JPS61120455A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS61120455A
JPS61120455A JP24064284A JP24064284A JPS61120455A JP S61120455 A JPS61120455 A JP S61120455A JP 24064284 A JP24064284 A JP 24064284A JP 24064284 A JP24064284 A JP 24064284A JP S61120455 A JPS61120455 A JP S61120455A
Authority
JP
Japan
Prior art keywords
light
substrate
signal processing
chips
elements
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24064284A
Other languages
Japanese (ja)
Inventor
Haruhisa Ando
安藤 治久
Mitsuhiro Mori
森 光廣
Shinya Oba
大場 信弥
Hitoshi Matsushima
整 松島
Masakazu Ejiri
江尻 正員
Kenji Maio
健二 麻殖生
Hirotada Ueda
博唯 上田
Kenji Kaneko
金子 憲二
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP24064284A priority Critical patent/JPS61120455A/en
Publication of JPS61120455A publication Critical patent/JPS61120455A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/12Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto
    • H01L31/16Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof structurally associated with, e.g. formed in or on a common substrate with, one or more electric light sources, e.g. electroluminescent light sources, and electrically or optically coupled thereto the semiconductor device sensitive to radiation being controlled by the light source or sources
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/58Structural electrical arrangements for semiconductor devices not otherwise provided for, e.g. in combination with batteries
    • H01L23/60Protection against electrostatic charges or discharges, e.g. Faraday shields
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Electromagnetism (AREA)
  • Led Devices (AREA)
  • Photo Coupler, Interrupter, Optical-To-Optical Conversion Devices (AREA)

Abstract

PURPOSE:To absorb heat efficiently, by performing signal transmission among several laminated chips, by light, improving signal processing efficiency, using a metal body as a light guide, and using the metal body as an electrostatic shield at the same time. CONSTITUTION:Light emitting elements 3 and 5 on an Si substrate 1 convert the signals from signal processing circuits 2 and 4 into light and emit the light downward from the substrate 1. The lower parts of the elements 3 and 5 are made thin so that the light is readily transmitted. The light passed through holes 7 and 8 of an Al plate 6 is converted into electricity by elements 11 and 13 in a substrate 9. The signals are inputted to signal processing circuits. The light emitting elements 3 and 5 are formed from III-V group compound semiconductor by an MBE method and the like. The substrate 1, 6 and 9 are machine and aligned with the substrates 1 and 9 being operated. The substrates are bonded by a resin. In this constitution, the chips can be connected in multiple stages, signal processing efficiency is excellent, the chips are electrically isolated, induction due to noises generated in the elements is not yielded, highly reliable data transmission can be performed, the metal plate also serves as role of electrostatic shielding, and heat can be absorbed excellently.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は、ウニ−ハスケーブル−インテグレーションに
関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to sea urchin hub cable integration.

〔発明の背景〕[Background of the invention]

LSIチップに含まれる多数のバンドから、セラミック
基板に配線するために、■EEE、 、Trans。
■EEE, Trans.

on、 Components、 HyBrids、 
and MannfacturingTechnolo
gy、 vol、 CHMT−6,扁2. ’rNNE
 19830図14に示すように、セラミック基板内に
配線を形成する方法が提案されている。この方法は、チ
ップの大型化に伴ない利用され始める技術であるが、二
次元平面でチップ間配線を行なうので、回路スピードの
点で制限を受ける。
on, Components, HyBrids,
and Mannfactoring Technology
gy, vol, CHMT-6, Bian 2. 'rNNE
19830 As shown in FIG. 14, a method of forming wiring within a ceramic substrate has been proposed. This method is a technology that is beginning to be used as chips become larger, but since inter-chip wiring is performed on a two-dimensional plane, it is limited in terms of circuit speed.

〔発明の目的〕[Purpose of the invention]

本発明は、LSIチップ(あるいはウェーハ)間の情報
伝達を垂直方向に行なわせることによシ、信号処理効率
を向上させるものである。
The present invention improves signal processing efficiency by vertically transmitting information between LSI chips (or wafers).

〔発明の概要〕[Summary of the invention]

重ね合わせたLSIチップ(あるいはウェーハ)間の接
続を電気的に行なわせる場合、多数の配線束を均一にバ
ンドと接続することを、機械的に難しい。また、テップ
(ウェーハ)で発生する熱を逃す為には、チップ間に介
在する物質は金属であることが望ましい。−万、チップ
(ウェーハ)間の通信に光を用いれば、上記の問題を一
挙に教法することができる。
When electrical connections are made between stacked LSI chips (or wafers), it is mechanically difficult to uniformly connect a large number of wiring bundles to bands. Furthermore, in order to release the heat generated by the chips (wafers), it is desirable that the material interposed between the chips be metal. - If light is used for communication between chips (wafers), the above problems can be solved all at once.

〔発明の実施例〕[Embodiments of the invention]

以下、本発明の実施例を第1図を用いて説明する。同図
は、素子の断面図を示しである。
Embodiments of the present invention will be described below with reference to FIG. This figure shows a cross-sectional view of the element.

図中、1はSi半導体基板、2および4は、信号処理回
路(演算回路、メモリー等)でおり、3゜5は発光素子
である。3.5の発光素子は、各々2.4からの信号を
光に変換し、その光は基板1の下方に放射される。3,
5の下部は、光が下方に透過し易い様に、基板1の厚さ
を薄くしであるが、基板1が薄ければ特に薄くする必要
はない。
In the figure, 1 is a Si semiconductor substrate, 2 and 4 are signal processing circuits (arithmetic circuit, memory, etc.), and 3.5 is a light emitting element. The light emitting elements 3.5 each convert the signal from 2.4 into light, and the light is emitted below the substrate 1. 3,
The thickness of the substrate 1 is made thinner at the lower part of the substrate 5 so that light can easily pass downward, but there is no need to make it particularly thin if the substrate 1 is thin.

6は、熱伝導率の高い物質(例えば、 At。6 is a material with high thermal conductivity (for example, At.

Cr、W、Ni等の金属)で形成され、7,8は、発光
素子、3,5からの光を通す為に、中空にしである。
7 and 8 are hollow to allow light from the light emitting elements 3 and 5 to pass through.

6を通って来た光信号は、Si半導体基板、9内に形成
した受光素子、11.13で光電変換を行ない、その電
気信号は、10.12の信号処理回路(演算回路、メモ
リー等)に入力される。
The optical signal that has passed through 6 undergoes photoelectric conversion at the Si semiconductor substrate, the photodetector formed in 9, and 11.13, and the electrical signal is sent to the signal processing circuit (arithmetic circuit, memory, etc.) at 10.12. is input.

特に発光素子である3、5は、Siでは実現できないの
で、■−■化合物(例えば、GaAS系)をMB E 
(Molecalar Beam g、pitaxy)
  @るいは、MOCVD(Metal Qrgani
c ChemicalVapour Depositi
on)法で形成すればよい。
In particular, the light-emitting elements 3 and 5 cannot be realized with Si, so a ■-■ compound (e.g., GaAS type) is used as MBE.
(Molecal Beam g, pitaxy)
@ Ruiha, MOCVD (Metal Qrgani
c Chemical Vapor Deposit
on) method.

1.6.9の基板は加工された後、接着用樹脂で接着す
る。この時、1,6.9の合わせは、1および9を動作
させながら位置合わせが行なえるので、特に合せマーク
は不要となる。金属体、6は、基板1,9で発生する熱
を外部に吸収できる。
After the substrate of 1.6.9 is processed, it is bonded with adhesive resin. At this time, alignment of 1 and 6.9 can be performed while operating 1 and 9, so no alignment mark is particularly required. The metal body 6 can absorb heat generated by the substrates 1 and 9 to the outside.

以上の説明では、3.5を発光素子、11゜13を受光
素子としたが、その逆であってもよい。
In the above description, 3.5 is the light emitting element and 11.degree. 13 is the light receiving element, but the opposite may be used.

また、基板9内に、発光素子、受光素子を含ませること
によシ、チップ(ウエーノS)の多段接続が可能である
Further, by including a light emitting element and a light receiving element in the substrate 9, it is possible to connect chips (Weno S) in multiple stages.

第2゛図は、第1図の基板1あるいは9に対する平面図
を示す。3i半導体基板21内に配置された22.24
は信号処理回路であり、26.27の配線を介して、2
3.25の発光(あるいは受光)素子につながる。22
.24は、素子内配線28.29によって相互につなが
っている。
FIG. 2 shows a plan view of the substrate 1 or 9 of FIG. 22.24 arranged in the 3i semiconductor substrate 21
is a signal processing circuit, and 2 is connected via wiring 26.27.
3.25 is connected to the light emitting (or light receiving) element. 22
.. 24 are connected to each other by intra-device wirings 28 and 29.

本実施例では、ヒートシンクの作用を確実にするために
、第1図の6の材料は金属としたが、発生熱量が小さい
場合には、半導体、絶縁体でもよく、さらには省略して
もよい。
In this embodiment, the material 6 in Fig. 1 is made of metal in order to ensure the function of the heat sink, but if the amount of heat generated is small, it may be made of a semiconductor or an insulator, or may even be omitted. .

本発明の別の実施例を第3図に示す。同図において、3
1〜40.42は、第1図における1〜10.12と同
じものである。本実施例では、基板39とに、40.4
2につながる電極板、45゜46を形成し、その上に光
導電膜47を、さらにその上に透明電極板48を形成し
たものである。
Another embodiment of the invention is shown in FIG. In the same figure, 3
1 to 40.42 are the same as 1 to 10.12 in FIG. In this embodiment, the substrate 39 is 40.4
2, a photoconductive film 47 is formed thereon, and a transparent electrode plate 48 is further formed thereon.

44は絶縁物である。例えば、44はSin、。44 is an insulator. For example, 44 is Sin.

45.46は人t147はアモルファス5iあるいは3
e系光電変換膜等、48としてはITO(インジウム、
ティン、オキサイド)を用いればよい。本実施例では、
基板39上面に受光部を形成できるので、信号処理回路
40.42の面積が大きくとれ、また、光の利用率が向
上し、チップ(あるいはウェーハ)間の位置合せが容易
になる。
45.46 is human t147 is amorphous 5i or 3
e-based photoelectric conversion film, etc., 48 is ITO (indium,
Tin, oxide) may be used. In this example,
Since the light receiving section can be formed on the upper surface of the substrate 39, the area of the signal processing circuits 40 and 42 can be increased, the efficiency of light utilization is improved, and alignment between chips (or wafers) is facilitated.

なお、50は、電極48の電圧が基板31の電圧と異な
る場合に用いる絶縁物であり、基板31の裏面の酸化膜
を代用しても良いし、あるいは、金属36の上面を酸化
、おるいは絶縁膜をコーティングしても良い。
Note that 50 is an insulator used when the voltage of the electrode 48 is different from the voltage of the substrate 31, and the oxide film on the back surface of the substrate 31 may be used instead, or the upper surface of the metal 36 may be oxidized or may be coated with an insulating film.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、複数枚重ねたチップ(あるいはウェー
ハ)間の信号伝達を光によシ行なうので、信号処理効率
が向上する。また、チップ(ウェーハ)間は電気的に分
離されているので、素子内で発生する雑音の誘導を受け
ず、信頼度の高い情報伝達が可能となる。光導波路とし
て用いる金属体は、静電シールドを兼ね、熱吸収を効率
良く行なえる。
According to the present invention, signal transmission between a plurality of stacked chips (or wafers) is carried out by light, so signal processing efficiency is improved. Furthermore, since the chips (wafers) are electrically isolated, they are not influenced by noise generated within the elements, allowing highly reliable information transmission. The metal body used as the optical waveguide also serves as an electrostatic shield and can efficiently absorb heat.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の実施例の素子の断面図、第2図はその
平面図、第3図は本発明の別の実施例に対する素子の断
面図を示す。 1・・・Si半導体基板、2・・・信号処理回路、3・
・・発第 1 図 fJZ  図 第3図
FIG. 1 is a sectional view of an element according to an embodiment of the invention, FIG. 2 is a plan view thereof, and FIG. 3 is a sectional view of an element according to another embodiment of the invention. DESCRIPTION OF SYMBOLS 1... Si semiconductor substrate, 2... Signal processing circuit, 3...
・・Departure No. 1 Figure fJZ Figure 3

Claims (1)

【特許請求の範囲】[Claims] 1、第1の半導体基板内に、少なくとも1個の発光素子
を含み、第2の半導体基板内に、少なくとも1個の受光
素子を含み、第1の半導体基板と第2の半導体基板との
間に、該発光素子と該受光素子とをむすぶ線を中空で囲
んだ金属板を配置することを特徴とする半導体装置。
1. At least one light emitting element is included in the first semiconductor substrate, at least one light receiving element is included in the second semiconductor substrate, and between the first semiconductor substrate and the second semiconductor substrate A semiconductor device characterized in that a metal plate is disposed in which a line connecting the light emitting element and the light receiving element is surrounded by a hollow space.
JP24064284A 1984-11-16 1984-11-16 Semiconductor device Pending JPS61120455A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24064284A JPS61120455A (en) 1984-11-16 1984-11-16 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24064284A JPS61120455A (en) 1984-11-16 1984-11-16 Semiconductor device

Publications (1)

Publication Number Publication Date
JPS61120455A true JPS61120455A (en) 1986-06-07

Family

ID=17062532

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24064284A Pending JPS61120455A (en) 1984-11-16 1984-11-16 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS61120455A (en)

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