JPS6090412A - Surface acoustic wave element - Google Patents

Surface acoustic wave element

Info

Publication number
JPS6090412A
JPS6090412A JP19849683A JP19849683A JPS6090412A JP S6090412 A JPS6090412 A JP S6090412A JP 19849683 A JP19849683 A JP 19849683A JP 19849683 A JP19849683 A JP 19849683A JP S6090412 A JPS6090412 A JP S6090412A
Authority
JP
Japan
Prior art keywords
electrode
insulating film
surface acoustic
acoustic wave
lift
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19849683A
Other languages
Japanese (ja)
Inventor
Masami Mochizuki
望月 正美
Shinichi Suzuki
進一 鈴木
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Pioneer Corp
Original Assignee
Pioneer Corp
Pioneer Electronic Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Pioneer Corp, Pioneer Electronic Corp filed Critical Pioneer Corp
Priority to JP19849683A priority Critical patent/JPS6090412A/en
Publication of JPS6090412A publication Critical patent/JPS6090412A/en
Pending legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02Details
    • H03H9/02535Details of surface acoustic wave devices
    • H03H9/02818Means for compensation or elimination of undesirable effects
    • H03H9/02834Means for compensation or elimination of undesirable effects of temperature influence
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02Details
    • H03H9/02535Details of surface acoustic wave devices
    • H03H9/02614Treatment of substrates, e.g. curved, spherical, cylindrical substrates ensuring closed round-about circuits for the acoustical waves
    • H03H9/02622Treatment of substrates, e.g. curved, spherical, cylindrical substrates ensuring closed round-about circuits for the acoustical waves of the surface, including back surface
    • HELECTRICITY
    • H03ELECTRONIC CIRCUITRY
    • H03HIMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
    • H03H9/00Networks comprising electromechanical or electro-acoustic devices; Electromechanical resonators
    • H03H9/02Details
    • H03H9/02535Details of surface acoustic wave devices
    • H03H9/02818Means for compensation or elimination of undesirable effects
    • H03H9/02842Means for compensation or elimination of undesirable effects of reflections
    • H03H9/0285Means for compensation or elimination of undesirable effects of reflections of triple transit echo

Landscapes

  • Physics & Mathematics (AREA)
  • Acoustics & Sound (AREA)
  • Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)

Abstract

PURPOSE:To reduce reflected waves at electrode finger ends by providing an insulating film over the entire surface of a substrate except electrode parts of a surface acoustic wave element by a lift-off method. CONSTITUTION:The surface of the piezoelectric substrate 1 except an input electrode 3 and an output electrode 3 on it is covered with the insulating film 5 by the lift-off method. Acoustic impedance values of the electrode part 2 and insulating film part 5 are denoted as Z1 and Z2, and the electrode gap which is a free surface is charged with the insulating film 5 to approximate the ratio Z1/Z2 to 1. Thus, the difference in acoustic impedance between the electrode part and gap part is eliminated, so reflected waves at electrode finger ends are reduced to remove or reduce the influence of a triple transient echo wave upon the characteristics.

Description

【発明の詳細な説明】 本発明は、弾性表向波素子に関し、特に弾性表面波に対
するg %インピーダンスを改善した弾性表面波素子に
関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a surface acoustic wave device, and more particularly to a surface acoustic wave device with improved g % impedance for surface acoustic waves.

従来の弾性表面波素子は、第1図に示すように、LiN
b0a(=オプ酸すチウA)I LiTa03(タンタ
ル酸リチウム)、圧電セラミックス等の圧電体基板1上
に大刀電気信号を弾性表1111波4に変換する入力電
極2と、伝搬してきた弾性表面波を電気信号に俊侠し、
取シ出す出力電極3から成る。
A conventional surface acoustic wave element is made of LiN, as shown in FIG.
b0a (= Op-Acid A) I On a piezoelectric substrate 1 made of LiTa03 (lithium tantalate), piezoelectric ceramics, etc., there is an input electrode 2 that converts an electric signal into an elastic wave 4, and a surface acoustic wave that has propagated. to electrical signals,
It consists of an output electrode 3 which is taken out.

通常、′a電極部、アルミニウム(A7)等の金属を基
板表面に被着し、これをフォトエツチング技術を用いて
Qr定形状の′I4極パターンを形成している。入力電
極2から励振された弾性表面波4は、基板表面を出力電
極3に向って伝搬し、出力信号として取り出される。こ
の時、弾性表面波4の一部は出力電極で反射され、入力
電極2に戻るが、ここでも上記と同様に反射が起こる。
Usually, a metal such as aluminum (A7) is deposited on the surface of the substrate for the 'a electrode part, and a photoetching technique is used to form a Qr regular-shaped 'I quadrupole pattern. A surface acoustic wave 4 excited from the input electrode 2 propagates along the substrate surface toward the output electrode 3 and is extracted as an output signal. At this time, a part of the surface acoustic wave 4 is reflected by the output electrode and returns to the input electrode 2, but reflection occurs here as well in the same manner as described above.

この波は、最初に伝搬した波に対して、3倍の遅延時間
を経た後、受信されるため、トリプルトランジットエコ
ー(以下TTEと略す)波と呼ばれ、たとえば弾性表面
波フィルタにおいては、通過帯域内での振幅特性リップ
ルや、群遅延特性リップル等の主なる発生原因となって
いた。
This wave is called a triple transit echo (hereinafter abbreviated as TTE) wave because it is received after a delay time three times that of the initially propagated wave, and for example, in a surface acoustic wave filter, it is This was the main cause of amplitude characteristic ripples and group delay characteristic ripples within the band.

TTEは、電極部と電極が存在しない伝搬路との音響イ
ンビータ゛ンスの不連続による反射成分と、負荷と電極
との電気的相互作用による反射成分から成ることがよく
知られている。後者の場合1よ、外部負荷との整合条件
によシ、ある仕度反射強度を抑圧することがh]能であ
る。
It is well known that TTE consists of a reflected component due to discontinuity in acoustic inbeatance between the electrode section and a propagation path where no electrode exists, and a reflected component due to electrical interaction between the load and the electrode. In the latter case (1), depending on the matching conditions with the external load, it is possible to suppress the reflected intensity to a certain extent.

一方、前者の場合、電極指を2分割(タプル′Qj、極
構造)にする力1人や、人力電極に対し出力電極を傾け
て反射波が入力端に直接戻らないようKする方法、ある
いは入出力11i極の一方を段状にする方法が用いられ
ている。
On the other hand, in the case of the former, there is a method of dividing the electrode finger into two (tuple 'Qj, polar structure), a method of tilting the output electrode with respect to the manual electrode so that the reflected wave does not return directly to the input end, or A method is used in which one of the input and output 11i poles is stepped.

さらに、電極にIjQfitの小さな相料を用いたり、
電極膜厚を薄くすることで音響インピーダンスの不連続
量を小ζ<シ、反射強度を減少きせている。
Furthermore, using a small IjQfit phase material in the electrode,
By reducing the thickness of the electrode film, the amount of discontinuity in acoustic impedance can be reduced to ζ<<, and the reflection intensity can be reduced.

しかし、これらの方法は、゛開極パターンや製作工程が
複雑であったり、また電極の占有面積も広くなる反ir
+J、 T T E波の充分な抑圧は得られなかった。
However, these methods require complicated opening patterns and manufacturing processes, and the electrodes occupy a large area due to the irradiation problem.
+J, T TE Sufficient suppression of E waves could not be obtained.

さらに′電極膜厚を薄くする方法は、電極での入力48
号の11(抗損を増大芒セ゛、電気イi」号を弾性表面
波に変換する効率が劣化するなどの欠点があった。
Furthermore, the method to reduce the electrode film thickness is to input 48
No. 11 (increasing resistance loss, electricity) had drawbacks such as deterioration of the efficiency of converting No. 11 into surface acoustic waves.

本発明は、上記の欠点を除去したものであp1弾性表血
波素子の?13.極都を除く基板全面にリフトオフ法で
絶縁膜を設け、電極指端での反射波を減少させた弾性表
面波素子を提供することを目的としている。
The present invention eliminates the above-mentioned drawbacks of the p1 elastic surface blood wave element. 13. The purpose of the present invention is to provide a surface acoustic wave element in which an insulating film is provided on the entire surface of the substrate except for the polar regions using a lift-off method, thereby reducing reflected waves at the ends of electrode fingers.

以下、本発明の実施例を図に従って、詳細に説明する。Embodiments of the present invention will be described in detail below with reference to the drawings.

第2図は本発明に係る弾性表面波素子の製作工程の実施
例を示す図である。まず、同図(alのように、LiN
b0.、LiTaO3,圧電セラミックス等の圧電体基
板1上に、絶縁膜5、たとえばSi Ot+ A It
’s膜等を真空蒸着法やスパッタリング法あるいはCV
D法によって形成する。次に、その上にポジ型フォトレ
ジスト6を塗布し、フォト技術を用い同図(b)のよう
に、入出WT、 極部(ターンの惑あけを行なう。
FIG. 2 is a diagram showing an embodiment of the manufacturing process of a surface acoustic wave device according to the present invention. First, as shown in the same figure (al), LiN
b0. , LiTaO3, piezoelectric ceramics, etc., an insulating film 5, for example, SiOt+ A It
's film etc. by vacuum evaporation method, sputtering method or CV
Formed by method D. Next, a positive type photoresist 6 is applied thereon, and the input/output WT and extreme portions (turns) are opened using a photo technique as shown in FIG. 2(b).

さらに、同図(clのように化学エツチングまたはドラ
イエツチング等により惑部の絶縁膜5を除去する。レジ
スト6はそのまま残し、さらにこの上に電極用の金属7
、たとえばアルミニウムを真空蒸着法やスパッタリング
法で同図(d)のように全面に被層後、リフトオフ法で
入出力電極以外の部分の金Jj5を除去し、素子は完成
する(絹2図(e))。
Furthermore, as shown in FIG.
For example, after coating the entire surface with aluminum using a vacuum evaporation method or sputtering method as shown in Figure 2(d), the lift-off method is used to remove the gold Jj5 from areas other than the input and output electrodes, and the device is completed (Silk Figure 2). e)).

上記工程により、入出力電極2,3以外の部分をi緑1
145で覆つノこ弾性表面波素子が得られる。
By the above process, the parts other than the input/output electrodes 2 and 3 are
A saw surface acoustic wave element covered with 145 is obtained.

次に、本発明の作用について説明する。Next, the operation of the present invention will be explained.

第3図は第2図telの人力電極2の1部拡大図である
。ここで、ff11.極部2と絶縁膜部5の音響インピ
ータンスをそiLぞれzlと2.とする。°従来、自由
表面であったit電極間隙絶縁膜5で埋めることでzi
と2.の比を1に近づけることがν1能となる。
FIG. 3 is a partially enlarged view of the manual electrode 2 shown in FIG. 2. Here, ff11. The acoustic impedances of the pole part 2 and the insulating film part 5 are respectively zl and 2. shall be. °By filling the IT electrode gap, which was previously a free surface, with the insulating film 5, the zi
and 2. Bringing the ratio of ν to close to 1 becomes the ν1 function.

一般に、電極指端で発生する反射波の強さは電イ1に部
と間隙との音響インピータンスの不連続量ξの関数とし
て表わこれる。ここで、たとえU′、1ξ1≦i1.0
5程度で、かつ電極指幅と電極間隙とが等しい場合、反
射波の振幅反射率1 rJ 1は、 1 P 1−w 1 tanh(Nξ〕1ここで、N:
電極の対数 となる。本発明の弾性表面波素子によれば、1ξ1≧0
となり、上式より音響インピーダンスの不連続に起因し
た反射波の反射率lp1もほとんど零にすることができ
る。
Generally, the intensity of the reflected wave generated at the end of the electrode finger is expressed as a function of the amount of discontinuity ξ in the acoustic impedance between the electrode 1 and the gap. Here, even if U′, 1ξ1≦i1.0
5, and when the electrode finger width and electrode gap are equal, the amplitude reflectance 1 rJ 1 of the reflected wave is 1 P 1-w 1 tanh (Nξ) 1 where, N:
This is the logarithm of the electrodes. According to the surface acoustic wave device of the present invention, 1ξ1≧0
According to the above equation, the reflectance lp1 of the reflected wave caused by the discontinuity of the acoustic impedance can also be made almost zero.

なお、絶縁膜5の膜厚h2は、′電極に用いた金桟材料
の’]量7711及び絶縁膜材料の質量ηL2がら、近
似的にり、=−シーh、とめられる。
The film thickness h2 of the insulating film 5 is approximated by =-shih based on the amount 7711 of the metal frame material used for the electrode and the mass ηL2 of the insulating film material.

2 なお、上記実施例では、圧電体基板1上に、絶縁膜5を
被着後、す7トオフ法によって電極膜7を設けたものを
示したが、迎に、電極膜7を被N後、リフトオフ法によ
って絶縁膜5を設けてもよい。
2. In the above embodiment, the electrode film 7 was provided on the piezoelectric substrate 1 by the step-off method after the insulating film 5 was deposited. Alternatively, the insulating film 5 may be provided by a lift-off method.

第3図において、゛電極部7の高さをh11絶縁膜5の
茜芒をり、とすると、hz>hlの場合、っまル絶縁膜
厚り、が電極膜厚h1より大きい場合はリフトオフ法に
よるパターン形成の容易式から前者の製作工程を採用す
るのが望舊しい。一方、11s>htの場合には、後者
の製作工程か望まし。
In FIG. 3, if the height of the electrode section 7 is h11 and the peak of the insulating film 5, then if hz>hl, the total insulating film thickness is greater than the electrode film thickness h1, then lift-off occurs. It is desirable to adopt the former manufacturing process because of the ease of pattern formation using the method. On the other hand, if 11s>ht, the latter manufacturing process is preferable.

一方、hl>h2の場合には、後者の製作工程が望まし
い。h、=h、の場合はどららの工程を採用しても構わ
ない。
On the other hand, when hl>h2, the latter manufacturing process is preferable. In the case of h,=h, the process of dora may be adopted.

また、上記実施例では、電極部を除く基板全面に絶縁族
を設けた揚台について説明しだが、反射波の発生蝕であ
る入出力電極部のみに絶縁膜を設けたものであってもよ
く、上記実施例と同様の効果を奏する。
Furthermore, in the above embodiment, an insulating film is provided on the entire surface of the substrate except for the electrode portions, but an insulating film may be provided only on the input/output electrode portions where reflected waves are generated. , the same effect as the above embodiment is achieved.

以上のように、本発明の弾性表面波素子は、入出力電極
部を除く圧電基板全面にリフトオフ法という極めて簡単
な方法によシ絶縁膜を設け、電4■部とその間隙部との
音響インピーダンスの差か無くなるように構成したので
、電極指端での弾性的な反射波の発生は減少し、TTE
による特性上への影響を除去あるいは著しく軽減するこ
とができる。
As described above, in the surface acoustic wave device of the present invention, an insulating film is provided on the entire surface of the piezoelectric substrate except for the input/output electrode portions by a very simple method called the lift-off method, and the acoustic Since the configuration eliminates the impedance difference, the generation of elastic reflected waves at the electrode finger ends is reduced, and TTE
It is possible to eliminate or significantly reduce the influence on characteristics caused by

なお、絶縁膜厚h2≧電極膜厚h1の場合には、絶縁膜
が電極の11!1面を保膿することになるので、追加エ
ツチングにより、電極j換厚を薄くする場合、電極側面
がエツチングされて電極が細くなるという不具合も起こ
らない。
In addition, when the insulation film thickness h2≧electrode film thickness h1, the insulation film will retain the 11! There is no problem of the electrode becoming thinner due to etching.

【図面の簡単な説明】[Brief explanation of drawings]

第1図r/i従来の弾性表面波装置を示す図、第2図(
at乃至82図(elは、本発明に係る弾性表面波素子
の製造工程ごとの断面図、第3図tよ本発明により形成
された第2図(e)における電極の1部を示す拡大断面
図でおる。 1・・・・・・圧電体基板 2・・・・・・入力電極 3・・・・・・出力電極 4・・・・・・弾性表面波 5・・・・・・絶縁膜 6・・・・・・レジスト 7・・・・・・金属膜 喘許出願人 パイオニア株式会社 第1図 第2図 第3図
Figure 1 r/i A diagram showing a conventional surface acoustic wave device, Figure 2 (
Figures at to 82 (el are cross-sectional views for each manufacturing process of the surface acoustic wave device according to the present invention, and Figure 3 t is an enlarged cross-sectional view showing a part of the electrode in Figure 2 (e) formed according to the present invention. The diagram shows: 1...Piezoelectric substrate 2...Input electrode 3...Output electrode 4...Surface acoustic wave 5...Insulation Membrane 6...Resist 7...Metal film Applicant: Pioneer Corporation Figure 1 Figure 2 Figure 3

Claims (1)

【特許請求の範囲】[Claims] 圧電基板上に互いに対向して形成された入力電極および
出力電極と、前記基板上の人出電極指端の部分傾形成さ
れた絶縁膜とを備え、前記人出電極指端での反射波を抑
圧したことを特−徴とする弾性表面波素子。
An input electrode and an output electrode are formed on a piezoelectric substrate to face each other, and an insulating film is formed on the substrate to partially tilt the exposed electrode finger end, and the reflected wave at the exposed electrode finger end is suppressed. A surface acoustic wave device characterized by suppression.
JP19849683A 1983-10-24 1983-10-24 Surface acoustic wave element Pending JPS6090412A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19849683A JPS6090412A (en) 1983-10-24 1983-10-24 Surface acoustic wave element

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19849683A JPS6090412A (en) 1983-10-24 1983-10-24 Surface acoustic wave element

Publications (1)

Publication Number Publication Date
JPS6090412A true JPS6090412A (en) 1985-05-21

Family

ID=16392088

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19849683A Pending JPS6090412A (en) 1983-10-24 1983-10-24 Surface acoustic wave element

Country Status (1)

Country Link
JP (1) JPS6090412A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996004713A1 (en) * 1994-08-05 1996-02-15 Japan Energy Corporation Surface acoustic wave device and production method thereof
EP0744830A1 (en) * 1994-10-20 1996-11-27 Japan Energy Corporation Surface acoustic wave device and production method thereof
WO2002031974A1 (en) * 2000-10-12 2002-04-18 Fujitsu Limited Surface acoustic wave device and method of producing the same
WO2004059837A1 (en) * 2002-12-25 2004-07-15 Matsushita Electric Industrial Co., Ltd. Electronic component and electronic apparatus using this electronic component

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5420947U (en) * 1977-07-13 1979-02-10
JPS5651535A (en) * 1979-10-01 1981-05-09 Kobe Steel Ltd Sintered ore of iron ores and its manufacture

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5420947U (en) * 1977-07-13 1979-02-10
JPS5651535A (en) * 1979-10-01 1981-05-09 Kobe Steel Ltd Sintered ore of iron ores and its manufacture

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO1996004713A1 (en) * 1994-08-05 1996-02-15 Japan Energy Corporation Surface acoustic wave device and production method thereof
US5923231A (en) * 1994-08-05 1999-07-13 Kinseki Limited Surface acoustic wave device with an electrode insulating film and method for fabricating the same
EP0744830A1 (en) * 1994-10-20 1996-11-27 Japan Energy Corporation Surface acoustic wave device and production method thereof
EP0744830A4 (en) * 1994-10-20 1999-02-03 Japan Energy Corp Surface acoustic wave device and production method thereof
WO2002031974A1 (en) * 2000-10-12 2002-04-18 Fujitsu Limited Surface acoustic wave device and method of producing the same
WO2004059837A1 (en) * 2002-12-25 2004-07-15 Matsushita Electric Industrial Co., Ltd. Electronic component and electronic apparatus using this electronic component

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