JPS6051055B2 - How to detect minute defects - Google Patents

How to detect minute defects

Info

Publication number
JPS6051055B2
JPS6051055B2 JP10571477A JP10571477A JPS6051055B2 JP S6051055 B2 JPS6051055 B2 JP S6051055B2 JP 10571477 A JP10571477 A JP 10571477A JP 10571477 A JP10571477 A JP 10571477A JP S6051055 B2 JPS6051055 B2 JP S6051055B2
Authority
JP
Japan
Prior art keywords
monitor
inspected
image
screen
television camera
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP10571477A
Other languages
Japanese (ja)
Other versions
JPS5439185A (en
Inventor
秀司 宮本
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Yamamura Glass KK
Original Assignee
Yamamura Glass KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yamamura Glass KK filed Critical Yamamura Glass KK
Priority to JP10571477A priority Critical patent/JPS6051055B2/en
Publication of JPS5439185A publication Critical patent/JPS5439185A/en
Publication of JPS6051055B2 publication Critical patent/JPS6051055B2/en
Expired legal-status Critical Current

Links

Description

【発明の詳細な説明】 本発明は、たとえばガラスびん等の物品における傷ある
いは破損等の欠点を検出する方法に関し、詳しくは、良
否判定の困難な微小欠点をテレビカメラを利用して検出
する方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for detecting flaws such as scratches or breakage in articles such as glass bottles, and more specifically, a method for detecting minute defects that are difficult to judge as good or bad using a television camera. It is related to.

従来、物品における微小欠点の検出方法としては、ミラ
ージユレンズを用いて複数個の物品像をテレビカメラの
撮像面上に結像させ、−フレーム中の欠点の数を多くし
て検出する方法や、クロスフィルターを用い輝度の高い
欠点像を十字状に光らせる事により、欠点像を大きくし
て検出する方法がある。
Conventionally, methods for detecting minute defects in articles include methods in which a mirage lens is used to form multiple images of the article on the imaging surface of a television camera, and the number of defects in the frame is increased to detect the defects. There is a method of detecting a defect image by enlarging it by using a cross filter to make a defect image with high brightness shine in a cross shape.

然し乍ら、前者においては撮像面上の物品像の光量が落
ち、且つ、視野が狭くなり微小欠点を見落とすという虞
れがある。また、後者においては欠点像の輝度が相当高
いものでないと光らず、輝度の低いものは検出しにくく
、実際上微小欠点を検出するのが困難であるといつた問
題を持つている。そこで、本発明は上記欠点に鑑み、良
否判定の困難な微小欠点を確実に検出する方法を提供す
ることを目的とする。
However, in the former case, the light intensity of the article image on the imaging surface is reduced, and the field of view is narrowed, so there is a risk that minute defects may be overlooked. In addition, the latter method does not emit light unless the brightness of the defect image is quite high, and it is difficult to detect a defect image with low brightness, which has the problem that it is actually difficult to detect minute defects. SUMMARY OF THE INVENTION In view of the above drawbacks, it is an object of the present invention to provide a method for reliably detecting minute defects that are difficult to judge.

以下、本発明の実施例について図面に基づき説明する。Embodiments of the present invention will be described below with reference to the drawings.

第1図aは本発明方法を実施するための一構成例を示し
1はコンベア等の搬送手段、2はこの搬送手段1によつ
て間欠的(又は連続的)に搬送される被検査物、3はテ
レビカメラ、4は光源である。そして、光源4から照射
された光は被検査物2の表面に当つて反射され、テレビ
カメラ3によつて該被検査物2の反射光像として撮像さ
れるよう構成してある。5はテレビカメラ3からのビデ
オ信号で、特殊効果発生器6に入力される。
FIG. 1a shows an example of a configuration for carrying out the method of the present invention, and 1 is a conveyance means such as a conveyor, 2 is an object to be inspected that is intermittently (or continuously) conveyed by this conveyance means 1, 3 is a television camera, and 4 is a light source. The light emitted from the light source 4 is reflected by the surface of the object 2 to be inspected, and is captured by the television camera 3 as a reflected light image of the object 2 to be inspected. 5 is a video signal from the television camera 3, which is input to the special effect generator 6.

8は特殊効果発生器6からのミキシング信号7に基づい
てその画面に像を映し出すモニターで、輝度とコントラ
ストを・適宜に調整しうるよう構成されている。
8 is a monitor that projects an image on its screen based on the mixing signal 7 from the special effect generator 6, and is configured so that the brightness and contrast can be adjusted as appropriate.

9はモニター8の画面を撮像するテレビカメラで、その
出力であるビデオ信号5’は特殊効果発生器6に入力さ
れる。
A television camera 9 takes an image of the screen of the monitor 8, and its output, a video signal 5', is input to the special effect generator 6.

ここに、特殊効果発生器6とは、入力されるビ門デオ信
号を重ね合わせたり(ミキシング)、左右分割して別々
の画面を作り出したり、或いは白黒反転する等の機能を
備えており、市販品として例えば松下通信工業社製型番
WJ540がある。
Here, the special effect generator 6 has functions such as overlapping (mixing) input video signals, dividing left and right to create separate screens, or inverting black and white. For example, there is model number WJ540 manufactured by Matsushita Tsushin Kogyo Co., Ltd.

次に、上述の構成の動作について、第1図を及び第3図
をも参照しながら説明する。今、被検査物2の微小欠点
があるものとすると、まず、テレビカメラ3が被検査物
2を撮像し−そのビデオ信号5が特殊効果発生器6に入
力される。他方、モニター8の画面8″がテレビカメラ
9によつて撮像されて、そのビデオ信号5″が特殊効果
発生器6に入力される。そして、特殊効果発生器6では
上記ビデオ信号5(被検査物2aとそれに伴なう欠点像
10aを含む)とビデオ信号5″(モニター8の画面8
″のみ)とがミキシングされて、第3図aに示すように
、ミキシング信号7が形成され、これがモニター8に入
力されることにより、同図aの右端に示す如き、映像が
表示される。次に、前モニター8の画面『をテレビカメ
ラ9にて撮像し、そのビデオ信号5″とテレビカメラ3
からのビデオ信号5とが特殊効果発生器6にてミキシン
グされ、ミキシング信号7が前記モニター8へ送られる
ことにより、第3図bの右端に示すように、画面8″に
は被検査物2a,2bと欠点像10a,10bが映し出
される。更に、前記モニター8の画面8″をテレビカメ
ラ9にて撮像し、そのビデオ信号5″とテレビカメラ3
からのビデオ信号5とが特殊効果発生器6にてミキシン
グされるとにより、第3図cの右端に示すように、画面
8″には被検査物2a,2b,2cと欠点像10a,1
0b,10cが映し出される。
Next, the operation of the above-described configuration will be explained with reference to FIG. 1 and FIG. 3 as well. Assuming that there is a minute defect in the object 2 to be inspected, first, the television camera 3 takes an image of the object 2 to be inspected, and the video signal 5 thereof is input to the special effect generator 6. On the other hand, a screen 8'' of a monitor 8 is imaged by a television camera 9, and its video signal 5'' is input to a special effects generator 6. Then, in the special effect generator 6, the video signal 5 (including the object to be inspected 2a and the accompanying defect image 10a) and the video signal 5'' (the screen 8 of the monitor 8
'') is mixed to form a mixed signal 7 as shown in FIG. 3a, which is input to the monitor 8 to display an image as shown at the right end of FIG. 3a. Next, the screen of the front monitor 8 is imaged by the television camera 9, and the video signal 5'' and the television camera 3 are
A special effect generator 6 mixes the video signal 5 with the video signal 5 from the monitor 8, and the mixed signal 7 is sent to the monitor 8. As shown in the right end of FIG. , 2b and defect images 10a, 10b are displayed.Furthermore, the screen 8'' of the monitor 8 is imaged by a television camera 9, and the video signal 5'' and the television camera 3 are captured.
As a result, as shown in the right end of FIG.
0b and 10c are displayed.

以下、上述と同様の操作をくり返し行なうことによりモ
ニター8の画像8″,8″″″,8″〜・・・・・は第
1図bに示されるようなものになり、モニター8の画面
8″上に被検査物像10a,10b,10c・・・・が
複数個連続した像として映し出され、それに伴い欠点像
10a,10b,10c・・・・・も複数個連続して映
し出されることにより強調される。さらにモニター8の
コントラスト及び輝度を調整することにより欠点像を一
層強調す−る。そして適当時間経過後に該被検査物像2
a,2b,2c・・・・・・を前記モニター8の画面8
″を撮像するテレビカメラ9でもつて走査し、走査信号
11を判定回路12に送り微小欠点を検出するものであ
る。また、前記テレビカメラ3,9のビデオ信号5,5
″を特殊効果発生装置6でもつて、被検査物像10a,
10b,10c・・・・を重ね合わせるよう調整すれば
、モニター8の画面8″上には第1図Cに示されるよう
な1個の被検査物2″と欠点像1『を得ることができる
Thereafter, by repeating the same operations as described above, the images 8'', 8'''', 8'' on the monitor 8 become as shown in FIG. 1b, and the screen on the monitor 8 becomes A plurality of images of the object to be inspected 10a, 10b, 10c, . is emphasized by Further, by adjusting the contrast and brightness of the monitor 8, the defect image is further emphasized. Then, after an appropriate period of time has passed, the inspection object image 2
a, 2b, 2c... on the screen 8 of the monitor 8
'' is also scanned by a television camera 9, and a scanning signal 11 is sent to a determination circuit 12 to detect minute defects.
'' with the special effect generating device 6, the image of the object to be inspected 10a,
10b, 10c, etc. are adjusted so that they are superimposed, it is possible to obtain one inspected object 2'' and defect image 1'' on the screen 8'' of the monitor 8 as shown in FIG. 1C. can.

この場合は、被検査物2″がモニター画面8″一杯に拡
大して映し出すことができ、しかも、輝度とコントラス
トを調整することによつて欠点像10″を拡大するとが
できる。
In this case, the inspected object 2'' can be enlarged and displayed to fill the monitor screen 8'', and the defect image 10'' can be enlarged by adjusting the brightness and contrast.

尚、この実施例においては欠点像10a,10b,10
c,・・,1『が白でモニター8の画面8″に黒地に白
く欠点像10a,10b,10c・・・・・,1『が映
し出される場合を説明したが、欠点像10a,10b,
10c,・・・1『が黒いときは前記特殊効果発生器6
によりネガティブ−ポジティブ反転を行ない黒地に白く
欠点像10a,10b,10c,・・・1『を映し出す
ことができハレーシヨン及び光滲現象により欠点像の検
出が容易となる。
In this embodiment, the defect images 10a, 10b, 10
We have explained the case where the defect images 10a, 10b, 10c..., 1' are white and the defect images 10a, 10b, 10c..., 1' are displayed on the screen 8'' of the monitor 8 as white on a black background.
10c,...1'' is black, the special effect generator 6
By performing negative-positive inversion, the defect images 10a, 10b, 10c, .

次に、第2図aは本発明の別実施例を示すもので、光源
4からの光を当てられた被検査物13とモニター8とを
1個のテレビカメラ9でもつて撮像可能に併置し、該被
検査物13の反射光像を該テレビカメラ9にて撮像し、
該カメラ9のビデオ信号14によりモニター8の画面8
゛上に映し出すように構成したものである。
Next, FIG. 2a shows another embodiment of the present invention, in which an object to be inspected 13 illuminated with light from a light source 4 and a monitor 8 are placed side by side so that a single television camera 9 can take an image. , capturing a reflected light image of the object to be inspected 13 with the television camera 9;
The screen 8 of the monitor 8 is displayed by the video signal 14 of the camera 9.
``It was constructed so that it would be projected on top.

本実施例の動作は前述の実施例の場合と略同様てあつて
第4図をも参照しながら説明すると、まず、第1段階に
おいて、何も映し出されていないモニター8の画面と被
検査物13をカメラ9て同時に撮像すると、4図aに示
すように、モニター8の画面8″には被検査物13aと
欠点像15aが映し出される。次いで、第2段階で前記
モニター8の画面8″と被検査物13とを同時に撮像す
ると、第4図bに示すように、モニター8の画面には被
検査物13a,13b1欠点像15a,15bが映し出
される。更に、第3段階では、モニター8の画面8″中
に被検査物13a,13b,13c1欠点像15a,1
5b,15cが映し出される。
The operation of this embodiment is almost the same as that of the previous embodiment, and will be explained with reference to FIG. 13 at the same time with the camera 9, the inspected object 13a and the defect image 15a are displayed on the screen 8'' of the monitor 8, as shown in FIG. When images of the inspection object 13 and the inspection object 13 are captured simultaneously, defect images 15a and 15b of the inspection object 13a and 13b1 are displayed on the screen of the monitor 8, as shown in FIG. 4b. Furthermore, in the third stage, the inspected objects 13a, 13b, 13c1 defect images 15a, 1 are displayed on the screen 8'' of the monitor 8.
5b and 15c are displayed.

なお、9″はテレビカメラ9の視野である。そして、以
下上述と同様の操作をくり返すことにより第2図bに示
されるようなモニター8、画像8″,8″″″・・を得
、連続する複数個の被検査物13b,13c,・・・・
とそれに伴う欠点像15b,15c・・・が前記モニタ
ー8の画面8″上に連続して形され、適当時間経過後に
該被検査物13b,13c・・・・を前記テレビカメラ
9にて走査し走査信号16を判定回路12に送り、該判
定回路12にて微小欠点を検出するものである。また、
この別実施例においてはモニター8と被検査物13とを
併置したが、場所等の関係上被検査物13をモニター8
に併置できない場合が生じるが、そのとき第2図aに示
される被検査物13の位置に鏡等の光学機器を設置して
被検査物像を該光学機器上に映す様にすれば第2図bと
同様のモニター8の画面8″及び画面8″,8゛″″・
・・・を得ることができる。ところで、上記のいずれの
実施例においても、最初にモニター8の画面8″上でコ
ントラスト及び輝度を適宜調整しておけば、欠点像10
a,・・・15b,・・・・は前記実施例のくり返し操
作を行なううちに段々と大きな信号となり、また、黒白
のコントラストも明瞭となり、欠点像10a・・・・,
15b・・・・・・が強調され、容易に観測することが
できるようになる。また、前記モニター8の画面8″上
の被検査物2a・・・・,13b・・・・・・は、いず
れも反射光像であるが、光源4をテレビカメラ9と逆方
向側に配置するようにすれぱ透過光像を得ることができ
る。本発明は以上説明したように、モニター画面上でコ
ントラストあるいは輝度を適宜調整することにより欠点
像を強調することが出来、しかも、欠点像を複数個モニ
ター画面上に映すことができるので判定困難な微小欠点
を確実に検出することができるという利点を持つている
Note that 9'' is the field of view of the television camera 9. Then, by repeating the same operations as described above, a monitor 8 and images 8'', 8'''', etc. as shown in FIG. 2b are obtained. , a plurality of consecutive test objects 13b, 13c,...
and accompanying defect images 15b, 15c, etc. are formed continuously on the screen 8'' of the monitor 8, and after an appropriate period of time, the inspected objects 13b, 13c,... are scanned by the television camera 9. The scanning signal 16 is sent to the determination circuit 12, and the determination circuit 12 detects minute defects.
In this other embodiment, the monitor 8 and the object to be inspected 13 are placed side by side, but due to the location etc., the object to be inspected 13 is placed on the monitor 8.
However, if an optical device such as a mirror is installed at the position of the inspected object 13 shown in Fig. 2a and the image of the inspected object is reflected on the optical device, the second Screen 8'' and screen 8'', 8'''' of monitor 8 similar to Figure b
... can be obtained. By the way, in any of the above embodiments, if the contrast and brightness are adjusted appropriately on the screen 8'' of the monitor 8, the defect image 10
As the operations in the above embodiment are repeated, the signals of a, . . . 15b, .
15b... is emphasized and can be easily observed. In addition, the objects to be inspected 2a..., 13b... on the screen 8'' of the monitor 8 are all reflected light images, but the light source 4 is placed in the opposite direction from the television camera 9. As explained above, the present invention makes it possible to emphasize a defect image by appropriately adjusting the contrast or brightness on the monitor screen. Since it can be displayed on multiple monitor screens, it has the advantage of being able to reliably detect minute defects that are difficult to judge.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図aは本発明の一実施例を示す説明図、第1図b及
びcはモニター画像を示し、第2図aは本発明の別実施
例を示す説明図、第2図bはモニター画像を示L1第3
図A,b,cは第1図aに示す実施例の動作説明図、第
4図A,b,cは第2図aに示す実施例の動作説明図て
ある。 2,13・・・・・・被検査物、2a,2b,2c,1
3b,13c・・・・・・被検査物像、3,9・・・・
・・テレビカメラ、8・・・・・・モニター、8″・・
・・モニターの画面、10a,10b,10c,15b
,15c・・・ノ・・・欠点像。
FIG. 1a is an explanatory diagram showing one embodiment of the present invention, FIGS. 1b and c are monitor images, FIG. 2a is an explanatory diagram showing another embodiment of the present invention, and FIG. 2b is a monitor Image shows L1 3rd
Figures A, b, and c are explanatory views of the operation of the embodiment shown in Fig. 1a, and Figures 4A, b, and c are explanatory views of the operation of the embodiment shown in Fig. 2a. 2, 13...Object to be inspected, 2a, 2b, 2c, 1
3b, 13c... Image of the object to be inspected, 3, 9...
...TV camera, 8...Monitor, 8''...
...Monitor screen, 10a, 10b, 10c, 15b
, 15c... - Defect image.

Claims (1)

【特許請求の範囲】[Claims] 1 被検査物をテレビカメラにて撮像しコントラスト及
び輝度調整可能なモニターの画面上に映し出し、該モニ
ター画像を前記カメラと同一あるいは別個のテレビカメ
ラでもつて撮像して前記モニター画面上に映し出し、も
つて重ね合わされた1個の被検査物像または連続する複
数個の被検査物像を前記モニター画面上に形成し、輝度
とコントラストを調整することにより欠点の像を強調し
、モニター画像を撮像するテレビカメラでもつて前記被
検査物を走査して微小欠点を検出することを特徴とする
微小欠点の検出方法。
1 The object to be inspected is imaged with a television camera and projected on the screen of a monitor whose contrast and brightness can be adjusted, and the monitor image is imaged with the same or a separate television camera as said camera and projected on said monitor screen. A single inspected object image or a plurality of consecutive inspected object images superimposed on each other are formed on the monitor screen, the image of the defect is emphasized by adjusting the brightness and contrast, and the monitor image is captured. A method for detecting minute defects, comprising scanning the object to be inspected with a television camera to detect minute defects.
JP10571477A 1977-09-01 1977-09-01 How to detect minute defects Expired JPS6051055B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10571477A JPS6051055B2 (en) 1977-09-01 1977-09-01 How to detect minute defects

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10571477A JPS6051055B2 (en) 1977-09-01 1977-09-01 How to detect minute defects

Publications (2)

Publication Number Publication Date
JPS5439185A JPS5439185A (en) 1979-03-26
JPS6051055B2 true JPS6051055B2 (en) 1985-11-12

Family

ID=14414994

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10571477A Expired JPS6051055B2 (en) 1977-09-01 1977-09-01 How to detect minute defects

Country Status (1)

Country Link
JP (1) JPS6051055B2 (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5666741A (en) * 1979-11-02 1981-06-05 Hoshitaka Nakamura Automatic inspection device for object
JPS5841677A (en) * 1981-09-04 1983-03-10 Mitsubishi Heavy Ind Ltd Vertical multi-layer welding method

Also Published As

Publication number Publication date
JPS5439185A (en) 1979-03-26

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