JPS61173167A - Method for measuring resistance value of chip resistor - Google Patents

Abstract

PURPOSE:To make possible the continuous measurement of a resistance value at a high speed with a simple operation by constituting a measuring instrument of a contact point formed by holding a pair of thin conductive sheets having elasticity so as to face each other apart at a slight space provided therebetween on supporting bases. CONSTITUTION:A pair of the thin conductive sheets 3a, 3b having elasticity are held to face each other apart at the slight space provided therebetween on the supporting bases 4a, 4b and the resistance value of a chip resistor 1 is measured by pressing the lower surfaces of the electrode parts 2a, 2b at both terminals of the chip resistor 1 attracted to a vacuum attraction nozzle to a pair of the sheets 3a, 3b. Since the sheets 3a, 3b have the elasticity, the sheets are deflected when pressed to the resistor 1. The time for measuring the resistance value is substantially assured by such deflection. The continuous measurement of the resistance value at the high speed is made possible by the simple operation.

Description

DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a method for measuring the resistance value of a chip resistor that can be used to continuously measure the resistance value of a chip resistor at high speed.

2. Description of the Related Art A conventional method for measuring the resistance value of a chip resistor is as shown in FIG.
The resistance value of the chip resistor 1 is determined by transferring the resistor from above to the resistance value measurement position and applying the contacts e & 6b in the horizontal direction to the electrodes 2a and 2b at both ends of the chip resistor 1 at the resistance value measurement position. are being measured. After the resistance value measurement is completed, the chip resistor 1 escapes from the resistance value measurement position, and the next chip resistor comes to the resistance value measurement position. By repeating this operation, the resistance value measurement is continuously performed.

Problems to be Solved by the Invention However, in the conventional configuration, the structure is complicated because it requires modification of the mechanism for transferring the chip resistor 1 and a mechanism for moving the contacts.
In addition, the chip resistor 1 is transferred to the resistance value measurement position and the contact 6 is
Since the operation of measuring the resistance value after sandwiching between a and 6b and escaping is complicated, it is disadvantageous to continuously measure the resistance value at high speed.
It had the disadvantage that the rate was about 0.00 pieces/min. Also,
When the chip resistor 1 is transferred to the resistance value measurement position, there is a danger that the chip resistor 1 may be damaged because it comes into contact with the resistance value measurement position base, and this becomes more difficult at higher speeds. It also had the disadvantage of being moderately large.

The present invention solves the above-mentioned conventional problems, and enables continuous high-speed measurement of the resistance value of a chip resistor using a simple structure and simple operation of the chip resistor. be.

Means for Solving the Problems In order to achieve this object, the method for measuring the resistance value of a chip resistor of the present invention consists of holding a pair of elastic conductive thin plates facing each other on a support with a slight distance between them. Consists of contacts.

Function: With this configuration, the resistance value of a chip resistor can be measured continuously and at high speed by simply pressing the lower surfaces of the electrodes at both ends of the chip resistor upward onto a pair of conductive thin plates. It is something.

EXAMPLE An example of the present invention will be described below with reference to the drawings. As shown in FIG.
By applying the lower surfaces of the electrode parts 2a and 2b at both ends of the chip resistor 10, which are held facing each other on the vacuum suction nozzle 5, to the pair of conductive thin plates 3 and 3b, the resistance of the chip resistor 1 is reduced. Measure the value. Since the conductive thin plates 3a and 3b have elasticity, they deflect when the chip resistor 1 is applied to them, and the amount of deflection ensures a sufficient time for measuring the resistance value. After measuring the resistance value, the chip resistor 1 performs a simple operation of escaping upward.

Effects of the Invention As described above, the present invention measures the resistance value of a chip resistor continuously and at high speed by simply applying the chip resistor to a pair of elastic conductive thin plates from above. Resistance value measurement can be performed, and processing of 100 pieces/minute or more is also possible. In addition, it is not only economical because of its simple structure, but also because the conductive thin plate has polarity, there is no damage to the chip resistor's appearance when it is applied to it, and it also improves quality. It is very helpful.

[Brief explanation of drawings]

FIG. 1 is a front view showing a method for measuring the resistance value of a chip resistor according to an embodiment of the present invention, FIG. 2 is a perspective view thereof, and FIG. 3 is a perspective view showing a conventional method for measuring the resistance value of a chip resistor. It is. 1... Chip resistor, 2a/2b...
Chip resistor both ends electrode parts, 3 & 3b... Conductive thin plate, 4a, 4b... Support stand, 6...
・Vacuum suction nozzle. Name of agent: Patent attorney Toshio Nakao;
... 4ζ Soar 1 - Resistor 5... J1 Shiiki94 Nos) ν

Claims (1)

[Claims] A pair of conductive thin plates having elasticity are held facing each other on a support with a slight gap between them, and the electrode portions at both ends of a chip resistor having electrode portions at both ends are applied to the pair of conductive thin plates from above. A method for measuring a resistance value of a chip resistor, comprising: measuring the resistance value of the chip resistor.