JPS60114709A - Thickness measuring apparatus for insulating material - Google Patents

Abstract

PURPOSE:To shorten measuring time and to improve measuring accuracy, by measuring the distances from an apparatus to the surface of a conductor and an insulator by two kinds sensors, and automatically calibrating the sensors before the measurement in the apparatus. CONSTITUTION:The contact points (c) and (b) of switches 11 and 12 are connected, and the outputs of sensors 1 and 2 are inputted to calibrating circuits 20. A moving mechanism comprising an actuator 4, a slide bearing 7, and limit switches 5 and 6 is operated, and calibrating values for the sensors 1 and 2 are obtained. The calibrating values of the output characteristics of the sensors 1 and 2 are inputted to an operating device 10, and the contact points (c) and (a) of the switches 11 and 12 are connected. Then, the operating device 10 detects the thickness of an insulating body R on a conductor M, based on the measured value of the distances from the sensors 1 and 2. The value is converted into the digital value and displayed on a display device 15.

Description

DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for measuring the thickness of an insulating material,
In particular, it relates to a device for measuring the thickness of rolled rubber on a metal roll.

Conventionally, as a thickness measuring device for insulators, Japanese Patent Application Laid-Open No. 58-1
Like the device shown in Publication No. 03601, it is possible to measure the difference in the distance from the device to the conductor surface and the distance from the device to the insulator using a combination of an eddy current sensor and an electrostatic sensor or an eddy current sensor and an optical sensor. A device for measuring the thickness of an insulator has been proposed.

The thickness measuring device is a compact and portable device that makes it possible to accurately measure, without contact, the thickness of insulation on a conductor surface, especially the thickness of rolled rubber on a metal roll in the rubber rolling process. It is. However, the optical sensors and electrostatic sensors require correction before measurement due to temperature drift, differences in characteristics due to composition, etc., and this correction requires
'Since the difference in the absolute amount of each sensor is taken as the thickness, the full range characteristics of each sensor must be investigated before measurement, which poses the problem of requiring a lot of effort.

An object of the present invention is to provide a device for measuring the thickness of an insulator by measuring the distance from the device to the surface of a conductor and the distance from the device to an insulator using two types of sensors.
To provide an excellent device for measuring the thickness of an insulating material, which allows the output characteristics of each sensor to be easily checked before measurement, and allows each sensor to be corrected in a short time, accurately, and extremely easily.

The insulator thickness measuring device of the present invention that achieves the above object has the following features:
It is equipped with two types of sensors that measure the distance from the device to the conductor surface and the distance to the insulator, respectively, and further includes a mechanism for moving the device a known distance in the direction of the conductor surface, and a mechanism for moving the device a known distance. The apparatus is characterized in that it has a circuit for checking the output characteristics of each sensor based on the output of each sensor, and that each sensor can be calibrated directly within the apparatus before measurement.

The present invention will be described in detail below using the accompanying drawings.

FIG. 1 is a block diagram illustrating the outline of the insulator thickness measuring device of the present invention, and FIGS. 2 and 3 show specific embodiments.

In these figures, 1 and 2 are sensors that measure the distance to the surface of the conductor M, and sensors that measure the distance to the insulator R, respectively.For example, sensor 2 is an electrostatic sensor or an optical sensor. 1 uses an eddy current sensor. The sensors 1 and 2 are attached to a base 3, and the base 3 is attached to an actuator 4 and a slider bearing 7.
The distance α of the reading in the direction of arrow AA' is
It can be moved (for example, by one line). The amount of movement of the base B is accurately grasped by a limit switch 6 that detects the output limit and a limit switch 5 that detects the return limit.

Further, the output JE lines 8 and 9 of the sensors 1 and 2 are connected to the arithmetic unit 1o via interlocking changeover switches 11 and 12, and the remaining contacts of the changeover switches are connected to the regeneration circuit 2°. (The output lines 8 and 9, the changeover switches 11 and 12, and the correction circuit 20 are not shown in FIGS. 2 and 3.) The limit switches 5 and 6 are connected to this correction circuit 20. controls the actuator 4 by the outputs of the limit switches 5 and 6.

When calibrating the sensors 1 and 20, connect the contacts c and b of the changeover switches 11 and 12.
so that the output of actuator 4. is input to the correction circuit 2o. Slide bearing 7, limit switch 5
, 6 is operated to obtain the correction values of the sensors 1 and 2. Since the correction values of the output characteristics of the sensors 1 and 2 determined by the correction circuit 20 are input to the arithmetic unit 1o, by connecting the contacts c'-a of the changeover switches 11 and 12, the distance measurement by the sensors 1 and 2 is Based on the measured value, the arithmetic unit 10 detects the thickness of the insulator R on the conductor M, converts this into digital, and displays the thickness of the insulator R on the display 15, for example, in digital numbers.

The configuration and functions of the device of the present invention are as described above,
Next, using the apparatus of the present invention, the insulator R on the conductor M is actually
The specific procedure for measuring the thickness of will be explained using the flowchart of FIG.

(1) Correcting the zero point Since the measured values of the distances from the sensors 1 and 2 to the conductor M and the insulator R are output as voltages, first measure the reference voltage value (zero point voltage). This zero point voltage is defined as the output voltage VOA of the sensor 1 and the output voltage voB of the sensor 2 in a state where there is no insulator R on the conductor M. Later sensor 1. sensor 2
The value obtained by subtracting this zero point voltage from the O output voltages VA and VB during measurement is used as the voltage corresponding to the distance from the zero point to the measurement point. This procedure is shown in FIG. 4 as steps ■→■→■→■→(5).

(2) Sensor gain correction In order to check the output characteristics (gains) of the sensors 1 and 2 during measurement, the device of the present invention uses the correction circuit 20 to , 2 by a known reference distance α (for example, l mm).Actuate the actuator 4 to move the base 6 toward the conductor side (step
), when the limit switch 6 is turned on (YES in step ■), the output voltage V2A of sensors 1 and 2
Step ■) to measure v2B, then actuator 4
is released (step ■), and when the base 3 reaches the return limit and the limit switch 5 is turned on (step [phase]
YES), the output voltages of sensors 1 and 2 VIA, V
Measure IB (step 0).

Then, the process moves to step 0, where the gains of the sensors 1 and 2 are calculated by the correction circuit 20. If the gains of the distance-output voltage characteristics of sensors 1 and 2 are KA and Kn, respectively, then KA
, Kn are expressed by the following formula.

α ni’=K”-V2B VIB V2A　’V+1. .

In addition, when the object to be measured is a rubber sheet on a roll, this correction shall be performed in a stationary state with the roll stopped rotating.

(3) Measuring the thickness of the insulator As described above, the zero point voltage VOA of sensors 1 and 2,
When Vou and gains KA and KB are determined, the process moves from step ① to step 0, and the voltage value ① corresponding to the distance to the surface of sensor 1 (4-M) is set.

The sensor 2 simultaneously measures a voltage value VB corresponding to the distance to the surface of the insulator R. In step 0, subtract the aforementioned zero point voltage from these measured values, and use the gain determined by the distance LA from the zero point to the surface of the insulator R and the distance LB from the zero point to the surface of the insulator R. Calculate.

With these distances LA and LB, the thickness L of the insulator R on the conductor M in step [phase] is determined by L=LIILA.

When measuring the thickness of the rubber sheet on the sheet output roll, use the roll corresponding to the conductor M.

The rubber 7-=t corresponding to the insulator R rotates eccentrically, and this eccentricity corresponds to the conductor M relative to the zero point.

This appears as a change in the surface position of the insulator R, but in the device of the present invention, the distances of the conductor M and the insulator R from the zero point are measured, and the thickness of the insulator R is determined by taking the difference between them. The thickness of the rubber sheet on the roll can be measured continuously. - In this case, step ■→■ in Figure 4
The procedure of →■→0→0→[phase] will be repeated. If YES is obtained in step [phase], the measurement ends.

In the device O of the present invention, the zero point correction described in (1) above and the sensor gain correction described in (2) can be performed as necessary before measurement or after interrupting measurement. Moreover, since the correction can be automatically performed using a calculation device and a correction circuit, anyone can easily perform this correction, which is very convenient.

〔Effect of the invention〕

As explained above, the insulator thickness measuring device of the present invention has the following features:
This is a device that non-contactly measures the thickness of an insulator on a conductor surface, and is equipped with two types of sensors that measure the distance from the device to the conductor surface and the distance at the insulator.
Furthermore, the device has a mechanism for moving the device a known distance in the direction of the conductor surface, and a circuit for checking the output characteristics of each sensor based on the output of each sensor by moving the device a known distance, and calibrating each sensor before measurement. Since calibration can be performed automatically within the camera, each sensor can be calibrated quickly, accurately, and extremely easily before or after measurement, reducing measurement time and improving measurement accuracy. This has the effect of making improvements possible.

[Brief explanation of the drawing]

Fig. 1 is a block diagram illustrating the outline of the insulating material thickness measuring device of the present invention, Figs. 2 and 3 are side and front views respectively showing an embodiment of the same measuring device, and Fig. 4 is the same device. 2 is a flowchart showing a measurement procedure. 1.2...sensor, 4...actuator, 5,6
...Limit switch, 10...Arithmetic device, 20.
...Correction circuit. Agent: Patent Attorney Makoto Ogawa − Patent Attorney: Ken Noguchi Patent Attorney: Kazuhiko Saishita

Claims (1)

[Claims] This is a device that non-contactly measures the thickness of an insulator on a conductor surface, and is equipped with two types of sensors that measure the distance from the device to the conductor surface and the distance to the insulator, respectively.
Furthermore, the device has a mechanism for moving the device a known distance in the direction of the conductor surface, and a circuit for checking the output characteristics of each sensor based on the output of each sensor by moving the device a known distance, and calibrating each sensor before measurement. A device that can automatically measure the thickness of insulation materials.