JPS6035901Y2 - Regulator test equipment for charging generator - Google Patents

Description

[Detailed description of the invention] This invention is a testing device for regulators for charging and generators, especially for testing regulators for vehicle generators. This invention relates to a testing device for regulators for charging and generators, which has a voltage generator that alternately generates voltages, and tests whether the regulator operates in a normal on/off state according to high and low voltages from the voltage generator. It is.

In general, the voltage generated by a vehicle charging generator fluctuates significantly depending on its rotational speed, that is, the speed of the vehicle and the size of the load.
A regulator is used to adjust the voltage of the generator to a constant voltage.

The above regulator used to be a Chirill type regulator using mechanical contacts, but with the development of semiconductors, semiconductor type regulators using semiconductors have come to be used.

FIG. 1 is a circuit diagram of a vehicle generator using a semiconductor regulator, in which three-phase AC power generated in the power generation winding 2 of the generator 1 is rectified into DC power by a full-wave rectifier 3. The electric power charges the battery 4 and supplies power to the load.

In this case, when the voltage of the generator 1 rises above the specified voltage, the voltage at point V1, which is divided by the resistors 6 and 7 of the regulator 5, becomes higher than the Zener voltage of the Zener diode 8, so the Zener diode 8 becomes conductive. A base current flows through the transistor 9, turning it on.

The current then flows through the resistor 11 to the transistor 9, forcing the transistor 10 to be turned off.

As a result, no current flows through the field winding 12, and the voltage of the generator 1 drops.

Next, when the voltage of the generator 1 falls below the specified voltage, the voltage at point 1 becomes lower than the Zener voltage of the Zener diode 8, so the Zener diode 8 becomes non-conductive.
The base current of transistor 9 is cut off, and transistor 9 is turned off.

As a result, the base N current of the transistor 10 flows and turns on, and current flows through the field winding 12, so that the voltage of the generator 1 increases.

In this way, the voltage of the generator 1 is controlled so as to be maintained at a specified voltage by alternately repeating a state in which the voltage is increased and a state in which it is decreased.

In such circuits, failure of the regulator not only damages loads such as the generator, battery, and lights, and significantly shortens the life of the generator, but also causes accidents such as burning out the insulation layer of the connecting wires. Become.

The failure of the semiconductor regulator 5 is mainly caused by two failure states: the transistor 10 is in a state where no current flows, or the transistor 10 is in an off state and no current flows.

Moreover, these failure states are difficult to discern from the outside because the regulator 5 is, for example, molded.

Conventionally, in order to detect these failure states, the regulator 5 to be tested is attached to the mounting terminal of a normal generator that operates by rotating the motor, and the generator is actually operated and the voltage of the generator reaches the specified voltage. The quality of the regulator 5 was determined by testing whether it was controlled to hold the voltage.

However, as test equipment must always have a large generator and a motor to drive it ready to function properly, the equipment becomes large, and maintenance is difficult and expensive, and space is also required.

As a solution to these difficulties, a test device for individually testing a regulator for a charging generator is being considered.

The test device has (i) a function of supplying a voltage higher than the specified voltage to the regulator;
ii) A function of increasing the voltage applied to the voltage detection terminal of the regulator with a time delay according to a predetermined time constant based on a time constant circuit when the regulator enters an operating state to increase the voltage, for example. and (iii) decrease the voltage applied to the voltage detection terminal when the regulator shifts to a non-operating state to reduce the voltage in response to the increased voltage applied to the voltage detection terminal. It is configured to have at least the following functions:

However, in the case of the test apparatus, the operation of the time constant circuit is dependent on the operation of the regulator to be tested, that is, it is operated in a separately excited type.

For this reason, even if the operating speed of the on/off operation of the regulator to be tested has decreased below the original operating speed, it is difficult to accurately grasp the decreased state.

Furthermore, since the separately excited type operation is performed, one test device is assigned to one regulator to be tested, which becomes a major bottleneck when testing a large number of regulators.

The present invention aims to solve the above-mentioned drawbacks, and is a voltage generator that uses a commercial power source to alternately generate a voltage level higher and lower than the specified voltage to the input terminal of a regulator for a charging generator. It is an object of the present invention to provide a testing device for a charging generator regulator, and to enable the testing device to easily determine whether the charging generator regulator is good or bad.

The present invention will be explained below with reference to FIG.

FIG. 2 is a circuit diagram of one embodiment of the present invention, and numerals 5 to 11 in the figure correspond to those in FIG.

13 is a commercial power supply, 14 is a switch, 15 is a transformer, 16
is a full wave rectifier, 17 is a smoothing capacitor, 18 and 19
21 is a diode, 22 and 23 are thyristors, 24 is a test device transistor, 25 to 31 are resistors, 32 is a capacitor, and 33 is an ammeter. .

Here, V when the transistor 24 of the test device does not operate
.

The voltage at the point is adjusted by resistors 25, 26 and 27 so that it is lower than the specified voltage of the regulator 5.

On the other hand, a voltage pulse having a constant period set as described above is applied to the thyristors 22 and 23 through the diode 21.

Further, the cyrisk 23 is set by a resistor 31 so that only a current equal to or less than the holding current flows therethrough.

In Figure 2, 3 is indicated by a small circle in the center of the diagram.
Connect one or more regulators under test to each terminal.

Then, when the switch 14 is turned on, a DC specified voltage that has been full-wave rectified by the full-wave rectifier 16 and smoothed by the capacitor 17 is applied to the regulator 5 .

Assuming that the transistor 24 is now in the off state, the voltage is V.

The voltage at the point becomes lower than the specified voltage, and the voltage at the point V1 becomes lower than the Zener voltage of the Zener diode 8.

Therefore, transistor 9 is turned off and transistor 10 is turned on, so that current flows through resistors 25 and 26 to ammeter 33.

As a result, the pointer of the ammeter 33 swings.

Next, after a set fixed period, a pulse from the unijunction transistor 20 is applied to the thyristors 22 and 23, and the thyristors 22 and 23 are turned on, but since only a current less than the holding current flows through the thyristor 23, the thyristor 23 immediately turns off.

Therefore, when the thyristor 22 is turned on, the base current of the transistor 24 flows through the resistor 30, turning on the transistor 24 and shorting the resistor 25.

The voltage at the point becomes higher than the specified voltage, and the voltage at the V1 point becomes higher than the Zener voltage.

Therefore, transistor 9 is turned on and transistor 10 is turned off, so that the swing of ammeter 33 becomes zero.

Here, when the thyristor 22 is turned on, the capacitor 32 is charged to the illustrated polarity.

Therefore, when the next pulse is applied from the unijunction transistor 20 to the thyristors 22 and 23, the thyristor 23 is turned on and the voltage of the charged capacitor 32 is applied to the thyristor 22 in the opposite direction, so the thyristor 22 is turned off and the transistor 24 is turned on. turns off and V.

The voltage at the point falls below the specified voltage. Therefore, transistor 9
is turned off, the transistor 10 is turned on, and the ammeter 33
The pointer swings because current flows through it.

If the above condition is repeated, the regulator 5 is normal. However, if the regulator 5 is malfunctioning and, for example, the transistor 10 is constantly turned off, the pointer of the ammeter 33 will change regardless of the voltage level. I can't shake it.

Further, when the transistor 10 is in an ON state, the pointer of the ammeter 33 swings within a certain range of a certain value or more at a period determined by a time constant.

As described above, according to this test device, it is possible to easily determine what kind of failure state the transistor 10 of the regulator 5 has.

As detailed above, the present invention is equipped with a voltage generator that alternately generates voltage levels higher and lower than the specified voltage for the input voltage of the regulator, so there is no need for a generator for testing. Therefore, the test device can be made smaller.

Furthermore, the presence or absence of a failure in the semiconductor of the regulator 5 and the state of the failure can be easily determined based on the current displayed by the ammeter.

[Brief explanation of the drawing]

FIG. 1 shows a circuit diagram of a conventional regulator testing device, and FIG. 2 shows a circuit diagram of an embodiment of the present invention. In the figure, 5 is a regulator, 8 is a Zener diode, 9 and 10 are transistors, 13 is a power supply, 15 is a transformer,
16 is a full-wave rectifier, 20 is a unijunction transistor, 21 is a diode, 22 and 23 are thyristors, 24 is a transistor of the test device, and 33 is an ammeter.

Claims (1)

[Scope of utility model registration request] A charging power generation device that operates to control the input voltage to the specified voltage by creating a voltage reduction action condition when the input voltage becomes higher than a predetermined specified voltage and by creating a voltage increase action condition when the input voltage becomes lower than the specified voltage. A voltage supply unit that generates a voltage at a level higher than at least the predetermined specified voltage, in a test device that supplies the input voltage to the machine regulator and tests the normality of the operation of the charging generator regulator. , a self-excited oscillation circuit unit that changes the voltage level of the voltage from the voltage supply unit, and inputs the voltage resulting from changing the voltage level by the self-excited oscillation circuit unit to the charging generator regulator. The above-mentioned self-excited type has a voltage generator equipped with a voltage supply terminal for supplying voltage as a voltage, and a display means for checking the state of the current flowing into a charging generator regulator detachably connected to the voltage supply terminal. The oscillation circuit section alternately changes the voltage level of the voltage from the voltage supply section to a level higher than the predetermined specified voltage and a level lower than the predetermined specified voltage at a predetermined period. A testing device for a regulator for a charging generator, configured as follows, wherein the regulator for the charging generator is detachably connected to the voltage supply terminal of the voltage generator.