JPS61197572U - - Google Patents

Info

Publication number
JPS61197572U
JPS61197572U JP8240885U JP8240885U JPS61197572U JP S61197572 U JPS61197572 U JP S61197572U JP 8240885 U JP8240885 U JP 8240885U JP 8240885 U JP8240885 U JP 8240885U JP S61197572 U JPS61197572 U JP S61197572U
Authority
JP
Japan
Prior art keywords
switch
capacitor
close
charging
control circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP8240885U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP8240885U priority Critical patent/JPS61197572U/ja
Publication of JPS61197572U publication Critical patent/JPS61197572U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
JP8240885U 1985-05-31 1985-05-31 Pending JPS61197572U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP8240885U JPS61197572U (enExample) 1985-05-31 1985-05-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP8240885U JPS61197572U (enExample) 1985-05-31 1985-05-31

Publications (1)

Publication Number Publication Date
JPS61197572U true JPS61197572U (enExample) 1986-12-10

Family

ID=30630097

Family Applications (1)

Application Number Title Priority Date Filing Date
JP8240885U Pending JPS61197572U (enExample) 1985-05-31 1985-05-31

Country Status (1)

Country Link
JP (1) JPS61197572U (enExample)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002131355A (ja) * 2000-10-24 2002-05-09 Tdk Corp 静電気吸収素子の電気特性評価方法及び装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59175742A (ja) * 1983-03-26 1984-10-04 Nec Home Electronics Ltd 電子部品のストレス試験方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59175742A (ja) * 1983-03-26 1984-10-04 Nec Home Electronics Ltd 電子部品のストレス試験方法

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002131355A (ja) * 2000-10-24 2002-05-09 Tdk Corp 静電気吸収素子の電気特性評価方法及び装置

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