JPS61129166U - - Google Patents
Info
- Publication number
- JPS61129166U JPS61129166U JP1117885U JP1117885U JPS61129166U JP S61129166 U JPS61129166 U JP S61129166U JP 1117885 U JP1117885 U JP 1117885U JP 1117885 U JP1117885 U JP 1117885U JP S61129166 U JPS61129166 U JP S61129166U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- tip
- contact
- proximal
- board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 14
- 238000007689 inspection Methods 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1117885U JPS61129166U (pt) | 1985-01-31 | 1985-01-31 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1117885U JPS61129166U (pt) | 1985-01-31 | 1985-01-31 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS61129166U true JPS61129166U (pt) | 1986-08-13 |
Family
ID=30493057
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1117885U Pending JPS61129166U (pt) | 1985-01-31 | 1985-01-31 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS61129166U (pt) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100455097B1 (ko) * | 2000-09-13 | 2004-11-08 | 니덱-리드 가부시키가이샤 | 기판 검사용 검사지그 및 그 검사지그를 구비한 기판검사장치 |
JP2019074483A (ja) * | 2017-10-19 | 2019-05-16 | 株式会社日本マイクロニクス | 電気的接続装置 |
-
1985
- 1985-01-31 JP JP1117885U patent/JPS61129166U/ja active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100455097B1 (ko) * | 2000-09-13 | 2004-11-08 | 니덱-리드 가부시키가이샤 | 기판 검사용 검사지그 및 그 검사지그를 구비한 기판검사장치 |
JP2019074483A (ja) * | 2017-10-19 | 2019-05-16 | 株式会社日本マイクロニクス | 電気的接続装置 |
US11249109B2 (en) | 2017-10-19 | 2022-02-15 | Kabushiki Kaisha Nihon Micronics | Electric connection device |