JPS61186241U - - Google Patents
Info
- Publication number
- JPS61186241U JPS61186241U JP7131585U JP7131585U JPS61186241U JP S61186241 U JPS61186241 U JP S61186241U JP 7131585 U JP7131585 U JP 7131585U JP 7131585 U JP7131585 U JP 7131585U JP S61186241 U JPS61186241 U JP S61186241U
- Authority
- JP
- Japan
- Prior art keywords
- guide
- semiconductor
- guide chute
- utility
- model registration
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims 13
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Specific Conveyance Elements (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第1図AはDIP形素子の斜視図、同図Bはそ
の正面図、第2図AはMFP形素子の斜視図、同
図Bはその正面図、第3図は本考案の案内装置が
適用されるハンドリングマシンの一実施例を示す
概略側面図、第4図は同平面図、第5図は第4図
のV―V線断面図、第6図は収納マガジンが配設
されている架台部分の概略斜視図、第7図、第8
図は本願考案の他の実施例説明図、第9図は本願
考案のさらに他の実施例を示す説明図。
10:素子本体、12:リード、14:素子本
体、16:リード、18:架台、26:素子、2
7:素子本体、28:供給マガジン、32:供給
シユート、34:測定部、36:分配機、40:
収納マガジン、42:上部案内板。
FIG. 1A is a perspective view of a DIP type device, FIG. 2B is a front view thereof, FIG. 2A is a perspective view of an MFP type device, FIG. A schematic side view showing one embodiment of the applicable handling machine, FIG. 4 is a plan view of the same, FIG. 5 is a cross-sectional view taken along the line V-V in FIG. 4, and FIG. 6 shows a storage magazine installed. Schematic perspective view of the pedestal part, Figures 7 and 8
The figure is an explanatory diagram of another embodiment of the present invention, and FIG. 9 is an explanatory diagram showing still another embodiment of the present invention. 10: Element body, 12: Lead, 14: Element body, 16: Lead, 18: Frame, 26: Element, 2
7: Element body, 28: Supply magazine, 32: Supply chute, 34: Measuring section, 36: Distributor, 40:
Storage magazine, 42: Upper guide plate.
Claims (1)
の電気的特性を測定し、その結果により分類収納
する半導体素子のハンドリングマシンにおいて、
供給マガジンからその本体を下向きに、リードを
上向きにして供給された半導体素子を、長手方向
に沿つた一方の側を、前記半導体素子の本体の片
側面と係合する素子案内面とし、他方の側を解放
面とした案内シユートにより案内することを特徴
とする半導体素子の案内装置。 (2) 実用新案登録請求の範囲第1項の記載にお
いて、前記案内シユートは、これを支持する架台
により、半導体素子の搬送方向に傾斜され、かつ
半導体素子を前記素子案内面に付勢する方向に傾
斜されて支持されていることを特徴とする半導体
素子の案内装置。 (3) 実用新案登録請求の範囲第1項の記載にお
いて、前記案内シユートは、これを支持する架台
により半導体素子の搬送方向に傾斜されて支持さ
れていると共に、前記案内シユートの半導体素子
滑落面が、前記半導体素子を前記素子案内面に付
勢する方向に傾斜して形成されていることを特徴
とする半導体素子の案内装置。 (4) 実用新案登録請求の範囲第1項ないし第3
項の記載において、前記素子案内面は、素子の搬
送方向に対し直角の方向に移動調整可能であるこ
とを特徴とする半導体素子の案内装置。 (5) 実用新案登録請求の範囲第1項ないし第4
項の記載において、前記案内シユートには素子飛
び出し防止用の位置調整可能な上部案内板が付設
されていることを特徴とする半導体素子の案内装
置。[Scope of Claim for Utility Model Registration] (1) In a semiconductor device handling machine that measures the electrical characteristics of semiconductor devices supplied by falling under their own weight and sorts and stores them according to the results,
A semiconductor element is supplied from a supply magazine with its body facing downward and its leads facing upward, with one side along the longitudinal direction serving as an element guide surface that engages with one side of the body of the semiconductor element, and the other A guide device for a semiconductor device, characterized in that the device is guided by a guide chute with an open side. (2) In the description of claim 1 of the utility model registration claim, the guide chute is tilted in the direction of conveyance of the semiconductor element by a pedestal supporting the guide chute, and the guide chute is tilted in a direction that urges the semiconductor element toward the element guide surface. A guide device for a semiconductor device, characterized in that the device is supported at an angle. (3) Utility Model Registration In the statement of claim 1, the guide chute is supported by a pedestal supporting the guide chute so as to be inclined in the conveying direction of the semiconductor device, and the semiconductor device sliding surface of the guide chute is is formed to be inclined in a direction that urges the semiconductor element toward the element guide surface. (4) Scope of claims for utility model registration, paragraphs 1 to 3
2. The device for guiding a semiconductor device according to item 1, wherein the device guide surface is movable and adjustable in a direction perpendicular to the direction of conveyance of the device. (5) Scope of claims for utility model registration, paragraphs 1 to 4
2. The semiconductor device guiding device according to item 1, wherein the guide chute is provided with a position-adjustable upper guide plate for preventing the device from popping out.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7131585U JPS61186241U (en) | 1985-05-14 | 1985-05-14 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP7131585U JPS61186241U (en) | 1985-05-14 | 1985-05-14 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61186241U true JPS61186241U (en) | 1986-11-20 |
Family
ID=30608695
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP7131585U Pending JPS61186241U (en) | 1985-05-14 | 1985-05-14 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61186241U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102540038A (en) * | 2010-12-27 | 2012-07-04 | 苏州晶能科技有限公司 | Sorting and testing equipment for full-automatic Light-Emitting Diode (LED) light source modules, and sorting and testing method thereof |
-
1985
- 1985-05-14 JP JP7131585U patent/JPS61186241U/ja active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN102540038A (en) * | 2010-12-27 | 2012-07-04 | 苏州晶能科技有限公司 | Sorting and testing equipment for full-automatic Light-Emitting Diode (LED) light source modules, and sorting and testing method thereof |
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