JPS5949971U - Semiconductor element failure detection device - Google Patents
Semiconductor element failure detection deviceInfo
- Publication number
- JPS5949971U JPS5949971U JP14564382U JP14564382U JPS5949971U JP S5949971 U JPS5949971 U JP S5949971U JP 14564382 U JP14564382 U JP 14564382U JP 14564382 U JP14564382 U JP 14564382U JP S5949971 U JPS5949971 U JP S5949971U
- Authority
- JP
- Japan
- Prior art keywords
- detection device
- failure detection
- semiconductor element
- element failure
- detector
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Ac-Ac Conversion (AREA)
Abstract
(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.
Description
第１図は従来の半導体整流回路における半導体素子の故
障検出装置を示す回路図、第２図は第１図に示す半導体
素子の故障を検出する検出器の正常状態時の動作説明図
、第３図は第１図に示す半導体素子の故障を検出する検
出器の故障時の動作説明図、第４図は従来の同相逆極性
結線方式の半導体整流回路における半導体素子の故障検
出装置を示す回路図、第５図は第４図に示す同相に設け
た半導体素子の故障を検出する検出器の正常状態の動作
説明図、第６図は第４図に示す同相に設けた半導体素子
の故障を検出する検出器の異常状態の動作説明図、第７
図は第４図に示す同相に設けた半導体素子の故障を検出
する検出器のさらに別の異常状態の動作説明図、第８図
は本考案に係る半導体素子故障検出装置の一実施例を示
す同相逆極性結線方式の半導体整流回路、第９図は第８
図に示す検出器の正常状態の動作説明図、第１０図は第
８図に示す検出器の誤動作防止状態の動作説明図、第１
１図は第８図に示す検出器のさらに別の正常状態の動作
説明図である。
１０・・・整流素子、１２・・・ヒユーズ、１４・・・
変圧器巻線、１６・・・中間リアクトル、１８・・・検
出器、２０・・・導体。FIG. 1 is a circuit diagram showing a failure detection device for a semiconductor element in a conventional semiconductor rectifier circuit, FIG. 2 is an explanatory diagram of the operation of the detector shown in FIG. The figure is an explanatory diagram of the operation of the detector for detecting a failure in a semiconductor element shown in Figure 1 at the time of failure, and Figure 4 is a circuit diagram showing a failure detection device for a semiconductor element in a conventional semiconductor rectifier circuit using the in-phase and opposite polarity connection method. , FIG. 5 is an explanatory diagram of the normal operation of the detector for detecting a failure in the semiconductor elements installed in the same phase as shown in FIG. 4, and FIG. Explanatory diagram of the operation of the detector in an abnormal state, No. 7
The figure is an explanatory diagram of another abnormal state of the operation of the detector for detecting a failure of a semiconductor element provided in the same phase as shown in FIG. 4, and FIG. 8 shows an embodiment of the semiconductor element failure detection device according to the present invention. Semiconductor rectifier circuit with in-phase reverse polarity connection method, Figure 9 shows 8
FIG. 10 is an explanatory diagram of the operation of the detector in the normal state shown in FIG.
FIG. 1 is an explanatory diagram of the operation of the detector shown in FIG. 8 in yet another normal state. 10... Rectifying element, 12... Fuse, 14...
Transformer winding, 16... intermediate reactor, 18... detector, 20... conductor.
Claims (3)
おいて、同相逆極性の半導体素子が接続される半導体間
にホールスイッチを使用した検出器をそれぞれ設けるこ
とを特徴とする半導体素子故障検出装置。(1) A semiconductor element failure detection device characterized in that, in a rectifier circuit in which semiconductor elements are connected with the same phase and opposite polarity, a detector using a Hall switch is provided between the semiconductors to which the semiconductor elements of the same phase and opposite polarity are connected. .
故障検出装置において、検出器は導体に流れる電流によ
って発生する所定方向の磁束によって作動するよう構成
してなる半導体素子故障検出装置。(2) Utility Model Registration Scope of Claim 1. The semiconductor device failure detection device according to claim 1, wherein the detector is configured to be activated by magnetic flux in a predetermined direction generated by a current flowing through a conductor.
の半導体素子故障検出装置において、検出器は、近接配
置された同相逆極性の半導体素子が接続される導体の中
間に設けてなる半導体素子故障検出装置。(3) Utility Model Registration Scope of Claims In the semiconductor element failure detection device according to claim 1 or 2, the detector is provided between conductors to which semiconductor elements of the same phase and opposite polarity are connected, which are arranged in close proximity. Semiconductor element failure detection device.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14564382U JPS5949971U (en) | 1982-09-28 | 1982-09-28 | Semiconductor element failure detection device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14564382U JPS5949971U (en) | 1982-09-28 | 1982-09-28 | Semiconductor element failure detection device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5949971U true JPS5949971U (en) | 1984-04-03 |
| JPH0323582Y2 JPH0323582Y2 (en) | 1991-05-22 |
Family
ID=30324426
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14564382U Granted JPS5949971U (en) | 1982-09-28 | 1982-09-28 | Semiconductor element failure detection device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5949971U (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56155824A (en) * | 1980-04-10 | 1981-12-02 | Bosch Gmbh Robert | Mechanical/electrical pressure converter |
| JPS57139672A (en) * | 1981-02-23 | 1982-08-28 | Sumitomo Electric Ind Ltd | Detecting structure for leakage current |
-
1982
- 1982-09-28 JP JP14564382U patent/JPS5949971U/en active Granted
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56155824A (en) * | 1980-04-10 | 1981-12-02 | Bosch Gmbh Robert | Mechanical/electrical pressure converter |
| JPS57139672A (en) * | 1981-02-23 | 1982-08-28 | Sumitomo Electric Ind Ltd | Detecting structure for leakage current |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0323582Y2 (en) | 1991-05-22 |
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