JPS60102666U - flaw detection equipment - Google Patents
flaw detection equipmentInfo
- Publication number
- JPS60102666U JPS60102666U JP19507583U JP19507583U JPS60102666U JP S60102666 U JPS60102666 U JP S60102666U JP 19507583 U JP19507583 U JP 19507583U JP 19507583 U JP19507583 U JP 19507583U JP S60102666 U JPS60102666 U JP S60102666U
- Authority
- JP
- Japan
- Prior art keywords
- flaw detection
- lift
- signal
- detection equipment
- ultrasound probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第1因はこの考案の一実施例の断面図、第2図はこの考
案の実施例を説明する図、第3図はこの □考案の
実施例を説明するためのブ白ツク図、第4図はこの考案
の実施例を説明するための図であ −る。The first factor is a cross-sectional view of an embodiment of this invention, Figure 2 is a diagram for explaining an embodiment of this invention, Figure 3 is a blank diagram for explaining an embodiment of this invention, and Figure 4 is a diagram for explaining an embodiment of this invention. The figure is a diagram for explaining an embodiment of this invention.
Claims (1)
記超音波探触子の信号からりフトオフ信号を発生するリ
フトオフパルス発生回路と、前記リフトオフ信号により
前記磁気探触子の信号の利得を補正する自動利得制御回
路とを備えたことを特徴とする探傷装置。″ A lift-off pulse generation circuit that integrates an ultrasound probe and a magnetic probe and generates a lift-off signal from the signal of the ultrasound probe, and a lift-off pulse generation circuit that generates a lift-off signal from the signal of the ultrasound probe, and A flaw detection device comprising: an automatic gain control circuit that corrects the gain of the flaw detection device.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19507583U JPS60102666U (en) | 1983-12-19 | 1983-12-19 | flaw detection equipment |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19507583U JPS60102666U (en) | 1983-12-19 | 1983-12-19 | flaw detection equipment |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS60102666U true JPS60102666U (en) | 1985-07-12 |
Family
ID=30419096
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19507583U Pending JPS60102666U (en) | 1983-12-19 | 1983-12-19 | flaw detection equipment |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS60102666U (en) |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58195073A (en) * | 1982-05-07 | 1983-11-14 | Nippon Denso Co Ltd | Preheat controller of engine |
-
1983
- 1983-12-19 JP JP19507583U patent/JPS60102666U/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS58195073A (en) * | 1982-05-07 | 1983-11-14 | Nippon Denso Co Ltd | Preheat controller of engine |
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