JPS61148508A - Control system abnormality device - Google Patents

Control system abnormality device

Info

Publication number
JPS61148508A
JPS61148508A JP59270218A JP27021884A JPS61148508A JP S61148508 A JPS61148508 A JP S61148508A JP 59270218 A JP59270218 A JP 59270218A JP 27021884 A JP27021884 A JP 27021884A JP S61148508 A JPS61148508 A JP S61148508A
Authority
JP
Japan
Prior art keywords
control system
signal
test signal
control
error area
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59270218A
Other languages
Japanese (ja)
Inventor
Yasunobu Hayama
葉山　安信
Sadamu Terado
寺戸　定
Mitsuhiro Abe
阿部　光博
Makoto Watanabe
誠 渡辺
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Heavy Industries Ltd
Original Assignee
Mitsubishi Heavy Industries Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Heavy Industries Ltd filed Critical Mitsubishi Heavy Industries Ltd
Priority to JP59270218A priority Critical patent/JPS61148508A/en
Publication of JPS61148508A publication Critical patent/JPS61148508A/en
Pending legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G05—CONTROLLING; REGULATING
    • G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
    • G05B23/00—Testing or monitoring of control systems or parts thereof
    • G05B23/02—Electric testing or monitoring
    • G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
    • G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
    • G05B23/0224—Process history based detection method, e.g. whereby history implies the availability of large amounts of data
    • G05B23/0227—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions
    • G05B23/0235—Qualitative history assessment, whereby the type of data acted upon, e.g. waveforms, images or patterns, is not relevant, e.g. rule based assessment; if-then decisions based on a comparison with predetermined threshold or range, e.g. "classical methods", carried out during normal operation; threshold adaptation or choice; when or how to compare with the threshold

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Automation & Control Theory (AREA)
  • Testing And Monitoring For Control Systems (AREA)

Abstract

PURPOSE:To always detect an abnormality with high sensitivity by integrating the absolute value of a control deviation, calculating an error area of a test signal and a feedback signal, and deciding that a control system is abnormal, in case a result of the operation has exceeded the allowable range. CONSTITUTION:In a position control system 21, in response to a stepwise test signal Xt, a feedback Y and a control deviation signal E are outputted. The control deviation value E which is brought to sampling by a sample holding circuit 22b and is digitized through an A/D converter 22c is calculated by an operating part 22d, and an error area Zs of the test signal Xt and the feedback signal Y is calculated. In such a case, it can be decided that the smaller this error area Zs is, the higher the accuracy of the control system 21 is. It is decided by the next deciding part 22e, and in case it is not below the allowable range S, ''control system abnormal'' is decided and displayed on a display part 22f.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 この発明は、例えば油圧制御系の異常動作及び故障等を
高感度に検出する制御系異常検出装置に関するｅ 〔従来の技術〕 従来よシ、例えば油圧制御系における制御弁の故障及び
油漏れ等の異常を検出するには、第５図に示すような異
常検出装置１１が使用される。この異常検出装置１１は
、制御系１２０制御目標値Ｘを入力し、制御系モデル１
３釦よって制御系１２の出力予測値Ｙ１を算出し、この
予測値Ｙ１と実際の制御系１２の出力値Ｙとから制御偏
差Ｅ（＝Ｙ、−Ｙ）を求める。次に、異常判定装置１４
によって上記制御偏差Ｅが予め設定される偏差許容範囲
内であるか否かを調べ、制御偏差Ｅが許容範囲を逸脱す
るとき、制御系１２は異常であると判定して表示装置１
５にこれを表示するものである。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a control system abnormality detection device that detects, for example, abnormal operation and failure of a hydraulic control system with high sensitivity. For example, to detect abnormalities such as control valve failures and oil leaks in a hydraulic control system, an abnormality detection device 11 as shown in FIG. 5 is used. This abnormality detection device 11 inputs the control target value X of the control system 120 and controls the control system model 1.
3 button to calculate the predicted output value Y1 of the control system 12, and calculate the control deviation E (=Y, -Y) from this predicted value Y1 and the actual output value Y of the control system 12. Next, the abnormality determination device 14
It is checked whether the control deviation E is within a preset allowable deviation range or not, and when the control deviation E deviates from the allowable range, the control system 12 determines that there is an abnormality and displays the display device 1.
This is displayed in 5.

すなわち、この異常検出装置１１は、制御系モデル１３
と実際の制御系１２とにそれぞれ実時間で同じ入力信号
を与え、その時の出力信号の差を検出することにより、
制御系１２の異常を検出するものでおる。尚、上記のよ
うな演算及び判定等は、通常ディノタルコンピュータで
処理される。That is, this abnormality detection device 11 uses the control system model 13
By applying the same input signal to the control system 12 and the actual control system 12 in real time, and detecting the difference between the output signals at that time,
This is to detect an abnormality in the control system 12. Incidentally, the above-mentioned calculations and judgments are normally processed by a dinotal computer.

ところで、上記のような従来の制御系異常検出装置では
、制御系モデル１３の精度によって検出感度が左右され
ることになる。すなわち、制御系モデル１３の特性と実
際の制御系１２の特性との誤差が大きいと、正常時にお
いても制御偏差Ｅが大きくなるため誤診断を行なう恐れ
がある。By the way, in the conventional control system abnormality detection device as described above, the detection sensitivity is influenced by the accuracy of the control system model 13. That is, if the error between the characteristics of the control system model 13 and the actual characteristics of the control system 12 is large, the control deviation E will be large even in normal conditions, and there is a risk of erroneous diagnosis.

一般に制御系は、微分方程式でモデル化されるが、モデ
ルの精度を高めるためには微分方程式の次数を上げる必
要がある。一方、微分方程式の次数を上げると計算が複
雑になり、これをディノタルコンピュータで演算する場
合には演算時間が長くなる。したがって、油圧制御系の
ように数１０　Ｈｚ〜数１００　Ｈｚの高速応答性を有
する制御系にこの装置を適用するには、演算時間が長時
間となるため制御系モデル１３を簡略化せざるを得ない
。Control systems are generally modeled using differential equations, but in order to improve the accuracy of the model, it is necessary to increase the order of the differential equations. On the other hand, as the order of the differential equation increases, the calculation becomes more complicated, and the calculation time becomes longer when the calculation is performed using a dinotal computer. Therefore, in order to apply this device to a control system that has a high-speed response of several tens to several hundreds of Hz, such as a hydraulic control system, the control system model 13 must be simplified because the calculation time will be long. I don't get it.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

ところが、この制御系モデル１３を簡略化すると、前述
したように正常時においても制御偏差Ｅが大きくなり、
誤診断する恐れがあるので、異常判定装置１４の許容値
を大きく設定する必要がある。しかしながら、この場合
、制御系の重故障のように制御偏差Ｅが非常に大きいと
きには検出可能であるが、劣化や軽故障のようく制御偏
差Ｅが小さいときには検出不可能であり、検出感度に問
題が生じてしまうととくなる。However, if this control system model 13 is simplified, the control deviation E becomes large even in normal conditions, as described above.
Since there is a risk of misdiagnosis, it is necessary to set a large tolerance value for the abnormality determination device 14. However, in this case, it is possible to detect when the control deviation E is very large, such as a serious failure in the control system, but it is impossible to detect when the control deviation E is small, such as when deterioration or a minor failure occurs, and there is a problem with detection sensitivity. If this occurs, it becomes .

この発明は上記のような問題を改善するためになされた
もので、制御系の劣化や故障の程度によらず、常に感度
良く異常を検出することのできる制御系異常検出装置を
提供することを目的とする。This invention was made in order to improve the above-mentioned problems, and aims to provide a control system abnormality detection device that can always detect abnormalities with high sensitivity regardless of the degree of deterioration or failure of the control system. purpose.

〔問題点を解決するための手段及び作用〕すなわちこの
発明に係る制御系異常検出装置は、制御系診断用のステ
、グ状のテスト信号を発生するテスト信号発生部と、こ
のテスト信号を上記制御系に与えそのフィートノ々、り
信号との差を検出する制御偏差検出手段と、この制御偏
差の絶対値を積算し上記テスト信号とフィーＦパック信
号との誤差面積を算出する演算部と、この演算結果が許
容範囲以下であるか否かを判定する判定部とを具備し、
この判定部により上記演算結果が許容範囲を上回ったと
判定された場合には、上記制御系を異常として判断する
ものである。[Means and operations for solving the problem] That is, the control system abnormality detection device according to the present invention includes a test signal generating section that generates a step-shaped test signal for control system diagnosis, and a test signal generating section that generates a step-shaped test signal for control system diagnosis. a control deviation detection means for detecting the difference between the foot signal applied to the control system; and a calculation section for calculating the error area between the test signal and the fee F pack signal by integrating the absolute value of the control deviation. and a determination unit that determines whether the calculation result is below the allowable range,
If the determination unit determines that the calculation result exceeds the allowable range, the control system is determined to be abnormal.

〔実施例〕〔Example〕

以下、第１図乃至第４図を参照してこの発明の一実施例
を詳細に説明する。Hereinafter, one embodiment of the present invention will be described in detail with reference to FIGS. 1 to 4.

第１図はこの発明に係る制御系異常検出装置を位置制御
油圧サーが系に適用する場合の構成を示すもので、２１
は位置制御系、２２は異常検出装置である。FIG. 1 shows a configuration in which the control system abnormality detection device according to the present invention is applied to a position control hydraulic system.
2 is a position control system, and 22 is an abnormality detection device.

まず、上記位置制御系２１は、目標値Ｘとフィードバッ
ク値Ｙとの制御偏差Ｅを演算器２１ｈで求めた後これを
増幅器２１ｂで増幅し、この増幅信号に応じて電気油圧
サー？弁２１ｃの開度を制御し、この開度に応じた油を
流入及び流出することＫよって油圧シリンダ及び負荷２
１ｄを駆動する。また、位置検出器２１ｅで油圧シリン
ダの位置を検出し、フィードバック値Ｙとして負帰還す
ることにより、目標値Ｘとフィードバック値Ｙとが一致
するように制御する。First, the position control system 21 calculates the control deviation E between the target value X and the feedback value Y using the arithmetic unit 21h, amplifies it using the amplifier 21b, and selects an electro-hydraulic sensor according to this amplified signal. By controlling the opening degree of the valve 21c and allowing oil to flow in and out according to this opening degree, the hydraulic cylinder and the load 2
Drive 1d. Further, the position of the hydraulic cylinder is detected by the position detector 21e, and negative feedback is provided as the feedback value Y, thereby controlling the target value X and the feedback value Y to match.

また、上記異常検出装置２２は、テスト許可信号２が供
給されること釦より所定のテスト信号Ｘｔを発生するテ
スト信号発生部２２１と、テスト信号Ｘｔをトリが信号
として上記制御偏差Ｅを定められた時間間隔Δｔで所定
期間Ｔだけサンプリング及びホールドするサンプルホー
ルド回路２２ｂと、このサンプルホールド回路２２ｂと
同期してアナログの制御側差信−！！Ｅをディジタル信
号に変換量るアナログ・ディジタル（以下いと記す）変
換器２２ｃと、このＡ／を変換器２２ｃを介してディジ
タル信号に変換された制御偏差信号Ｅの絶対値を上記所
定期間において積算する演算部２２ｄと、この演算部２
２ｄによる演算値２．が予め設定される許容範囲Ｓ以下
にあるか否かにより制御系２１が異常であるか否かの判
定を行なう判定部２２ｅと、この判定結果を表示する表
示部２２１とから構成されるものである。The abnormality detection device 22 also includes a test signal generation section 221 that generates a predetermined test signal Xt from a button when the test permission signal 2 is supplied, and a test signal generation section 221 that generates a predetermined test signal Xt using the test signal Xt as a signal to determine the control deviation E. A sample hold circuit 22b samples and holds the sample for a predetermined period T at time intervals Δt, and an analog control-side differential signal is synchronized with the sample hold circuit 22b. ! An analog-to-digital (hereinafter referred to as "A") converter 22c converts E into a digital signal, and the absolute value of the control deviation signal E converted into a digital signal via the converter 22c is integrated over the predetermined period. The calculation unit 22d and the calculation unit 2
Calculated value 2 by 2d. It is comprised of a determination section 22e that determines whether or not the control system 21 is abnormal based on whether or not it is below a preset tolerance range S, and a display section 221 that displays the determination result. be.

以下、上記のように構成した異常検出装置２２の動作に
ついて説明する。The operation of the abnormality detection device 22 configured as described above will be explained below.

まず、制御系がテスト可能な状態５であるときに、テス
ト許可信号２をテスト信号発生部２２ｇに与えると、こ
のテスト信号発生部２２１は第２図（ａ）に示すような
ステップ状のテスト信号Ｘｔを発生する。このテスト信
号Ｘｔは、その振幅及び周期が予め設定されており、位
置制御系２１の目標値Ｘに並列に入力される。この位置
制御系２ノでは、ステ、デ状のテスト信号Ｘｔに応答し
て、第２図（ｂ）および（ｃ）に示すようなフィードバ
ック信号Ｙおよび制御偏差信号Ｅを出力するようになる
。First, when the control system is in the testable state 5, when the test permission signal 2 is given to the test signal generator 22g, the test signal generator 221 performs a step-like test as shown in FIG. 2(a). A signal Xt is generated. This test signal Xt has its amplitude and period set in advance, and is input in parallel to the target value X of the position control system 21. The position control system 2 outputs a feedback signal Y and a control deviation signal E as shown in FIGS. 2(b) and 2(c) in response to the step and de-shaped test signals Xt.

また、異常検出装置２２では、テスト信号Ｘｔがトリが
信号となりてサンプルホールド回路２２ｂが所定の周期
Δｔで制御偏差Ｅのサンプリングを開始すると共忙、〜
重置換器２２ｅでディノタル信号に変換する。ここで、
上記サングルホールド回路２２ｂによるサンプリング周
期Δｔは、制御系２１の時定数と比較して充分小さい値
、例えば１／１０〜１１５０程度に設定し、また、その
サンプリング時間Ｔは、上記サンプリング周期Δｔの場
合とは逆に、制御系２１の時定数と比較して充分大きな
値、例えば５〜１０倍程度に設定する。これにより、上
記制御偏差信号Ｅの波形は精度良く、しかも定常状態に
達するまで確実にサンプリングされるようになる。In addition, in the abnormality detection device 22, when the test signal Xt becomes a signal and the sample hold circuit 22b starts sampling the control deviation E at a predetermined period Δt, the abnormality detection device 22 is busy.
The multiple transducer 22e converts it into a dinotal signal. here,
The sampling period Δt by the sample hold circuit 22b is set to a value sufficiently small compared to the time constant of the control system 21, for example, about 1/10 to 1150, and the sampling time T is On the contrary, it is set to a sufficiently large value compared to the time constant of the control system 21, for example, about 5 to 10 times. As a result, the waveform of the control deviation signal E can be sampled accurately and reliably until a steady state is reached.

この後、上記サンプルホールド回路２２ｂによりサンプ
リングされψ変換器２２ｃを介してディノタル化された
制御偏差値Ｅを、演算部２２（１により下式に従って演
算し、上記テスト信号Ｘｔとフィードパ、り信号Ｙとの
誤差面積２、を算出する。Thereafter, the control deviation value E sampled by the sample hold circuit 22b and dinotated via the ψ converter 22c is calculated by the calculation unit 22 (1) according to the following formula, Calculate the error area 2.

２：誤差面積 ｎ：データ数（Ｔ／Ｊｔ） Ｅ（１）　：制御偏差値 ここで、上記誤差面積２．は、制御系２１に与えたテス
ト信号Ｘｔと、このテスト信号Ｘｔを与えたことにより
得られるフィードパ、り信号Ｙとのずれを定量的忙表わ
すもので、この誤差面積２、が小さいほど上記制御系２
１の精度は高い本のと判断できる。これにより、上記誤
差面積２、が予め設定される許容範囲Ｓ以内であるか否
かを、次の判定部２２＠によりて判定し、許容範囲Ｓ以
下でない場合には「制御系異常」と判定し表示部２２１
に表示されるようになる。2: Error area n: Number of data (T/Jt) E(1): Control deviation value Here, the error area 2. is a quantitative representation of the deviation between the test signal Xt given to the control system 21 and the feed signal Y obtained by giving this test signal Xt, and the smaller this error area 2, the better the above control System 2
The accuracy of 1 can be judged as a high book. Thereby, the next determination unit 22@ determines whether or not the error area 2 is within the preset tolerance range S, and if it is not within the tolerance range S, it is determined that there is a "control system abnormality". Display section 221
will be displayed.

つまり、例えば第３図（ａ）に示すように、極めて正常
な状態に近いフィードパ、り信号ＹをＹ、とするテスト
信号Ｘｔとの誤差面積ｚ３を２゜とすると、制御系２ノ
の応答が劣化し、第３図（ｂ）および（ｃ）で示すよう
なフィードパ、り信号Ｙ、、Ｙ、が出力される場合には
、これに伴なってその誤差面積２．も２．．２．という
ように必然的に増加する。また、例えば第４図（ＩＡ）
乃至（ｃ）に示すように、制御系２ノのフィードバック
信号Ｙが正常な応答状態Ｙ□から不安定な応答状態Ｙ、
、Ｙ、に変化した場合でも、上記テスト信号Ｘｔとの誤
差面積２．は２．．２．というように必然的に増加する
ものである。In other words, for example, as shown in FIG. 3(a), if the error area z3 between the feed signal Y, which is in an extremely normal state, and the test signal Xt is 2 degrees, then the response of the control system 2 is 3 (b) and (c) are output, the error area 2. Also 2. ．． 2. As such, it will inevitably increase. Also, for example, Fig. 4 (IA)
As shown in (c), the feedback signal Y of the control system 2 changes from a normal response state Y□ to an unstable response state Y,
, Y, the error area with the test signal Xt is 2. is 2. ．． 2. As such, it will inevitably increase.

＜）たがりて、上記のように構成される異常検出装置に
よれば、判定部２２６によって上記誤差面積２．が許容
範囲Ｓ以下であるか否かを監視し、許容範囲Ｓを越えた
場合には表示部２２ｆにより異常表示を行なうよ５Ｋｔ
、たので、上記許容範囲Ｓの設定如何くよシ制御系の軽
微な故障や劣化等も検出することができ、前記第５図に
おける従来例による場合と比較して極めて高感度な異常
検出が可能となる。<) Therefore, according to the abnormality detection device configured as described above, the determination unit 226 determines the error area 2. It monitors whether or not it is below the allowable range S, and if it exceeds the allowable range S, an abnormality is displayed on the display section 22f.
Therefore, depending on the setting of the above-mentioned tolerance range S, even minor failures and deterioration of the control system can be detected, and abnormality detection can be performed with extremely high sensitivity compared to the conventional example shown in FIG. It becomes possible.

尚、上記実施例では図示していないが、誤差面積２．の
経時変化を記録することにより、制御系劣化の進行状況
を知ることも可能である。Although not shown in the above embodiment, the error area 2. By recording changes over time, it is also possible to know the progress of control system deterioration.

〔発明の効果〕〔Effect of the invention〕

以上のようＫこの発明によれば、制御系診断用のステ、
グ状のテスト信号を発生するテスト信号発生部と、この
テスト信号を上記制御系に与えその７４−ドパ、り信号
との差を検出する制御偏差検出手段と、この制御偏差の
絶対値を積算し上記テスト信号とフィード・臂ツク信号
との誤差面積を算出する演算部と、この演算結果ボ１容
範囲以下であるか否かを判定する判定部とを具備し、こ
の判定部によシ上記演算結果が許容範囲を上回ったと判
定された場合には、上記制御系を異常として判断するよ
うにしたので、制御系の劣化や故障の程度によらず、常
に感度良く異常を検出することのできる制御系異常検出
装置を提供できる。As described above, according to the present invention, a control system diagnostic station,
a test signal generating section that generates a test signal in the form of a 74-dopa signal, a control deviation detection means that applies this test signal to the control system and detects the difference between it and the 74-dopa signal, and detects the absolute value of this control deviation. It is equipped with an arithmetic unit that integrates and calculates the error area between the test signal and the feed/waist signal, and a determination unit that determines whether or not the result of this calculation is less than or equal to one volume range. If it is determined that the above calculation result exceeds the allowable range, the control system is determined to be abnormal, so abnormalities can always be detected with high sensitivity regardless of the degree of deterioration or failure of the control system. It is possible to provide a control system abnormality detection device that can perform the following functions.

【図面の簡単な説明】[Brief explanation of the drawing]

第１図はこの発明の一実施９１に係る制御系異常検出装
置を示すプロ、り構成図、第２図乃至第４図はそれぞれ
上記実施例の動作を説明する九めの波形図、第５図は従
来の制御系異常検出装置を示すｆ口、り構成図である。 ２１・・・位置制御系、２２・・・異常検出装置、２２
　ｍ　＝テスト信号発生部、２２ｂ・・・サンプルホー
ルド回路、２２ｃ・・・しΦ変換器、２２ｄ・・・演算
部、２２・・・・判定部、２２１・・・表示部、Ｘ・・
・目標値、Ｙ・・・フィード・々、り信号１．Ｅ、・・
・制御偏差信号、２・・・テスト許可信号、Ｘｔ・・・
テスト信号、ｚ、・・・誤差面積。 第３図 Ｙｌ ｓ５図 １フFIG. 1 is a block diagram showing a control system abnormality detection device according to a 91st embodiment of the present invention, FIGS. 2 to 4 are ninth waveform diagrams illustrating the operation of the above embodiment, and FIG. The figure is a block diagram showing a conventional control system abnormality detection device. 21... Position control system, 22... Abnormality detection device, 22
m = test signal generation section, 22b... sample hold circuit, 22c... Φ converter, 22d... calculation section, 22... judgment section, 221... display section, X...
・Target value, Y...feed, signal 1. E...
・Control deviation signal, 2...Test permission signal, Xt...
Test signal, z, ... error area. Figure 3 Yl s5 Figure 1 F

Claims (1)

【特許請求の範囲】[Claims] 制御系診断用のステップ状のテスト信号を発生するテス
ト信号発生部と、このテスト信号を上記制御系に与えそ
のフィードバック信号との差を検出する制御偏差検出手
段と、この制御偏差の絶対値を積算し上記テスト信号と
フィードバック信号との誤差面積を算出する演算部と、
この演算結果が許容範囲以下であるか否かを判定する判
定部とを具備したことを特徴とする制御系異常検出装置
。A test signal generation section that generates a step-like test signal for control system diagnosis, a control deviation detection means that applies this test signal to the control system and detects the difference with the feedback signal, and a control deviation detection means that detects the absolute value of this control deviation. an arithmetic unit that integrates and calculates the error area between the test signal and the feedback signal;
A control system abnormality detection device comprising: a determination unit that determines whether the calculation result is below an allowable range.
JP59270218A 1984-12-21 1984-12-21 Control system abnormality device Pending JPS61148508A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59270218A JPS61148508A (en) 1984-12-21 1984-12-21 Control system abnormality device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59270218A JPS61148508A (en) 1984-12-21 1984-12-21 Control system abnormality device

Publications (1)

Publication Number Publication Date
JPS61148508A true JPS61148508A (en) 1986-07-07

Family

ID=17483184

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59270218A Pending JPS61148508A (en) 1984-12-21 1984-12-21 Control system abnormality device

Country Status (1)

Country Link
JP (1) JPS61148508A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0482216U (en) * 1990-11-28 1992-07-17

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0482216U (en) * 1990-11-28 1992-07-17

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