JPS61152977U - - Google Patents
Info
- Publication number
- JPS61152977U JPS61152977U JP3659685U JP3659685U JPS61152977U JP S61152977 U JPS61152977 U JP S61152977U JP 3659685 U JP3659685 U JP 3659685U JP 3659685 U JP3659685 U JP 3659685U JP S61152977 U JPS61152977 U JP S61152977U
- Authority
- JP
- Japan
- Prior art keywords
- diode
- section
- inspection
- defective product
- jig
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000007689 inspection Methods 0.000 claims description 9
- 230000002950 deficient Effects 0.000 claims description 4
- 238000005259 measurement Methods 0.000 claims description 2
- 230000005284 excitation Effects 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3659685U JPH0413668Y2 (cs) | 1985-03-13 | 1985-03-13 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP3659685U JPH0413668Y2 (cs) | 1985-03-13 | 1985-03-13 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS61152977U true JPS61152977U (cs) | 1986-09-22 |
| JPH0413668Y2 JPH0413668Y2 (cs) | 1992-03-30 |
Family
ID=30541927
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP3659685U Expired JPH0413668Y2 (cs) | 1985-03-13 | 1985-03-13 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0413668Y2 (cs) |
-
1985
- 1985-03-13 JP JP3659685U patent/JPH0413668Y2/ja not_active Expired
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0413668Y2 (cs) | 1992-03-30 |