JPS5954951A - 赤外線ガス分析計 - Google Patents

赤外線ガス分析計

Info

Publication number
JPS5954951A
JPS5954951A JP57165595A JP16559582A JPS5954951A JP S5954951 A JPS5954951 A JP S5954951A JP 57165595 A JP57165595 A JP 57165595A JP 16559582 A JP16559582 A JP 16559582A JP S5954951 A JPS5954951 A JP S5954951A
Authority
JP
Japan
Prior art keywords
gas
cell
concentration
infrared
optical axis
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57165595A
Other languages
English (en)
Japanese (ja)
Other versions
JPH023459B2 (enrdf_load_html_response
Inventor
Tsutomu Gotou
後藤　▲つとむ▼
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Azbil Corp
Original Assignee
Azbil Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Azbil Corp filed Critical Azbil Corp
Priority to JP57165595A priority Critical patent/JPS5954951A/ja
Publication of JPS5954951A publication Critical patent/JPS5954951A/ja
Publication of JPH023459B2 publication Critical patent/JPH023459B2/ja
Granted legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/31—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry
    • G01N21/35—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light
    • G01N21/3504—Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry using infrared light for analysing gases, e.g. multi-gas analysis

Landscapes

  • Physics & Mathematics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP57165595A 1982-09-22 1982-09-22 赤外線ガス分析計 Granted JPS5954951A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57165595A JPS5954951A (ja) 1982-09-22 1982-09-22 赤外線ガス分析計

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57165595A JPS5954951A (ja) 1982-09-22 1982-09-22 赤外線ガス分析計

Publications (2)

Publication Number Publication Date
JPS5954951A true JPS5954951A (ja) 1984-03-29
JPH023459B2 JPH023459B2 (enrdf_load_html_response) 1990-01-23

Family

ID=15815331

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57165595A Granted JPS5954951A (ja) 1982-09-22 1982-09-22 赤外線ガス分析計

Country Status (1)

Country Link
JP (1) JPS5954951A (enrdf_load_html_response)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010019780A (ja) * 2008-07-14 2010-01-28 Fuji Electric Systems Co Ltd レーザ式ガス分析計
JP2010032422A (ja) * 2008-07-30 2010-02-12 Fuji Electric Systems Co Ltd レーザ式ガス分析計、酸素ガス濃度測定方法

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0554472U (ja) * 1991-12-26 1993-07-20 古河機械金属株式会社 コイルチューブの巻付け装置
JP2009014661A (ja) * 2007-07-09 2009-01-22 Fuji Electric Systems Co Ltd ガス濃度計測装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2010019780A (ja) * 2008-07-14 2010-01-28 Fuji Electric Systems Co Ltd レーザ式ガス分析計
JP2010032422A (ja) * 2008-07-30 2010-02-12 Fuji Electric Systems Co Ltd レーザ式ガス分析計、酸素ガス濃度測定方法

Also Published As

Publication number Publication date
JPH023459B2 (enrdf_load_html_response) 1990-01-23

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