JPS6094616U - Inspection jig - Google Patents

Inspection jig

Info

Publication number
JPS6094616U
JPS6094616U JP18459883U JP18459883U JPS6094616U JP S6094616 U JPS6094616 U JP S6094616U JP 18459883 U JP18459883 U JP 18459883U JP 18459883 U JP18459883 U JP 18459883U JP S6094616 U JPS6094616 U JP S6094616U
Authority
JP
Japan
Prior art keywords
tip
inspection jig
inspected
center axis
predetermined distance
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP18459883U
Other languages
Japanese (ja)
Inventor
修身 加藤
石川 清好
Original Assignee
三菱レイヨン株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 三菱レイヨン株式会社 filed Critical 三菱レイヨン株式会社
Priority to JP18459883U priority Critical patent/JPS6094616U/en
Publication of JPS6094616U publication Critical patent/JPS6094616U/en
Pending legal-status Critical Current

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Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の実施例の正面図、第2図は同上実施例
の側面図である。 1・・・チャック、1a、1b・・・把持部、3・・・
ブラケット、4・・・ハンドル、5・・・支持台、7・
・・スライドユニット、8・・・支柱、9・・・中心軸
FIG. 1 is a front view of an embodiment of the present invention, and FIG. 2 is a side view of the same embodiment. 1... Chuck, 1a, 1b... Gripping part, 3...
Bracket, 4... Handle, 5... Support stand, 7.
... Slide unit, 8... Support, 9... Center axis.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 1 被検査物を把持する把持部を有するチャックを支持
台上の所定の回転中心軸線の周りに回転、   可能に
支持させるとともに、該把持部の先端が該回転中心軸線
上から所定の距離だけ離間するよう配置し、被検査物が
前記把持部によってその先端が該把持部先端から前記所
定の距離だけ突出するよう把持されたとき、該被検査物
先端が前記回転中心軸線上に位置するようにしたことを
特徴とする検査用治具。    ・2 前記支持台が摺
動自在である実用新案登録請求の範囲第1項記載の検査
用治具。
1. A chuck having a gripping part that grips the object to be inspected is rotated around a predetermined rotational center axis on a support stand, and supported so that the tip of the gripping part is spaced a predetermined distance from the rotational center axis. and the tip of the object to be inspected is positioned on the rotation center axis when the object to be inspected is held by the gripping portion such that its tip protrudes from the tip of the gripping portion by the predetermined distance. An inspection jig characterized by: -2 The inspection jig according to claim 1, wherein the support base is slidable.
JP18459883U 1983-12-01 1983-12-01 Inspection jig Pending JPS6094616U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18459883U JPS6094616U (en) 1983-12-01 1983-12-01 Inspection jig

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18459883U JPS6094616U (en) 1983-12-01 1983-12-01 Inspection jig

Publications (1)

Publication Number Publication Date
JPS6094616U true JPS6094616U (en) 1985-06-27

Family

ID=30399215

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18459883U Pending JPS6094616U (en) 1983-12-01 1983-12-01 Inspection jig

Country Status (1)

Country Link
JP (1) JPS6094616U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6425424A (en) * 1987-07-21 1989-01-27 Matsushita Electric Ind Co Ltd Manufacture of semiconductor device

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6425424A (en) * 1987-07-21 1989-01-27 Matsushita Electric Ind Co Ltd Manufacture of semiconductor device

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