JPS60117728A - Nozzle shifter - Google Patents

Nozzle shifter

Info

Publication number
JPS60117728A
JPS60117728A JP22623683A JP22623683A JPS60117728A JP S60117728 A JPS60117728 A JP S60117728A JP 22623683 A JP22623683 A JP 22623683A JP 22623683 A JP22623683 A JP 22623683A JP S60117728 A JPS60117728 A JP S60117728A
Authority
JP
Japan
Prior art keywords
nozzle
wafer
sliding member
shaft
photoresist
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP22623683A
Other languages
Japanese (ja)
Inventor
Yoshiki Iwata
岩田 義樹
Nobuo Kawase
信雄 川瀬
Keitoku Tanaka
田中 佳徳
Takashi Miyake
隆 三宅
Hiroshi Kawaura
廣 川浦
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Inc
Canon Marketing Japan Inc
Original Assignee
Canon Inc
Canon Hanbai KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Canon Inc, Canon Hanbai KK filed Critical Canon Inc
Priority to JP22623683A priority Critical patent/JPS60117728A/en
Publication of JPS60117728A publication Critical patent/JPS60117728A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/16Coating processes; Apparatus therefor
    • G03F7/162Coating on a rotating support, e.g. using a whirler or a spinner

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Coating Apparatus (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE:To move an exhaust port in a nozzle for supplying a photo-resist up to a position separate from a carrying path for a wafer by sliding a sliding member, to which the nozzle is fixed, along a guide shaft. CONSTITUTION:When a sliding member 1 is moved along a guide shaft 2 by the revolution of a lever 3 centering around a shaft 6, the position of a pin 4 is changed continuously along a long hole 5 in the lever 3 because a distance between the pin 4 fixed to the sliding member 1 and the shaft 6 is altered. The lever 3 is turned centering around the shaft 6 by operating a cylinder device 7. A positive type photo-resist supply nozzle 10 and a negative type photo-resist supply nozzle 11 are bundled by a nozzle holder 13, and extend vertically toward the surface of a wafer 12. The nozzles 10 and 11 are fixed to the sliding member 1 through a retaining fitting. Accordingly, the nozzles are moved in parallel together with a sliding along the guide shaft 2 in the direction crossing with a wafer carrying path of the sliding member 1.

Description

【発明の詳細な説明】 本発明はノズル移動装置に関し、特にウニノ・にフォト
レジストを塗布するためのコーターにおいて、フォトレ
ジスト供給用ノズルの排出口をウェハの搬送径路から離
れた位置まで移動させるためのノズル移動装置に関する
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a nozzle moving device, and in particular, to a coater for applying photoresist to a substrate, for moving the outlet of a photoresist supply nozzle to a position away from the wafer conveyance path. The present invention relates to a nozzle moving device.

IC,LSI等の半導体素子を製造するためには、ウェ
ハを洗浄するためのスクラ/<−、洗浄を終えたウニノ
・にフォトレジストを塗布するためのコーター、フォト
レジストを塗布されたウニノ1上へ回路パターンを転写
するためのアライナ−1回路パターンを転写されたウニ
ノーを現像するためのデベロッパー等の種々の半導体製
造装置が使用される。
In order to manufacture semiconductor devices such as ICs and LSIs, a scrubber/<- is used to clean the wafer, a coater is used to apply photoresist to the cleaned wafer, and the top of the wafer coated with photoresist is used. Various semiconductor manufacturing apparatuses are used, such as an aligner for transferring a circuit pattern to a wafer, and a developer for developing a substrate onto which a circuit pattern has been transferred.

このうちコーターにおいてはキャ1ノツジ(ウェハ搬送
装置)によって運ばれてくるウニノ・をチャックによっ
て吸着保持し、しかる後フォトレジストを供給ノズルか
らウニノ・上へ滴下させ、チャックを回転軸によって回
転させて、シェフ1面上へフォトレジストを均一に塗布
している。ところでフォトレジスト供給ノズルは、ウニ
ノヘ上へ7.オドレジストを滴下させた後チャックを回
転させるのに先立って、ウニノーから離れた位置へ移動
させておかなければならない。この点に関し従来供給ノ
ズルは、フォトレジストを塗布されたウニノが搬送され
る方向(第1図の矢印方向)、へ引込められるよ5にな
っていた。このため引込められた供給ノズルかう搬送途
中のウェハ面上へフォトレジストが滴下してしまうおそ
れがあった。
Among these, in the coater, the unicorn carried by the carrier nozzle (wafer transport device) is adsorbed and held by the chuck, and then the photoresist is dropped onto the unicorn from the supply nozzle, and the chuck is rotated by the rotating shaft. , photoresist is uniformly applied on one surface of the chef. By the way, the photoresist supply nozzle is 7. Before rotating the chuck after dropping the odresist, it must be moved to a position away from Uninot. In this regard, conventionally the supply nozzle has been retracted 5 in the direction in which the photoresist-coated unit is conveyed (in the direction of the arrow in FIG. 1). For this reason, there was a fear that the retracted supply nozzle would drop the photoresist onto the surface of the wafer during transportation.

更に供給ノズルの排出口近(にあるフォトレジストは空
気にさらされるため、時間の経過につれて変質すること
がある。このような変質したフォトレジストをウェハ面
上へ塗布することは、不良な半導体素子を製造すること
につながるため好ましくない。
Furthermore, the photoresist near the outlet of the supply nozzle is exposed to air and may deteriorate over time. Coating such deteriorated photoresist onto the wafer surface may lead to defective semiconductor devices. This is not desirable because it leads to the production of

それ数本発明の目的は、フォトレジスト供給用ノズルの
排出口をウェハの搬送径路から離れた位置まで移動させ
るためのノズル移動装科提供することにおる。
Another object of the present invention is to provide a nozzle moving device for moving the outlet of a photoresist supply nozzle to a position away from the wafer transport path.

本発明の他の目的は、変質したフォトレジストを予め排
出させておくためにフォトレジスト供給用ノズ、ルをウ
ェハの搬送径路から離れたフォトレジスト溜めの上方へ
移動させるためのノズル移動装置を提供することにある
Another object of the present invention is to provide a nozzle moving device for moving a photoresist supply nozzle above a photoresist reservoir away from a wafer transport path in order to discharge deteriorated photoresist in advance. It's about doing.

次に添付の図面を参照して本発明の好ましい実施例につ
いて説明する。
Preferred embodiments of the invention will now be described with reference to the accompanying drawings.

1g1図は本発明に従って構成されたノズル移動装置の
平面図であり、第2図は第1図のA−A線に漬った図で
ある。スライド部材1の底部にはレバー6がピンチによ
ってゆるくとりつけられている。
1g1 is a plan view of a nozzle moving device constructed according to the present invention, and FIG. 2 is a view taken along line A--A in FIG. 1. A lever 6 is loosely attached to the bottom of the slide member 1 with a pinch.

第1図に破線で示されているよ5にレバー6の先端部に
は長穴5が形成されており、ピンチは長穴5に沿って動
くことができる。従ってスライド部材1が軸6を中心と
したレバー6の回転により案内軸2に沿って動くとき、
スライド部材1に固定されたビン4と軸6との間の距離
は変化するため−、レバー6の長穴5に沿ってピン4の
位置は変わってい(。軸6を中心としたレバー6の回転
はシリンダー装置7を作動させることによっておこなわ
れる。ここで案内軸2は、フォトレジスト供給ノズル1
0および11の排出口がウェハ12の搬送径路から離れ
た位置(例えば第1図の破線位置)まで移動できるよう
に十分な長さを有していなければならない。
As shown by broken lines in FIG. 1, an elongated hole 5 is formed at the tip of the lever 6, and the pinch can move along the elongated hole 5. Therefore, when the slide member 1 moves along the guide shaft 2 due to the rotation of the lever 6 about the shaft 6,
Since the distance between the pin 4 fixed to the slide member 1 and the shaft 6 changes, the position of the pin 4 along the elongated hole 5 of the lever 6 changes (the distance of the lever 6 around the shaft 6 changes). The rotation is carried out by actuating the cylinder device 7, in which the guide shaft 2 is connected to the photoresist supply nozzle 1.
It must have a sufficient length so that the discharge ports 0 and 11 can move to a position away from the transport path of the wafer 12 (for example, the position indicated by the broken line in FIG. 1).

第2図から明らかなようにスライド部材1の側面ICt
′iL字形遮光板8がネジどめされている。スライド部
材1に近接して設置されたフォトカフ゛ラー9は蓮9を
板8を挿通させるように凹所9aを形成されている。
As is clear from FIG. 2, the side ICt of the slide member 1
'iL-shaped light shielding plate 8 is screwed. A photocoupler 9 installed close to the slide member 1 has a recess 9a formed therein so that the plate 8 can be inserted through the lotus 9.

ポジ型フォトレジスト供給ノズル10およびネガ型フォ
トレジスト供給ノズル11は、チャック(図示せず)に
よって保持されたウニノS12の中央上方に位置したと
ころでノズル保持具16によって束ねられている。ノズ
ル10および11は保持具13によって束ねられた後、
ウニノ・12の面へ向かって垂直に延びている。更にノ
ズル10および11はスライド部材1へ保持金具14を
介して固定されているため1スライド部材1がウニノ1
搬送径路(第1図中において矢印で示す)と交差する方
向へ案内軸2に沿って摺動するに従って一緒に平行移動
することができる。
The positive type photoresist supply nozzle 10 and the negative type photoresist supply nozzle 11 are bundled by a nozzle holder 16 at a position above the center of the Unino S12 held by a chuck (not shown). After the nozzles 10 and 11 are bundled together by the holder 13,
It extends perpendicularly towards the surface of Unino 12. Further, since the nozzles 10 and 11 are fixed to the slide member 1 via the holding fitting 14, 1 slide member 1
As they slide along the guide shaft 2 in a direction intersecting the conveyance path (indicated by the arrow in FIG. 1), they can be translated together.

更に第1図に破線で示されているとおり、ウェハ12の
搬送径路から離れた位置へ移動したフォトレジスト供給
ノズル10および11の排出口の垂直下刃にはフォトレ
ジスト溜め15が設置されている。111j述したよう
に供給ノズル10又は11からウニI・12面上へ7オ
トレジストを滴下した後でチャック(図示せず)によっ
てウニノ・12を回転させる前に、ノズル10および1
1をスライド部材1を移動させることによってウニノS
12の搬送径路から離れた位置へ引込める。ノズル10
および11は、新たなウニノ1がフォトフシスト塗布位
置にセットされるまでこの引込み位置にとどまっていな
ければならな(・。このときノズル10および11のフ
ォトレジスト排出口近くにおるフォトレジストは空気に
さらされるため待機時間の経過につれて変質することが
ある。そこで新たにセットされたウニノ・の中心部上方
へ供給ノズル1および11を移動させる前に、変質のお
それのある排出口近くのフォトレジストを予めフォトレ
ジスト溜め15へ向けて廃棄しておくのが好まし〜・0
Further, as shown by broken lines in FIG. 1, a photoresist reservoir 15 is installed at the vertical lower blade of the discharge port of the photoresist supply nozzles 10 and 11, which have been moved to a position away from the transport path of the wafer 12. . 111j As described above, after dropping the 7 otoresist onto the surface of the sea urchin I 12 from the supply nozzle 10 or 11, and before rotating the sea urchin 12 with a chuck (not shown),
1 by moving the slide member 1.
It can be retracted to a position away from the conveyance path of 12. nozzle 10
and 11 must remain in this retracted position until a new unit 1 is set to the photoresist application position (at this time, the photoresist near the photoresist outlet of nozzles 10 and 11 is exposed to air. Therefore, before moving the supply nozzles 1 and 11 above the center of the newly set Unino®, remove the photoresist near the discharge port where there is a risk of deterioration. It is preferable to dispose of it toward the photoresist reservoir 15~・0

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明に従って構成されたノズル移動装置の平
面図、 第2図は第1図のA−A線に沿った図である。 1・・−スライド部材 2・・−案内軸5 @@@ レ
ノく− 10,11・・・フォトレジスト供給ノズル15・・・
フォトレジスト溜め 出願人 キャノン販売株式会社 キャノン株式会社
FIG. 1 is a plan view of a nozzle moving device constructed according to the present invention, and FIG. 2 is a view taken along line A--A in FIG. 1. 1...-Slide member 2...-Guide shaft 5 @@@Renoku- 10, 11... Photoresist supply nozzle 15...
Photoresist reservoir applicant Canon Sales Co., Ltd. Canon Co., Ltd.

Claims (1)

【特許請求の範囲】 ウェハの搬送径路と交差する方向へ案内軸に沿って摺動
可能なスライド部材と1 前記スライド部材に固定されたフォトレジスト供給用ノ
ズルと、 前記スライド部材を案内軸に浴って摺動させるための手
段とから構成され、 前記案内軸は、フォトレジスト供給用ノズルの排出口が
ウェハの搬送径路から離れた位置まで移動できるように
十分な長さを有していることを特徴とする、ノズル移動
装置。
[Scope of Claims] A slide member that is slidable along a guide shaft in a direction intersecting a wafer transport path; 1. A photoresist supply nozzle fixed to the slide member; and a means for sliding the guide shaft, and the guide shaft has a sufficient length so that the discharge port of the photoresist supply nozzle can move to a position away from the wafer transport path. A nozzle moving device characterized by:
JP22623683A 1983-11-30 1983-11-30 Nozzle shifter Pending JPS60117728A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22623683A JPS60117728A (en) 1983-11-30 1983-11-30 Nozzle shifter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22623683A JPS60117728A (en) 1983-11-30 1983-11-30 Nozzle shifter

Publications (1)

Publication Number Publication Date
JPS60117728A true JPS60117728A (en) 1985-06-25

Family

ID=16842023

Family Applications (1)

Application Number Title Priority Date Filing Date
JP22623683A Pending JPS60117728A (en) 1983-11-30 1983-11-30 Nozzle shifter

Country Status (1)

Country Link
JP (1) JPS60117728A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63301520A (en) * 1987-05-30 1988-12-08 Nec Corp Photoresist coating device
EP0790082A3 (en) * 1996-02-15 1998-07-15 Singulus Technologies AG Apparatus for coating substrates

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5632724A (en) * 1979-08-24 1981-04-02 Hitachi Ltd Photoresist applying apparatus

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5632724A (en) * 1979-08-24 1981-04-02 Hitachi Ltd Photoresist applying apparatus

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS63301520A (en) * 1987-05-30 1988-12-08 Nec Corp Photoresist coating device
EP0790082A3 (en) * 1996-02-15 1998-07-15 Singulus Technologies AG Apparatus for coating substrates

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