JPS6073380A - Measurement of magnetostriction constant - Google Patents

Abstract

PURPOSE:To make it possible to easily measure the magnetostriction of a magnetic crystal, by providing a permanent magnet to the leading end of a yoke and calculating the relative change amount of grating constant by using a magnetic field applying apparatus having such a structure that the yoke is driven by a motor. CONSTITUTION:A square shaft 15 having a yoke 14 attached to the leading end thereof by the screw 13 provided to a gear 12 driven by a motor 10 is provided so as to pierce a holding plate 16 in a before and behind slidable manner and a pair of permanent magnets are fixed to the inside of the yoke 14. The yoke 14 provided with the permanent magnets 17 is formed so as to be freely attached to and detached from the shaft 15. By exchanging this yoke, a necessary magnetic field value can be obtained. A specimen support stand 18 having a specimen 6 attached thereto is set to the prescribed position in an X-ray diffraction apparatus and a magnetic field applying apparatus is placed so as to be opposed to the support stand 18 and the motor is driven to apply magnetic fields from the permanent magnets 17. By this method, magnetostriction constant can be easily measured.

Description

DETAILED DESCRIPTION OF THE INVENTION (a) Technical Field of the Invention The present invention relates to a method for measuring the number of magnetic worms using a magnetic field application device that is easy to handle.

(b) Back of technology ←ζ Bubble memory (Bubble memory) Ha non-magnetic 14-
The (111
A magnetic bubble generation circuit is created by epitaxially growing a magnetic carnet with the required T6-temperature properties on a surface of ), and using this as a substrate and using a conductive material on this substrate.

Patterns such as gate circuits, transfer circuits, detection circuits, etc. are made using high permeability magnetic material barbs, and cylindrical magnetic bubble magnetic domains, which are held by a bias magnetic field applied perpendicular to the substrate, are formed on the substrate surface. This is a memory that is driven along a transfer circuit by a rotating magnetic field applied in parallel, and writes and reads information.

For magnetic garnet used in high-density double memories, in which ion-implanted devices are the mainstream, material properties required from the viewpoint of use include ion-implanted anisotropy constant (Ki) and magnetostriction constant (λ).

Here, the ion implantation induced anisotropy constant (K1) is related to the ease of bubble movement due to the driving magnetic field, and a large value indicates that a wide bias margin υ can be obtained. Further, the magnetostriction constant (λ) indicates the degree of deformation that occurs when a magnetic material is magnetized, and there is the following relationship between the two.

3 E Δd K# - Ding λ1 + Jj (d'......(1) However, E...... Young's modulus μ...
・・・・・・Poisson's ratio d・・・・・・・・・
・・・・・・Lattice constant Now, Garnet for bubble memory)
In the case of , the magnetostriction constant is expressed as (λ11.) because it is grown on the (1113 plane) of GGG, and the
111) The change in the lattice constant seen from the direction will be the same. Here, the value of J(i) can be measured by ferromagnetic resonance absorption (F'MRI method).In other words, the magnetic field is grown along the film surface of the magnetic t'ig garnet grown on the GGG plane. The value of the applied resonant magnetic field (Hl), the value of the resonant magnetic field when applied perpendicular to the film surface (Hl), and the rotational magnetic ratio of spin (γ) of 3
Ki can be set from one im. Therefore, the magnetostriction constant (λ1, 1) is calculated as follows: When a magnetic field is applied to a magnetic core, the interstitial space [1 tl - measured becomes completely 0 (C) Prior art and problems The 4%-/constant θ of the Carnet film, that is, the crystal lattice spacing, can be measured using an X-ray diffraction device.

Figure 1 +-r shows the configuration of this device, with X-ray tube 1
X-rays 4 generated by applying a high electric field between the filament 2 and the anode 3 made of copper are projected onto the GGG crystal to narrow the wavelength width and make it monochromatic, and then grown epitaxially on the (111) plane of the GGG. It is projected onto a magnetic garnet sample 6, causes diffraction to occur in this crystal lattice, and is measured by a counter tube 7, thereby determining the lattice spacing. Here, in order to apply a magnetic field to the magnetic garnet sample, the conventional method is to place the sample on a sample holder 9 located at the center of a magnetic pole 8 made of an electromagnet, as shown in FIG. Xm was projected through the hole 19, thereby measuring the change (7) in the lattice constant due to the addition of the magnetic field Δd.

However, this method requires a large electromagnet, weighs more than 1 ton, consumes a lot of power, requires water cooling, and is impractical. Also, there is a residual magnetic field, so it is impossible to completely eliminate the magnetic field. There is a problem that it cannot be done.

(d) Object of the Invention The entire object of the present invention is to provide a configuration of a magnetic field application device that allows the magnetostriction constant of a magnetic crystal to be easily determined.

(e) An object of the present invention is to measure the relative change in lattice constant necessary for calculating the magnetostriction constant of a magnetic crystal by providing a permanent magnet at the tip of a yoke, and driving the yoke with a motor. This is done using a structured magnetic field application device! This can be achieved by using a magnetostriction constant measurement method characterized by:

(fl) Example of the Invention There are two cases in which a magnetic field is applied to the sample 6: parallel to the sample surface and perpendicular to the sample surface.

Fig. 413 shows an example in which the shafts are applied in parallel, and a square shaft 15 with a yoke 14 attached to the tip is attached to a holding plate 16 by a screw 13 provided on a gear 12 that meshes with and interlocks with a gear 11 driven by a motor 10. It is configured to penetrate and slide forward and backward. A pair of permanent magnets 1715 (adhesively fixed) are placed inside the yoke 14, which has a U-shaped cross section and is made of a magnetic material such as iron.
The yoke 14, on which all the permanent magnets 17 are suspended, is formed to be detachable from the shaft 15, and by replacing it, the required magnetic field value can be obtained. On the other hand, the sample 6 whose lattice constant is to be measured is fixed to the test tI support 18 with adhesive or the like, and the sample support 1 with the sample 6 attached thereto.
8 is set at a prescribed position in the X-ray diffraction apparatus as shown in FIG.
5 and apply a magnetic field using the permanent magnet 170. With this configuration, the magnetic field can be applied without any problem to the projection of the X-rays 4 shown by the broken line.

FIG. 4 shows an embodiment showing the configuration of a device that applies a magnetic field perpendicularly to the sample 6. Gear 111-1 rotates from motor 10IC: screws 13 are provided on the four sides of support base 19 and interlock with gear 111-1. This allows the shaft 15 to slide up and down. Further, as in the case of the apparatus shown in FIG. 3, a yoke 14 with a permanent magnet 17 provided inside is fixed in a removable manner, and the permanent magnet 17 is arranged so as to sandwich the sample 6 from the front and back. It becomes possible to apply a magnetic field.

In addition, in the embodiments of FIGS. 3 and 4, the permanent magnet 1
By selecting No. 7, the magnetic field can be applied with a large capacity of D in the range of 0 to 5000 Oe. This makes it possible to easily measure the change in the lattice spacing due to the magnetic field applied UK.

(g) Effects of the Invention The present invention has made great efforts until now in the measurement of the relative change in the lattice constant due to the magnetic field, which is 9 μ when calculating the magnetostriction constant of a magnetic Carnet.
This was done in order to improve the need for multiple installations, and by using the device according to the present invention, it can be easily and continuously performed, and by moving the magnet 17 away from the sample 6, the magnetic field can be completely zeroed out. It is possible to realize the state of , and high-efficiency measurement becomes fiJ capability.

[Brief explanation of drawings]

Figure 1 is a clear diagram of the configuration of the X-ray diffraction device H51, Figure 2 is a sectional view showing the configuration of a conventional magnetic field application device, Figure 3 and C44
The figure is a perspective view of the magnetic field application device according to the present invention. In the figure, 4 indicates X&! , 61- is the sample, the a pole of the 8Vi electromagnet, ] Off, -F knee 1'13, 1211-
j gear, 13 is a screw, 14 is a yoke, 15 is a shaft,
17 is a permanent magnet. 1st Figure Half 3 Threshold Hayabusa 4 Figure

Claims (1)

[Claims] Measurement of the amount of relativization of the lattice constant necessary to calculate the magnetostriction constant of a magnetic crystal is carried out using a magnetic field application device made of S, in which a permanent magnet is placed at the tip of a yoke, and the yoke is pivoted by a motor. A method for measuring a magnetostriction constant, characterized by: