JPS61120006A - Signal detecting method of measuring head - Google Patents

Signal detecting method of measuring head

Info

Publication number
JPS61120006A
JPS61120006A JP24056184A JP24056184A JPS61120006A JP S61120006 A JPS61120006 A JP S61120006A JP 24056184 A JP24056184 A JP 24056184A JP 24056184 A JP24056184 A JP 24056184A JP S61120006 A JPS61120006 A JP S61120006A
Authority
JP
Japan
Prior art keywords
light
detection
level
signal
receiving element
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP24056184A
Other languages
Japanese (ja)
Inventor
Kosaku Mukai
向井 幸作
Saijiyu Suzuki
鈴木 ▲さい▼壽
Yuichi Shimizu
清水 湧一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NIPPON TSUSHIN GIJUTSU KK
Original Assignee
NIPPON TSUSHIN GIJUTSU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NIPPON TSUSHIN GIJUTSU KK filed Critical NIPPON TSUSHIN GIJUTSU KK
Priority to JP24056184A priority Critical patent/JPS61120006A/en
Publication of JPS61120006A publication Critical patent/JPS61120006A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/02Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/024Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by means of diode-array scanning

Abstract

PURPOSE:To detect a signal with high precision irrelevantly to the intensity of incident light by detecting and storing the measurement output of a photodetecting element array by detecting means which differ in level, and selecting some bit string of a detection logical signal with the highest level. CONSTITUTION:The output of the photodetecting element array 11 corresponding to a scan is stored in memories 29-31 whose writing is controlled by FFs 26-28 through attenuators 18 and 19 of the detecting means which differ in level, sampling circuits 23-25, etc. Then when light incident on the array 1 is weak, three bits, their one center bit, etc., are stored in the memories 29 and 30 and when intense, five bits, three bits, and their one center bit are stored in the memories 29-31 respectively; and a switching control circuit 32 outputs some bit of the detection logical signal with the highest level and the bit string is outputted through the memory 30. Therefore, only center position information having the highest level is selected irrelevantly to variation in the intensity of the incident light which varies in the state of its reflected light and high- precision signal detection is performed by measuring the shape of a body optically.

Description

【発明の詳細な説明】 (産業上の利用分野) 本発明は溶接用ロボット等において1作業対象物の溶接
面の形状および位置を計測するなめの計測ヘッドの信号
検出方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION (Field of Industrial Application) The present invention relates to a signal detection method of a diagonal measurement head for measuring the shape and position of a welding surface of a workpiece in a welding robot or the like.

(従来技術) 従来のこの種計測ヘッドの制御回路の構成は、jlE/
図に示すごとく、レーザの変調と揺動ミラーによる走査
、このレーザ光ビームの反射を受光素子アレーに結像さ
せた受光位置の検出、上記各部のタイミング制御とプロ
セッサによる計算処理よりなり、この受光検出方法を対
象としていた。
(Prior art) The configuration of the control circuit of a conventional measurement head of this type is jlE/
As shown in the figure, the light receiving process consists of laser modulation, scanning by a swinging mirror, detection of the light receiving position by imaging the reflection of this laser beam on a light receiving element array, timing control of the above parts, and calculation processing by a processor. The target was detection methods.

第7図を、さらに詳細に説明すると、次の如き構成で動
作が行なわれる。発振回路/のレーザ光変調信号出力f
Mが駆動回路コを通じて、レーザ3に供給され、これを
強度変調し、その出力光ビームは揺動ミラー弘の揺動動
作によう図示せざる被測定面上を一定角度!だけ往復移
動し走査する。
To explain FIG. 7 in more detail, the operation is performed with the following configuration. Laser light modulation signal output f of oscillation circuit/
M is supplied to the laser 3 through the drive circuit, which modulates its intensity, and its output light beam travels at a constant angle on the surface to be measured (not shown), just like the oscillating movement of the oscillating mirror! It moves back and forth and scans.

揺動ミラー≠は、クロックカウンタ乙、ミラー駆動回路
7により駆動され、計測区間は左右端の検出センサざ、
りの出力、測定制御論理IOにより決められる。
The swinging mirror≠ is driven by the clock counter O and the mirror drive circuit 7, and the measurement period is between the detection sensors at the left and right ends,
output, determined by the measurement control logic IO.

被測定面上のレーザ光ビームの輝点は、受光レンズによ
り受光素子アレー//上に結像され、走査カウンタ12
、切替スイッチ回路/3の走査によプ、入射光の存在す
る受光素子の走査タイミングで切替スイッチ/3の出力
となシ、アンプ/≠、パ/ドパスフイルタ/夕、整流平
滑回路/6により復調されて直流レベル信号となる。こ
の検出レベルはレベル判定保持回路/7において各受光
素子の切替と同期するサンプリング信号OL、でレベル
判定を行ない、受光している場合をレベル″l。
The bright spot of the laser beam on the surface to be measured is imaged by the light receiving lens onto the light receiving element array //, and the scanning counter 12
, the output of the changeover switch /3 is turned on by the scanning of the changeover switch circuit /3, the output of the changeover switch /3 is turned off at the scanning timing of the light receiving element where the incident light is present, the amplifier /≠, the pass filter /1, and the rectification and smoothing circuit /6 demodulates. and becomes a DC level signal. This detection level is determined by a level determination holding circuit/7 using a sampling signal OL that is synchronized with switching of each light receiving element, and when light is being received, it is set to level "1".

の論理信号としてシフトレジスタ等に蓄積され、適当な
処理単位(例えばrビット)にまとめて検出信号Dsと
してまた、クロックカウンタ6からビーム移動方向指示
信号DI、走査制御カウンタからビーム角度信号B人、
測定制御論理/Qから測定範囲信号MAが夫々プロセッ
サ処理システムに伝えられる。
are stored in a shift register or the like as logical signals, and are collected into appropriate processing units (for example, r bits) as detection signals Ds. Also, a beam movement direction instruction signal DI is sent from the clock counter 6, and a beam angle signal B is sent from the scan control counter.
Measurement range signals MA are communicated from the measurement control logic /Q to the respective processor processing systems.

受光素子アレー//は、例えば6弘個の受光素子から構
成され、レーザ光ビームの揺動動作に比較して遥かに高
速に走査されるので、素子の切替出力期間の間VC6≠
個のうちの結像している素子のタイミングだけ出力を生
じる。この受光素子ア゛レーの走査と論理出力との時間
関係をg1図に示すO いま走査カウンタ12の入力OL、(/〜口)〔第2図
(a)〕により切替スイッチ回路/3は1〜口のように
順次切替り〔第2図(b)〕、その間に受光している素
子lの走査タイミングで切替スイッチ出力〔第2図(d
)〕に変調波が生じる。これを復調してクロックOL、
 C第2図(C)〕でサンプリングすることでレジスタ
には1番目のビットに論理1/1の信号〔第2図(f)
〕が保持される。この時のレーザ光ビーム角度と受光素
子iの位置から三角測量の手法により被測定面までの距
離が求められる。
The light-receiving element array // is composed of, for example, 6 light-receiving elements, and is scanned at a much higher speed than the swinging operation of the laser beam, so that during the switching output period of the elements, VC6≠
An output is generated only at the timing of the imaged element among the elements. The time relationship between the scanning of this light-receiving element array and the logic output is shown in diagram g1. Now, the input OL of the scanning counter 12, (/~) [FIG. 2(a)] changes the changeover switch circuit /3 to 1. - Switching sequentially like a mouth [Figure 2 (b)], during which the changeover switch outputs at the scanning timing of the element l receiving light [Figure 2 (d)]
)] a modulated wave is generated. Demodulate this and clock OL,
By sampling with [Fig. 2 (C)], the register receives a logic 1/1 signal [Fig. 2 (F)] in the first bit.
] is retained. At this time, the distance to the surface to be measured is determined from the laser beam angle and the position of the light receiving element i by a triangulation method.

(発明が解決しようとする問題点) ここで受光のレベルは被測定面の反射率により大幅に変
化し、反射率の低い面を充分に計測し得るために社、低
レベルを検出し得るようにレベル設定を行なうことが必
要がある。また、反射率の高い面からの受光においては
、出力レベルも大きくなると同時(隣接素子や、光の反
射等の影響罠より他の素子からも低レベルの出力が生じ
る場合もあり、これらの各信号を検出して受光判定範囲
が拡がり之り多くの信号を生ずることもある。第2図(
dlで点線で例示したのがこの状態を示すもので、この
ような論理出力の増加は、これらの受光素子出力の平均
位置を中心位置とする必要が生じ、処理内容を増加させ
ると同時に計算の精度を低下させる要因となる。
(Problem to be Solved by the Invention) Here, the level of received light changes significantly depending on the reflectance of the surface to be measured. It is necessary to set the level. Furthermore, when receiving light from a highly reflective surface, the output level also increases (low-level output may also be generated from adjacent elements or other elements due to the influence of light reflection, etc.). When a signal is detected, the light receiving judgment range expands and many signals may be generated.Figure 2 (
The dotted line in dl shows this situation.Increasing the logical output like this requires centering the position on the average position of these light-receiving element outputs, which increases the processing content and at the same time slows down the calculation. This becomes a factor that reduces accuracy.

(問題点を解決するための手段) 本発明は上記のような計算精度の低下を除くため、入射
光量の大幅な変化に対して複数の検出レベルを設け、受
光位置判定の誤差要因となる出力を除去し、入射光の強
弱に関係なく受光中心位置を求め、高精度で計測し得る
信号検出方法を提供するものである。以下、実施例図面
により詳細に説明する。
(Means for Solving the Problems) In order to eliminate the above-mentioned deterioration in calculation accuracy, the present invention provides multiple detection levels for large changes in the amount of incident light, and reduces the output that causes errors in light receiving position determination. The object of the present invention is to provide a signal detection method that can remove the light, determine the light receiving center position regardless of the strength of the incident light, and perform measurement with high accuracy. Hereinafter, it will be explained in detail with reference to the drawings of the embodiment.

(発明の構成) 本発明の構成は受光入力レベルに対応して複数の検出レ
ベルを設け、各レベルでの判定出力を7回の受光素子ア
レーの走査の間、順次に蓄積し、走査終了時に1番高い
レベルで検出論理信号があるビット列を計算処理のため
選択使用することを特徴とする計測ヘッドの信号検出方
法である。
(Structure of the Invention) The structure of the present invention provides a plurality of detection levels corresponding to the light receiving input level, sequentially accumulates the judgment output at each level during seven scans of the light receiving element array, and at the end of the scan. This is a signal detection method for a measurement head characterized in that a bit string having a detection logic signal at the highest level is selectively used for calculation processing.

〈実施例〉 第3図は本発明の一実施例を示すブロック図であり、第
弘図は検出・選7択の動作を説明する図である。
<Embodiment> FIG. 3 is a block diagram showing an embodiment of the present invention, and FIG. 3 is a diagram explaining the detection/selection operation.

受光素子アレーl/、切替スイッチ回路/3、走査カウ
ンタ/2、アンプ/44Fi第1図と同じ構成で、かつ
動作を行う。アンプl≠の出力には複数の検出レベルの
異なる検出回路が接続される。
It has the same configuration and operation as in FIG. 1, including a light receiving element array l/, a changeover switch circuit/3, a scanning counter/2, and an amplifier/44Fi. A plurality of detection circuits having different detection levels are connected to the output of the amplifier l≠.

第3図では説明上、検出レベルを3段に変えた場合を例
示するものであるが、精度を上げるには更に増加させて
も差支えない。ここでアッテネッタ/r、/りはそれぞ
れ例えば20 dBづつ信号に減衰を与え、次段の復調
回路、20.u/l  2.2、及びサンプリング保持
回路23.24t、21の出力は順次0.2.0.≠O
dBのレベル差を持って検出するように構成される。こ
の検出出力はメモ1)29.30.j/に同時に記憶さ
れ、受光素子の一回の走査終了時には各メモリに検出レ
ベルの異なった論理情報が1ピツト(受光素子が61A
個の時は41Aビツト)づつ蓄えられる。各メモリへの
論理171の信号書込の状態は監視7リツプ70ッグ2
6,27. λrで記憶され、走査終了後のメモリ33
への高速転送期間によ)大きな減衰量を与え之出力記憶
のあるメモリコタ〜3/を選択して転送する。メモリ3
3の内容は1次の走査サイクルでプロセッサ処理システ
ム3りに送出する。
For the sake of explanation, FIG. 3 shows an example in which the detection level is changed to three levels, but the detection level may be increased further to improve accuracy. Here, the attenuators /r and /r each attenuate the signal by, for example, 20 dB, and the attenuators 20. u/l 2.2, and the outputs of the sampling and holding circuits 23.24t and 21 are sequentially 0.2.0. ≠O
It is configured to detect with a level difference of dB. This detection output is memo 1) 29.30. At the end of one scan of the light-receiving element, one pit of logic information with different detection levels is stored in each memory (the light-receiving element is 61A
41A bits) are stored at a time. The status of the logic 171 signal write to each memory is monitored by
6,27. λr is stored in the memory 33 after scanning is completed.
3/ is selected and transferred, giving a large amount of attenuation (due to the high-speed transfer period) and having an output memory. memory 3
The contents of 3 are sent to the processor processing system 3 in the first scan cycle.

カウンタ34tFiメモリのアドレスを指示するカウン
タ、79クグ70ツノ3jはメモリ33の書込み、読出
しとカウンタ34tのクロックを切替える制御7リツグ
7oツグ、アンドゲート36.3?。
Counter 34tFi Counter 79, 70, 3j, which indicates the address of the memory, Control 7, 7o, AND gate 36.3? .

オアゲート31rはカウンタ34tのクロックを選択す
るゲートである。第3図の動作は他の制御部(図示せず
)から与えられる走査、転送、リセットの信号により制
御される。走査期間では制御フリップフロ゛ツブ3よの
出力によりメモリコタ〜3/を書込みの状態に、メモリ
33を読出しの状態にする。f&同時に切替判断回路3
2はOFFになり転送は行なわれない。またこの状態で
はカウンタJ4CはクロックOL、に同期したクロック
OL、で動作しサンプリング結果を順次指定アドレスに
書込む。転送期間では制御7リツプフロツプ3!は反転
し、メモリ22〜31は読出し、メモリ33は書込み、
切替判断回路3コは有効になり、カウンタ3≠に入力さ
れる高速クロックOLtにより、メモリー2〜37のう
ち選択されたメモリからメモリ33へ転送する。これら
制御部分はプログラム制御により行ってもよい。
The OR gate 31r is a gate that selects the clock of the counter 34t. The operations shown in FIG. 3 are controlled by scanning, transfer, and reset signals applied from another control section (not shown). During the scanning period, the output from the control flip-flop 3 puts the memory controller ~3/ into the write state and the memory 33 into the read state. f & switching judgment circuit 3 at the same time
2 is turned OFF and no transfer is performed. In this state, the counter J4C operates with the clock OL synchronized with the clock OL and sequentially writes the sampling results to the designated addresses. During the transfer period, control 7 lip-flops 3! is inverted, memories 22 to 31 are read, memory 33 is written,
The switching judgment circuit 3 becomes valid and transfers data from the memory selected from the memories 2 to 37 to the memory 33 in response to the high speed clock OLt inputted to the counter 3≠. These control parts may be controlled by a program.

次に第≠図は、このメモリ内容と転送の状態を説明する
。すなわち走査クロックOL、〔第参図(a)〕に示す
7回の走査区間■【おいて、切替スイッチ出力a(第4
’図(b)〕、検出レベル/では3個の受光素子i  
/+  i、l +/ がサンプリングされるが。
Next, Figure ≠ will explain the contents of this memory and the state of transfer. In other words, when the scanning clock OL is used for the seven scanning sections shown in Figure (a), the changeover switch output a (fourth
'Figure (b)], detection level /, three light receiving elements i
/+ i, l +/ is sampled.

検出レベル2でサンプリングされる受光素子出力はiだ
けになる。この状態はメモリコタ(メモリ内容/)、メ
モリ30(メモリ内容コ)に蓄積され、niでの走査終
了後の転送区間でメモ930の内容が転送され、nピッ
トのうち/ビットだけが111の状態を示す。また被測
定面の反射率が高い時は走査区間■に例示するように切
替スイッチ出力は大きくなると同時に隣接素子からの出
力も増加し、検出レベルに対応して3つのメモリにはそ
れぞれj、j、/ビットの蓄積が行なわれ、転送区間に
メモリ内容3が選択されて転送される。
The light receiving element output sampled at detection level 2 is only i. This state is stored in the memory (memory contents/) and the memory 30 (memory contents), and the contents of the memo 930 are transferred in the transfer section after the end of scanning in ni, and only the / bit out of n pits is in the state of 111. shows. In addition, when the reflectance of the surface to be measured is high, as shown in the scanning section ■, the changeover switch output increases and at the same time the output from the adjacent element also increases, and the three memories j and j correspond to the detection level. , /bits are accumulated, and memory content 3 is selected and transferred during the transfer period.

このようにメモリ33に転送される情報は入力光レベル
の強弱に応じて中心のビット位置だけとなる。メモリ3
3の情報は次の走査期間中にプロセッサの処理に有効な
フォーマットで送り出される。
In this way, the information transferred to the memory 33 is only the central bit position depending on the strength of the input light level. memory 3
3 is sent in a format valid for processing by the processor during the next scan period.

(発明の効果) 以上説明したように本発明によれば、溶接頭等の如く反
射光の状態が大幅に変化する入射光に対しても最もレベ
ルの大きい中心位置の情報だけを複数のレベル 検出手
段により選択することが可能で多くの出力が生ずること
による計算処理を減らし、計算誤差を減少させる効果を
有する。
(Effects of the Invention) As explained above, according to the present invention, only the information of the center position with the highest level can be detected at multiple levels even for incident light where the state of reflected light changes significantly, such as from a welding head. This has the effect of reducing calculation processing and calculation errors due to the fact that many outputs can be selected by the means.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来の計測ヘッド制御回路のブロック図、第2
図は検出のタイミングと出力の関係を説明する図、第3
図は本発明の一実施例を示す信号検出回路のブロック構
成図、第弘図は本発明を用い九場合の信号レベルと検出
出力、情報の選択を説明する図であるう 3・・・レーザ、≠・・・揺動ミラー、//・・・受光
素子アレー、/、2・・・走査カウンタ、13・・・切
替スイッチ回路、/Jr、/9・・・アッテネータ、λ
0.2八2.2・・・復調回路、23.21A、21・
・・サンプリング保持回路、2り、30.3/・・・検
出情報蓄積メモリ、26.λ7,21r・・・受光検出
監視71Jツブ70ツブ、3.2・・・メモリ切替判断
回路、33・・・出力情報蓄積メモリ、3り・・・プロ
セッサ処理システム。
Figure 1 is a block diagram of a conventional measurement head control circuit;
Figure 3 is a diagram explaining the relationship between detection timing and output.
The figure is a block configuration diagram of a signal detection circuit showing one embodiment of the present invention, and Figure 1 is a diagram explaining the signal level, detection output, and information selection in nine cases using the present invention. , ≠... Swinging mirror, //... Light receiving element array, /, 2... Scanning counter, 13... Changeover switch circuit, /Jr, /9... Attenuator, λ
0.28 2.2... Demodulation circuit, 23.21A, 21.
...Sampling holding circuit, 2, 30.3/...Detection information storage memory, 26. λ7, 21r...Light reception detection monitoring 71J tube 70 tube, 3.2...Memory switching judgment circuit, 33...Output information storage memory, 3...Processor processing system.

Claims (1)

【特許請求の範囲】[Claims] 複数個の直線に配置された受光素子アレー上に、被測定
面上を照射して揺動するレーザ光ビームの反射光を結像
させ、該レーザ光ビームを一定周波数で変調し、一つの
受光素子に複数の変調波が存在するような周期で受光素
子を切替えて前記レーザ光ビームの揺動より遥かに高速
に全部の受光素子を走査して結像している受光素子を検
出し、この時の照射ビーム角と受光素子位置とから被測
定面上の位置と測定基準線からの距離を求める計測ヘッ
ドにおいて、受光変調出力を検出し論理信号に変換して
受光している素子位置を、検出レベルの異なる複数の検
出手段で行い、受光素子アレーの一回の走査終了時に各
検出レベルにおける検出結果のうち一番高いレベルで検
出論理信号が存在する結果を選択して受光素子位置を求
めるようにしたことを特徴とする計測ヘッドの信号検出
方法。
The reflected light of the laser beam that irradiates the surface to be measured and oscillates is imaged on a plurality of linearly arranged photodetector arrays, and the laser beam is modulated at a constant frequency to form a single received light beam. The light-receiving elements are switched at a frequency such that a plurality of modulated waves are present in the element, and all the light-receiving elements are scanned at a much higher speed than the swinging of the laser beam to detect the light-receiving element that is forming an image. The measurement head calculates the position on the surface to be measured and the distance from the measurement reference line from the irradiation beam angle and the position of the light-receiving element.The measurement head detects the received light modulation output and converts it into a logical signal to determine the position of the element receiving the light. This is performed using multiple detection means with different detection levels, and at the end of one scan of the light receiving element array, the light receiving element position is determined by selecting the result in which a detection logic signal exists at the highest level among the detection results at each detection level. A signal detection method for a measurement head, characterized in that:
JP24056184A 1984-11-16 1984-11-16 Signal detecting method of measuring head Pending JPS61120006A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP24056184A JPS61120006A (en) 1984-11-16 1984-11-16 Signal detecting method of measuring head

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24056184A JPS61120006A (en) 1984-11-16 1984-11-16 Signal detecting method of measuring head

Publications (1)

Publication Number Publication Date
JPS61120006A true JPS61120006A (en) 1986-06-07

Family

ID=17061355

Family Applications (1)

Application Number Title Priority Date Filing Date
JP24056184A Pending JPS61120006A (en) 1984-11-16 1984-11-16 Signal detecting method of measuring head

Country Status (1)

Country Link
JP (1) JPS61120006A (en)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5670407A (en) * 1979-11-14 1981-06-12 Hitachi Ltd Detecting device for photocut line
JPS57208404A (en) * 1981-06-19 1982-12-21 Hitachi Ltd Configuration detecting method
JPS58171611A (en) * 1982-04-02 1983-10-08 Hitachi Ltd Method and device for detecting shape

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5670407A (en) * 1979-11-14 1981-06-12 Hitachi Ltd Detecting device for photocut line
JPS57208404A (en) * 1981-06-19 1982-12-21 Hitachi Ltd Configuration detecting method
JPS58171611A (en) * 1982-04-02 1983-10-08 Hitachi Ltd Method and device for detecting shape

Similar Documents

Publication Publication Date Title
JP2660929B2 (en) Arc sensor using CCD solid-state imaging device
CN1273966C (en) Method for recording information on recording carrier
CN1060159A (en) Utilize the focus signal skew to obtain optimum focusing
US4435079A (en) Apparatus for testing lenses by determining best focus
US4868403A (en) Surface inspecting apparatus
CN1643365B (en) Analysis apparatus and analysis disc used for the same
JPS61120006A (en) Signal detecting method of measuring head
EP0252502B1 (en) Optical information recording and reproducing apparatus with tracking control by sampling
US4797872A (en) Method for reproducing data recorded on optical card
JPS62125547A (en) Correcting method for angle displacement of optical recording medium
US5578819A (en) Optical recorder having a signal separation circuit and a FIFO memory circuit
US5329508A (en) Regenerating device for optical recording medium in which overlapping regions are read out by a light beam in a time sharing manner to provide servo control of the positional relationship between the light beam and the medium
US5703842A (en) Information recording/reproducing apparatus for executing system control and servo control by single CPU
JPS5975760A (en) Photoscanning system
JPH05644B2 (en)
JPS6224856B2 (en)
JPH05182197A (en) Optical information recording and reproducing device
EP1315155A1 (en) Optical recording medium and misalignment measuring instrument
JPS6315103A (en) Laser beam emission control in measuring apparatus
JPH0492220A (en) Optical recording and reproducing device
JPS61158048A (en) Recording information reader
SU1711113A1 (en) Half-tone image recording device
JPH0315227B2 (en)
JPS62256239A (en) Angular displacement correcting device for optical recording medium
JP3631069B2 (en) Disk surface defect inspection system