28-30 are chain identification flip-flops, 31-33 are error display flip-flops, 3
4 to 37 are multiplexers (MPX), 38 is a scan-in data signal (line), 39 is a scan-out data signal (line), 40 is a scan mode signal (line), 41 is a shift clock signal (line), 42 is a group A select signal (line), 43 is a chain select group 1 signal (line), 44 is a chain select group 2 signal, and 6 is an error detection signal (line) from each block. Non-invention 1: Circuit diagram of 1 embodiment according to Figure 1 Concave

Claims (2)

[Claims] (1) A central processing unit (1), a plurality of adapter units (4, 5) controlled by the central processing unit (1), and the central processing unit (1) and each adapter unit (4, 5). The circuit to be diagnosed in the central processing unit (1) and each adapter unit (4, 5) includes a scan flip-flop capable of serial scan-in/out. In the data processing device, the circuit to be diagnosed is divided into functional block units (20 to 22), and the divided functional block units (20 to 22) are divided into functional block units (20 to 22).
Chain identification flip-flops (28
A scan chain (25 to 27) capable of independently performing serial scan operation is provided, and the scan chain (25 to 27) in the functional block unit (20 to 22) is provided, and the scan chain (25 to 27) in the functional block units (20 to 22) is 27)
The function block unit (20 to 22) in which the error has been detected using the external designated selection signal (43) for selecting the function block unit (43) and the error detection signal (46) generated for each function block unit (20 to 22) ) in the scan chain (25
The present invention is characterized by being provided with a circuit (23) for selecting a scan chain (25-27) to perform a serial scan operation based on a self-specified selection signal (44) for selecting a serial scan operation (25-27). Diagnostic control method. (2) In the initial state, the external designation selection signal (4
3), each functional block unit (20 to 22) is initialized, and during system operation, when an error occurs, the chain is automatically determined by the self-specified selection signal (44), thereby controlling the monitoring device (2). reads the chain identification flip-flops (28 to 30) using a serial scan operation, and identifies the unit of the above function block where the error occurred (
20 to 22) and performs diagnosis in corresponding functional block units (20 to 22).