JPS61118952A - Device for producing scanning images - Google Patents

Device for producing scanning images

Info

Publication number
JPS61118952A
JPS61118952A JP59238429A JP23842984A JPS61118952A JP S61118952 A JPS61118952 A JP S61118952A JP 59238429 A JP59238429 A JP 59238429A JP 23842984 A JP23842984 A JP 23842984A JP S61118952 A JPS61118952 A JP S61118952A
Authority
JP
Japan
Prior art keywords
sample
image
target
signal
memory
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP59238429A
Other languages
Japanese (ja)
Inventor
Teruaki Ono
輝昭 大野
Shinjiro Katagiri
片桐 信二郎
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Hitachi Naka Seiki Ltd
Original Assignee
Hitachi Ltd
Hitachi Naka Seiki Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd, Hitachi Naka Seiki Ltd filed Critical Hitachi Ltd
Priority to JP59238429A priority Critical patent/JPS61118952A/en
Publication of JPS61118952A publication Critical patent/JPS61118952A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/252Tubes for spot-analysing by electron or ion beams; Microanalysers
    • H01J37/256Tubes for spot-analysing by electron or ion beams; Microanalysers using scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

PURPOSE:To alleviate the deterioration of the sample caused by scanning lines by generating a signal from an image memory so that scanning lines are prevented from being irradiated upon the sample after the image memory completes storing a given number of pictures. CONSTITUTION:Radiated X-rays are transmitted by a sample 8 and then converted into an electric signal by means of a scintillator 10. The electric signal is then supplied to a displayer 13 through an amplifier 15 and is displayed as an image on the displayer 13. When a memory 14 completes storing the image of one picture, the memory 14 generates a signal which causes an excitation power supply 12 to energize a coil 11 for producing a magnetic field. As the result, the electron rays are deflected as indicated by the broken line and then are interrupted by a disphragm 14. Since it is adequate for electron rays to be irradiated upon the target for a short time, the temperature of the target is not increased and the thermal deterioration of the sample 8 close to the target is alleviated.

Description

【発明の詳細な説明】 〔発明の利用分野〕 本発明は走査画像形成装置に係り、走査線による試料損
傷を軽減するに好適な画像記憶装置に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Application of the Invention] The present invention relates to a scanning image forming apparatus, and more particularly to an image storage device suitable for reducing sample damage caused by scanning lines.

〔発明の背景〕[Background of the invention]

添付資料は西品名ルーゼツクス(500)の詳細カタロ
グである。本装置は光学顕微鏡、走査電子顕微鏡等に広
く使用されている。画像の記憶装置を備えた処理装置で
ある2本装置の機能は種々あるが、何れも記憶された像
の処理に重点がおかれ、オリジナル信号の処理に関して
は全く配慮されていなかった。
The attached document is a detailed catalog of the Nishi product name Luzetskus (500). This device is widely used in optical microscopes, scanning electron microscopes, etc. These two devices, which are processing devices equipped with image storage devices, have various functions, but in both cases, emphasis has been placed on processing the stored images, and no consideration has been given to processing the original signals.

〔発明の目的〕[Purpose of the invention]

粒子線、放射線等を試料面上を走査して像を形成する装
置では、これ等粒子線等による試料損傷、たとえば熱的
な影響、放射線損傷、汚れなどの損傷金堂ける。本発明
は記憶装置を備えて、一画面の形成を終えたとき、これ
等粒子線が試料に照射されることを阻止する手段を有す
る。
In an apparatus that forms an image by scanning a particle beam, radiation, etc. over a sample surface, damage to the sample caused by the particle beam, etc., such as thermal effects, radiation damage, stains, etc. can occur. The present invention includes a storage device and means for preventing these particle beams from being irradiated onto the sample when one screen has been formed.

〔発明の概要〕[Summary of the invention]

前記走査画像形成装置に於て、生物、有機物。 In the scanning image forming apparatus, living things and organic matter.

等を試料とする揚台、熱的に非常に弱いものがある。ま
た、加速粒子線によるチャージアップなど長時間の照射
によシ、その影響が増加し、本来の正常な像の観察、ま
たは寸法の計測を不可能にすることがある。本発明では
一画面または所要の回数の画像を記憶装置に重ねて、像
を形成したのち、記憶装置からの信号により走査線を阻
止して、試料損傷を軽微に止める。
There are some lifting platforms that are very weak in terms of heat. In addition, long-term irradiation such as charge-up with accelerated particle beams may increase the effects, making it impossible to observe normal images or measure dimensions. In the present invention, one screen or a required number of images are superimposed on a storage device to form an image, and then the scanning line is blocked by a signal from the storage device to minimize damage to the sample.

〔発明の実施例〕[Embodiments of the invention]

第1図は走査X線顕微鏡の一実施例である。電子は1の
フィラメントから発し、ウェネルト円筒2により収束さ
れ、陽極3によって加速、絞シ4の小孔を通って、対物
し/ズ5によシ、ターゲット7上に強い点状電子線が結
像される。電子線は走査コイル6によってターゲット上
を面走査され、放射されたX線は試料8を透過し、シン
チレータ10により電気信号として、増巾器15を介し
、ディスプレイ装置13に、像として観察、撮影される
。14は面像の記憶装置でちゃ、一度記憶された像はT
V像として随時ディスプレイのブラウン管で観察できる
。一画面の像が記憶完了した時装置14よシ信号を発し
、励0電源12によシ、磁場発生用のコイル11に通電
し、図に点線で示すように偏向し、絞シ4によって遮断
する。ターゲット上への電子線の照射が短時間ですむた
め、ターゲットの温度上昇がなく、ターゲットに接近し
た試料の熱損傷およびX線損傷が軽減される。
FIG. 1 shows an embodiment of a scanning X-ray microscope. Electrons are emitted from the filament 1, focused by the Wehnelt cylinder 2, accelerated by the anode 3, passed through the small hole of the diaphragm 4, passed through the objective lens 5, and form a strong dot-shaped electron beam on the target 7. imaged. The electron beam is surface-scanned over the target by the scanning coil 6, and the emitted X-rays are transmitted through the sample 8, converted into electrical signals by the scintillator 10, and then transmitted to the display device 13 via the amplifier 15 to be observed and photographed as an image. be done. 14 is a storage device for surface images, and the image once stored is T.
It can be observed as a V image at any time on a cathode ray tube display. When the image of one screen has been memorized, the device 14 issues a signal, the excitation power source 12 energizes the coil 11 for generating a magnetic field, deflects it as shown by the dotted line in the figure, and shuts it off by the diaphragm 4. do. Since irradiation of the electron beam onto the target takes only a short time, the temperature of the target does not rise, and thermal damage and X-ray damage to the sample that approaches the target are reduced.

第2図は走査電子顕微鏡に応用した実施例である。コン
デンサレンズ16によって収束された電子線は試料8上
を面走査される。像は記憶完了されたあと、記憶装置1
4の信号により、ソレノイドのコイルに通電され、プラ
ンジャ17に直結した絞りを動かして電子線を阻止する
FIG. 2 shows an embodiment applied to a scanning electron microscope. The electron beam focused by the condenser lens 16 is scanned across the surface of the sample 8. After the image is stored, it is stored in storage device 1.
The solenoid coil is energized by the signal No. 4, and the aperture directly connected to the plunger 17 is moved to block the electron beam.

画像の記憶回数は目的から見ると、−回が最も良いが、
試料の損傷の度合によっては複数回の像を重ねることも
考慮されてよい。たとえば電子線による試料の汚れなど
は4〜5回の照射では実害の現れない場合があり、所要
回数画像を蓄積したのち完了信号を発してもよい。
From the viewpoint of the purpose, the best number of times to memorize an image is - times, but
Depending on the degree of damage to the sample, it may be considered to superimpose multiple images. For example, if a sample is stained by an electron beam, no actual damage may occur after 4 to 5 irradiations, and a completion signal may be issued after a required number of images have been accumulated.

〔発明の効果〕〔Effect of the invention〕

本発明によれば、試料に対する走査線量は最少に止める
ことができるので、熱的、放射線によるもの、汚れ、チ
ャージアップなどの試料損傷を軽減することができる。
According to the present invention, since the scanning dose to the sample can be kept to a minimum, damage to the sample due to thermal damage, radiation damage, contamination, charge-up, etc. can be reduced.

] 大である。] It's large.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図はX線走査顕微鏡に対する実施例説明図、第2図
は走査電子顕微鏡に対する実施例説明図を示す。 1・・・フィラメント、4・・・絞り、5・・・対物レ
ンズ、7・・・ターゲット、8・・・試料、10・・・
検出器、13・・・ディスプレイ、14・・・記憶装置
、12・・・励磁電源、11・・・磁場発生コイル、1
7・・・ソレノイド、18・・・プランジャー。
FIG. 1 is an explanatory diagram of an embodiment for an X-ray scanning microscope, and FIG. 2 is an explanatory diagram of an embodiment for a scanning electron microscope. DESCRIPTION OF SYMBOLS 1... Filament, 4... Aperture, 5... Objective lens, 7... Target, 8... Sample, 10...
Detector, 13...Display, 14...Storage device, 12...Excitation power supply, 11...Magnetic field generation coil, 1
7...Solenoid, 18...Plunger.

Claims (1)

【特許請求の範囲】[Claims] 1、粒子線、光線、およびX線等の走査により、像を得
る装置に於て、画像の記憶装置を備え、所要回数の画面
を記憶完了後、信号を発する手段を有し、これにより、
試料に対する該走査線の照射を阻止することを特徴とす
る走査画像形成装置。
1. A device for obtaining an image by scanning with particle beams, light beams, X-rays, etc., is equipped with an image storage device, and has means for emitting a signal after storing the required number of screens, thereby:
A scanning image forming apparatus characterized in that irradiation of the scanning line to the sample is blocked.
JP59238429A 1984-11-14 1984-11-14 Device for producing scanning images Pending JPS61118952A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP59238429A JPS61118952A (en) 1984-11-14 1984-11-14 Device for producing scanning images

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP59238429A JPS61118952A (en) 1984-11-14 1984-11-14 Device for producing scanning images

Publications (1)

Publication Number Publication Date
JPS61118952A true JPS61118952A (en) 1986-06-06

Family

ID=17030073

Family Applications (1)

Application Number Title Priority Date Filing Date
JP59238429A Pending JPS61118952A (en) 1984-11-14 1984-11-14 Device for producing scanning images

Country Status (1)

Country Link
JP (1) JPS61118952A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04294040A (en) * 1991-03-22 1992-10-19 Hamamatsu Photonics Kk X-ray image device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04294040A (en) * 1991-03-22 1992-10-19 Hamamatsu Photonics Kk X-ray image device

Similar Documents

Publication Publication Date Title
US4852137A (en) Imaging of light-opaque specimens by transmission of radiation therethrough
JP3191554B2 (en) X-ray imaging device
JPS5917590B2 (en) X-ray fluoroscope
US3439114A (en) Fluoroscopic television and cinecamera system
US3872305A (en) Convertible scanning electron microscope
JPS61118952A (en) Device for producing scanning images
US3835314A (en) Intensifier radiographic imaging system
US3515870A (en) X-ray system for superimposing the image of a reference object and an x-ray image
US3711711A (en) Scanning electron microscope scanning system
JPH05325860A (en) Method for photographing image in scanning electron microscope
US5117447A (en) Image input apparatus
JPS60138252U (en) Sample image display device in particle beam equipment
JPH06231716A (en) Ion micro beam device
JPH0696711A (en) Display method for image of scanning electron microscope
JPH082603Y2 (en) X-ray analyzer
Morgan An Appraisal of Screen Intensification Systems
US3920890A (en) Graphic display of raster scanning system output signals
JPH0139393Y2 (en)
Beckmann et al. The Electrodelca, A New Photofluorographic Camera with Image Intensification
JPS61267000A (en) X-ray microscope
GB2133611A (en) Radiographic magnifying device
JPS58196476A (en) Radiation image multiplying tube
JPH0210381B2 (en)
Fontijn et al. An operational 150 kV microfocus rod anode X-ray system for non-destructive testing
JPS59101134A (en) Radiation image enlarging apparatus