JPS5979832A - Fabrication of specimen to be microscopically examined by two-stage replica method - Google Patents

Fabrication of specimen to be microscopically examined by two-stage replica method

Info

Publication number
JPS5979832A
JPS5979832A JP19050382A JP19050382A JPS5979832A JP S5979832 A JPS5979832 A JP S5979832A JP 19050382 A JP19050382 A JP 19050382A JP 19050382 A JP19050382 A JP 19050382A JP S5979832 A JPS5979832 A JP S5979832A
Authority
JP
Japan
Prior art keywords
replica
stage
specimen
stage replica
cellulose acetate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19050382A
Other languages
Japanese (ja)
Inventor
Kazuhiro Saito
斉藤 一弘
Hiroshi Sakamoto
阪本 博
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Resonac Holdings Corp
Original Assignee
Showa Denko KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Showa Denko KK filed Critical Showa Denko KK
Priority to JP19050382A priority Critical patent/JPS5979832A/en
Publication of JPS5979832A publication Critical patent/JPS5979832A/en
Pending legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N1/00Sampling; Preparing specimens for investigation
    • G01N1/28Preparing specimens for investigation including physical details of (bio-)chemical methods covered elsewhere, e.g. G01N33/50, C12Q
    • G01N1/2806Means for preparing replicas of specimens, e.g. for microscopal analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

PURPOSE:To obtain a specimen to be microscopically examined faithful to an original specimen used in the examination due to an electron microscope within a short time, by such simple operation that metal In is pressed to the surface to be examined to fabricate one stage replica and a second replica is fabricated from said one stage replica by cellulose acetate. CONSTITUTION:Metal In is pressed to the surface to be examined of a rotary grinder by a hand presser and the uneveness of the specimen surface is transferred to In to obtain one stage replica. In the next step, 2-3 drops of acetone are dripped on the surface of said replica while a cellulose acetate film is adhered from above so as to exclude air bubbles and, after acetone is volatilized, said cellulose acetate film is peeled off to obtain a second stage replica. This second stage replica is fixed to the specimen stand of a scanning type electron microscope so as to upwardly direct the uneven surface thereof and, after a silver paste is applied to the periphery of the replica, gold is vapor deposited to the uneven surface to take a photograph while performing microscopic examination. By this method, the excellent two-stage replica is simply obtained within a short time. In addition, the one stage replica can be made preservable for a long time and can be used at a necessary time.

Description

【発明の詳細な説明】 この発明は、特に走査型′電子顕微鏡の恢鏡試料ケ容易
力・つ迅速に調剤するこ乙のできる二段レプリカ法によ
る検鏡試料の作成方法に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention particularly relates to a method for preparing a microscopic specimen using a two-stage replica method, which makes it easy and quick to prepare a microscopic specimen for a scanning electron microscope.

走査型t4g、子顕微鏡は周知のようにその焦点深度が
深(、ヴ体感に富む像が得られ、観察試料に多岐にわた
・る種々のものが採用できることなどから広い分野で活
用されている。
As is well known, scanning T4G microscopes are used in a wide range of fields because of their deep depth of focus, the ability to obtain immersive images, and the ability to use a wide variety of observation samples. .

ところで、走査型邂子顕微鋭の検鏡試料の作成方法は、
被観察物が大きい時には酢酸セルロース膜による一般レ
プリカ法が一般に採用されている。
By the way, the method for preparing a microscopic specimen for the scanning-type Oshi Microscope is as follows.
When the object to be observed is large, a general replica method using a cellulose acetate membrane is generally employed.

しかし、この一段レプリカ伝で得られた検鏡試料は、被
観察物の表面構造の凹凸が反転しているため、被観察物
の表面構造を直感四にかつ立体的にイメージとして把握
することがはなはだ困難である欠点がある。このため、
一段レプリカカ・らさらにレプリカ乞敗る二段レプリカ
法が好ましいことになるが、二段レプリカ法ケ採用する
には一般しプリカ?形成丁石材料に、原試料(#観察物
〕の表面の微妙なかつ微少な凹凸を完壁に転写する定 
  −めの十分な塑性と、二段レプリカ乞取る際に転写
され定凹凸が変形しないための十分な剛性とン兼ね備え
たものを用いる必要がある。この条件ケ満丁材料として
は、初めは液状物であり、のち固化して固体となる重合
性アクリル果樹)I’#Txとがある、しかし、このよ
うな同化性液状吻乞用いるものでは、操作が面倒であり
、まに試料調製に長時間馨要するという欠点がある。
However, in the microscopic specimen obtained with this one-stage replica, the unevenness of the surface structure of the object to be observed is reversed, so it is difficult to grasp the surface structure of the object to be observed intuitively and three-dimensionally. It has the disadvantage of being extremely difficult. For this reason,
The two-stage replica method is preferable, but is it generally necessary to use the two-stage replica method? A method that perfectly transfers the subtle and minute irregularities on the surface of the original sample (#observation object) to the formed stone material.
- It is necessary to use a material that has both sufficient plasticity and sufficient rigidity to prevent the transferred regular irregularities from being deformed when the two-stage replica is obtained. An example of a material that meets these conditions is polymerizable acrylic fruit (I'#Tx), which is initially a liquid and then solidifies into a solid. The disadvantage is that it is cumbersome to operate and requires a long time to prepare the sample.

この発明は上記事情に鑑みてなされ定もので、調製操作
が簡単で、迅速に一般しプリカ乞作成でき、特に原試料
が大型の場合に好適な二段レプリカ法による検鏡試料の
作成方法を提供することを目的とし、一段レプリカの形
成材料に金属インジウムを用いること乞脣徴とするもの
である。
The present invention was made in view of the above circumstances, and provides a method for preparing a microscopic specimen using a two-stage replica method, which is easy to prepare, can be quickly made in general, and is particularly suitable when the original specimen is large. The purpose of the present invention is to provide a single-stage replica using metallic indium as the material for forming the replica.

以下、この発明の詳細な説明する。The present invention will be described in detail below.

ここでは原試料(被観察物]に使用済の回転砥石χ選び
、この原試料から本発明方法および従来方法によって検
鏡試料を作成し、さらに原試料そのものを検鏡試料とし
て走査型電子顕微鏡で検鏡し、得られた顕微鏡写真を比
較することによって本発明方法の有用性を説明する、 まず、本発明方法による検鏡試料の作成手順ケ説明する
Here, a used rotary grindstone χ is selected as the original sample (object to be observed), a microscopic sample is prepared from this original sample by the method of the present invention and the conventional method, and the original sample itself is used as a microscopic sample and is subjected to a scanning electron microscope. The usefulness of the method of the present invention will be explained by examining the specimen and comparing the obtained micrographs. First, the procedure for preparing a specimen using the method of the present invention will be explained.

(11會属インジウム(純度q9,9*)*ハンドプレ
ツサで圧し、1c+T12程度の平滑面音形成する。
(11 indium (purity q9, 9*) *Press with a hand presser to form a smooth surface sound of about 1c+T12.

(21金属インジウムの平滑面に原試料の回転砥石ン載
せ、ハンドプレツサにて押圧し、原試料の表面の凹凸?
金属インジウム表面に転写し、一段レプリカ乞作る。
(Place the original sample on a smooth surface of indium metal 21 with a rotating grindstone, press it with a hand presser, and check the unevenness of the surface of the original sample.
It is transferred onto a metallic indium surface to create a single-stage replica.

(3)一段レプリカの凹凸面に注射器等でアセト772
〜3滴滴下し、ついで適当な人ぎさの酢酸“こセルロー
ス膜(厚みQ 、 93mm )ゲ気泡が入らないよう
に注意して凹凸面に貼りつげろ、(4130分放置して
アセトンが揮散したら匪酸セルロース膜ゲゆつ(つと一
段レプリカの金属インジウム表面から剥がし、二段レプ
リカとする。
(3) Apply acetate 772 to the uneven surface of the single-stage replica using a syringe, etc.
Add ~3 drops of acetic acid, then apply a cellulose membrane (thickness Q, 93 mm) of a suitable amount of acetic acid to the uneven surface, being careful not to introduce any air bubbles. Peel the cellulose sulfate film from the metal indium surface of the one-stage replica to create a two-stage replica.

(51走査型電子顕微鏡用試料台に両面粘着テープ乞貼
り、酢酸セルロースの二段レプリカの凹凸面が土となる
ように固足し、さらに銀ペースト馨二段レプリカの周囲
に塗付する。
(51) Apply double-sided adhesive tape to the sample stage for a scanning electron microscope, and firmly fix the uneven surface of the two-stage replica of cellulose acetate to soil, and then apply silver paste around the two-stage replica.

(6)  イオンスパッタを用い、電圧1zoov、’
g流5〜l QmAで並?4分間二段レプリカの凹凸面
に蒸着する。
(6) Using ion sputtering, voltage 1zoov,'
G style 5~l QmA average? Deposit on the uneven surface of the two-stage replica for 4 minutes.

(7)  走査型電子顕微鏡(明石製作PJr)ン用い
℃試料傾斜角45°加速電圧15KVで検鏡し、顕微鏡
写真を撮影する。
(7) Using a scanning electron microscope (Akashi PJr), examine the sample at a tilt angle of 45 degrees Celsius and an acceleration voltage of 15 KV, and take a micrograph.

また、酢酸セルロースによる一般レプリカの作成手順は
次の通りである。
Further, the procedure for creating a general replica using cellulose acetate is as follows.

(1)  原試料の回転砥石の観察表面にアセトンを2
〜3滴滴下し、酢酸セルロース膜(厚み0.08m m
 ) ’i気泡が入らないようにして貼りつける、(2
)以下前述の本発明方法による手順(4)〜(71によ
って同様に検鏡し、顕微鏡写真を撮影する。
(1) Add acetone to the observation surface of the rotating grindstone of the original sample.
~3 drops were added to the cellulose acetate membrane (thickness 0.08 mm).
) 'i Paste without creating any air bubbles, (2
) Thereafter, a microscope is similarly examined according to steps (4) to (71) according to the method of the present invention described above, and a microscopic photograph is taken.

さらに、原試料そのものの検鏡は、回転砥石?約1cm
  角に切り出し、これ乞そのまま検鏡試料として検鏡
し、写真撮影した。
Furthermore, is the original specimen itself examined using a rotating grindstone? Approximately 1cm
I cut it out into a corner, examined it as a specimen under a microscope, and photographed it.

図面は以上の稙々の方法で作成されたレプリカもしくは
原試料からの検鏡試料の顕微鏡写真である。第1図ない
し第5図は回転砥石原試料の写真で、倍率は第1図が5
0倍、第2図が200倍。
The drawings are micrographs of microscopic specimens from replicas or original specimens prepared by the above-described method. Figures 1 to 5 are photographs of rotating grindstone samples, and the magnification of Figure 1 is 5.
0x, Figure 2 is 200x.

第3図が700倍、第4図が2500倍、第5図が1万
倍である。第6図ないし第10図は本発明方法による二
段レプリカの写真であり、w、11図T、cいし第15
図は金属インジウムの一般レプリカをそのまま検鏡試料
としたものの写真、第16図ないしi@20図は従来の
酢酸セルロース膜ヨる一般レプリカ法によるものの写真
である。第1図ないし第5図の写真から、原試料は細孔
構造を持つレジジ部や砥料、砥粒、コーティング材の残
留する砥粒脱落部からなっていることがわかる。コーテ
イング材に半分近く覆れた矩形状砥粒(工、一部欠落し
ており、砥粒上部に数μmのピットや1μrnオーダの
階段状のステップがある。この原試料の写真に対し、第
6図ないし第10図の本発明の二段レプリカ法による検
鏡試料による写真では、比較的平坦部にあるレジンの細
孔やコーテイング材の形状が失われている部分があり、
全体的に先鋭度に欠けている。しかし、砥粒の待つビッ
トやステップ等の構造は原試料からの写真のものとほぼ
同様に表われており、全体として原試料の凹凸構造を十
分表現している。また、第11図ないし第15図のイン
ジウムの一般レプリカによる写真および第16図ないし
第20図の従来の酢酸セルロースの一般レプリカによる
写真では、表面構造が逆転しているので実像をイメージ
として把握しにくく、特に砥粒のくいこみ部(凹部)は
多くの陰影Yつくり、形状χ不鮮明としている。し力)
シ。
Figure 3 is 700x, Figure 4 is 2500x, and Figure 5 is 10,000x. Figures 6 to 10 are photographs of two-stage replicas made by the method of the present invention;
The figure shows a photograph of a general replica of metallic indium used as a specimen under a microscope, and Figures 16 to 20 are photographs of the conventional replica method using a cellulose acetate membrane. From the photographs in FIGS. 1 to 5, it can be seen that the original sample consists of a registration part with a pore structure and an abrasive drop-off part where abrasive, abrasive grains, and coating material remain. The rectangular abrasive grains (roughly half covered by the coating material) are partially missing, and there are pits of several μm and stair-like steps on the order of 1 μrn at the top of the abrasive grains. In the photographs of microscopic specimens obtained by the two-stage replica method of the present invention shown in Figures 6 to 10, there are parts where the pores of the resin and the shape of the coating material have been lost in relatively flat areas;
It lacks sharpness overall. However, the structure of the bits, steps, etc. where the abrasive grains wait appears almost the same as in the photograph from the original sample, and the uneven structure of the original sample is fully expressed as a whole. Furthermore, in the photographs of general replicas of indium shown in Figures 11 to 15 and the photographs of conventional general replicas of cellulose acetate shown in Figures 16 to 20, the surface structure is reversed, so it is difficult to understand the real image as an image. In particular, the part where the abrasive grains are inserted (recessed part) has many shadows Y and the shape χ is unclear. power)
Sh.

酢酸セルロース一段レプリカによるものでは、全体とし
ての先鋭度が高く、原試料の微細構造をよ(再現してい
ることがわかる。
It can be seen that the one-stage cellulose acetate replica has a high degree of sharpness as a whole and reproduces the fine structure of the original sample.

以上のように、本発明の方法によって得られろ検鏡試料
は原試料の微細構造?、若干の先鋭度の低下はあるもの
のほぼ完全に転写しており、培率20 (l Q〜30
00倍までは十分観察に耐えうろことがわかる。よって
、本発明の方法は、その操作性ケカ1j味−[れは従来
の二段レプリカ法に]分取って代りうるものとなる。
As described above, the microscopic specimen obtained by the method of the present invention has a fine structure similar to that of the original specimen. Although there was a slight decrease in sharpness, the transfer was almost complete, and the culture rate was 20 (l Q~30
It can be seen that it can withstand observation up to 00x magnification. Therefore, the method of the present invention can replace the conventional two-stage replica method due to its operability.

以上説明しムニよ5に、この発明の二段レプリカ法によ
る検鏡試料の作成方法シま、被観察物の覗祭表面に揄属
インジウムY抑圧して一段レプリカを作成し、この一段
レプリカから酢酸セルロースによって二段レプリカを作
成するものであるので、一段レプリカY数分以内&極め
て短時間に作成でき、全体としての調製時間が短縮でき
、かつ操作もい1こって簡単であり、熟練を要しない。
Having explained the above, the method for preparing a speculum specimen using the two-stage replica method of the present invention is to create a one-stage replica by suppressing genus indium Y on the surface of the object to be observed, and from this one-stage replica. Since a two-stage replica is created using cellulose acetate, a single-stage replica can be created within a few minutes and in an extremely short time.The overall preparation time can be shortened, and the operation is simple and requires no skill. do not.

ま1こ、一段レプリカはこれケ長く保存することができ
るとともに心安に応じて自由に二段レプリカ著増ること
もできろ。さらに、被観察物の寸法的制限χ受けること
が少なく、応用範囲が広いなどの利点乞有するものとな
る。
Well, one-tier replicas can be stored for a long time, and you can also freely increase the number of two-tier replicas depending on your peace of mind. Further, it has advantages such as being less subject to dimensional limitations χ of the object to be observed and having a wide range of applications.

【図面の簡単な説明】[Brief explanation of the drawing]

図面はいずれも回転砥石の衣面の微細構造ン示す走査型
4子顕微鏡写真で、第1図ないし第5図は原試料による
もの、第6図ないし第10図は本発明の検鏡試料の作成
方法の検鏡試料によるもの、第11図ないし第15図は
争属インジウムの一段レプリカによるもの、第16図な
いし第20図(工従米の酢酸セルロースによる一段レプ
リカによるものである。 出願人  昭和電工株式会仕
The drawings are all scanning quadruple micrographs showing the fine structure of the coating surface of the rotary grindstone. Figures 1 to 5 are of the original sample, and Figures 6 to 10 are of the microscopic specimen of the present invention. Figures 11 to 15 are based on microscopic specimens of the preparation method, Figures 11 to 15 are one-stage replicas of disputed indium, and Figures 16 to 20 are one-stage replicas of cellulose acetate produced by Kojomai. Applicant: Showa Denko Co., Ltd.

Claims (1)

【特許請求の範囲】[Claims] 被観察物の観察表面に貧属インジウムケ押圧して金属イ
ンジウム表面に上記観察表面の凹凸面馨逆転して転写+
シr、ニ一段しプリカケ作成し、この曾属インジウム一
段レプリカから酢酸セルロースケ用いて二段レプリカケ
作成すること馨特徴とする二段レプリカ法による検鏡試
料の作成方法。
Press a layer of poor metal indium onto the observation surface of the object to be observed, and reversely transfer the uneven surface of the observation surface to the metal indium surface.
A method for preparing a microscopic specimen using a two-stage replica method, which is characterized in that a one-stage replica of indium chloride is prepared, and then a two-stage replica is created from this one-stage replica using cellulose acetate.
JP19050382A 1982-10-29 1982-10-29 Fabrication of specimen to be microscopically examined by two-stage replica method Pending JPS5979832A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19050382A JPS5979832A (en) 1982-10-29 1982-10-29 Fabrication of specimen to be microscopically examined by two-stage replica method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19050382A JPS5979832A (en) 1982-10-29 1982-10-29 Fabrication of specimen to be microscopically examined by two-stage replica method

Publications (1)

Publication Number Publication Date
JPS5979832A true JPS5979832A (en) 1984-05-09

Family

ID=16259169

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19050382A Pending JPS5979832A (en) 1982-10-29 1982-10-29 Fabrication of specimen to be microscopically examined by two-stage replica method

Country Status (1)

Country Link
JP (1) JPS5979832A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6135529A (en) * 1984-07-27 1986-02-20 Hitachi Ltd Method for measuring miniaturized groove
EP0690301A1 (en) * 1994-06-30 1996-01-03 Societe Nationale D'etude Et De Construction De Moteurs D'aviation "Snecma" Method for non-destructive characterisation of the state of a workpiece surface
US7481098B2 (en) * 2007-06-18 2009-01-27 United Technologies Corporation Method of determining depth of intergranular attack (IGA) for a metal part
US7900497B2 (en) 2007-12-04 2011-03-08 Hitachi Global Storage Technologies Netherlands B.V. System, method and apparatus for obtaining true roughness of granular media

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6135529A (en) * 1984-07-27 1986-02-20 Hitachi Ltd Method for measuring miniaturized groove
EP0690301A1 (en) * 1994-06-30 1996-01-03 Societe Nationale D'etude Et De Construction De Moteurs D'aviation "Snecma" Method for non-destructive characterisation of the state of a workpiece surface
FR2722001A1 (en) * 1994-06-30 1996-01-05 Snecma PROCESS FOR THE NON-DESTRUCTIVE CHARACTERIZATION OF THE SURFACE CONDITION OF A PART
US5610326A (en) * 1994-06-30 1997-03-11 Societe Nationale D'etude Et De Construction De Moteurs D'aviation "Snecma" Non-destructive process for characterizing the surface condition of a part
US7481098B2 (en) * 2007-06-18 2009-01-27 United Technologies Corporation Method of determining depth of intergranular attack (IGA) for a metal part
US7603890B2 (en) * 2007-06-18 2009-10-20 United Technologies Corporation Method of inspecting a metal alloy part for incipient melting
US7900497B2 (en) 2007-12-04 2011-03-08 Hitachi Global Storage Technologies Netherlands B.V. System, method and apparatus for obtaining true roughness of granular media

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