JPS61105805U - - Google Patents

Info

Publication number
JPS61105805U
JPS61105805U JP19122284U JP19122284U JPS61105805U JP S61105805 U JPS61105805 U JP S61105805U JP 19122284 U JP19122284 U JP 19122284U JP 19122284 U JP19122284 U JP 19122284U JP S61105805 U JPS61105805 U JP S61105805U
Authority
JP
Japan
Prior art keywords
wavelength interference
intensity detector
light intensity
light
laser length
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19122284U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19122284U priority Critical patent/JPS61105805U/ja
Publication of JPS61105805U publication Critical patent/JPS61105805U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Instruments For Measurement Of Length By Optical Means (AREA)
JP19122284U 1984-12-17 1984-12-17 Pending JPS61105805U (xx)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19122284U JPS61105805U (xx) 1984-12-17 1984-12-17

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19122284U JPS61105805U (xx) 1984-12-17 1984-12-17

Publications (1)

Publication Number Publication Date
JPS61105805U true JPS61105805U (xx) 1986-07-05

Family

ID=30748662

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19122284U Pending JPS61105805U (xx) 1984-12-17 1984-12-17

Country Status (1)

Country Link
JP (1) JPS61105805U (xx)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010131337A1 (ja) * 2009-05-13 2010-11-18 Koyama Naoyuki レーザ測距方法及びレーザ測距装置
WO2010131339A1 (ja) * 2009-05-13 2010-11-18 Koyama Naoyuki レーザ測距方法及びレーザ測距装置
WO2011070656A1 (ja) * 2009-12-09 2011-06-16 Koyama Naoyuki 測距方法及びレーザ測距装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5316652A (en) * 1976-07-29 1978-02-15 Oki Electric Ind Co Ltd Thickness measuring apparatus of plate form objects

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5316652A (en) * 1976-07-29 1978-02-15 Oki Electric Ind Co Ltd Thickness measuring apparatus of plate form objects

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2010131337A1 (ja) * 2009-05-13 2010-11-18 Koyama Naoyuki レーザ測距方法及びレーザ測距装置
WO2010131339A1 (ja) * 2009-05-13 2010-11-18 Koyama Naoyuki レーザ測距方法及びレーザ測距装置
WO2011070656A1 (ja) * 2009-12-09 2011-06-16 Koyama Naoyuki 測距方法及びレーザ測距装置

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