JPS61128833U - - Google Patents
Info
- Publication number
- JPS61128833U JPS61128833U JP1985004359U JP435985U JPS61128833U JP S61128833 U JPS61128833 U JP S61128833U JP 1985004359 U JP1985004359 U JP 1985004359U JP 435985 U JP435985 U JP 435985U JP S61128833 U JPS61128833 U JP S61128833U
- Authority
- JP
- Japan
- Prior art keywords
- signal
- delay
- signal delay
- conductor
- delay element
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004020 conductor Substances 0.000 claims description 3
- 238000010586 diagram Methods 0.000 description 2
Landscapes
- Pulse Circuits (AREA)
- Networks Using Active Elements (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985004359U JPS61128833U (enEXAMPLES) | 1985-01-17 | 1985-01-17 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1985004359U JPS61128833U (enEXAMPLES) | 1985-01-17 | 1985-01-17 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61128833U true JPS61128833U (enEXAMPLES) | 1986-08-12 |
Family
ID=30479852
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1985004359U Pending JPS61128833U (enEXAMPLES) | 1985-01-17 | 1985-01-17 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61128833U (enEXAMPLES) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01109918A (ja) * | 1987-10-23 | 1989-04-26 | Nec Corp | 遅延回路 |
| WO2001093423A1 (en) * | 2000-05-30 | 2001-12-06 | Advantest Corporation | Variable delay circuit and semiconductor circuit test device |
-
1985
- 1985-01-17 JP JP1985004359U patent/JPS61128833U/ja active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH01109918A (ja) * | 1987-10-23 | 1989-04-26 | Nec Corp | 遅延回路 |
| WO2001093423A1 (en) * | 2000-05-30 | 2001-12-06 | Advantest Corporation | Variable delay circuit and semiconductor circuit test device |