JPS5950322A - Diagnosis system for abnormality - Google Patents
Diagnosis system for abnormalityInfo
- Publication number
- JPS5950322A JPS5950322A JP57160372A JP16037282A JPS5950322A JP S5950322 A JPS5950322 A JP S5950322A JP 57160372 A JP57160372 A JP 57160372A JP 16037282 A JP16037282 A JP 16037282A JP S5950322 A JPS5950322 A JP S5950322A
- Authority
- JP
- Japan
- Prior art keywords
- instrument
- signal
- scanning
- thermogram
- abnormality
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005856 abnormality Effects 0.000 title claims abstract description 15
- 238000003745 diagnosis Methods 0.000 title claims abstract description 12
- 238000001757 thermogravimetry curve Methods 0.000 claims abstract description 15
- 238000010438 heat treatment Methods 0.000 claims abstract description 5
- 238000000034 method Methods 0.000 claims description 7
- 239000003550 marker Substances 0.000 abstract description 7
- 230000020169 heat generation Effects 0.000 abstract description 4
- 239000000758 substrate Substances 0.000 abstract description 2
- 238000003491 array Methods 0.000 abstract 1
- 230000002159 abnormal effect Effects 0.000 description 5
- 230000006866 deterioration Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 230000015556 catabolic process Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000011835 investigation Methods 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J5/00—Radiation pyrometry, e.g. infrared or optical thermometry
- G01J5/48—Thermography; Techniques using wholly visual means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Testing Of Devices, Machine Parts, Or Other Structures Thereof (AREA)
- Radiation Pyrometers (AREA)
Abstract
Description
【発明の詳細な説明】
この発明は、例えばＨし器を構成する電子部品の異常状
態を発熱の有無によって診断する異常診断方式に関する
。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an abnormality diagnosis method for diagnosing an abnormal state of an electronic component constituting, for example, an H-detector based on the presence or absence of heat generation.
現在、原子カシラントの社会的に置かれた環境では、故
障や事故により一旦プラントが停止すると原因調査や再
発防止対策などの処理ン完了させなければ再起動できな
い情勢にあり、これを避けるためにプラントを制御する
計器類の潜在的故障ビ早期に発見し、処理することによ
り、顕在化故障乞未然に防止する必要がある。Currently, in the social environment of atomic cashlicants, once a plant has stopped due to a breakdown or accident, it cannot be restarted unless the investigation of the cause and measures to prevent recurrence have been completed. It is necessary to prevent potential failures from occurring in the instruments that control them by early detection and treatment.
上記制御用の計器はほとんど電子部品で構成されており
、この計器の点検には計器に対して計測用の基準信号ン
供給し、このときの計器出力が正常値となるように調整
して行なわれる。Most of the control instruments mentioned above are made up of electronic components, and when inspecting these instruments, it is necessary to supply a reference signal for measurement to the instruments and adjust the instrument output at this time to a normal value. It will be done.
しかし、このような方法では各部品の劣化状態を把握で
きず、潜在的故障を発見することは不可能である。また
、各計器の部品一点毎に電気的に点検することは、その
部品数が膨大であり、また複雑な配保路を着脱しなけれ
ばならないため、極めて困難である。However, with this method, it is not possible to grasp the deterioration state of each component, and it is impossible to discover potential failures. Further, it is extremely difficult to electrically inspect each component of each meter because the number of components is enormous and complicated distribution routes must be used to attach and detach them.
この発明は上記欠点全改善し、計器ン構成する各電子部
品の劣化状態ビ診１１ｒＬ、潜在的故障を早期に発見す
ることのでさる異常診断方式を提供１−ることＺ目的と
する。It is an object of the present invention to overcome all of the above-mentioned drawbacks and to provide an abnormality diagnosis method that can inspect the deterioration state of each electronic component constituting an instrument and detect latent failures at an early stage.
すなわち、この発明における異常診断方式は平面状に広
がった対象物から放射される赤外線ンスキャニングしな
がら平面状のサーモグラムを得るに際し、スキャニング
の始点に列状の発熱体ン配設しその像をもって基準点と
し、通常時に得られる対象物のサーモグラムＺアナログ
処理して記憶し、別途得られるサーモグラムのアナログ
処理値と比較し、対象物各部の発熱異常の有無を診断す
るようにしたものである。That is, the abnormality diagnosis method in this invention obtains a planar thermogram while scanning infrared rays emitted from a planar spread object. As a reference point, the thermogram Z of the object obtained under normal conditions is processed and stored in analog form, and compared with the analog processed values of the thermogram obtained separately to diagnose the presence or absence of abnormal heat generation in each part of the object. be.
以下、図面についてこの発明の一実施例を説明する５、
第１図はその構成２示１−もので、被診断計器１ノの電
子部品χ取り付けた平面状の基板１２じ発熱基線とする
スキャニング同期マーカ１３を配設する。このスキャニ
ング同期マーカ１３は診断部分の端に配設される列状の
発熱体で、この発熱体の発する赤外線ンサー七グラム（
サーモ像）パターン信号の基点とするものである。Hereinafter, one embodiment of the present invention will be explained with reference to the drawings.5.
FIG. 1 shows the configuration 2, in which a scanning synchronization marker 13 is provided as a heat generation baseline on a flat substrate 12 to which an electronic component χ of an instrument to be diagnosed 1 is attached. This scanning synchronization marker 13 is a row-shaped heating element disposed at the end of the diagnostic section, and the infrared radiation sensor emitted by this heating element is 7 grams (
(thermographic image) is used as the base point of the pattern signal.
このスキャニング同期マーカ１３ン配設した基板１２部
は赤外線カメラ１４で撮影する。この赤外線カメラ１４
は基板１２の各電子部品から発生する熱に対応する赤外
線を、ミラーでスキャニングしながら赤外線センサで受
光検出するもので、診断部分の発熱部品の絶対温度に比
例した放射エネルギーである赤外線を検出し、これ乞ア
ナログ信号に変換して出力する。そし−モグラム・ぞタ
ーン信号として比較演算装置１６に供給するとともに、
信号切替器１７の選択に対応してビデオレコーダ１８お
よびディスプレイ装置１９に供給とする。The part of the board 12 on which the scanning synchronization marker 13 is arranged is photographed by an infrared camera 14. This infrared camera 14
The infrared sensor receives and detects infrared rays corresponding to heat generated from each electronic component of the board 12 while scanning with a mirror, and detects infrared rays that are radiant energy proportional to the absolute temperature of the heat generating components of the diagnostic part. , which is then converted to an analog signal and output. In addition to supplying it to the comparison calculation device 16 as a turn signal,
The signal is supplied to the video recorder 18 and the display device 19 in accordance with the selection of the signal switch 17.
上記比較演算装置１６には、予め各診断計器の通常時に
おけるサーモグラム標準パターン信号が記憶され°Ｃい
る記憶装置２０から、被診断計器１１の型式に合致する
標準・母ターン信号乞供給する。この標準・ぐターン信
号は比較演算装置１６において赤外線カメラ１４からの
破除［ｒ計器１１のサーモグラム・やターン信号と比較
演算するもので、破除…■計器１１の異常の有無！診断
する。丁なわち、標準・ぐターン信号に対し被診断計器
１）の・母ターン信号のうち定めた範囲外にある部分ン
異常部分と判断し、その診断結果を記録装置２ノに記録
させると共に信号切替器１７を介してビデオレコーダ１
８或いはディスグレイ装置１９に供給し、収録・表示さ
せるようにしている。The comparison calculation device 16 is supplied with a standard/main turn signal matching the model of the instrument 11 to be diagnosed from a storage device 20 in which thermogram standard pattern signals for each diagnostic instrument under normal conditions are stored in advance. This standard turn signal is compared with the thermogram of the infrared camera 14 and the turn signal from the infrared camera 14 to determine whether there is an abnormality in the instrument 11 or not. Diagnose. In other words, the part of the main turn signal of the instrument to be diagnosed 1) that is outside the specified range with respect to the standard turn signal is determined to be an abnormal part, and the diagnosis result is recorded in the recording device 2 and the signal is Video recorder 1 via switch 17
8 or a display gray device 19 for recording and display.
このビデオレコーダ１８は赤外線カメラ１４で捕えた破
除…「計器１１のサーモグラム収録及び比較演算装置１
６の診断結果ン収録するための装置であり、またディス
プレイ装置１９は被診断計器１１のサーモグラムのＬｔ
＋Ｉ向表示及び比較演算結果１６の診断結果をｉ［！１
１面表示させるための装置である。上記ビデオレコーダ
１６の再生信号は信号切替器１７によってディスプレイ
装置１９或いはＡ／Ｔ）変換器１５を介して比較演算装
置１６へ供給可能とされる。This video recorder 18 captures the damage captured by the infrared camera 14.
6, and the display device 19 is a device for recording the diagnostic results of the instrument 11 to be diagnosed.
+I direction display and comparison calculation result 16 diagnosis result i[! 1
This is a device for displaying on one screen. The reproduced signal from the video recorder 16 can be supplied to the comparator 16 via the display device 19 or the A/T converter 15 by the signal switch 17.
すなわち、上−記装置を用いて被診断計器１ノを診断す
るには、まず赤外線カメラ１４を動作状態にある被診断
計器１１の基板１２に対応して設置し、基板１２上の各
電子部品から放射される赤外線をスキャニングして赤外
線センサで受光し被診断計器１１のサーモグラムパター
ン信号ン得る。そしてこの・母ターン伯′号ｔ゛比較ｉ
ａ算装ｆｌｘ６（＝入力し、記１．は装置２θからのサ
ーモグラム標準パターン信号と比較する。That is, in order to diagnose the instrument to be diagnosed 1 using the above-mentioned device, first, the infrared camera 14 is installed corresponding to the board 12 of the instrument to be diagnosed 11 in the operating state, and each electronic component on the board 12 is installed. The infrared rays emitted from the infrared rays are scanned and received by an infrared sensor to obtain a thermogram pattern signal of the instrument 11 to be diagnosed. And this mother turn number t゛ comparison i
a calculation system flx6 (= input, and note 1. is compared with the thermogram standard pattern signal from the device 2θ.
第２図はその一例乞示すものでＡ図はイ票準パターン信
号、Ｂ図は被診断計器１）の・やターン信号を示してい
る。両信号の左側の棒状信号がスキャニング同期マーカ
１３（二よる基点信号であり、この尽点信号で同期を合
わせ両信号を比較すると、右から３番目の位置に対応す
る電）部品が異常であることがわかる。Fig. 2 shows an example of this, in which Fig. A shows a semi-pattern signal, and Fig. B shows a turn signal of the instrument to be diagnosed 1). The bar-shaped signal on the left side of both signals is the scanning synchronization marker 13 (it is a base point signal based on two points, and if you synchronize with this end point signal and compare both signals, the electric wire corresponding to the third position from the right) is abnormal. I understand that.
この比較演算結果はゾリンタ等の記録装置２１に記録さ
れると共に、ビデオレコーダ１８に収録され、アイスプ
レイ装置１９に画面表示される。The results of this comparison calculation are recorded in a recording device 21 such as Zolinta, recorded in a video recorder 18, and displayed on the screen of an ice play device 19.
したがって、破除断計Ｂｚｘの基板１２にスキャニング
同１す」マーカ１３乞配設し、赤外線カメラ１４で走査
検知することにより、走査毎に一定位置（二基点信号が
得られ、これにまり比敗演算時の同期合わせが容昌とな
る。そして同１ｉｊ１合わせン行なった標準）やターン
信号と被診断計器１ノの・やターン信号と７比較すれば
どの電子部品が異常であるかを判別することかできる。Therefore, by disposing a scanning marker 13 on the board 12 of the fracture breakage meter Bzx and scanning and detecting it with an infrared camera 14, a fixed position (two base point signals) can be obtained for each scan. Synchronization at the time of calculation is correct.Then, by comparing the same standard (standard) and turn signal with the turn signal of the instrument to be diagnosed, it is possible to determine which electronic component is abnormal. I can do it.
以」二のようにこの発明によれば、異常診断方式ン平面
状に広がった対象物から放射される赤外線ンスキャニン
グしながら平面状のサーモグラムを得るに際し、ソキャ
ニングの始点に列状の発熱体を配設しその像！もって基
準点とし、ｉｌ！１常時に得られる対象物のサーモグラ
ムのアナ整
ログ処理値と比較し、対象物各部の発貴異常の有フ１１
（を診断するようにしたことにより、従来至難とされて
いた計器内の電子部品の潜在故障や劣化が検知できるの
で、計器の異常早期発見が可能となる。これにより、計
器整備点検作業の能率向上、コスト低減が可能となり、
計測制御袋数の信頼性の向上、プラント設備などの稼動
率回上等を望むことができるようになる。As described above, according to the present invention, when obtaining a flat thermogram while scanning infrared rays emitted from a flat object in an abnormality diagnosis method, a row of heating elements is placed at the starting point of scanning. Place the statue! Use it as a reference point, and use it as a reference point! 1. Compare with the analog processed values of the thermogram of the object that is constantly obtained, and check whether there is any abnormality in the emission of each part of the object.11
(By diagnosing this, it is possible to detect latent failures and deterioration of electronic components inside instruments, which were previously considered to be extremely difficult. This makes it possible to detect instrument abnormalities early. This improves the efficiency of instrument maintenance and inspection work. It is possible to improve and reduce costs.
It will be possible to improve the reliability of the number of bags measured and controlled, and to increase the operating rate of plant equipment.
この異常診断方式は平面的に勧測可能な形状で、且つ劣
化、故障等で部品の鈍熱が変化するものであれば応用可
能である。This abnormality diagnosis method can be applied to any part that has a shape that can be measured on a plane and where the sluggish heat of the part changes due to deterioration, failure, etc.
第、１図はこの発明の一実施例に係る異常診断装置の構
成を示す図、第２図は上記装置２用いて標準・やターン
信号（Δ）と被診断装置の・やターン信号（均と乞比較
した例Ｚ示す図である。
１１・・・被診断Ｂ１器、１２・・・基板、１３・・・
スキャニング同期マーカ、１４・・・赤外線カメラ、１
５・・・Ａ／Ｄ変換器、１６・・・比較演算装置、）７
・・・信号切替器、１８・・・ビデオレコーダ、１９・
・・ディスプレイ装置、２０・・・記憶装置、２ノ・・
・記録装置。1 is a diagram showing the configuration of an abnormality diagnosis device according to an embodiment of the present invention, and FIG. 2 is a diagram showing the configuration of an abnormality diagnosis device according to an embodiment of the present invention, and FIG. It is a diagram showing Example Z for comparison with 11... B1 device to be diagnosed, 12... Board, 13...
Scanning synchronization marker, 14...Infrared camera, 1
5...A/D converter, 16...Comparison calculation device,)7
... signal switcher, 18... video recorder, 19.
...Display device, 20...Storage device, 2no...
・Recording device.
Claims (1)
ニングしながら平面状のサーモグラム乞得るに際し、ス
キャニングの始点に列状の発熱体を配設しその像をもっ
て基準点とし、通常時に得られる対象物のサーモグラム
をアナログ処理して記憶し、別途得られるサーモグラム
のアナログ処理値と比較し、対象物各部の発熱異常の有
無乞診断するようにした異常診断方式。When obtaining a planar thermogram by scanning infrared rays emitted from a symmetrical object spread out in a planar shape, a row of heating elements is placed at the starting point of scanning, and its image is used as a reference point, and the object obtained under normal conditions is An abnormality diagnosis method in which the thermogram of an object is processed and stored in analog form, and compared with the analog processed values of the separately obtained thermogram to diagnose the presence or absence of heat abnormality in each part of the object.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57160372A JPS5950322A (en) | 1982-09-14 | 1982-09-14 | Diagnosis system for abnormality |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP57160372A JPS5950322A (en) | 1982-09-14 | 1982-09-14 | Diagnosis system for abnormality |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPS5950322A true JPS5950322A (en) | 1984-03-23 |
Family
ID=15713539
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP57160372A Pending JPS5950322A (en) | 1982-09-14 | 1982-09-14 | Diagnosis system for abnormality |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5950322A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6284724U (en) * | 1985-11-16 | 1987-05-29 | ||
| JPS62115638U (en) * | 1986-01-13 | 1987-07-23 | ||
| JPH02150730A (en) * | 1988-11-30 | 1990-06-11 | Wakomu:Kk | Heating temperature measuring method, method and device for heat treatment |
| JPH02234085A (en) * | 1989-03-08 | 1990-09-17 | Mitsubishi Electric Corp | Semiconductor device |
-
1982
- 1982-09-14 JP JP57160372A patent/JPS5950322A/en active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6284724U (en) * | 1985-11-16 | 1987-05-29 | ||
| JPS62115638U (en) * | 1986-01-13 | 1987-07-23 | ||
| JPH02150730A (en) * | 1988-11-30 | 1990-06-11 | Wakomu:Kk | Heating temperature measuring method, method and device for heat treatment |
| JPH02234085A (en) * | 1989-03-08 | 1990-09-17 | Mitsubishi Electric Corp | Semiconductor device |
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