JPS61178486U - - Google Patents

Info

Publication number
JPS61178486U
JPS61178486U JP6108885U JP6108885U JPS61178486U JP S61178486 U JPS61178486 U JP S61178486U JP 6108885 U JP6108885 U JP 6108885U JP 6108885 U JP6108885 U JP 6108885U JP S61178486 U JPS61178486 U JP S61178486U
Authority
JP
Japan
Prior art keywords
test board
test
attached
fixing
test head
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP6108885U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP6108885U priority Critical patent/JPS61178486U/ja
Publication of JPS61178486U publication Critical patent/JPS61178486U/ja
Pending legal-status Critical Current

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  • Testing Of Individual Semiconductor Devices (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例の分解斜視図、第2
図ないし第4図は同実施例の更に詳細な構成、作
用説明図である。 1……テストヘツド、2……テストボード、3
……押え枠、4……ロツク部、11,21……接
続端子、31……ロツク金具、42……レバー、
44……係止体。
Fig. 1 is an exploded perspective view of one embodiment of the present invention;
The figures to FIG. 4 are explanatory diagrams of the more detailed structure and operation of the same embodiment. 1...Test head, 2...Test board, 3
... Presser frame, 4 ... Lock part, 11, 21 ... Connection terminal, 31 ... Lock metal fitting, 42 ... Lever,
44...Locking body.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] テストヘツド1にテストボード2を固定する機
構であつて、テストヘツド1に取り付けられた接
続端子11とテストボード2に取り付けられた接
続端子21とを接続する機構において、押え枠3
でテストボード2の周辺を押え、前記テストヘツ
ドに固定されかつ前記押え枠を固定するためのロ
ツク部4のレバー42の一部に、往復動可能なテ
ーパ状の係止体44を設け、該係止体を前記押え
枠に取り付けられたロツク金具31に嵌合させて
前記テストボードをテストヘツドに固定すること
により、前記接続端子11,21どうしを接続さ
せる機構を設け、レバー42を引くことによつて
前記係止体を前記ロツク金具から外し、前記テス
トボードの取り外しが行なえる構成としたことを
特徴とするテストボード固定機構。
In the mechanism for fixing the test board 2 to the test head 1, which connects the connection terminal 11 attached to the test head 1 and the connection terminal 21 attached to the test board 2, the presser frame 3
A reciprocably movable tapered locking body 44 is provided on a part of the lever 42 of the locking portion 4 which is fixed to the test head and which fixes the holding frame. A mechanism is provided for connecting the connection terminals 11 and 21 by fitting the stopper into the lock fitting 31 attached to the presser frame and fixing the test board to the test head, and by pulling the lever 42. The test board fixing mechanism is characterized in that the test board can be removed by removing the locking body from the lock fitting.
JP6108885U 1985-04-25 1985-04-25 Pending JPS61178486U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP6108885U JPS61178486U (en) 1985-04-25 1985-04-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP6108885U JPS61178486U (en) 1985-04-25 1985-04-25

Publications (1)

Publication Number Publication Date
JPS61178486U true JPS61178486U (en) 1986-11-07

Family

ID=30589040

Family Applications (1)

Application Number Title Priority Date Filing Date
JP6108885U Pending JPS61178486U (en) 1985-04-25 1985-04-25

Country Status (1)

Country Link
JP (1) JPS61178486U (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6410641A (en) * 1987-07-02 1989-01-13 Tokyo Electron Ltd Ring insertion equipment
JPH01264235A (en) * 1987-12-23 1989-10-20 Tokyo Electron Ltd Wafer prober

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6410641A (en) * 1987-07-02 1989-01-13 Tokyo Electron Ltd Ring insertion equipment
JPH01264235A (en) * 1987-12-23 1989-10-20 Tokyo Electron Ltd Wafer prober

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