JPS60118754U - Two-dimensional image comparison inspection device - Google Patents

Two-dimensional image comparison inspection device

Info

Publication number
JPS60118754U
JPS60118754U JP552884U JP552884U JPS60118754U JP S60118754 U JPS60118754 U JP S60118754U JP 552884 U JP552884 U JP 552884U JP 552884 U JP552884 U JP 552884U JP S60118754 U JPS60118754 U JP S60118754U
Authority
JP
Japan
Prior art keywords
detection head
dimensional image
inspection device
image comparison
comparison inspection
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP552884U
Other languages
Japanese (ja)
Inventor
高部　俊幸
Original Assignee
株式会社　計測技術研究所
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 株式会社　計測技術研究所 filed Critical 株式会社　計測技術研究所
Priority to JP552884U priority Critical patent/JPS60118754U/en
Publication of JPS60118754U publication Critical patent/JPS60118754U/en
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Abstract] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第１図は本考案たる二次元画像の比較検査装置の斜視図
、第２図は同上一部破断側面図、第３図は検出ヘッドの
部分を示す正面図、第４図は可動検出ヘッドの縦断側面
図である。 １；′フレーム、・１ｂ；ヘッド支持部、３；テーブル
、１１；サブフレーム、１５，１６；検出ヘッド、Ａ；
検査対象物、Ｍ、、　Ｍ２．　Ｍ３；モータ。Fig. 1 is a perspective view of the two-dimensional image comparison inspection device of the present invention, Fig. 2 is a partially cutaway side view of the same, Fig. 3 is a front view showing the detection head, and Fig. 4 is a movable detection head. FIG. 1; 'Frame, 1b; Head support section, 3; Table, 11; Subframe, 15, 16; Detection head, A;
Inspection object, M, M2. M3; Motor.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] フレームに対し可動状態に取り付けられたサブフレーム
に、二基の撮像レンズを主体とした検出ヘッドを搭載し
、この検出ヘッド下方に設けた一対の検査対象物上の所
定の特徴を各別の検出ヘッドで掃引し、両者の異同を検
出して検査対象物の検査を行う装置において、前記サブ
フレームに搭載された少なくとも一つの検出ヘッドは、
サブフレームに対し、その可動方向と同じ方向に位置調
節自在に構成されていることを特徴とする二次元画像の
比較検査装置。A detection head consisting mainly of two imaging lenses is mounted on a sub-frame movably attached to the frame, and the detection head is installed below the detection head to detect each predetermined feature on a pair of objects to be inspected. In a device that inspects an object to be inspected by sweeping with a head and detecting differences between the two, at least one detection head mounted on the subframe includes:
A two-dimensional image comparison inspection device characterized by being configured such that its position can be freely adjusted in the same direction as the movable direction of the sub-frame.
JP552884U 1984-01-18 1984-01-18 Two-dimensional image comparison inspection device Pending JPS60118754U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP552884U JPS60118754U (en) 1984-01-18 1984-01-18 Two-dimensional image comparison inspection device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP552884U JPS60118754U (en) 1984-01-18 1984-01-18 Two-dimensional image comparison inspection device

Publications (1)

Publication Number Publication Date
JPS60118754U true JPS60118754U (en) 1985-08-10

Family

ID=30482114

Family Applications (1)

Application Number Title Priority Date Filing Date
JP552884U Pending JPS60118754U (en) 1984-01-18 1984-01-18 Two-dimensional image comparison inspection device

Country Status (1)

Country Link
JP (1) JPS60118754U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61213612A (en) * 1985-03-19 1986-09-22 Hitachi Ltd Inspecting instrument for pattern of printed board

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61213612A (en) * 1985-03-19 1986-09-22 Hitachi Ltd Inspecting instrument for pattern of printed board

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