JPS61207964A - Object inspecting device by reflected sound wave - Google Patents

Object inspecting device by reflected sound wave

Info

Publication number
JPS61207964A
JPS61207964A JP60047370A JP4737085A JPS61207964A JP S61207964 A JPS61207964 A JP S61207964A JP 60047370 A JP60047370 A JP 60047370A JP 4737085 A JP4737085 A JP 4737085A JP S61207964 A JPS61207964 A JP S61207964A
Authority
JP
Japan
Prior art keywords
frequency
standard pattern
sound wave
reflected
sound waves
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60047370A
Other languages
Japanese (ja)
Inventor
Toshihiro Kimura
俊宏 木村
Takao Watanabe
渡辺 孝男
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi High Tech Corp
Original Assignee
Hitachi Electronics Engineering Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Electronics Engineering Co Ltd filed Critical Hitachi Electronics Engineering Co Ltd
Priority to JP60047370A priority Critical patent/JPS61207964A/en
Publication of JPS61207964A publication Critical patent/JPS61207964A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To execute efficiently and uniformly inspection by providing a comparing and operating means for comparing a spectrum feature data which is derived by an analyzing means, with a standard pattern which has been stored in a storage means, and outputting a data for showing a result of its comparison. CONSTITUTION:A sound wave is reflected at positions of each different depth of the inside of a canned food 13, respectively, in accordance with a difference of frequencies and inputted to a loudspeaker 8, and by an analyzing part 10, its spectrum feature data is derived successively at every sound wave of each frequency. On the other hand, in this case, based on an operation of a frequency selecting part 7, a standard pattern of every frequency is read out successively from a memory 2 and 3 and given to a comparing and operating part 11. In the comparing and operating part 11, the spectrum feature data of every frequency given from the analyzing part 10 and the standard pattern of each frequency of the memory 2 and 3 are compared successively, and a data for showing a result of the comparison is outputted by plural ways at every frequency. In a deciding part 12, weighting, a statistical processing, etc. are performed with regard to these data, and whether a defect exists in the contents of the canned food 13 or not is decided.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、音波を媒体として物体の品質に関する情報
を得るための装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a device for obtaining information regarding the quality of an object using sound waves as a medium.

〔従来の技術〕[Conventional technology]

缶詰の製造段階において、完成した缶詰の中身に異物が
混入していないかどうか、あるいは中身が不足していな
いかどうか等の中身に関する品質検査を行なう場合には
、外観による検査は不可能なため、従来熟練作業者が缶
詰を手に持って揺ったり棒でたたいて音を聴いたりして
経験的な勘に頼って検査を行なっていた。
At the manufacturing stage of canned goods, when performing quality inspections on the contents of finished cans, such as whether there are any foreign substances mixed in or whether there are any shortages of contents, it is impossible to perform inspections based on appearance. In the past, skilled workers carried out inspections by holding cans in their hands and shaking them or hitting them with a stick to listen to the sound, relying on their empirical intuition.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

しかし、このような検査の仕方は非能率的であるばかり
でなく、作業者の相違に応じて検査結果にある程度の個
人差が生じることを避けることができないという問題が
あった。
However, such an inspection method is not only inefficient, but also has the problem that it is impossible to avoid a certain degree of individual variation in inspection results depending on the operator.

この発明は上述の点に鑑みてなされたもので、効率的且
つ均一的な検査を行なうことができるようにした検査装
置を提供しようとするものである。
The present invention has been made in view of the above-mentioned points, and it is an object of the present invention to provide an inspection apparatus that can perform efficient and uniform inspection.

〔問題点を解決するための手段及び作用〕この発明に係
る物体検査装置は、検査対象物に所定の音波を入射させ
る音波発生手段と、前記検査対象物により反射された音
波を受信し、受信した音声信号の波形のスペクトル特徴
データを求める分析手段と、前記検査対象物により反射
された音波のスペクトルの標準パターンを記憶した記憶
手段と、前記分析手段により求められたスペクトル特徴
データと前記記憶手段に記憶された標準パターンとを比
較し、その比較結果を表わすデータを出力する比較演算
手段とを具えたことを特徴としている。
[Means and effects for solving the problem] The object inspection device according to the present invention includes a sound wave generating means for making a predetermined sound wave incident on the object to be inspected, and a means for receiving the sound wave reflected by the object to be inspected. analysis means for obtaining spectral characteristic data of the waveform of the audio signal, storage means for storing a standard pattern of the spectrum of the sound wave reflected by the object to be inspected, and spectral characteristic data obtained by the analysis means and the storage means. The present invention is characterized in that it includes a comparison calculation means for comparing the standard pattern stored in the image forming apparatus and a standard pattern stored in the image forming apparatus, and outputting data representing the comparison result.

所定の音波を成る物体に入射したとき該物体により反射
される音波の波形は、組成、質量、密度等の該物体に関
する種々な要素の相違に応じて変化する。従って、成る
検査対象物が所定の組成、質量、密度等を有する状態に
対応した反射音波のスペクトルの標準パターンを予め記
憶手段に記憶させ、音波発生手段、分析手段を用いて検
査対象物に関して求められたスペクトル特徴データと前
記記憶手段の記憶内容とを比較演算手段により比較すれ
ば、これにより検査対象物の組成、質量、密度等に関す
る情報(すなわち検査対象物の品質に関する情報)を得
ることができる。
When a given sound wave is incident on an object, the waveform of the sound wave reflected by the object changes depending on various factors related to the object, such as composition, mass, density, etc. Therefore, a standard pattern of the spectrum of a reflected sound wave corresponding to a state in which the inspection object has a predetermined composition, mass, density, etc. is stored in advance in the storage means, and the standard pattern of the spectrum of the reflected sound wave corresponding to the state in which the inspection object is found has a predetermined composition, mass, density, etc. By comparing the obtained spectral feature data with the stored content of the storage means by the comparison calculation means, information regarding the composition, mass, density, etc. of the inspection object (i.e., information regarding the quality of the inspection object) can be obtained. can.

尚、検査対象物に所定の欠陥が存在する場合の反射音波
のスペクトルの標準パターン及び該対象物に欠陥が存在
しない場合の反射音波のスペクトルの標準パターンが記
憶手段に記憶されている場合には、求められたスペクト
ル特徴データを欠陥の存在しない場合の標準パターン及
び欠陥の存在する場合の標準パターンの双方と夫々比較
することによっていずれにより類似しているかを判断す
ることができるので、検査対象物の品質に関するより正
確な情報を得ることが可能である。
In addition, if the standard pattern of the spectrum of reflected sound waves when a predetermined defect exists in the object to be inspected and the standard pattern of the spectrum of reflected sound waves when there is no defect in the object to be inspected are stored in the storage means. By comparing the obtained spectral feature data with both the standard pattern with no defects and the standard pattern with defects, it is possible to determine which one is more similar. It is possible to obtain more accurate information regarding the quality of

〔実施例〕〔Example〕

以下、添付図面を参照しながらこの発明の一実施例を詳
細に説明する。
Hereinafter, one embodiment of the present invention will be described in detail with reference to the accompanying drawings.

検査装置1は、完成した缶詰13の中身に関する品質検
査を行なうものである。検査装置1において、良品メモ
リ2には、缶詰16の中身に欠陥がない場合(すなわち
中身の組成及び量が規格通りである場合)における反射
音波スペクトルの標準パターンが、入射した音波の周波
数の相違に対応して複数通り予め記憶されている。また
欠陥品メモリ乙には、缶詰16の中身に欠陥がある場合
(すなわち中身に異物が混入しあるいは中身が不足して
いる場合)における反射音波スペクトルの標準パターン
がメモリ2と同様に入射した音波の周波数の相違に対応
して複数通り予め記憶されている。
The inspection device 1 performs a quality inspection on the contents of the completed canned goods 13. In the inspection device 1, the non-defective memory 2 indicates that the standard pattern of the reflected sound wave spectrum when there is no defect in the contents of the can 16 (that is, when the composition and amount of the contents are in accordance with the specifications) is the difference in the frequency of the incident sound wave. A plurality of patterns are stored in advance in correspondence with the above. In addition, in defective memory B, the standard pattern of the reflected sound wave spectrum when there is a defect in the contents of the can 16 (that is, when the contents are contaminated with foreign matter or the contents are insufficient) is the same as in memory 2. A plurality of patterns are stored in advance in correspondence with the difference in frequency.

発信器4は所定の周波数の電気的信号を出力するもので
あり、その周波数は制御入力に与えられる信号に基づき
調節されるようになっている。発信器4の出力信号は増
幅器5を介してスピーカ6に与えられる。スピーカ6か
らはこの出力信号と同一の周波数及び波形を有する音波
が出力され、この音波は、ベルトコンベア14に搬送さ
れて所定の位置Aを通過する1個の缶詰13に入射する
The oscillator 4 outputs an electrical signal of a predetermined frequency, and the frequency is adjusted based on a signal applied to a control input. The output signal of the oscillator 4 is given to a speaker 6 via an amplifier 5. The speaker 6 outputs a sound wave having the same frequency and waveform as this output signal, and this sound wave is conveyed to the belt conveyor 14 and is incident on one can 13 passing a predetermined position A.

メモリ2及び乙のアドレス人力ADDには周波数選択部
7からアドレス指定信号が与えられており、発信器4の
制御入力には、同じく周波数選択部7から周波数制御信
号が与えられている。周波数選択部7は、1個の缶詰が
前記位置Aを通過する時間内にメモリ2及び乙の各記憶
アドレスを順次指定して各周波数毎の標準パターンを順
次全てメモリ2及び6から出力させる役割を果たすと共
に、現在アドレス指定中の標準パターンに対応する周波
数と同一の周波数の信号を発振器4が出力するように発
振器4の周波数を順次調節する役割を果たす。
An address designation signal is given from the frequency selection section 7 to the memory 2 and the address manual input ADD, and a frequency control signal is also given from the frequency selection section 7 to the control input of the oscillator 4. The frequency selection unit 7 has the role of sequentially specifying each storage address of the memory 2 and O within the time it takes for one canned food to pass the position A, and sequentially outputs all standard patterns for each frequency from the memories 2 and 6. It also serves to sequentially adjust the frequency of the oscillator 4 so that the oscillator 4 outputs a signal with the same frequency as the frequency corresponding to the standard pattern currently being addressed.

位置Aを通過する缶詰16により反射された音波は、検
査装置1内のマイクロフォン8に入力される。マイクロ
フォン8からはこの音波と同一の周波数及び波形を有す
る電気的信号が出力され、この信号は増幅器9を介して
分析部10に与えられる。
The sound waves reflected by the can 16 passing through position A are input to the microphone 8 in the inspection device 1 . The microphone 8 outputs an electrical signal having the same frequency and waveform as this sound wave, and this signal is given to the analysis section 10 via the amplifier 9.

分析部10は、与えられた信号をディジタル信号に変換
し、該ディジタル信号をスペクトル分析してそのスペク
トル特徴データを求めるためのものである。分析部10
により求められたスペクトル特徴データは、逐次比較演
算部11に与えられる0 比較演算部11は、メモリ2及び6から出力された標準
パターンを逐次入力し、分析部10から与えられたスペ
クトル特徴データと前記標準パターンとを逐次比較して
その比較結果を表わすデータを出力するものである。こ
のデータは、判定部12に与えられる。
The analysis section 10 is for converting a given signal into a digital signal, performing spectrum analysis on the digital signal, and obtaining its spectral characteristic data. Analysis section 10
The spectral feature data obtained by The pattern is successively compared with the standard pattern and data representing the comparison result is output. This data is given to the determination section 12.

判定部12は、比較演算部11により与えられたデータ
に適宜の重み付け、統計的処理等を施すことにより、検
査対象となった前記缶詰16の中身の欠陥の有無につい
て、最終的な判定を行ない、判定結果を示す信号を出力
するものである。
The determination unit 12 performs a final determination as to whether or not there is a defect in the contents of the canned food 16 that is the subject of inspection by subjecting the data provided by the comparison calculation unit 11 to appropriate weighting, statistical processing, etc. , which outputs a signal indicating the determination result.

以上のような構成を有する検査装置1においては、成る
1個の缶詰13がベルトコンベア14に搬送されて位置
Aを通過するとき、周波数選択部7の動作に基づき、夫
々異なる周波数を有する信号が順次発振器4から出力さ
れ、これに応じて夫々異なる周波数を有する音波が順次
スピーカ6から出力されて前記缶詰13の内部に入射す
る。これらの音波は、その周波数の相違に応じて夫々缶
詰16内部の異なる深さの位置において反射されてスピ
ーカ8に入力され、分析部10により各周波数の音波毎
に順次そのスペクトル特徴データが求められる。他方こ
のとき、周波数選択部7の動作に基づき、メモリ2及び
3から各周波数毎の標準パターンが順次読み出されて比
較演算部11に与えられる。これにより比較演算部11
では、分析部10から与えられる各周波数毎のスペクト
ル特徴データとメモリ2及び3の各周波数毎の標準パタ
ーンとが順次(すなわち同一の周波数のもの同士で各周
波数毎に)比較され、その比較結果を表わすデータが各
周波数毎に複数通り出力される。
In the inspection device 1 having the above configuration, when one canned food 13 is conveyed to the belt conveyor 14 and passes through position A, signals having different frequencies are generated based on the operation of the frequency selection section 7. Sound waves are sequentially output from the oscillator 4, and correspondingly, sound waves having different frequencies are sequentially output from the speaker 6 and enter the inside of the can 13. These sound waves are reflected at different depth positions inside the can 16 depending on the difference in their frequencies and are input to the speaker 8, and the analysis section 10 sequentially obtains spectral characteristic data for each sound wave of each frequency. . On the other hand, at this time, based on the operation of the frequency selection section 7, standard patterns for each frequency are sequentially read out from the memories 2 and 3 and provided to the comparison calculation section 11. As a result, the comparison calculation section 11
Then, the spectral feature data for each frequency given from the analysis unit 10 and the standard patterns for each frequency in the memories 2 and 3 are compared sequentially (that is, for each frequency among those of the same frequency), and the comparison result is A plurality of data representing each frequency are output.

判定部12では、これらの複数のデータについて重み付
け、統計的処理等を施し、前記缶詰13の中身の欠陥の
有無についての判定が行なわれる。
The determining section 12 performs weighting, statistical processing, etc. on these plural data, and determines whether or not there is a defect in the contents of the canned food 13.

以下、ベルトコンベア14に搬送されて位置Aを通過す
る個々の缶詰13毎に同様な検査処理が行なわれていく
Thereafter, similar inspection processing is performed for each individual can 13 that is conveyed to the belt conveyor 14 and passes through position A.

〔発明の効果〕〔Effect of the invention〕

以上の通りこの発明に係る物体検査装置によれば、検査
対象物により反射された音波の波形の特徴に基づいて該
検査対象物の品質に関する情報を得るようにしたので、
客観的な検査基準の下で正確な情報を迅速に得ることが
可能である。従って得られた情報を用いることにより、
検査対象物の欠陥の有無を正確かつ効率的に判定するこ
とができ、また検査対象物の品質管理を適確かつ効率的
に行なうこともできる。
As described above, according to the object inspection apparatus according to the present invention, information regarding the quality of the object to be inspected is obtained based on the waveform characteristics of the sound waves reflected by the object to be inspected.
It is possible to quickly obtain accurate information under objective testing standards. Therefore, by using the information obtained,
The presence or absence of defects in the object to be inspected can be determined accurately and efficiently, and the quality of the object to be inspected can also be appropriately and efficiently controlled.

【図面の簡単な説明】[Brief explanation of drawings]

図はこの発明に係る物体検査装置の一実施例を示す。 1・・・検査装置、2・・・良品メモリ、3・・・欠陥
品メモリ、4・・・発信器、5,9・・・増幅器、6・
・・スピーカ、7・・・周波数選択部、8・・・マイク
ロフォン、10・・・分析部、11・・・比較演算部、
12・・・判定部、13・・・缶詰、14・・・ベルト
コンベア。
The figure shows an embodiment of an object inspection device according to the present invention. DESCRIPTION OF SYMBOLS 1... Inspection device, 2... Good memory, 3... Defective memory, 4... Transmitter, 5, 9... Amplifier, 6...
... Speaker, 7 ... Frequency selection section, 8 ... Microphone, 10 ... Analysis section, 11 ... Comparison calculation section,
12... Judgment section, 13... Canned goods, 14... Belt conveyor.

Claims (1)

【特許請求の範囲】 1、検査対象物に所定の音波を入射させる音波発生手段
と、 前記検査対象物により反射された音波を受信し、受信し
た音声信号の波形のスペクトル特徴データを求める分析
手段と、 前記検査対象物により反射された音波のスペクトルの標
準パターンを記憶した記憶手段と、前記分析手段により
求められたスペクトル特徴データと前記記憶手段に記憶
された標準パターンとを比較し、その比較結果を表わす
データを出力する比較演算手段と を具えたことを特徴とする反射音波による物体検査装置
。 2、前記記憶手段は、前記検査対象物に所定の欠陥が存
在する場合の反射音波のスペクトルの標準パターン及び
該対象物に欠陥が存在しない場合の反射音波のスペクト
ルの標準パターンを夫々記憶するものである特許請求の
範囲第1項記載の反射音波による物体検査装置。
[Scope of Claims] 1. Sound wave generation means for injecting predetermined sound waves into the object to be inspected; and analysis means for receiving the sound waves reflected by the object to be inspected and obtaining spectral characteristic data of the waveform of the received audio signal. and a storage means that stores a standard pattern of the spectrum of the sound wave reflected by the inspection object, and compares the spectral feature data obtained by the analysis means with the standard pattern stored in the storage means, and performs the comparison. 1. An object inspection device using reflected sound waves, comprising a comparison calculation means for outputting data representing a result. 2. The storage means stores a standard pattern of the spectrum of reflected sound waves when a predetermined defect exists in the object to be inspected, and a standard pattern of the spectrum of reflected sound waves when there is no defect in the object. An object inspection device using reflected sound waves according to claim 1.
JP60047370A 1985-03-12 1985-03-12 Object inspecting device by reflected sound wave Pending JPS61207964A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP60047370A JPS61207964A (en) 1985-03-12 1985-03-12 Object inspecting device by reflected sound wave

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP60047370A JPS61207964A (en) 1985-03-12 1985-03-12 Object inspecting device by reflected sound wave

Publications (1)

Publication Number Publication Date
JPS61207964A true JPS61207964A (en) 1986-09-16

Family

ID=12773215

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60047370A Pending JPS61207964A (en) 1985-03-12 1985-03-12 Object inspecting device by reflected sound wave

Country Status (1)

Country Link
JP (1) JPS61207964A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63172960A (en) * 1987-01-12 1988-07-16 Meidensha Electric Mfg Co Ltd Inspecting device for ceramic semiconductor substrate
JPH02167465A (en) * 1988-12-21 1990-06-27 Ngk Insulators Ltd Ultrasonic flaw inspecting method
JPH05164748A (en) * 1991-12-13 1993-06-29 Tokyo Electric Power Co Inc:The Discriminating method for propriety of insulator for power transmission line
JPH06117467A (en) * 1992-09-30 1994-04-26 Nissin Kogyo Kk Brake pad abnormality judging method and device therefor
JPH09133658A (en) * 1995-10-27 1997-05-20 Takahiko Otani Ultrasonic flaw detection method
WO2006093232A1 (en) 2005-03-03 2006-09-08 Tokyo Electron Limited Minute structure inspection device, minute structure inspection method, and minute structure inspection program

Cited By (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63172960A (en) * 1987-01-12 1988-07-16 Meidensha Electric Mfg Co Ltd Inspecting device for ceramic semiconductor substrate
JPH02167465A (en) * 1988-12-21 1990-06-27 Ngk Insulators Ltd Ultrasonic flaw inspecting method
JPH05164748A (en) * 1991-12-13 1993-06-29 Tokyo Electric Power Co Inc:The Discriminating method for propriety of insulator for power transmission line
JPH06117467A (en) * 1992-09-30 1994-04-26 Nissin Kogyo Kk Brake pad abnormality judging method and device therefor
JPH09133658A (en) * 1995-10-27 1997-05-20 Takahiko Otani Ultrasonic flaw detection method
WO2006093232A1 (en) 2005-03-03 2006-09-08 Tokyo Electron Limited Minute structure inspection device, minute structure inspection method, and minute structure inspection program
JPWO2006093232A1 (en) * 2005-03-03 2008-08-07 東京エレクトロン株式会社 Microstructure inspection apparatus, microstructure inspection method, and microstructure inspection program
US7726190B2 (en) 2005-03-03 2010-06-01 Tokyo Electron Limited Device, method and program for inspecting microstructure
JP4628419B2 (en) * 2005-03-03 2011-02-09 東京エレクトロン株式会社 Microstructure inspection apparatus, microstructure inspection method, and microstructure inspection program

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