JPS5989771A - Ion sputtering device provided with mechanism for automatically increasing impressed voltage - Google Patents
Ion sputtering device provided with mechanism for automatically increasing impressed voltageInfo
- Publication number
- JPS5989771A JPS5989771A JP19932982A JP19932982A JPS5989771A JP S5989771 A JPS5989771 A JP S5989771A JP 19932982 A JP19932982 A JP 19932982A JP 19932982 A JP19932982 A JP 19932982A JP S5989771 A JPS5989771 A JP S5989771A
- Authority
- JP
- Japan
- Prior art keywords
- sample
- voltage
- chamber
- ion sputtering
- constitution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/34—Sputtering
Landscapes
- Chemical & Material Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Physical Vapour Deposition (AREA)
Abstract
Description
【発明の詳細な説明】
本発明は薄膜生成装置に係シ、特に直流放電式イオンス
パッタリング装置に使用するのに好適な薄膜生成装置に
関する1、
イオンスパッタリング装置では、ターゲットの種類によ
シ適当な放電々圧がおシ、この電圧が発生されるよう予
め設定しておく、たとえは金をターゲットとする場合、
1500Vから2000V程度である。一方、真9度は
この設定電圧に対して放電々流を規定するもので、また
適当な値にしなければならない。上記のターゲットの場
合10−+’(’orr程度が通算用いられている。、
このような放電条件をチェックするため、短詩1141
放゛亀状態を監視するための印加スイッチを有するのが
光通である。そして放電が適正であれlよタイマーを動
作せしめて、所足の時間コーティングを行うことになる
。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a thin film generating apparatus, and particularly to a thin film generating apparatus suitable for use in a DC discharge type ion sputtering apparatus. If the discharge voltage is high, set it in advance so that this voltage is generated.For example, when targeting gold,
The voltage is about 1500V to 2000V. On the other hand, true 9 degrees defines the discharge current with respect to this set voltage, and must be set to an appropriate value. In the case of the above target, approximately 10-+'('orr is used in total.
In order to check such discharge conditions, short poem 1141
The light transmitter has an application switch for monitoring the radiation state. If the discharge is appropriate, the timer will be activated and coating will take place for the required amount of time.
本発明の目的は゛電子、イオン等による試料の損傷を軽
減しうるイオンスパッタリング装置を提供することにあ
る。An object of the present invention is to provide an ion sputtering apparatus that can reduce damage to a sample caused by electrons, ions, etc.
従来装置では、生物試料等ではコーテイング後その楢造
が破壊されていることが多い。その原因はスパッタリン
グの初期に放電によって生じた電子および負のイオンが
高速で試料に衝突し、その熱的およびイオン等による槓
械的衝撃によって損傷されることが実験の結果判明した
。すなわち、不良導体試料表面への荷電が急激に生する
場合、たとえ短時間といえども損傷の原因となる。これ
を避けるためには、放電々圧を徐々に上昇させて時間を
かけて試料表面の一位を高めるようにすれはよい。In conventional devices, the coating of biological samples is often destroyed after coating. Experiments have revealed that the cause of this is that electrons and negative ions generated by discharge collide with the sample at high speed during the initial stage of sputtering, causing damage due to thermal and mechanical impact caused by the ions. That is, if the surface of a defective conductor sample is suddenly charged, it may cause damage even if it is only for a short time. To avoid this, it is a good idea to gradually increase the discharge pressure to raise the level of the sample surface over time.
以下本発明の一実施例を第1図によル説明する。An embodiment of the present invention will be explained below with reference to FIG.
試料2は試料ホルダー3に固定されて、本体大空チャン
バー1の中にある試料台4上においである。試料に導電
性#膜コーティングを行うため、チャンバーは10−1
〜10−” Torrの圧力に保ち、それはロータリー
ポンプ5によって行われる。チャンバー内には!−ゲッ
ト電極6が設けられ、絶縁物7を介してh電圧コード8
によって高電圧整流器9および晶電圧トランスlOにつ
ながっている。The sample 2 is fixed to a sample holder 3 and placed on a sample stage 4 inside the large open chamber 1 of the main body. In order to coat the sample with conductive # film, the chamber is set at 10-1.
A pressure of ~10" Torr is maintained, which is carried out by a rotary pump 5. A !-get electrode 6 is provided in the chamber, and an h voltage cord 8 is connected through an insulator 7.
is connected to a high voltage rectifier 9 and a crystal voltage transformer IO.
本発明は高圧トランス−次側に供給するMl、圧を始動
時のみ第2図に示されたグラフのように漸次電圧を上昇
さ七るユニット11をもつ。The present invention has a unit 11 that gradually increases the voltage of Ml and pressure supplied to the downstream side of the high voltage transformer only at the time of starting, as shown in the graph shown in FIG.
本実施例によれは、試料2はチェンバー内に生じるプラ
ズマによる損傷を軽減させる効果がある。According to this embodiment, the sample 2 has the effect of reducing damage caused by plasma generated within the chamber.
第1図中に示した11の内容を第3図に示す。The contents of 11 shown in FIG. 1 are shown in FIG.
供給電圧を漸次上昇させるために ザイリスタ12を用
いて、電源部13からの又流100■を制御している。In order to gradually increase the supply voltage, a Zyrister 12 is used to control the current 100 from the power supply section 13.
ザイリスタ12は駆動部14と制御部15から安定して
動作させられ、操作入力は制御部155インプツトされ
る!
゛電圧上昇の時間は印加する電圧と試料によって異なる
が、通′にのスパッタリング装置では定常放電々圧20
00V、放電々流20mAに於て、3〜4秒のスローア
ップを行うことによって、生物膜の破れなしにコーディ
ングを行うことができた。The Zyristor 12 is stably operated by the drive unit 14 and the control unit 15, and operation inputs are input to the control unit 155!゛The voltage rise time varies depending on the applied voltage and the sample, but in ordinary sputtering equipment, the steady discharge voltage is 20
By performing slow-up for 3 to 4 seconds at 00V and 20mA discharge current, coding could be performed without breaking the biofilm.
スローアップの時間は放電々圧および放電々流に応じて
、また試料の性質にもよシ調節できるのが望ましい。It is desirable that the slow-up time can be adjusted depending on the discharge pressure and discharge current, and also on the properties of the sample.
第1図は本発明の一実施例の概要図、第2図はターゲッ
ト屯極への印加電圧と時間との関係を示す図、第3図は
供給電圧漸次上昇ユニットの内部回路図である。
11・・・供給電圧漸次上昇ユニット、12・・・・リ
ーイリスタ、13・・・電源部、14・・・ザイリスタ
駆動部、手続補正書(方式)
特バ′「片長n着杉和夫殿
事件の表示
昭和57年 特訂願第199329 号発 明 の
名 称 印加電圧自動上昇機格のついたイオンスパッタ
リング装置
補正をする者
゛1印1との関fI 特を1出願人11 所
東京都千代田区丸の内−丁目5番1号名 称ffi
+01株式会社 日 立 製 イ乍所代表者 三 1)
勝 茂
住 所 茨城県勝田市市毛1040番地名 称 日
立肺珂精器株式公社
代表者 安藤進一部
代 理 人
居 所 東京都千代田区丸の内−丁目5番1号補正
の 月 象 明細1ii=および委任状の発明の名称を
順書の発明の名称に一致させた)。
2、代理権を鉦明する1面として添伺委任状を提出致し
ます。
添付iI類の目録
1、浄書した明細! 1通2、
委任状 1通以上FIG. 1 is a schematic diagram of an embodiment of the present invention, FIG. 2 is a diagram showing the relationship between voltage applied to a target electrode and time, and FIG. 3 is an internal circuit diagram of a supply voltage gradual increase unit. 11...Supply voltage gradual increase unit, 12...Lee Iristor, 13...Power supply section, 14...Zyristor drive section, procedural amendment (method) Invention of Special Revision Application No. 199329 filed in 1982
Name Person who corrects ion sputtering equipment with automatic applied voltage increase feature
5-1 Marunouchi-chome, Chiyoda-ku, Tokyo Name: ffi
+01 Hitachi Corporation Representative 3 1)
Katsu Shigeju Address: 1040 Ichige, Katsuta City, Ibaraki Prefecture Name Hitachi Lungkake Seiki Co., Ltd. Representative Susumu Ando Deputy Director Address: 5-1 Marunouchi-chome, Chiyoda-ku, Tokyo Amended
The title of the invention in the power of attorney was made consistent with the title of the invention in the written statement). 2. We will submit a power of attorney to confirm your authority to represent you. Attachment II catalog 1, detailed details! 1 letter 2,
One or more power of attorney
Claims (1)
於いて、放電々圧を、コーティングすべき試料に対して
適当なスピードをもって予め定められた電圧まで徐々に
高めることを特徴とするイオンスパッタリング装置。1. W using ion sputtering! Film generation device fK
An ion sputtering apparatus characterized in that the discharge pressure is gradually increased to a predetermined voltage at an appropriate speed for the sample to be coated.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19932982A JPS5989771A (en) | 1982-11-12 | 1982-11-12 | Ion sputtering device provided with mechanism for automatically increasing impressed voltage |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19932982A JPS5989771A (en) | 1982-11-12 | 1982-11-12 | Ion sputtering device provided with mechanism for automatically increasing impressed voltage |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5989771A true JPS5989771A (en) | 1984-05-24 |
Family
ID=16405980
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19932982A Pending JPS5989771A (en) | 1982-11-12 | 1982-11-12 | Ion sputtering device provided with mechanism for automatically increasing impressed voltage |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5989771A (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02254160A (en) * | 1989-03-27 | 1990-10-12 | Ube Ind Ltd | Plasma controller |
JPH0617242A (en) * | 1992-03-11 | 1994-01-25 | Fuji Xerox Co Ltd | Thin film forming method and thin film forming device |
-
1982
- 1982-11-12 JP JP19932982A patent/JPS5989771A/en active Pending
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH02254160A (en) * | 1989-03-27 | 1990-10-12 | Ube Ind Ltd | Plasma controller |
JPH0617242A (en) * | 1992-03-11 | 1994-01-25 | Fuji Xerox Co Ltd | Thin film forming method and thin film forming device |
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