JPS60196642A - 計算機応用内部瑕疵非破壊測定方法 - Google Patents

計算機応用内部瑕疵非破壊測定方法

Info

Publication number
JPS60196642A
JPS60196642A JP5323684A JP5323684A JPS60196642A JP S60196642 A JPS60196642 A JP S60196642A JP 5323684 A JP5323684 A JP 5323684A JP 5323684 A JP5323684 A JP 5323684A JP S60196642 A JPS60196642 A JP S60196642A
Authority
JP
Japan
Prior art keywords
boundary
measured
defects
computer
cracks
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP5323684A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0412412B2 (cg-RX-API-DMAC10.html
Inventor
Shiro Kubo
司郎 久保
Kiyotsugu Oji
大路　清嗣
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
University of Osaka NUC
Original Assignee
Osaka University NUC
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Osaka University NUC filed Critical Osaka University NUC
Priority to JP5323684A priority Critical patent/JPS60196642A/ja
Publication of JPS60196642A publication Critical patent/JPS60196642A/ja
Publication of JPH0412412B2 publication Critical patent/JPH0412412B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N3/00—Investigating strength properties of solid materials by application of mechanical stress
    • G01N3/02—Details
    • G01N3/06—Special adaptations of indicating or recording means

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
JP5323684A 1984-03-19 1984-03-19 計算機応用内部瑕疵非破壊測定方法 Granted JPS60196642A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5323684A JPS60196642A (ja) 1984-03-19 1984-03-19 計算機応用内部瑕疵非破壊測定方法

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5323684A JPS60196642A (ja) 1984-03-19 1984-03-19 計算機応用内部瑕疵非破壊測定方法

Publications (2)

Publication Number Publication Date
JPS60196642A true JPS60196642A (ja) 1985-10-05
JPH0412412B2 JPH0412412B2 (cg-RX-API-DMAC10.html) 1992-03-04

Family

ID=12937166

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5323684A Granted JPS60196642A (ja) 1984-03-19 1984-03-19 計算機応用内部瑕疵非破壊測定方法

Country Status (1)

Country Link
JP (1) JPS60196642A (cg-RX-API-DMAC10.html)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2016047093A1 (ja) * 2014-09-25 2017-07-06 日本電気株式会社 状態判定装置および状態判定方法
US12313601B2 (en) 2020-09-16 2025-05-27 Mitsubishi Electric Corporation Crack estimation device and crack estimation method

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4074443B2 (ja) * 2001-05-18 2008-04-09 新日本製鐵株式会社 鋳型内鋳片の状態評価装置、方法、コンピュータプログラム、及びコンピュータ読み取り可能な記憶媒体

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56115937A (en) * 1980-02-19 1981-09-11 Tokyo Koki Seizosho:Kk Detecting method for crack of test piece
JPS5710449A (en) * 1980-06-21 1982-01-20 Teruo Kishi Temperature compensation type crack measuring device

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS56115937A (en) * 1980-02-19 1981-09-11 Tokyo Koki Seizosho:Kk Detecting method for crack of test piece
JPS5710449A (en) * 1980-06-21 1982-01-20 Teruo Kishi Temperature compensation type crack measuring device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPWO2016047093A1 (ja) * 2014-09-25 2017-07-06 日本電気株式会社 状態判定装置および状態判定方法
US12313601B2 (en) 2020-09-16 2025-05-27 Mitsubishi Electric Corporation Crack estimation device and crack estimation method

Also Published As

Publication number Publication date
JPH0412412B2 (cg-RX-API-DMAC10.html) 1992-03-04

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Legal Events

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