JPS5979843A - Apparatus for emission spectral analysis - Google Patents

Apparatus for emission spectral analysis

Info

Publication number
JPS5979843A
JPS5979843A JP19130282A JP19130282A JPS5979843A JP S5979843 A JPS5979843 A JP S5979843A JP 19130282 A JP19130282 A JP 19130282A JP 19130282 A JP19130282 A JP 19130282A JP S5979843 A JPS5979843 A JP S5979843A
Authority
JP
Japan
Prior art keywords
sensitivity
measuring sensitivity
type
specimen
sample
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19130282A
Other languages
Japanese (ja)
Other versions
JPS642891B2 (en
Inventor
Shuzo Hayashi
修三 林
Naoki Imamura
直樹 今村
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Shimazu Seisakusho KK
Original Assignee
Shimadzu Corp
Shimazu Seisakusho KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp, Shimazu Seisakusho KK filed Critical Shimadzu Corp
Priority to JP19130282A priority Critical patent/JPS5979843A/en
Publication of JPS5979843A publication Critical patent/JPS5979843A/en
Publication of JPS642891B2 publication Critical patent/JPS642891B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/66Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence
    • G01N21/67Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light electrically excited, e.g. electroluminescence using electric arcs or discharges

Landscapes

  • Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

PURPOSE:To achieve the reduction of working load and the enhancement of analytical efficiency, by a method wherein the table of the measuring sensitivity of each element is stored at every kind of a specimen and the kind is indicated by key operation to automatically set proper measuring sensitivity to each element in said kind. CONSTITUTION:Sensitivity setting circuits 1-n corresponding to a first- an n-th elements are respectively equipped with resistances connected in series, a short- circuiting switches S11-S16 and switch control circuits and change over high voltage applied to a photoelectric multiplier Pi to set the measuring sensitivity thereof. When the desired key among the specimen kind indication keys A-X of an operation table T is pressed, CPU successively reads the measuring sensitivity of each element with respect to the kind thereof from memory to outputs the same to a data bus BUS and the sensitivity data of the corresponding element is read in the latch circuits K of the circuit 1-n. By this method, the opening the closing of each switch S11-S16 in each circuit 1-n is set and the measuring sensitivity of each element is set corresponding to the specimen kind indicated by an operator.

Description

【発明の詳細な説明】 本発明は分析対象の品種によって各元素の測定感度を切
換えるようにした発光分光分析装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an optical emission spectrometer in which the measurement sensitivity of each element can be changed depending on the type of analysis target.

色々な試料において成る元素の濃度を測定しようとする
とき、試料の品種によってその元素の含有量は大幅に異
シ、発光分析の場合、成る元素に対する測定感度を一定
にしておくと、へ品種の試料では感度が過剰で測定値が
スケールオーバーし、起る。従来は分析する人が手動で
試料の品種によって各元素の測定感度を夫々の品種に対
して適当した値に設定している。分析対象の数が少いと
きとか分析対象の品種の切換わシが頻繁でない場合はこ
れでもよいが、分析対象の数が多く、多品種である場合
には分析する者にとって大へんな負担増しになる。
When trying to measure the concentration of an element in various samples, the content of that element varies greatly depending on the type of sample, and in the case of luminescence analysis, if the measurement sensitivity for the element is held constant, the content of that element will vary depending on the type of sample. This occurs when the sample has excessive sensitivity and the measured value overscales. Conventionally, an analyzer manually sets the measurement sensitivity of each element to a value appropriate for each type of sample, depending on the type of sample. This is fine when the number of analysis targets is small or when the types of analysis targets are not changed frequently, but if there are many analysis targets and there are many types, the burden on the person conducting the analysis increases considerably. become.

本発明は試料の品種を指定すれば自動的にその品種にお
ける各元素に対して適当な測定感度が設定されるように
した発光分光分析装置を提供しようとするものである。
The present invention aims to provide an optical emission spectrometer in which, when the type of sample is specified, an appropriate measurement sensitivity is automatically set for each element in that type.

本発明発光分光分析装置は、試料の品種毎に各元素の測
定感度の表を予めメモリに記憶させておき、オペレータ
の試料の品種を指定するキー操作によって上記メモリか
ら指定品種の試料に対する各元素の測定感度が設定され
るようになっていることを特徴とするものである。
The optical emission spectrometer of the present invention stores a table of measurement sensitivity of each element for each sample type in advance in memory, and when the operator operates a key to specify the sample type, each element is selected from the memory for the sample of the specified type. It is characterized in that the measurement sensitivity of is set.

本発明によるときは分析作業を行うものは単に試料の品
種を指定する操作だけで各品種毎に各元担が軽減され、
感度選択の誤りがなくなり、分析能率が向上する。
According to the present invention, the person performing the analysis work simply specifies the type of sample, and the burden on each individual type is reduced.
Mistakes in sensitivity selection are eliminated and analysis efficiency is improved.

以下実施例によって本発明を説明する。図は本発明の一
実施例装置の構成を示す。図でブロック1〜nは第1〜
第nの元素に対応させた感度設定回路で、夫々直列接続
された抵抗と各抵抗毎に並列に設けられた短絡用スイッ
チ811〜Sn6とそれらのスイッチを制御する回路か
ら成っており、各抵抗列の一端が検出器用高圧電源■に
接続され、各抵抗列の他端には光電子増倍管PI−Pn
と抵抗ROが並列に接続されている。一つのブロック例
えば1において、スイッチS11〜S’16の開閉の選
択によって抵抗列の全抵抗が変化し、抵抗Roとの比が
変わることによって光電子増倍管P1に印加される高電
圧が切換えられてPlの感度が成る値に決まり、第1元
素の測定感度が設定される。他のブロック2,3・・・
(不図示)・・・nにおいても同様である。各ブロック
1〜nにおける各抵抗列は一番左のものの抵抗値をRと
すると、右へ順に2R,4R,・・・25−32Rとな
っており一12進数の第1桁〜第6桁に対応させ、2進
数の1をスイッチオン、Oをスイッチオンとすると、ス
゛       抵抗値が得られる。DRはスイッチ8
11−、、Etn6を操作するドライバー回路、Kはデ
ータラッチ回路で、CPUからインターフェースエFを
介して2進数データの信号が印加され、ストローブ信号
によってそのデータを読み込みラッチしてドライバー回
路DRに出力する。
The present invention will be explained below with reference to Examples. The figure shows the configuration of an apparatus according to an embodiment of the present invention. In the figure, blocks 1 to n are the first to
This is a sensitivity setting circuit corresponding to the n-th element, and consists of resistors connected in series, shorting switches 811 to Sn6 provided in parallel for each resistor, and a circuit for controlling these switches. One end of the row is connected to the high-voltage power supply for the detector, and the other end of each resistor row is connected to a photomultiplier tube PI-Pn.
and a resistor RO are connected in parallel. In one block, for example 1, the total resistance of the resistor string changes by opening and closing the switches S11 to S'16, and the high voltage applied to the photomultiplier tube P1 is switched by changing the ratio with the resistance Ro. Then, the sensitivity of Pl is determined to be a value, and the measurement sensitivity of the first element is set. Other blocks 2, 3...
(not shown)...The same applies to n. Assuming that the resistance value of the leftmost resistor array in each block 1 to n is R, the resistance values are 2R, 4R, ...25-32R in order to the right, and the 1st to 6th digits of the hexadecimal number are 2R, 4R, ...25-32R. , and if the binary number 1 is the switch on and O is the switch on, the resistance value is obtained. DR is switch 8
11-, the driver circuit that operates Etn6, K is a data latch circuit, to which a binary data signal is applied from the CPU via the interface E, the data is read and latched by the strobe signal, and output to the driver circuit DR. do.

C、P Uのメモリには下表に示すようなデータが記憶
させである。
Data shown in the table below is stored in the memories of C and PU.

この表のデータは試料品種毎の各元素1〜nに対する測
定感度を示し、品種Aの試料の元素l〜nの測定感度は
al、a2・・・anである。操作卓Tには試料の品種
を指定するA 、 Xのキーがあり、オペレータが到来
した試料の品種を見てその品種のキーを押すと、CPU
はメモリからその品種に対する各元素の測定感度を順次
読出してデータノくスBUSに出力し、それと並行して
ブロックl〜nのデータラッチ回路Kに順にストローブ
信号を送って、対応元素の感度のデータを各ラッチ回路
Kに読込ませる。かくして各ブロック1〜nにおけるス
イッチS]−1〜Sn6の開閉が設定され、オペレータ
が指定した試料品種に応じて各元素の測定感度が設定さ
れる。
The data in this table shows the measurement sensitivity for each element 1 to n for each sample type, and the measurement sensitivity for elements l to n of the sample of type A is al, a2, . . . an. The operator console T has A and X keys to specify the type of sample, and when the operator sees the type of sample that has arrived and presses the key for that type, the CPU
sequentially reads the measurement sensitivity of each element for that product from the memory and outputs it to the data node BUS, and in parallel, sends a strobe signal to the data latch circuits K of blocks l to n in order to read the sensitivity data of the corresponding element. is read into each latch circuit K. Thus, the opening and closing of the switches S]-1 to Sn6 in each block 1 to n are set, and the measurement sensitivity of each element is set according to the sample type specified by the operator.

上述した実施例ではオペレータが到来した試料の品種を
ラベル等を見て判定し自分でキー操作によって品種指定
を行うが、ラベルに光電読取り用のストライプ符号等で
品種を記入しておき、オペレータが手持ち式のストライ
プ符号読取装置で、ラベルの記録を走査してCPUに試
料品種の指定信号を入力させるようにしてもよく、この
ようにすればオペレータによるラベル記入事項の読み間
違い、キー操作の誤りも防がれ、オペレータの作業負担
は一層軽減される。更に試料の形、ラベルの貼付位置等
を規定しておけば品種データの読取り、CPUへの入力
をも自動化することができる。
In the above-described embodiment, the operator determines the type of sample that has arrived by looking at the label, etc., and specifies the type himself by operating keys. A hand-held stripe code reader may be used to scan the record on the label and input a signal specifying the sample type to the CPU, which prevents the operator from misreading the label entry or erroneous key operation. This will further reduce the operator's workload. Furthermore, by specifying the shape of the sample, the position of label attachment, etc., it is possible to automate the reading of type data and input to the CPU.

【図面の簡単な説明】[Brief explanation of drawings]

図面は本発明の一実施例装置の構成を示すブロック図で
ある。 1− n・・・各元素毎の測定感度設定回路、DR・・
・スイッチの開閉を操作するドライバー回路、K・・・
データラッチ回路、工F・・・インターフェース、T・
・・操作卓、BUEI・・・データバス、■・・・検出
器用高圧電源、P1〜Pn・・・各元素毎の光電子増倍
管。 代理人 弁理士  昧   浩  介
The drawing is a block diagram showing the configuration of an apparatus according to an embodiment of the present invention. 1-n...Measurement sensitivity setting circuit for each element, DR...
・Driver circuit that operates the switch opening/closing, K...
Data latch circuit, engineering F...interface, T.
...Operation console, BUEI...data bus, ■...high-voltage power supply for the detector, P1 to Pn...photomultiplier tubes for each element. Agent Patent Attorney Kosuke Mai

Claims (1)

【特許請求の範囲】[Claims] 試料の品種毎に各元素の測定感度のデータをメモリに記
憶させておき、試料品種指定信号によって上記メモリか
ら指定品種に対する各元素の測定感度のデータを読出し
て、そのデータに基いて各元素に対する測定感度を設定
するようにしたことを特徴とする発光分光分析装置。
The measurement sensitivity data for each element is stored in memory for each sample type, and the measurement sensitivity data for each element for the specified type is read out from the memory in response to the sample type designation signal. An emission spectrometer characterized in that measurement sensitivity can be set.
JP19130282A 1982-10-29 1982-10-29 Apparatus for emission spectral analysis Granted JPS5979843A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19130282A JPS5979843A (en) 1982-10-29 1982-10-29 Apparatus for emission spectral analysis

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19130282A JPS5979843A (en) 1982-10-29 1982-10-29 Apparatus for emission spectral analysis

Publications (2)

Publication Number Publication Date
JPS5979843A true JPS5979843A (en) 1984-05-09
JPS642891B2 JPS642891B2 (en) 1989-01-19

Family

ID=16272296

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19130282A Granted JPS5979843A (en) 1982-10-29 1982-10-29 Apparatus for emission spectral analysis

Country Status (1)

Country Link
JP (1) JPS5979843A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0471156U (en) * 1990-10-31 1992-06-24

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5427493A (en) * 1977-08-03 1979-03-01 Kawasaki Steel Co Instrumental analysis

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5427493A (en) * 1977-08-03 1979-03-01 Kawasaki Steel Co Instrumental analysis

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0471156U (en) * 1990-10-31 1992-06-24

Also Published As

Publication number Publication date
JPS642891B2 (en) 1989-01-19

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