JPS5969476U - Photoelectron spectrometer - Google Patents
Photoelectron spectrometerInfo
- Publication number
- JPS5969476U JPS5969476U JP16597082U JP16597082U JPS5969476U JP S5969476 U JPS5969476 U JP S5969476U JP 16597082 U JP16597082 U JP 16597082U JP 16597082 U JP16597082 U JP 16597082U JP S5969476 U JPS5969476 U JP S5969476U
- Authority
- JP
- Japan
- Prior art keywords
- electric field
- filter
- bypass
- low
- pass filter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Landscapes
- Analysing Materials By The Use Of Radiation (AREA)
- Electron Tubes For Measurement (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
一面は本考案の実施例を示し、第1図は本考案 〜
の光電子分光分析装置のフィルタ式アナライザの概略を
示す断面図、第2図はバックグラウンドを有する光電子
スペクトルの線図、第3図はバイパススペクトルの線図
、第4図は第2図の光電子スペクトルからバラクグラウ
ンドを消去して得られた光電子スペクトルの線図である
。
1・・・試料、2・・・軟X′線、3・・・光電子、4
・・・フィルタ式アナライザ、5・・・減速電場、7・
・・ローパスフィルタ、8・・・バイパスフィルタ、9
・・・検出器、S、・・・光電子スペクトル、$2…バ
イパススペクトル、B・・・バックグラウンド。
1 ゛第3図
第4図One side shows an embodiment of the present invention, and Fig. 1 shows the embodiment of the present invention.
Figure 2 is a diagram of the photoelectron spectrum with background, Figure 3 is the diagram of the bypass spectrum, and Figure 4 is the photoelectron spectrum of Figure 2. FIG. 2 is a diagram of a photoelectron spectrum obtained by removing the background noise from the . 1... Sample, 2... Soft X' ray, 3... Photoelectron, 4
...filter type analyzer, 5...deceleration electric field, 7.
...Low pass filter, 8...Bypass filter, 9
...Detector, S, ...Photoelectron spectrum, $2...Bypass spectrum, B...Background. 1 ゛Figure 3Figure 4
Claims (1)
ライザのローパスフィルタの電位を、試料に照射される
軟X線のエネルギよりも高く設定するとともに、減速電
場とノ椅パスフィルタとを同電位とすることにより減速
電場を通過した光電子が全て検出器に導かれるようにし
、減速電場とバイパスフィルタとを同電位に保ちつつ走
査することでバイパススペクトルを求め、次いでローパ
スフィルタとバイパスフィルタの電位を通常の分析電位
に設定して減速電場のみを走査することにより光電子ス
ペクトルを求め、前記ノ1イパススペクトルの曲線を光
電子ス外りトルのバッククラランドレベルに補正し、光
電子スペクトルから補正されたバイパススペクトルを減
算することにより光電子スペクトルのバックグラウンド
を消去するようにしたことを特徴とする光電子分光分析
装置。A non-dispersive filter-type analyzer is applied, and the potential of the low-pass filter of the stiff-type analyzer is set higher than the energy of the soft X-rays irradiated to the sample, and the deceleration electric field and the low-pass filter are set to the same potential. By doing this, all the photoelectrons that have passed through the deceleration electric field are guided to the detector, and the bypass spectrum is obtained by scanning while keeping the deceleration electric field and the bypass filter at the same potential, and then the potentials of the low-pass filter and the bypass filter are set to the normal A photoelectron spectrum is obtained by scanning only the decelerating electric field with the analysis potential set to A photoelectron spectrometer characterized in that the background of a photoelectron spectrum is erased by subtracting .
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16597082U JPS5969476U (en) | 1982-10-31 | 1982-10-31 | Photoelectron spectrometer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP16597082U JPS5969476U (en) | 1982-10-31 | 1982-10-31 | Photoelectron spectrometer |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS5969476U true JPS5969476U (en) | 1984-05-11 |
Family
ID=30363471
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP16597082U Pending JPS5969476U (en) | 1982-10-31 | 1982-10-31 | Photoelectron spectrometer |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5969476U (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012533855A (en) * | 2009-07-17 | 2012-12-27 | ケーエルエー−テンカー・コーポレーション | Charged particle energy analyzer |
-
1982
- 1982-10-31 JP JP16597082U patent/JPS5969476U/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012533855A (en) * | 2009-07-17 | 2012-12-27 | ケーエルエー−テンカー・コーポレーション | Charged particle energy analyzer |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP1231485A3 (en) | X ray detector with a wide dynamic range | |
JPS5969476U (en) | Photoelectron spectrometer | |
JPS58174856U (en) | electronic microscope | |
JPS60214288A (en) | Scintillation camera | |
JPS54154294A (en) | Computer tomography device | |
Cottrell | Dormancy effects on nonelectronics(equipment reliability models for stored components) | |
JPS608867U (en) | Fluorescent X-ray analyzer | |
JPS58116649U (en) | macro analyzer device | |
JPS6049455U (en) | X-ray analyzer | |
JPH02118254U (en) | ||
JPS5810075U (en) | Pulse height discrimination circuit for X-ray analyzer | |
JPS5857065U (en) | surface analysis device | |
JPS637350U (en) | ||
JPS5854576U (en) | X-ray detector | |
JPS5941856U (en) | Sample surface etching device for analysis equipment, etc. | |
Gardner | PROTON CAPTURE GAMMA RAYS FROM Si $ sup 28$ IN THE REGION OF THE PHOTONUCLEAR GIANT RESONANCE (thesis) | |
JPS6114392U (en) | Scattered radiation removal device for nuclear medicine imaging equipment | |
JPS58136758U (en) | Infrared radiation gas analyzer | |
JPS58157958U (en) | electron spectrometer | |
JPS59179361U (en) | X-ray analyzer | |
JPS603458U (en) | Fluorescent X-ray intensity measurement system holder for EXAFS measurement | |
JPS58184762U (en) | multi-channel analyzer | |
JPS6372553U (en) | ||
JPS5871157U (en) | Fluorescent X-ray device | |
DE19950919A1 (en) | Evaluation unit for detector system has at least one distributor that transmits signals from detectors to selected signal processor |