JPS60130043A - Electron microscope - Google Patents
Electron microscopeInfo
- Publication number
- JPS60130043A JPS60130043A JP23809683A JP23809683A JPS60130043A JP S60130043 A JPS60130043 A JP S60130043A JP 23809683 A JP23809683 A JP 23809683A JP 23809683 A JP23809683 A JP 23809683A JP S60130043 A JPS60130043 A JP S60130043A
- Authority
- JP
- Japan
- Prior art keywords
- magnetic pole
- pole piece
- specimen
- sample
- driving mechanism
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/02—Details
- H01J37/20—Means for supporting or positioning the objects or the material; Means for adjusting diaphragms or lenses associated with the support
Abstract
Description
【発明の詳細な説明】
本発明は、対物レンズの上磁極片と下磁極片の間に試料
駆動機構等を備えた電子顕微鏡に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an electron microscope equipped with a sample driving mechanism and the like between an upper magnetic pole piece and a lower magnetic pole piece of an objective lens.
一般に、電子顕微鏡の試料ステージとしては、観察−り
る試料及び観察目的によりトップエントリ一方式又はサ
イドエントリ一方式のいずれかが使用される。これらの
試料ステージの試料駆動機構は、いずれも対物レンズヨ
ークに固定されており、試料駆動機構からの振動が試料
に伝わり易い。又、対物レンズヨークと対物レンズ磁場
を形成する上磁極片、下磁極片及びスペーサーとは一体
でないので、該上、下磁極片と対物レンズヨークに試料
駆動機構を介して保持された試料とは機械的に遠く離れ
でしまう。そのため、試料の受ける振動と、対物レンズ
磁場の振動は全く別々なものとなって振動の影響が大き
く像観察に影響を与えるという欠点があった。Generally, as a sample stage for an electron microscope, either a top entry type or a side entry type is used depending on the sample to be observed and the purpose of observation. The sample drive mechanisms of these sample stages are all fixed to the objective lens yoke, and vibrations from the sample drive mechanisms are easily transmitted to the sample. Furthermore, since the objective lens yoke, the upper magnetic pole piece, the lower magnetic pole piece, and the spacer that form the objective lens magnetic field are not integrated, the sample held by the upper magnetic pole piece, the lower magnetic pole piece, and the objective lens yoke via the sample drive mechanism is Mechanically they are far apart. Therefore, the vibrations experienced by the sample and the vibrations of the objective lens magnetic field are completely different, and the vibrations have a large effect on image observation.
本発明は以上の点に鑑みなされたもので、対物レンズl
極片又は該磁極片を係合するためのスペーサーのいずれ
かに実質的に試料ステージ及び試わ1駆動機構を支持し
たことを特徴としている。The present invention was made in view of the above points, and the objective lens l
The present invention is characterized in that either the pole piece or the spacer for engaging the pole piece substantially supports the sample stage and the drive mechanism.
以上本発明の実施例を添付図面に基づぎ詳述する。第1
図は本発明の一実施例装置を示す構成図C−あり、第2
図は第1図の実施例装置のA−A方向から眺めた拡大図
である。図中1は内部に励磁」イル2を有する対物レン
ズヨークである。該対物レンズヨーク環状端部には、上
磁極片3と下磁極片4が非磁性体で形成されたスペーサ
ー5を介し対向して配置され、これらが一体として対物
レンズを構成している。そして、対物レンズヨーク内の
励磁コイル2が励磁されると、上、下磁極片間にレンズ
磁場が形成される。6は下磁極片に固定された固定台C
あり、該固定台6上にはY動スデージ7が図示しない移
動を滑らかにする手段を介して載置されCおり、該Y動
ステージ7は、固定台6に固定され本図では図示しない
駆動電源に接続された例えば圧電素子を利用しlご直線
的に移動覆る駆動機構(特公昭51−12497号参照
)8によりY軸方向に移動する。9はY動ステージ7上
に図示しない移動を滑らかに覆る手段を介して移動【1
能に設(プられたX動ステージであり、該X動ステージ
9はY動ステージ7上に固定された、前記駆動機構8と
同様な駆動機構10によりX軸方向に移動する。11は
X動ステージ9に真空外のY方向より取り外し可能に載
置された試料ホルダーであり、12は試料ホルダー11
に載置された試料である。13は試料ホルダー11とX
動スデージ9とを固定づるためのスプリングである。The embodiments of the present invention will be described in detail with reference to the accompanying drawings. 1st
The figure is a block diagram showing an embodiment of the device of the present invention.
The figure is an enlarged view of the embodiment apparatus of FIG. 1 viewed from the direction AA. In the figure, reference numeral 1 denotes an objective lens yoke having an excitation coil 2 inside. At the annular end of the objective lens yoke, an upper magnetic pole piece 3 and a lower magnetic pole piece 4 are arranged facing each other with a spacer 5 formed of a non-magnetic material interposed therebetween, and together constitute an objective lens. When the excitation coil 2 in the objective lens yoke is excited, a lens magnetic field is formed between the upper and lower magnetic pole pieces. 6 is a fixed base C fixed to the lower magnetic pole piece.
A Y-movement stage 7 is placed on the fixed base 6 via means for smoothing the movement (not shown), and the Y-movement stage 7 is fixed to the fixed base 6 and is mounted on a drive unit (not shown in the figure). It is moved in the Y-axis direction by a drive mechanism (see Japanese Patent Publication No. 51-12497) connected to a power source that uses, for example, a piezoelectric element to move linearly. 9 moves on the Y-movement stage 7 via a means (not shown) that smoothly covers the movement [1
The X-movement stage 9 is fixed on the Y-movement stage 7 and is moved in the X-axis direction by a drive mechanism 10 similar to the drive mechanism 8 described above. It is a sample holder that is removably placed on the moving stage 9 from the Y direction outside the vacuum, and 12 is the sample holder 11.
This is the sample placed on the . 13 is the sample holder 11 and X
This is a spring for fixing the movable stage 9.
14はスペーサー5に穿たれた孔5aを貫通ずる駆動機
構8及び1Oの引出し線でコネクター15に接続されて
いる。16はコネクター15に接続され図示しない駆動
電源より各駆動機構に電力を供給するため接続端子であ
り、該接続端子16は部月17及びOリング18により
対物レンズヨーク1を真空を保持して貫通している。14 is connected to the connector 15 by a lead wire of the drive mechanism 8 and 1O passing through a hole 5a formed in the spacer 5. Reference numeral 16 is a connection terminal connected to the connector 15 to supply power to each drive mechanism from a drive power source (not shown). are doing.
以上の様に構成された装置において、試料交換は本図で
は図示しない試料交換棒の先端に設けられたネジ部と、
試料ホルダー11に設りられたネジ部を螺合させること
により真空外のY方向より試料交換が可能に形成されて
いる。又、試料12の移動は対物レンズを構成する上磁
極片3と下磁極j゛14の間に配置しl〔試料駆動機構
を外部の駆動電源により駆動して移動するように構成さ
れている。そのため、従来装置の様に外部に設けられた
試料駆動機構の試料駆動棒を介して該試料を移動さける
構成となっていないため、外部の振動が試お1に伝わら
ず、又試料と上、F磁極片とが一体と41って振動づ゛
るため振動による影響の少ない像観察を行うことが可能
となる。In the apparatus configured as described above, sample exchange is performed using a threaded part provided at the tip of a sample exchange rod (not shown in this figure).
By screwing together a threaded portion provided on the sample holder 11, the sample can be exchanged from the Y direction outside the vacuum. The sample 12 is moved by placing it between an upper magnetic pole piece 3 and a lower magnetic pole 14 constituting an objective lens and driving the sample drive mechanism with an external drive power source. Therefore, unlike conventional devices, the sample is not moved via the sample drive rod of the sample drive mechanism installed externally, so external vibrations are not transmitted to the sample 1, and the sample and top Since the F magnetic pole piece vibrates together with the F magnetic pole piece 41, it is possible to observe images with less influence from vibration.
尚、本発明は以上の実施例に限定されず変形が川面であ
る。本実施例では、対物レンズの下磁極Jiに固定台6
を介して試料ステージ及び試料駆動機構を設(〕たが、
上磁極片又はスペーサに支持するよう構成しても同様の
効果を得ることができる。It should be noted that the present invention is not limited to the above embodiments, and modifications are possible. In this embodiment, a fixed base 6 is attached to the lower magnetic pole Ji of the objective lens.
Set up the sample stage and sample drive mechanism through the
A similar effect can be obtained by supporting the upper magnetic pole piece or a spacer.
第1図は本発明の一実施例を示す構成図、第2図は第1
図の一実施例装置をA−A方向より眺めた図である。
1:対物レンズヨ]−り、2:励磁コイル、3:上磁極
J’i’、4:下磁極片、5ニスペーサ−26:固定台
、7:Y動ステージ、8.10:駆動機構。
9:X動ステージ、11:試料ホルダー、12:試23
1.13ニスプリング、14:引き出し線、15:コネ
クター、16:接続端子、17:部材。
18:Oリング。
特許出願人
日本電子株式会社
代表者 清勝 −夫FIG. 1 is a configuration diagram showing one embodiment of the present invention, and FIG.
It is a figure which looked at one Example apparatus of the figure from the AA direction. 1: Objective lens rotation, 2: Excitation coil, 3: Upper magnetic pole J'i', 4: Lower magnetic pole piece, 5 Ni spacer, 26: Fixed base, 7: Y movement stage, 8.10: Drive mechanism. 9: X movement stage, 11: Sample holder, 12: Trial 23
1.13 spring, 14: lead wire, 15: connector, 16: connecting terminal, 17: member. 18: O-ring. Patent applicant: JEOL Ltd. Representative Kiyokatsu - Husband
Claims (1)
サーのいずれかに実質的に試料ステージ及び試お1駆動
機構を支持したことを特徴とする電子顕微鏡。An electron microscope characterized in that a sample stage and sample stage 1 drive mechanism are substantially supported on either the objective lens magnetic pole piece or a spacer that engages the magnetic pole piece.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP23809683A JPS60130043A (en) | 1983-12-16 | 1983-12-16 | Electron microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP23809683A JPS60130043A (en) | 1983-12-16 | 1983-12-16 | Electron microscope |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60130043A true JPS60130043A (en) | 1985-07-11 |
Family
ID=17025105
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP23809683A Pending JPS60130043A (en) | 1983-12-16 | 1983-12-16 | Electron microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60130043A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62291849A (en) * | 1986-06-11 | 1987-12-18 | Hitachi Ltd | Object lens in electron beam length meter or the like |
WO2009062929A2 (en) * | 2007-11-13 | 2009-05-22 | Carl Zeiss Smt Ltd | Beam device and system comprising a particle beam device and an optical microscope |
-
1983
- 1983-12-16 JP JP23809683A patent/JPS60130043A/en active Pending
Cited By (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS62291849A (en) * | 1986-06-11 | 1987-12-18 | Hitachi Ltd | Object lens in electron beam length meter or the like |
WO2009062929A2 (en) * | 2007-11-13 | 2009-05-22 | Carl Zeiss Smt Ltd | Beam device and system comprising a particle beam device and an optical microscope |
EP2061067A3 (en) * | 2007-11-13 | 2010-04-07 | Carl Zeiss SMT Limited | Beam device and system comprising a particle beam device and an optical microscope |
WO2009062929A3 (en) * | 2007-11-13 | 2010-09-16 | Carl Zeiss Smt Ltd | Beam device and system comprising a particle beam device and an optical microscope |
US8530856B2 (en) | 2007-11-13 | 2013-09-10 | Carl Zeiss Nts Limited | Beam device system comprising a particle beam device and an optical microscope |
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