JPS61205009U - - Google Patents
Info
- Publication number
- JPS61205009U JPS61205009U JP7348685U JP7348685U JPS61205009U JP S61205009 U JPS61205009 U JP S61205009U JP 7348685 U JP7348685 U JP 7348685U JP 7348685 U JP7348685 U JP 7348685U JP S61205009 U JPS61205009 U JP S61205009U
- Authority
- JP
- Japan
- Prior art keywords
- linear
- dark area
- optical sensor
- light source
- area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 230000003287 optical effect Effects 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Length Measuring Devices By Optical Means (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985073486U JPH0439523Y2 (pl) | 1985-05-20 | 1985-05-20 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985073486U JPH0439523Y2 (pl) | 1985-05-20 | 1985-05-20 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61205009U true JPS61205009U (pl) | 1986-12-24 |
| JPH0439523Y2 JPH0439523Y2 (pl) | 1992-09-16 |
Family
ID=30612898
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985073486U Expired JPH0439523Y2 (pl) | 1985-05-20 | 1985-05-20 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0439523Y2 (pl) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017072382A (ja) * | 2015-10-05 | 2017-04-13 | 富士通株式会社 | 検査基準光生成装置，検査基準光生成方法，検査装置，検査方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59180315A (ja) * | 1983-03-30 | 1984-10-13 | Fujitsu Ltd | スル−ホ−ル検査法 |
-
1985
- 1985-05-20 JP JP1985073486U patent/JPH0439523Y2/ja not_active Expired
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS59180315A (ja) * | 1983-03-30 | 1984-10-13 | Fujitsu Ltd | スル−ホ−ル検査法 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2017072382A (ja) * | 2015-10-05 | 2017-04-13 | 富士通株式会社 | 検査基準光生成装置，検査基準光生成方法，検査装置，検査方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0439523Y2 (pl) | 1992-09-16 |