JPS61186801A - Measuring instrument for internal diameter of extremely small hole - Google Patents

Measuring instrument for internal diameter of extremely small hole

Info

Publication number
JPS61186801A
JPS61186801A JP2671685A JP2671685A JPS61186801A JP S61186801 A JPS61186801 A JP S61186801A JP 2671685 A JP2671685 A JP 2671685A JP 2671685 A JP2671685 A JP 2671685A JP S61186801 A JPS61186801 A JP S61186801A
Authority
JP
Japan
Prior art keywords
gauge
ferrule
extremely small
small hole
lever
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2671685A
Other languages
Japanese (ja)
Inventor
Shoji Ueno
上野 正二
Takashi Ueno
隆史 上野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
KIYOKUYOU SEIKI KK
Original Assignee
KIYOKUYOU SEIKI KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by KIYOKUYOU SEIKI KK filed Critical KIYOKUYOU SEIKI KK
Priority to JP2671685A priority Critical patent/JPS61186801A/en
Publication of JPS61186801A publication Critical patent/JPS61186801A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B5/00Measuring arrangements characterised by the use of mechanical techniques
    • G01B5/08Measuring arrangements characterised by the use of mechanical techniques for measuring diameters
    • G01B5/12Measuring arrangements characterised by the use of mechanical techniques for measuring diameters internal diameters

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • A Measuring Device Byusing Mechanical Method (AREA)

Abstract

PURPOSE:To take numbers of measurements in a short time by inserting a ferrule into a word base fitted onto a lever and then making the center axis of a rotating shaft to cross an extremely small hole. CONSTITUTION:When the ferrule 17 is inserted into a work holder 12 and a grip part 22 is held and rotated to right firstly, a ball begins to fall against a spring and is then pushed up by the spring on reaching the position of a recessed part 6' to engage the recessed part 6', so that the rotation stops. Then, the center axis of the extremely small hole 18 of the ferrule 17 is on the same line with the center axis of a wire gauge 19', which is slid, thereby measuring the insertion of the gauge 19'. Then when the lever 2 is moved to the position of a recessed part 6, the extremely small hole 18 is positioned on the center axis of the wire gauge 19, which is slide to measure the extremely small hole 18 by the gauge 19. Further, when the lever is moved to the position of a recessed part 6'', the center axis of a wire gauge 19'' is on the center axis of the extremely small hole 18 and the gauge 19'' is slid to measure and inspect the extremely small hole 18.

Description

【発明の詳細な説明】 「産業上の利用分野」 本発明は、例えば光ファイバーの接続のために使用する
部品フェルールの微細孔を簡便に測定できることを特徴
とした微細孔の内径測定装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION "Field of Industrial Application" The present invention relates to a device for measuring the inner diameter of micropores, which is capable of easily measuring micropores in component ferrules used, for example, for connecting optical fibers. be.

「従来の技術」 近年は通信用の電線に代って光ファイバーが開発され、
実用化されている。その線径は一例として125μでガ
ラス製で2層となっており、光の通る中心層は50μで
外側の反射層の外径が125μであり、その外側は緩衝
層を介してビニール被覆されている。その接続であるが
、電気の場合は導電体の完全接続で良いが、光の場合は
光軸の断面の円形を完全に接続する必要がある。その接
続の手段として、アーク放電で溶接するが、溶接が使え
ない場合は、コネクターを使って突合せ接合する。その
コネクターは、第5図、第7図に示したように、円筒状
プラグと、プラスチック族、ステンレス製、セラミック
製によって円筒状ζこ形成され、その一端が閉塞され、
その閉塞部には126μ、127μの精度の高い微細孔
が穿設されたフェルールと袋ナツトからなっているもの
である。その接続は光ファイバーの中心層にフェルール
の微細孔に挿通し、光ファイバーの端面を、フェルール
の端面と同一面としたものを、円筒状プラグの両端より
挿入してフェルールの端面を突合せることで光ファイバ
ーの中心層を突合せ、円筒状プラグの両端lこ係合して
いる袋ナツトを螺合して締付はフェルールを中央に引寄
せて接合する。よってフェルールの微細孔の精度がよく
ないと、光ファイバーの中心層が偏心して接続すること
\なり、光の伝達が良好とならず、フェルールの微細孔
の精度は穀も重要なポイントである。
``Conventional technology'' In recent years, optical fibers have been developed to replace electric wires for communication.
It has been put into practical use. The wire diameter is, for example, 125μ, and it is made of two layers of glass.The center layer through which light passes is 50μ, and the outer diameter of the outer reflective layer is 125μ, and the outside is covered with vinyl through a buffer layer. There is. Regarding the connection, in the case of electricity, it is sufficient to completely connect the conductors, but in the case of light, it is necessary to completely connect the circular cross section of the optical axis. Arc discharge welding is used as a means of connection, but if welding is not possible, butt joints are used using connectors. As shown in FIGS. 5 and 7, the connector is formed into a cylindrical shape by a cylindrical plug and a material made of plastic, stainless steel, or ceramic, and one end of the connector is closed.
The closed portion is made up of a ferrule and a cap nut in which highly accurate fine holes of 126 μm and 127 μm are bored. The connection is made by inserting the optical fiber into the center layer of the optical fiber through the fine hole of the ferrule, making the end surface of the optical fiber flush with the end surface of the ferrule, inserting it from both ends of the cylindrical plug, and abutting the end surfaces of the ferrule. The center layers of the cylindrical plug are butted together, and the cap nuts engaged with both ends of the cylindrical plug are screwed together, and the ferrule is pulled toward the center and joined. Therefore, if the precision of the micropores in the ferrule is not good, the center layer of the optical fiber will connect eccentrically, resulting in poor light transmission.The precision of the micropores in the ferrule is also an important point.

しかしながら、従来微細孔の内径検査、測定は当初顕微
鏡などの光学的方法が用いられていたが、装置が犬がか
りな上、測定誤差が大きい難点があり、現在では高精度
に仕上げられたワイヤーゲージを使う方法が簡便かつ正
確であるため、光学的方法に代って、かなり広く行われ
ているようになってきている。その測定検査は、例えば
125μの線径の光フアイバー用のフェルールに対して
は、要求精度公差に応じて125乃至126μのワ−ク
ースを「通り」とし、127乃至128μのワイヤーゲ
ージを「止り」とすることによって調べている。その測
定であるが、他の道具を用いず人手に頼る方法がとられ
ている。すなわち、フェルールを左手に持ち、ワイヤー
ゲージの柄を右手に持って肉眼で、ワイヤーゲージの先
端をフェルールの微細孔に挿入し、その嵌合具合を調べ
る方法である。この様な人手法では対象系が非常に細か
いため、ワイヤーゲージの先端をフェルールの微細孔に
命中させるのをこも熟練を要するばかりでなく、熟練者
といえども一時ζこ多数の検査、測定を行うことは大変
な疲労を要するものである。また、人手によるものは、
フェルールの微細孔lこワイヤーゲージを挿入する(こ
−直線に摺動することは少なく、折曲して挿入するとき
はワイヤーゲージを折曲したり破損したりしてしまう等
の欠点があった。
However, optical methods such as microscopes were originally used to inspect and measure the inner diameter of micropores, but these had the drawbacks of requiring complicated equipment and large measurement errors.Currently, highly accurate wire gauges are used. Because the method using the optical method is simple and accurate, it has become widely used instead of the optical method. For example, for a ferrule for an optical fiber with a wire diameter of 125μ, the measurement inspection is performed with a workpiece of 125 to 126μ as a “pass” and a wire gauge of 127 to 128μ as a “stop” depending on the required accuracy tolerance. We are investigating by doing this. For this measurement, a method is used that relies on humans without using any other tools. That is, the method involves holding the ferrule in the left hand, holding the handle of the wire gauge in the right hand, and inserting the tip of the wire gauge into the fine hole of the ferrule with the naked eye to check the fit. In this manual method, the target system is very fine, so not only does it require great skill to hit the tip of the wire gauge into the microscopic hole in the ferrule, but even an experienced person must undergo numerous inspections and measurements at one time. Doing so requires great fatigue. In addition, the manual
Insert the wire gauge through the fine hole in the ferrule (this has the disadvantage that it rarely slides in a straight line, and when bent and inserted, the wire gauge may be bent or damaged) .

「発明が解決しようとする間珀点」 本発明は、前記のように人手によるものでなく、作業性
を改善したもので、測定に使用する数個の異なるワイヤ
ーゲージを同一中心に向ってセットしておき、また、フ
ェルールの取付けた微細孔の中心軸の方向をワンタッチ
によって、前記の異なるワイヤーゲージの中心軸上に変
更できるようにし、夫々のワイヤーゲージを手で摺動さ
せて微細孔に嵌合して測定できるようにして作業性を良
好にして短時間に多量の検査測定を行うことができ、し
かもワイヤーゲージの折曲や破損を防止するようにして
いる。
``The problem that the invention attempts to solve'' The present invention improves workability without requiring manual work as described above, and sets several different wire gauges used for measurement toward the same center. In addition, the direction of the center axis of the microhole where the ferrule is attached can be changed with one touch to the center axis of the different wire gauges mentioned above, and each wire gauge can be manually slid into the microhole. The wire gauges can be fitted to each other for measurement, improving workability, allowing a large amount of inspection and measurement to be carried out in a short period of time, and preventing bending or damage to the wire gauge.

r問題点を解決するための手段」 その構造を図面について説明する。(1)は台板であっ
て、この略中央にはレバー(2)の一端が回転軸(3)
で枢着されている。(4)はガイドプレートであって、
レバー(2)の自由端側の台板(1)の表面外端縁に設
けられ、回転軸(3)を支点とした円弧状をし、レバー
(2)を挾むようにし、その両端を台板(1)に螺子(
5)等によって固着している。(6)(6八〇)は球面
状の凹部で、ガイドプレート(4)の下面に一定の間隔
(例えば30度づ\)に必要な数(例えば2個またはそ
れ以上、□□□面は一例として3個)設けられている。
"Means for Solving Problems" The structure will be explained with reference to the drawings. (1) is a base plate, and one end of the lever (2) is attached to the rotating shaft (3) approximately in the center of the base plate.
It is pivoted on. (4) is a guide plate,
It is provided on the outer edge of the surface of the base plate (1) on the free end side of the lever (2), and has an arc shape with the rotating shaft (3) as the fulcrum, so as to sandwich the lever (2), and both ends of the base plate are attached to the base plate (1). Attach the screw (
5) It is fixed due to etc. (6) (680) are spherical recesses, and the required number (e.g., 2 or more) at regular intervals (e.g., every 30 degrees) on the lower surface of the guide plate (4). As an example, 3 pieces) are provided.

(7)はブツシュで、凹部(61t6i(6)と対応す
る位置。
(7) is a bush, the position corresponding to the recess (61t6i(6)).

で、レバー(2)ζこ上下方向lこ設けられている。こ
の内部には発条(8)とボール(9)を内在させ、発条
(8)によってボール(9)を常に上方に押上げ、ボー
ル(9)を凹部(61(61+61の伺ねかに保合させ
るようにしている。
A lever (2) is provided in the vertical direction. A spring (8) and a ball (9) are contained inside this, and the ball (9) is constantly pushed upward by the spring (8), and the ball (9) is held in the recess (61 (61+61)). I try to let them do it.

Qlはワークベースであって、レバー(2)上に固着さ
れ、その上部には水平方向に貫通孔(15)を台板(1
)1を設け、これにワークホルダー(1カが取付けられ
、その中心軸は、前記回転軸(3)の中心軸(xlと父
叉するようにしている。(L3はゲージガイドであって
、ワークベースu1のワークホルダーa′lJの外方に
、中心軸(x)を支点とした同一円周上に設けた円弧壁
でこの中央の上面に、ワイヤーゲージの卿付部が挿通で
きる円弧溝Iが設けられている。α9はゲージベースで
あって、扇形をして回転軸(3)に近接してレバー(2
)と対向して台板(1)lこ固着されている。ゲージベ
ースαりには、ゲージホルタ−u61(16)(161
を水平に増付けて口上 いるが、その中心軸は、4→伴フセー→(61(61(
61と回転軸(3)の中心軸(x) (!:を結ぶ線上
で、しかも、ワークホルダー021の中心軸と同一線上
にあるようにしている。(17)はフェルールで、一端
ζこは微細孔a〜が設けられている。a旧’aaiはワ
イヤーゲージであって、一方にはを何部(21が設けら
れ、こねよりワイヤーQυが突出している。器はレバー
(2)の端部より突出して設けた把持部である。(ハ)
は円筒状プラグ、124+は袋ナツト、Q51は光ファ
イバーで、中心層の外側に反射層(イ)が設けられ、そ
の外層には緩衝層(2)を介してビニール(至)被覆さ
れている。翰はフェルールσηを挿入したときに突出し
ないようにし゛た当りである。
Ql is a work base, which is fixed on the lever (2) and has a horizontal through hole (15) in the upper part of the base plate (1).
) 1 is provided, and a work holder (1 piece) is attached to this, the central axis of which intersects the central axis (xl) of the rotating shaft (3). (L3 is a gauge guide, A circular arc wall is provided on the same circumference with the central axis (x) as a fulcrum on the outside of the work holder a'lJ of the work base u1, and on the upper surface of the center thereof, there is an arc groove through which the attached part of the wire gauge can be inserted. α9 is a gauge base, which has a fan shape and is located close to the rotation axis (3) and has a lever (2).
) is fixed to the base plate (1). For gauge base α, gauge holter U61 (16) (161
is added horizontally, but its central axis is 4 → Banfusei → (61 (61 (
61 and the center axis (x) (!:) of the rotating shaft (3), and also on the same line as the center axis of the work holder 021. (17) is a ferrule, and one end ζ Microholes a~ are provided.A'aai is a wire gauge, and one side is provided with a number of parts (21), and a wire Qυ protrudes from the kneader. (c)
124+ is a cylindrical plug, 124+ is a cap nut, and Q51 is an optical fiber. A reflective layer (A) is provided on the outside of the center layer, and the outer layer is covered with vinyl via a buffer layer (2). The ferrule was made so that it would not protrude when the ferrule ση was inserted.

「作 用」 本発明は前記のような構造であるので、フェルール15
)を台板(1)ηの微細孔(18)の許容精度が例えば
125+0.5〜1.5μである場合は、ゲージホルダ
ー翰には125μのワイヤーゲージ(15)を台板(1
)を、ゲージホルダーaeには、126μのワイヤーゲ
ージ(ICJを、ゲージホルダー(161には127μ
のワイヤーゲージα9を挿入しておく、この場合125
μは「通り」検査となり、126μは許容限度内の測定
値で、127μは「止り」検査となるものである。今ワ
ークホルダー〇35こフェルールaηを差込み、先ず把
持部(イ)を持って右方に回動すると、ボール(9)は
発条(8)に抗して下方に下って凹部(6)より外れて
右方lこ回動することができ、凹部(6)位置に達する
とボール(9)は発条(8)によって上方に押上って凹
部(6)に係合し、回動は停止する。
"Function" Since the present invention has the above-mentioned structure, the ferrule 15
) on the base plate (1) If the allowable accuracy of the fine hole (18) with η is, for example, 125+0.5 to 1.5 μ, then the wire gauge (15) with a diameter of 125 μ is placed on the base plate (1) on the gauge holder.
), the gauge holder ae has a 126μ wire gauge (ICJ), and the gauge holder (161 has a 127μ wire gauge).
Insert the wire gauge α9, in this case 125
μ is a "go through" test, 126μ is a measurement within acceptable limits, and 127μ is a "stop" test. Now, insert the work holder 〇35 ferrule aη and first hold the grip part (A) and turn it to the right.The ball (9) will go down against the spring (8) and come out of the recess (6). When the ball (9) reaches the position of the recess (6), the ball (9) is pushed upward by the spring (8) and engages with the recess (6), and the rotation stops.

そのようにすると、ワークベースαQのフェルールUη
の微細孔側の中心軸は、ワイヤーゲージQlの中心軸と
同一線上をこなり、ワイヤーゲージ(15)を台板(1
)を摺動して、ワイヤーゲージa3の挿通の測定を行う
、次に、レーバー(2)を凹部(6)の位置に移動させ
ると、フェルールσηの微細孔(181は、今度はワイ
ヤーゲージq9の中心軸上に存在すること\なり、次で
ワイヤーゲージ四を摺動して、ワイヤーゲージ(IIに
よる微細孔α綽の測定を行う、そして、またレバー(2
)を凹部(6)の位置に移動させると、ワイヤーゲージ
σ9の中心軸は、フェルールαηの微細孔0秒の中心軸
上に存在すること\なり、ワイヤーゲージdを摺動して
微細孔α樽の測定を行い検査を行うものである。そのよ
うにしてワイヤーゲージα■9が微細孔(1g+を挿通
したものを「通り」とし、ワイヤーゲージ(19を挿通
したものは「止り」として検査を行うものである。
By doing so, the ferrule Uη of the work base αQ
The central axis of the fine hole side is on the same line as the central axis of the wire gauge Ql, and the wire gauge (15) is placed on the base plate (1
) to measure the insertion of the wire gauge a3.Next, when the lever (2) is moved to the position of the recess (6), the fine hole (181) of the ferrule ση is now inserted into the wire gauge q9. Next, slide the wire gauge 4 to measure the fine hole α with the wire gauge (II), and then move the lever (2
) to the position of the recess (6), the central axis of the wire gauge σ9 is located on the central axis of the fine hole 0 seconds of the ferrule αη, and the wire gauge d is moved to the position of the fine hole α. The barrels are measured and inspected. In this way, the wire gauge α■9 inserted through the fine hole (1g+) is regarded as a "pass", and the wire gauge (19 inserted through it is treated as a "stop") and inspected.

「発明の効果」 本発明は、フェルールaηを、レバー(2)の上に取付
けたワークベース(1■は差込むことによって、回転軸
(3)の中心軸(x+と、微細孔α梯と交叉することが
でき、レバー(2)を回動固定する位置に至らしめると
、使用するワイヤーゲージ(1,1il’lα3の何れ
かが、測定するフェル−ルミ力の微細孔α&の中心軸上
に存在させることができ、ワイヤーゲージの先端を労せ
ずしてフェルールαηの微細孔α&の口元に導くことが
でき熟練を要することなく安易に検査測定を迅速に行う
ことができる。よって従来に比較し作業性が良好となる
し、フェルール(1ηの微細孔0Qとワイヤーゲージの
中心軸は何時も同一軸上に存在しているので、ワイヤー
ゲージの先端を屈折させたりすることがなく、ワイヤー
ゲージの破損も少ない等の効果を奏する。
"Effects of the Invention" The present invention enables the ferrule aη to be inserted into the work base (1 When the lever (2) is rotated to the fixed position, either the wire gauge (1 or 1il'lα3) to be used will be placed on the central axis of the fine hole α& of the Fer-Lumi force to be measured. The tip of the wire gauge can be guided to the mouth of the fine hole α & of the ferrule αη without effort, and inspection and measurements can be easily and quickly performed without requiring any skill. This improves workability, and since the fine hole 0Q of the ferrule (1η) and the central axis of the wire gauge are always on the same axis, the tip of the wire gauge will not be bent, and the wire gauge will not bend. It has the advantage of less damage.

なお、図面では異なるワイヤーゲージを3本屯付けたも
のについて説明しているが、凹部(6+ts’oeTの
数を2個または3個以上に増減し、それに供う数のワイ
ヤーゲージを取付けるようにすることは当然である。
In addition, although the drawing explains the case where three different wire gauges are attached, it is possible to increase or decrease the number of recesses (6+ts'oeT) to 2 or 3 or more and attach the corresponding number of wire gauges. It is natural to do so.

【図面の簡単な説明】[Brief explanation of the drawing]

図面は本発明の一実施例を示すものであって、その第1
図は、本発明の斜視図、第2図は平面図、第3図は縦断
側面図、第4図は一部の斜視図、第5図はフェルールの
断面図、第6図はワイヤーゲージの斜視図、第7図は光
ファイバーのコネクターζこよる接合状態を示した断面
図である。 (1)・・・・・・・・・台板、(2)・・・・・・・
・・レバー、(3)・・・・・・・・・回転軸、(4)
・・・・・・・・ガイドプレート、αα・・・・・・・
・・ワークホルタ−1(lり・・・・・・・・・ゲージ
ベース、(I′rI・・・・・・・・・フェル特許出願
人    旭洋精機株式会社 第7図 第2図 第3図
The drawings show one embodiment of the present invention, and the first embodiment is shown in the drawings.
The figures are a perspective view of the present invention, Fig. 2 is a plan view, Fig. 3 is a longitudinal side view, Fig. 4 is a partial perspective view, Fig. 5 is a sectional view of the ferrule, and Fig. 6 is a wire gauge. The perspective view and FIG. 7 are cross-sectional views showing the joined state of the optical fiber connector ζ. (1)・・・・・・・・・Base plate, (2)・・・・・・
...Lever, (3) ...Rotary shaft, (4)
・・・・・・・・・Guide plate, αα・・・・・・
... Work Holter 1 (I'rI......Fel Patent Applicant Kyokuyo Seiki Co., Ltd. Fig. 7 Fig. 2 Fig. 3

Claims (1)

【特許請求の範囲】[Claims] 台板(1)の略中央にレバー(2)を軸支し、レバー(
2)の自由端寄りにガイドプレート(4)を取付け、レ
バー(2)はガイドプレート(4)に対し、数個所に回
動固定できるようにし、レバー(2)上には、ワークベ
ース(10)を取付け、これにはフェルール(17)を
水平に差込み固定できるようにワークホルダー(12)
を取付け、その中心軸を、回転軸(3)の中心軸(x)
と交叉させ、ワークベース(10)と対向してゲージベ
ース(15)を台板(1)に取付け、ゲージベース(1
5)には、レバー(2)が回動固定する位置に対応して
ワイヤーゲージ(19)(19′)(19″)を、その
中心軸が、ワークホルダー(12)と同一中心軸上にあ
るように取付け、しかもそのワイヤーゲージ(19)(
19′)(19″)は、ゲージベース(15)に対して
摺動できるようにしたことを特徴とした微細孔の内径測
定装置。
The lever (2) is pivotally supported approximately in the center of the base plate (1), and the lever (
A guide plate (4) is installed near the free end of 2), and the lever (2) can be rotated and fixed at several locations with respect to the guide plate (4). ), and attach the work holder (12) to it so that the ferrule (17) can be inserted horizontally and fixed.
, and its center axis is the center axis (x) of the rotating shaft (3).
Attach the gauge base (15) to the base plate (1) facing the work base (10), crossing the gauge base (1).
5), place the wire gauges (19) (19') (19'') corresponding to the rotationally fixed position of the lever (2) so that their central axes are on the same central axis as the work holder (12). Install it as shown, and the wire gauge (19) (
19') (19'') is a microhole inner diameter measuring device characterized by being able to slide on a gauge base (15).
JP2671685A 1985-02-14 1985-02-14 Measuring instrument for internal diameter of extremely small hole Pending JPS61186801A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2671685A JPS61186801A (en) 1985-02-14 1985-02-14 Measuring instrument for internal diameter of extremely small hole

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2671685A JPS61186801A (en) 1985-02-14 1985-02-14 Measuring instrument for internal diameter of extremely small hole

Publications (1)

Publication Number Publication Date
JPS61186801A true JPS61186801A (en) 1986-08-20

Family

ID=12201074

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2671685A Pending JPS61186801A (en) 1985-02-14 1985-02-14 Measuring instrument for internal diameter of extremely small hole

Country Status (1)

Country Link
JP (1) JPS61186801A (en)

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020089294A (en) * 2002-11-06 2002-11-29 (주) 티오피에스 Ferrule inspection device and inspection method using wire
KR100426540B1 (en) * 2001-07-31 2004-04-13 (주) 티오피에스 testing apparatus for ferrule
CN107014333A (en) * 2017-05-31 2017-08-04 西安交通大学 In small-bore cartridge by diffusion of volatile treating agent micro hole precision measurement apparatus in place and method
CN107091624A (en) * 2017-06-07 2017-08-25 深圳天珑无线科技有限公司 Detect the detection control method of tool and detection tool
CN112179306A (en) * 2020-09-10 2021-01-05 罗显美 Hollow wafer standard component internal diameter detection equipment
CN112945059A (en) * 2021-01-27 2021-06-11 惠州市积和智能科技有限公司 Aperture detection device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5585202A (en) * 1978-12-22 1980-06-27 Hitachi Seiki Co Ltd Measuring device for general purpose

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5585202A (en) * 1978-12-22 1980-06-27 Hitachi Seiki Co Ltd Measuring device for general purpose

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100426540B1 (en) * 2001-07-31 2004-04-13 (주) 티오피에스 testing apparatus for ferrule
KR20020089294A (en) * 2002-11-06 2002-11-29 (주) 티오피에스 Ferrule inspection device and inspection method using wire
CN107014333A (en) * 2017-05-31 2017-08-04 西安交通大学 In small-bore cartridge by diffusion of volatile treating agent micro hole precision measurement apparatus in place and method
CN107091624A (en) * 2017-06-07 2017-08-25 深圳天珑无线科技有限公司 Detect the detection control method of tool and detection tool
CN112179306A (en) * 2020-09-10 2021-01-05 罗显美 Hollow wafer standard component internal diameter detection equipment
CN112179306B (en) * 2020-09-10 2022-06-14 山东国勘工程检测鉴定有限公司 Hollow wafer standard component internal diameter detection equipment
CN112945059A (en) * 2021-01-27 2021-06-11 惠州市积和智能科技有限公司 Aperture detection device

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