JPS61176456U - - Google Patents
Info
- Publication number
- JPS61176456U JPS61176456U JP6141685U JP6141685U JPS61176456U JP S61176456 U JPS61176456 U JP S61176456U JP 6141685 U JP6141685 U JP 6141685U JP 6141685 U JP6141685 U JP 6141685U JP S61176456 U JPS61176456 U JP S61176456U
- Authority
- JP
- Japan
- Prior art keywords
- plunger
- sleeve
- probe needle
- contact head
- slidable
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims 2
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6141685U JPS61176456U (de) | 1985-04-24 | 1985-04-24 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP6141685U JPS61176456U (de) | 1985-04-24 | 1985-04-24 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61176456U true JPS61176456U (de) | 1986-11-04 |
Family
ID=30589679
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP6141685U Pending JPS61176456U (de) | 1985-04-24 | 1985-04-24 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61176456U (de) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6224371U (de) * | 1985-07-26 | 1987-02-14 | ||
| WO2018163755A1 (ja) * | 2017-03-10 | 2018-09-13 | 山一電機株式会社 | ケルビン検査用端子の位置決め機構、および、それを備えるｉｃソケット |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5761566B2 (de) * | 1980-07-29 | 1982-12-24 | Kaneyama Kikai Kk | |
| JPS6038663A (ja) * | 1983-08-12 | 1985-02-28 | Hitachi Ltd | テスト用コンタクトピン |
-
1985
- 1985-04-24 JP JP6141685U patent/JPS61176456U/ja active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5761566B2 (de) * | 1980-07-29 | 1982-12-24 | Kaneyama Kikai Kk | |
| JPS6038663A (ja) * | 1983-08-12 | 1985-02-28 | Hitachi Ltd | テスト用コンタクトピン |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6224371U (de) * | 1985-07-26 | 1987-02-14 | ||
| WO2018163755A1 (ja) * | 2017-03-10 | 2018-09-13 | 山一電機株式会社 | ケルビン検査用端子の位置決め機構、および、それを備えるｉｃソケット |