JPS61181171A - Semiconductor pressure sensor - Google Patents
Semiconductor pressure sensorInfo
- Publication number
- JPS61181171A JPS61181171A JP2268685A JP2268685A JPS61181171A JP S61181171 A JPS61181171 A JP S61181171A JP 2268685 A JP2268685 A JP 2268685A JP 2268685 A JP2268685 A JP 2268685A JP S61181171 A JPS61181171 A JP S61181171A
- Authority
- JP
- Japan
- Prior art keywords
- diaphragm
- shape
- pressure sensor
- ellipse
- rectangle
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 title claims abstract description 17
- 239000013078 crystal Substances 0.000 claims description 5
- 230000035945 sensitivity Effects 0.000 abstract description 6
- 230000003190 augmentative effect Effects 0.000 abstract 1
- 229910052710 silicon Inorganic materials 0.000 description 9
- 239000010703 silicon Substances 0.000 description 9
- 238000010586 diagram Methods 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 5
- 239000000758 substrate Substances 0.000 description 5
- 150000003376 silicon Chemical class 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- YCIMNLLNPGFGHC-UHFFFAOYSA-N catechol Chemical compound OC1=CC=CC=C1O YCIMNLLNPGFGHC-UHFFFAOYSA-N 0.000 description 2
- 238000009792 diffusion process Methods 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 2
- PIICEJLVQHRZGT-UHFFFAOYSA-N Ethylenediamine Chemical compound NCCN PIICEJLVQHRZGT-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 230000036772 blood pressure Effects 0.000 description 1
- 210000004204 blood vessel Anatomy 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000012530 fluid Substances 0.000 description 1
- 238000001727 in vivo Methods 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 239000002689 soil Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L29/00—Semiconductor devices adapted for rectifying, amplifying, oscillating or switching, or capacitors or resistors with at least one potential-jump barrier or surface barrier, e.g. PN junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
- H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
- H01L29/84—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by variation of applied mechanical force, e.g. of pressure
Abstract
Description
【発明の詳細な説明】
(イ)発明の属する技術分野
本発明は、半導体のピエゾ抵抗効果を利用してガス圧、
水圧等の流体圧力の測定を行なう半導体圧力センサに関
する。Detailed Description of the Invention (a) Technical field to which the invention pertains The present invention utilizes the piezoresistance effect of semiconductors to
The present invention relates to a semiconductor pressure sensor that measures fluid pressure such as water pressure.
(ロ)従来技術とその問題点
最近の高度に発達した半導体高集積回路製造技術が利用
できることと、その機械的強度からシリコンを材料に用
い六半導体圧力七ンサが注目されている。これは、シリ
コン単結晶基板の中央部に5〜30μm程度の肉薄のダ
イアフラムを設け、このダイアフラム上に感圧素子とし
ての拡散ピエゾ抵抗を形成して、そのピエゾ抵抗効果に
より圧力を抵抗値変化から電圧変化に変換して検出する
ものである。(b) Prior art and its problems Semiconductor pressure sensors using silicon as a material are attracting attention because of the availability of recent highly developed semiconductor highly integrated circuit manufacturing technology and its mechanical strength. This is achieved by providing a thin diaphragm of approximately 5 to 30 μm in the center of a silicon single crystal substrate, forming a diffused piezoresistor as a pressure-sensitive element on this diaphragm, and using the piezoresistance effect to control pressure from changes in resistance. It is detected by converting it into a voltage change.
その−例の概略構造を第2図に示す。図においては、n
−型シリコン単結晶基板(1)を用いてありその中央部
に10μmの厚さのダイアフラム(2)ヲ設け、このダ
イアフラム(2)にp−型拡散ピエゾ抵抗(3,4,5
,6)が4個形成されている。これらのp−型拡散ピエ
ゾ抵抗(3,4,5,6)は、p 型拡散リード部(7
)を介してAl端子(8,9,10,11>に接続され
ている。このように4個のp−型拡散ピエゾ抵抗をブリ
ッジ回路に組み上げることにより圧力感度の向上をはか
つている。実際にはAA端子(8)(端子l)とM端子
α0(端子3)の間に定電流または定電圧をかけ、AJ
j端子(9)(端子2)とA/端子aυ(端子4)の電
圧変化を検出する。The schematic structure of this example is shown in FIG. In the figure, n
A diaphragm (2) with a thickness of 10 μm is provided at the center of the - type silicon single crystal substrate (1), and p-type diffused piezoresistors (3, 4, 5
, 6) are formed. These p-type diffused piezoresistors (3, 4, 5, 6) are connected to the p-type diffused lead part (7
) to the Al terminals (8, 9, 10, 11>).By assembling four p-type diffused piezoresistors into a bridge circuit in this way, pressure sensitivity is improved.Actually A constant current or constant voltage is applied between the AA terminal (8) (terminal 1) and the M terminal α0 (terminal 3), and the AJ
Detect voltage changes at the j terminal (9) (terminal 2) and the A/terminal aυ (terminal 4).
このような半導体圧力センサの最大の利点は、信号処理
回路との結合が容易であるということも含めて、半導体
高集積回路製造技術を駆使して小型化が可能ということ
である。このため金属抵抗歪ゲージ等を用いていてはな
かなか実現できなかった応用が考えられる工うになった
。その代表例が、カテーテルの先端や側面に装着して、
血管内に挿入して生体内で直接I/ζ血圧値をモニタす
るカテーテル型圧力センサである。このような圧力セン
サではカテーテルの先端または側面に実装するために、
センサチップの幅をできるだけ小さくする必要があり、
最大でも1.5M程度に押えなくてはならない。この場
合問題となるのは、センサチップサイズの制約によりチ
ップ中央部に形成できるダイアフラムの最大寸法が自ず
と決定されることである。即ち、圧力センサの感度を決
定する最も重要な要素は、ダイアフラム寸法とダイアフ
ラム部の比率であるが、ダイアフラム寸法を大きくとれ
ないときに高感度を得ようとするとダイアフラム部を薄
くしなくてはならないが、ダイアフラム部にも加工技術
や耐圧限界等の問題から限度があるため高感度な圧力セ
ンサを実現することは困難である。The greatest advantage of such a semiconductor pressure sensor is that it can be easily combined with a signal processing circuit and can be miniaturized by making full use of semiconductor highly integrated circuit manufacturing technology. For this reason, it has become possible to consider applications that would not be easily realized using metal resistance strain gauges. A typical example is when it is attached to the tip or side of a catheter.
This is a catheter-type pressure sensor that is inserted into a blood vessel to directly monitor I/ζ blood pressure values in vivo. For such pressure sensors to be mounted on the tip or side of the catheter,
The width of the sensor chip must be made as small as possible,
It must be kept to about 1.5M at maximum. In this case, the problem is that the maximum dimension of the diaphragm that can be formed in the center of the chip is naturally determined by the sensor chip size restriction. In other words, the most important factor that determines the sensitivity of a pressure sensor is the ratio of the diaphragm size to the diaphragm portion, but if you want to obtain high sensitivity when the diaphragm size cannot be increased, the diaphragm portion must be made thinner. However, it is difficult to realize a highly sensitive pressure sensor because the diaphragm part also has limitations due to problems such as processing technology and pressure resistance limits.
(ハ)発明の目的
本発明は、カテーテルの先端等に装着できる程に小型化
を行なっても高感度なセンサを比較的容易に実現できる
ような半導体圧力センサの構造を提案することを目的と
する。(c) Purpose of the Invention The purpose of the present invention is to propose a structure for a semiconductor pressure sensor that can be miniaturized to the extent that it can be attached to the tip of a catheter, etc., and still make it relatively easy to realize a highly sensitive sensor. do.
に)問題点を解決するための手段
本発明による半導体圧力センサは、センサチップ中央部
に形成するダイアフラム形状を従来用いられているよう
な真円や正方形、正六角形等の正多角形ではなく、チッ
プ寸法に余裕のある方向に長い楕円や長方形の様な形状
にすることを最大の特徴としている。B) Means for Solving the Problems The semiconductor pressure sensor according to the present invention has a diaphragm formed in the center of the sensor chip that is not shaped like a regular polygon such as a perfect circle, square, or regular hexagon as conventionally used. The main feature is that the chip is shaped like an ellipse or rectangle, which is longer in the direction that allows for the chip dimensions.
半導体圧力センサに望まれる小型化の方向は、その応用
分野により異なっている。例えば、カテーテル型圧力セ
ンサの場合には、カテーテルの直径が&5−程度以下で
あるため、直径方向のチップサイズが最大でも2.0
mm程度に押えなくてはならないが、カテーテルの軸方
向には10am程度まで許容できる。この場合には軸方
向に長いセンサチップを作成し、その方向に長い楕円ま
たは長方形状のダイアフラムを形成するこれにより本発
明の半導体圧力センサは構成される。The direction of miniaturization desired for semiconductor pressure sensors differs depending on the field of application. For example, in the case of a catheter-type pressure sensor, the diameter of the catheter is about &5- or less, so the diametrical tip size is at most 2.0
Although it must be kept to about 10 mm, it is permissible up to about 10 am in the axial direction of the catheter. In this case, the semiconductor pressure sensor of the present invention is constructed by creating a sensor chip that is long in the axial direction and forming an elliptical or rectangular diaphragm that is long in that direction.
従来の半導体圧力センサのダイアフラムが真円及び正方
形、正六角形等の正多角形といった方向性に乏しい形状
にしてあったのは、ピエゾ抵抗効果に寄与するダイアフ
ラムの変形によって生じる応力の非線形性をダイアフラ
ム全面にわたりできるだけ小さくしてピエゾ抵抗の形成
位置及び形状の自由度を大きくするためであった。The diaphragm of conventional semiconductor pressure sensors has a shape with poor directionality, such as a perfect circle, a square, or a regular polygon such as a regular hexagon. This was done to increase the degree of freedom in the formation position and shape of the piezoresistor by making it as small as possible over the entire surface.
これに対し、本発明の様に特定方向に長い形状のダイア
フラムを形成しても楕円や長方形の様な中心対称な形状
であれば、ダイアプラムの変形により生じる応力の線形
性がよく保なれている領域が存在する。例えば楕円にお
ける長軸、短軸の周辺や長方形における2本の線対称軸
の周辺などである。On the other hand, even if a diaphragm is formed with a long shape in a specific direction as in the present invention, if the shape is centrally symmetrical such as an ellipse or a rectangle, the linearity of the stress caused by the deformation of the diaphragm is well maintained. A region exists. For example, the areas around the long axis and short axis of an ellipse, and the areas around two axes of line symmetry in a rectangle.
さて本発明による最大の利点は、このように余裕のある
方向にダイアフラムを少しでも長くすることにより、ダ
イアフラムの一定圧力に対する変形量が大きくなり、ひ
いてはその方向に生じる応力が大きくなるので圧力感度
が大きくなることである。Now, the biggest advantage of the present invention is that by making the diaphragm as long as possible in a direction with a margin, the amount of deformation of the diaphragm with respect to a constant pressure increases, which in turn increases the stress generated in that direction, which reduces pressure sensitivity. It's about getting bigger.
(ホ)実施例 以下、本発明を図面にもとすいて説明する。(e) Examples The present invention will be explained below with reference to the drawings.
第1図は本発明の一実施例としてのシリコンダイアフラ
ム型圧力センサの構造を示す図である。FIG. 1 is a diagram showing the structure of a silicon diaphragm type pressure sensor as an embodiment of the present invention.
図の(a)はセンサチップの表面構成図で、(b)はセ
ンサチップ長手方向のダイアプラム部を含む断面図、(
c)はこれと直交する方向のダイアフラム部を含む断面
図である。図において基板は1.5 mn X 40
mmのn−型シリコン単結晶基板(1)でその厚みは0
.4閤であり、表面は(100)面、側面は(110)
面である。これに裏面からエチレンジアミンとピロカテ
コール及び水の混合液に代表されるアルカリ系のエツチ
ング液によるエツチングによって、厚さ10/jmのダ
イアフラム(2)が0.5 wr X 1.5 amの
大きさの長方形た形成されてあり、この上に410>方
向に細長いパタンのp−型拡散ビエゾ抵抗(3,4,5
゜6)が短い方の辺に中央部で垂直に交わるように2個
(3:R1と5:Rs)、長い方の辺の中央近くに示す
従来技術によるシリコンダイアフラム型上ンサと同様に
p+型拡散リすド部(7)を介して4個のAl端子(8
,9,10,11)に接続されていて全く同じ様な入出
力により圧力を検出する。(a) of the figure is a surface configuration diagram of the sensor chip, (b) is a cross-sectional view including the diaphragm part in the longitudinal direction of the sensor chip, (
c) is a sectional view including the diaphragm portion in a direction perpendicular to this. In the figure, the substrate is 1.5 mm x 40
mm n-type silicon single crystal substrate (1) with a thickness of 0
.. It is 4 pieces, the surface is (100) and the side is (110).
It is a surface. The diaphragm (2) with a thickness of 10/jm was etched from the back side with an alkaline etching solution such as a mixture of ethylenediamine, pyrocatechol, and water to form a diaphragm (2) with a size of 0.5 wr x 1.5 am. A rectangular shape is formed, and a p-type diffused viezo resistor (3, 4, 5
゜6) are perpendicularly intersecting at the center of the short side (3:R1 and 5:Rs), and the p+ Four Al terminals (8) are connected via the mold diffusion lid part (7).
, 9, 10, 11) and detect pressure using exactly the same input and output.
この場合、長方形のダイアフラムの辺に垂直ニ形成され
た2個のp−型拡散ピエゾ抵抗(R1、Rs )は、ダ
イアフラム上部からの圧力により抵抗にそつに方向の応
力を受は抵抗値を増大させ、逆に残土する。まな、これ
ら4つのp−型拡散ピエゾ抵抗を形成しである位置は応
力の線形性が高い領域である。In this case, the two p-type diffused piezoresistors (R1, Rs) formed perpendicularly to the sides of the rectangular diaphragm receive stress in the direction along the resistor due to pressure from the top of the diaphragm, which increases the resistance value. On the contrary, the soil is left behind. The positions where these four p-type diffused piezoresistors are formed are regions where the stress is highly linear.
(へ)発明の効果
以上述べなように、本発明の半導体圧力センサの構造に
すれば、カテーテルの先端等に装着出来る程に小型化を
行っても高感度なセンサを比較的容易に実現できること
になる。(F) Effects of the Invention As mentioned above, by using the structure of the semiconductor pressure sensor of the present invention, it is possible to relatively easily realize a highly sensitive sensor even if it is miniaturized to the extent that it can be attached to the tip of a catheter, etc. become.
表画面の簡単な説明
第1図は本発明の一実施例たる長方形状のダイアフラム
を有するシリコン・ダイアフラム型の圧力センサの構造
を示す図で、第2図は従来技術による正方形状のダイア
フラムを有するシリコン・ダイアフラム型の圧力センサ
の構造を示す図である。各々の図において、(a)はセ
ンサチップの表面構成図、(b)はセンサチップ長手方
向のダイアフラム部を含む断面図、同じ<(c)はこれ
と直交する方向のダイヤフラム部を含む断面図である。Brief explanation of the front screen Figure 1 is a diagram showing the structure of a silicon diaphragm type pressure sensor having a rectangular diaphragm, which is an embodiment of the present invention, and Figure 2 is a diagram showing the structure of a silicon diaphragm type pressure sensor having a square diaphragm according to the prior art. FIG. 3 is a diagram showing the structure of a silicon diaphragm type pressure sensor. In each figure, (a) is a surface configuration diagram of the sensor chip, (b) is a cross-sectional view including the diaphragm part in the longitudinal direction of the sensor chip, and (c) is a cross-sectional view including the diaphragm part in the direction orthogonal to this. It is.
In−型シリコン単結晶基板 2 ダイアフラム 3p−型拡散ピエゾ抵抗 (R1) 4 (Rg)〃 5 (Rs)〃 6 (R4)〃 7p十型拡散リ一ド部 8 A7端子(端子l)In-type silicon single crystal substrate 2 Diaphragm 3p-type diffused piezoresistor (R1) 4 (Rg) 5 (Rs)〃 6 (R4) 7p 10 type diffusion lead part 8 A7 terminal (terminal l)
Claims (1)
するダイアフラムを設け、そのダイアフラム部に感圧素
子としての拡散抵抗を形成してなる半導体圧力センサに
おいて、前記ダイアフラムの平面形状が真円及び正多角
形とは異なり、特定方向に長い形状であることを特徴と
する半導体圧力センサ(1) In a semiconductor pressure sensor in which a diaphragm that deforms depending on the atmosphere to be measured is provided in the center of a semiconductor crystal plate, and a diffused resistor as a pressure-sensitive element is formed in the diaphragm portion, the planar shape of the diaphragm is a perfect circle. A semiconductor pressure sensor that differs from a regular polygon in that it has a long shape in a specific direction.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2268685A JPS61181171A (en) | 1985-02-06 | 1985-02-06 | Semiconductor pressure sensor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2268685A JPS61181171A (en) | 1985-02-06 | 1985-02-06 | Semiconductor pressure sensor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61181171A true JPS61181171A (en) | 1986-08-13 |
Family
ID=12089750
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP2268685A Pending JPS61181171A (en) | 1985-02-06 | 1985-02-06 | Semiconductor pressure sensor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61181171A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0239574A (en) * | 1988-07-29 | 1990-02-08 | Nippon Denso Co Ltd | Semiconductor pressure sensor |
JP2006038049A (en) * | 2004-07-26 | 2006-02-09 | Nof Corp | Emergency shut-off method and device for gas outlet |
-
1985
- 1985-02-06 JP JP2268685A patent/JPS61181171A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0239574A (en) * | 1988-07-29 | 1990-02-08 | Nippon Denso Co Ltd | Semiconductor pressure sensor |
JP2006038049A (en) * | 2004-07-26 | 2006-02-09 | Nof Corp | Emergency shut-off method and device for gas outlet |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Samaun et al. | An IC piezoresistive pressure sensor for biomedical instrumentation | |
US5289721A (en) | Semiconductor pressure sensor | |
CA1078217A (en) | Force transducing cantilever beam and pressure transducer incorporating it | |
US5872315A (en) | Pressure detecting apparatus | |
US5081867A (en) | Semiconductor sensor | |
US3266303A (en) | Diffused layer transducers | |
US6595066B1 (en) | Stopped leadless differential sensor | |
JPH0425735A (en) | Semicondcutor diaphragm for measuring pressure and differential pressure | |
US10156489B2 (en) | Piezoresistive pressure sensor | |
JPH06213743A (en) | Semiconductor pressure sensor | |
US3161844A (en) | Semiconductor beam strain gauge | |
JPS61181171A (en) | Semiconductor pressure sensor | |
JPS59158566A (en) | Semiconductor acceleration sensor | |
US7021154B2 (en) | Force sensing element | |
JP2895262B2 (en) | Composite sensor | |
US4106349A (en) | Transducer structures for high pressure application | |
JP2516211B2 (en) | Semiconductor pressure sensor | |
JPH0648421Y2 (en) | Semiconductor acceleration sensor | |
JPH0419495B2 (en) | ||
JPS61222273A (en) | Semiconductor pressure transducer | |
CN212988661U (en) | MEMS pressure chip | |
JPH04247667A (en) | Semiconductor pressure sensor | |
JPH01114731A (en) | Semiconductor pressure transducer | |
JPS5924553B2 (en) | pressure sensor | |
JPH0259635B2 (en) |