JPS61110182U - - Google Patents
Info
- Publication number
- JPS61110182U JPS61110182U JP20065684U JP20065684U JPS61110182U JP S61110182 U JPS61110182 U JP S61110182U JP 20065684 U JP20065684 U JP 20065684U JP 20065684 U JP20065684 U JP 20065684U JP S61110182 U JPS61110182 U JP S61110182U
- Authority
- JP
- Japan
- Prior art keywords
- measurement terminals
- clip
- widen
- rows
- interval
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000005259 measurement Methods 0.000 claims description 4
- 239000000523 sample Substances 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Description
第１図は、本考案の一実施例に係るＩＣクリツ
プの実施例を示す斜視図、そして、第２図は、従
来例を示す斜視図である。 １……プリント基板、２……ＩＣ、３……測定
端子、４……プローブ、６……ＩＣクリツプ。
プの実施例を示す斜視図、そして、第２図は、従
来例を示す斜視図である。 １……プリント基板、２……ＩＣ、３……測定
端子、４……プローブ、６……ＩＣクリツプ。
Claims (1)
- 測定端子の配列を片側二列にすると共に、隣接
する測定端子間に段差を設け測定端子間の間隔を
広げてなるＩＣクリツプ。
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20065684U JPS61110182U (ja) | 1984-12-25 | 1984-12-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP20065684U JPS61110182U (ja) | 1984-12-25 | 1984-12-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61110182U true JPS61110182U (ja) | 1986-07-12 |
Family
ID=30761710
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP20065684U Pending JPS61110182U (ja) | 1984-12-25 | 1984-12-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61110182U (ja) |
-
1984
- 1984-12-25 JP JP20065684U patent/JPS61110182U/ja active Pending