JPS60237354A - 熱スプレ−イオン源とその効率を改善する方法 - Google Patents

熱スプレ−イオン源とその効率を改善する方法

Info

Publication number
JPS60237354A
JPS60237354A JP60025076A JP2507685A JPS60237354A JP S60237354 A JPS60237354 A JP S60237354A JP 60025076 A JP60025076 A JP 60025076A JP 2507685 A JP2507685 A JP 2507685A JP S60237354 A JPS60237354 A JP S60237354A
Authority
JP
Japan
Prior art keywords
ions
mass
ion source
orifice
thermal spray
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP60025076A
Other languages
English (en)
Japanese (ja)
Inventor
ウイリアム　エイチ　マツクフアデン
マニケル　ジー　タツカー
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Thermo Finnigan LLC
Original Assignee
Finnigan Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Finnigan Corp filed Critical Finnigan Corp
Publication of JPS60237354A publication Critical patent/JPS60237354A/ja
Pending legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H01J49/049—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample with means for applying heat to desorb the sample; Evaporation
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/06—Electron- or ion-optical arrangements
    • H01J49/067—Ion lenses, apertures, skimmers

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Dispersion Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
JP60025076A 1984-02-10 1985-02-12 熱スプレ−イオン源とその効率を改善する方法 Pending JPS60237354A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US57921184A 1984-02-10 1984-02-10
US579211 1984-02-10

Publications (1)

Publication Number Publication Date
JPS60237354A true JPS60237354A (ja) 1985-11-26

Family

ID=24316012

Family Applications (1)

Application Number Title Priority Date Filing Date
JP60025076A Pending JPS60237354A (ja) 1984-02-10 1985-02-12 熱スプレ−イオン源とその効率を改善する方法

Country Status (2)

Country Link
EP (1) EP0153113A3 (fr)
JP (1) JPS60237354A (fr)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000123781A (ja) * 1998-10-14 2000-04-28 Hitachi Ltd 大気圧イオン化質量分析装置

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4814612A (en) * 1983-08-30 1989-03-21 Research Corporation Method and means for vaporizing liquids for detection or analysis
US4730111A (en) * 1983-08-30 1988-03-08 Research Corporation Ion vapor source for mass spectrometry of liquids
US4861989A (en) * 1983-08-30 1989-08-29 Research Corporation Technologies, Inc. Ion vapor source for mass spectrometry of liquids
GB8404683D0 (en) * 1984-02-22 1984-03-28 Vg Instr Group Mass spectrometers
GB2324906B (en) * 1997-04-29 2002-01-09 Masslab Ltd Ion source for a mass analyser and method of providing a source of ions for analysis
US7368728B2 (en) 2002-10-10 2008-05-06 Universita' Degli Studi Di Milano Ionization source for mass spectrometry analysis

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5291497A (en) * 1976-01-27 1977-08-01 Kankiyou Rikagaku Kenkiyuushiy Measuring apparatus for vinyl chloride monomer concentration

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4160161A (en) * 1978-05-30 1979-07-03 Phillips Petroleum Company Liquid chromatograph/mass spectrometer interface

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5291497A (en) * 1976-01-27 1977-08-01 Kankiyou Rikagaku Kenkiyuushiy Measuring apparatus for vinyl chloride monomer concentration

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000123781A (ja) * 1998-10-14 2000-04-28 Hitachi Ltd 大気圧イオン化質量分析装置

Also Published As

Publication number Publication date
EP0153113A2 (fr) 1985-08-28
EP0153113A3 (fr) 1987-09-23

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