JPS61139456U - - Google Patents
Info
- Publication number
- JPS61139456U JPS61139456U JP2136285U JP2136285U JPS61139456U JP S61139456 U JPS61139456 U JP S61139456U JP 2136285 U JP2136285 U JP 2136285U JP 2136285 U JP2136285 U JP 2136285U JP S61139456 U JPS61139456 U JP S61139456U
- Authority
- JP
- Japan
- Prior art keywords
- ray diffraction
- sample
- move
- setting jig
- satisfies
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000002441 X-ray diffraction Methods 0.000 claims description 4
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Sampling And Sample Adjustment (AREA)
Description
第１図は本考案のセツテイング治具の平面図を
示す。第２図、第３図は本考案のセツテイング治
具の側面図及び斜視図を示す。第４図は本考案の
セツテイング治具を用いて試料をセツテイングし
た状態を示す図である。
図中、Ａ……試料のＸ線回折面となる面、Ｂ…
…セツテイング治具を固定セツトするガイド溝、
１……本考案のセツテイング治具、２……Ｚ軸回
転台、３……Ｘ軸移動台、４……Ｙ軸移動台、５
……Ｚ軸移動台、６……面内回転台、７……試料
。
FIG. 1 shows a plan view of the setting jig of the present invention. 2 and 3 show a side view and a perspective view of the setting jig of the present invention. FIG. 4 is a diagram showing a state in which a sample is set using the setting jig of the present invention. In the figure, A...the surface that becomes the X-ray diffraction surface of the sample, B...
...Guide groove for fixedly setting the setting jig,
1... Setting jig of the present invention, 2... Z-axis rotary table, 3... X-axis moving table, 4... Y-axis moving table, 5
... Z-axis moving table, 6 ... In-plane rotating table, 7 ... Sample.
Claims (1)
転出来る連続移動式Ｘ線回折用試料台に、試料が
Ｘ線回折条件を満足する位置に設定出来るような
円筒状で中心部に位置決め板を備えたＸ線回折用
試料セツテイング治具、 A continuously movable X-ray diffraction sample stage that can move in the X- and Y-axis directions and move and rotate in the Z-axis direction has a cylindrical positioning plate in the center that allows the sample to be set at a position that satisfies the X-ray diffraction conditions. X-ray diffraction sample setting jig equipped with
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2136285U JPS61139456U (en) | 1985-02-19 | 1985-02-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2136285U JPS61139456U (en) | 1985-02-19 | 1985-02-19 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61139456U true JPS61139456U (en) | 1986-08-29 |
Family
ID=30512685
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2136285U Pending JPS61139456U (en) | 1985-02-19 | 1985-02-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61139456U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63118550U (en) * | 1987-01-27 | 1988-08-01 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52143095A (en) * | 1976-05-24 | 1977-11-29 | Rigaku Denki Co Ltd | Device for setting xxray diffraction specimen |
-
1985
- 1985-02-19 JP JP2136285U patent/JPS61139456U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS52143095A (en) * | 1976-05-24 | 1977-11-29 | Rigaku Denki Co Ltd | Device for setting xxray diffraction specimen |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63118550U (en) * | 1987-01-27 | 1988-08-01 |