JPS61101766U - - Google Patents
Info
- Publication number
- JPS61101766U JPS61101766U JP18743084U JP18743084U JPS61101766U JP S61101766 U JPS61101766 U JP S61101766U JP 18743084 U JP18743084 U JP 18743084U JP 18743084 U JP18743084 U JP 18743084U JP S61101766 U JPS61101766 U JP S61101766U
- Authority
- JP
- Japan
- Prior art keywords
- fixed magnet
- magnet roll
- magnetic
- sleeve
- center
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000004907 flux Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
Landscapes
- Magnetic Brush Developing In Electrophotography (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18743084U JPS61101766U (hu) | 1984-12-12 | 1984-12-12 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18743084U JPS61101766U (hu) | 1984-12-12 | 1984-12-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS61101766U true JPS61101766U (hu) | 1986-06-28 |
Family
ID=30744895
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18743084U Pending JPS61101766U (hu) | 1984-12-12 | 1984-12-12 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS61101766U (hu) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2003091743A1 (fr) * | 2002-04-26 | 2003-11-06 | Kabushiki Kaisha Toshiba | Procede et systeme de diagnostic de deterioration de bobine |
-
1984
- 1984-12-12 JP JP18743084U patent/JPS61101766U/ja active Pending
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2003091743A1 (fr) * | 2002-04-26 | 2003-11-06 | Kabushiki Kaisha Toshiba | Procede et systeme de diagnostic de deterioration de bobine |
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