JPS60106244U - 回転円盤押え機構 - Google Patents
回転円盤押え機構Info
- Publication number
- JPS60106244U JPS60106244U JP20105783U JP20105783U JPS60106244U JP S60106244 U JPS60106244 U JP S60106244U JP 20105783 U JP20105783 U JP 20105783U JP 20105783 U JP20105783 U JP 20105783U JP S60106244 U JPS60106244 U JP S60106244U
- Authority
- JP
- Japan
- Prior art keywords
- presser foot
- holding mechanism
- disc holding
- turntable
- pressing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Holding Or Fastening Of Disk On Rotational Shaft (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20105783U JPS60106244U (ja) | 1983-12-26 | 1983-12-26 | 回転円盤押え機構 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20105783U JPS60106244U (ja) | 1983-12-26 | 1983-12-26 | 回転円盤押え機構 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS60106244U true JPS60106244U (ja) | 1985-07-19 |
JPH0222837Y2 JPH0222837Y2 (en, 2012) | 1990-06-20 |
Family
ID=30762486
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20105783U Granted JPS60106244U (ja) | 1983-12-26 | 1983-12-26 | 回転円盤押え機構 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60106244U (en, 2012) |
Families Citing this family (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6380751B2 (en) | 1992-06-11 | 2002-04-30 | Cascade Microtech, Inc. | Wafer probe station having environment control enclosure |
US5345170A (en) | 1992-06-11 | 1994-09-06 | Cascade Microtech, Inc. | Wafer probe station having integrated guarding, Kelvin connection and shielding systems |
US5561377A (en) | 1995-04-14 | 1996-10-01 | Cascade Microtech, Inc. | System for evaluating probing networks |
US6002263A (en) | 1997-06-06 | 1999-12-14 | Cascade Microtech, Inc. | Probe station having inner and outer shielding |
US6445202B1 (en) | 1999-06-30 | 2002-09-03 | Cascade Microtech, Inc. | Probe station thermal chuck with shielding for capacitive current |
US6965226B2 (en) | 2000-09-05 | 2005-11-15 | Cascade Microtech, Inc. | Chuck for holding a device under test |
US6914423B2 (en) | 2000-09-05 | 2005-07-05 | Cascade Microtech, Inc. | Probe station |
US6836135B2 (en) | 2001-08-31 | 2004-12-28 | Cascade Microtech, Inc. | Optical testing device |
US6777964B2 (en) | 2002-01-25 | 2004-08-17 | Cascade Microtech, Inc. | Probe station |
US6847219B1 (en) | 2002-11-08 | 2005-01-25 | Cascade Microtech, Inc. | Probe station with low noise characteristics |
US7250779B2 (en) | 2002-11-25 | 2007-07-31 | Cascade Microtech, Inc. | Probe station with low inductance path |
US6861856B2 (en) | 2002-12-13 | 2005-03-01 | Cascade Microtech, Inc. | Guarded tub enclosure |
US7221172B2 (en) | 2003-05-06 | 2007-05-22 | Cascade Microtech, Inc. | Switched suspended conductor and connection |
US7492172B2 (en) | 2003-05-23 | 2009-02-17 | Cascade Microtech, Inc. | Chuck for holding a device under test |
US7250626B2 (en) | 2003-10-22 | 2007-07-31 | Cascade Microtech, Inc. | Probe testing structure |
US7187188B2 (en) | 2003-12-24 | 2007-03-06 | Cascade Microtech, Inc. | Chuck with integrated wafer support |
US7176705B2 (en) | 2004-06-07 | 2007-02-13 | Cascade Microtech, Inc. | Thermal optical chuck |
US7330041B2 (en) | 2004-06-14 | 2008-02-12 | Cascade Microtech, Inc. | Localizing a temperature of a device for testing |
US7535247B2 (en) | 2005-01-31 | 2009-05-19 | Cascade Microtech, Inc. | Interface for testing semiconductors |
-
1983
- 1983-12-26 JP JP20105783U patent/JPS60106244U/ja active Granted
Also Published As
Publication number | Publication date |
---|---|
JPH0222837Y2 (en, 2012) | 1990-06-20 |
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