JPS5946845A - Method for measuring polarization and dielectric breakdown of material - Google Patents
Method for measuring polarization and dielectric breakdown of materialInfo
- Publication number
- JPS5946845A JPS5946845A JP15853382A JP15853382A JPS5946845A JP S5946845 A JPS5946845 A JP S5946845A JP 15853382 A JP15853382 A JP 15853382A JP 15853382 A JP15853382 A JP 15853382A JP S5946845 A JPS5946845 A JP S5946845A
- Authority
- JP
- Japan
- Prior art keywords
- voltage
- sample
- electrodes
- current
- phenomenon
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
Abstract
Description
【発明の詳細な説明】
本発明は物質の分極性及び絶縁破壊性の測定方法に関す
るものである。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to a method for measuring polarizability and dielectric breakdown properties of substances.
一対の電極の間に固体試料を接触させ、この両電極間に
測定回路を介して直流電圧を印加すると、試料を通して
測定回路に電流が流れる。このようにして測定回路に流
れる電流は、定常状態において流れる定常電流と、′電
圧を印加してから定常状態に達する間に流れる過渡電流
とから成立っている。When a solid sample is brought into contact between a pair of electrodes and a DC voltage is applied between the two electrodes via a measurement circuit, a current flows through the sample and into the measurement circuit. The current that flows through the measurement circuit in this way consists of a steady current that flows in a steady state and a transient current that flows between when the voltage is applied and when the steady state is reached.
過渡電流は、通電により物ｔｑ構造が誘電現象によって
分極を受ける現象と、電圧の印加による物質破壊に伴う
現象とによるエネルギー吸収によって生起される。従っ
て、この定常電流の方向とは反対の方向に流れる電流を
測定１−ることによって、過渡現象に用いられたエネル
ギー、即ち、物質の分極性及び物質の絶縁破壊性を四側
することができる。The transient current is caused by energy absorption due to a phenomenon in which the material tq structure undergoes polarization due to a dielectric phenomenon when current is applied, and a phenomenon accompanying material destruction due to the application of voltage. Therefore, by measuring the current flowing in the opposite direction to the steady current, it is possible to estimate the energy used in the transient phenomenon, that is, the polarizability of the material and the dielectric breakdown property of the material. .
本発明は、このような観点によりなされたもので、２つ
の電極間に試料を接触させると共に、該電極間にはロー
１抵抗を介して直流定電１１二を印加し、それによって
試料及びロード抵抗に的流電流を流すと共に、該ロー１
２抵抗の両端に電圧を発生させ、この電圧を微分処理し
、得られた微分値を試料の分極性及び絶縁破壊性の関数
として測定し、次いでその測定終了後、該直流定電圧の
印加を停止させると共に、両電極間をロード抵抗を介し
て短絡させ、その際に流れる電流によりロード抵抗の両
端に電圧を発生させ、この電圧を微分処理し、得られた
微分値を試料の分極性として測定することを特徴とする
物質の分極性及び絶縁破壊性の測定方法を提供するもの
である。The present invention was made from this point of view, in which a sample is brought into contact between two electrodes, and a constant DC current 112 is applied between the electrodes via a low 1 resistor, whereby the sample and the load are brought into contact with each other. While passing a target current through the resistor, the low 1
A voltage is generated across two resistors, this voltage is differentiated, the obtained differential value is measured as a function of the polarizability and dielectric breakdown property of the sample, and then, after the measurement is completed, the application of the constant DC voltage is At the same time, the two electrodes are short-circuited via a load resistor, the current flowing at that time generates a voltage across the load resistor, this voltage is differentiated, and the obtained differential value is used as the polarizability of the sample. The present invention provides a method for measuring the polarizability and dielectric breakdown of a substance.
次に本発明を図面により説明する。Next, the present invention will be explained with reference to the drawings.
図面は本発明の方法を実施するだめの測定装置系統図で
あり、Ｓは試料、Ｅ＋＋Ｅ２は針状の接触電極、Ｒはロ
ー１抵抗、１は高入力微分装置、２は直流定電圧電源、
３は手動型リレー回路、４は記録計を示す。The drawing is a system diagram of a measuring device for carrying out the method of the present invention, where S is a sample, E++E2 is a needle-shaped contact electrode, R is a low 1 resistor, 1 is a high input differentiator, 2 is a DC constant voltage power supply,
3 is a manual relay circuit, and 4 is a recorder.
本発明においては、２個（一対）の針状電極Ｂ ｌ ＋
Ｅ２を試料Ｓの表面に接触させると共に、直流定電圧電
源２からの直流定電圧を両電極ＥＩ＋Ｅ２の間に印加す
る。この直流定電圧の印加により、試料Ｓを通じ、電極
Ｅｌ＋”２の間に設けられた測定回路に定常電流と過渡
電流が流れるが、この測定回路にはロード抵抗Ｉｔが挿
入されていることがら、このロード抵抗の両端に電流に
比例して電ｊ“１−が発生ずる。そして、この発生した
電Ｊ：Ｅ ｉｔ人カイノビ−ダンスの高い微分装置２て
微分処」４１１され、イ：１られだ微分値は、試料の分
極性及び絶縁破壊１シ１の関数として記録計４に記録さ
れる。In the present invention, two (pair) needle-shaped electrodes B l +
E2 is brought into contact with the surface of the sample S, and a constant DC voltage from the constant DC voltage power source 2 is applied between the electrodes EI+E2. Due to the application of this constant DC voltage, a steady current and a transient current flow through the sample S to the measurement circuit provided between the electrodes El+"2, but since a load resistor It is inserted in this measurement circuit, A voltage j"1- is generated across the load resistor in proportion to the current. Then, this generated electric current is differentiated using a differentiator with a high degree of resistance, and the differential value of the electric current is calculated as a function of the polarizability of the sample and the dielectric breakdown of the recorder. Recorded in 4.
前記において、直流定圧電源か一定で、電極Ｅ、。In the above, the DC constant voltage power supply is constant, and the electrode E.
Ｅ２に印加される電圧が一定であれば、試に’ｌ Ｓに
流れる定常電流成分は一定であるから、この定常電流成
分の電圧を微分処理すればそのイ１１′昧」、零になる
。If the voltage applied to E2 is constant, the steady-state current component flowing through S is constant, so if the voltage of this steady-state current component is differentiated, it becomes zero.
これに対し、過渡電流成分は時間により変化することか
ら、ロード抵抗１ｔの両端に発生した電圧の微分値は過
渡電流成分によって形成され／こものであり、これによ
って過渡′ｆｌｊ流成分全成分電流成分から分離させる
ことが可能になるニ１′かりてなく、この微分値が零に
なったＩＬ’Ｉ Ｖ′Ｃ過、１隻現象が終Ｉｔ、ｌここ
とを示すため、過渡現象の終ｒ時を・決定することがで
きる。On the other hand, since the transient current component changes with time, the differential value of the voltage generated across the load resistor 1t is formed by the transient current component. It becomes possible to separate it from IL'I V'C, and this differential value becomes zero. You can decide the time.
過渡現象終了後、手動型リレー回路３を作用させて、直
流定電圧電源を端子５，６がらはずして、電極Ｅｌ 、
Ｉ・ｒ２に対する電圧の印加を停止させると共に、端
子５，６の間を短絡させる。そして、その短絡により逆
方向に電流が流れる。この電光によりロード抵抗ＩＬの
両端に電圧が生じ、この電圧は微分装置ｉ’＋’により
微分処理され、その微分値は、試別の分極性の関数とし
て記録計４に記録される。After the transient phenomenon ends, the manual relay circuit 3 is activated to disconnect the DC constant voltage power source from the terminals 5 and 6, and connect the electrodes El,
The application of voltage to I.r2 is stopped, and terminals 5 and 6 are short-circuited. The short circuit causes current to flow in the opposite direction. This lightning generates a voltage across the load resistor IL, this voltage is differentiated by the differentiator i'+', and the differential value is recorded on the recorder 4 as a function of the polarizability of the sample.
過渡現象のうち、分子の分極化により吸収されたエネル
ギーは・分子中に蓄積されるが、この蓄積されたエネル
ギーは、前記端子５，６の短絡により放出される。この
際の蓄積エネルギーの放出により生じる電流の流れは、
試別に対して電圧を印加し、エネルギー吸収を行わせた
場合の電流の方向とは逆方向になる。そして、この蓄積
エネルギーの放出による電流は、ロード抵抗Ｒの両端に
電圧として観測される。Among the transient phenomena, energy absorbed by polarization of molecules is stored in the molecules, but this stored energy is released by shorting the terminals 5 and 6. The current flow caused by the release of stored energy at this time is
The direction is opposite to the direction of current when a voltage is applied to the sample and energy is absorbed. A current due to the release of this stored energy is observed as a voltage across the load resistor R.
本発明において、直流定電圧電源としては、一般に、１
０〜１０万ボルトの定電圧を発生するものが用いられ、
寸だローＩＳ抵抗Ｉｔとしては、通常１００〜１０メグ
オームのものが採用される。電極間の距離は、通常１〜
ｌ０ｃｍである。In the present invention, the DC constant voltage power supply generally includes 1
Those that generate a constant voltage of 0 to 100,000 volts are used,
The low IS resistance It is usually 100 to 10 megohms. The distance between the electrodes is usually 1~
It is 10 cm.
本発明の方法は神々の低分子、１．Ｈ’ｐ；分子の翁機
又は無機の固体物質に対してＪｌ：？Ｊ川用＼れる。The method of the present invention uses divine small molecules, 1. H'p; Jl for molecular or inorganic solid substances: ? For J river\reru.
次に、本発明による測定例を・；ｊ、ず。。Next, measurement examples according to the present invention are as follows. .
測定試料としてフェニル゛アルノ゛ヒト樹脂を用い、第
１図に示した装置を用いて測定を？−ｉ″っだ。この場
合、直流定圧電源による電圧として＋ （１０（ｌボル
ト、ロード抵抗１しとして１へ４Ω、電極間隔として１
０調、針状電極Ｂｌ’＋ ｌ＞２として白金製のものを
・用いた。Using phenylaluminum resin as the measurement sample, perform the measurement using the apparatus shown in Figure 1. -i''. In this case, the voltage from the DC constant voltage power supply is +
In the zero tone, a platinum electrode was used as the needle electrode Bl'+l>2.
その測定結果を第２３図に／Ｊ、ず。第２図ｔ」、微分
曲線を示し、縦１１１＋はロー！５抵抗１（、の両ψ１
１．；に生じる電圧の微分値（Ｌ）であり、横１１’ｌ
ｌｌ ｉｔ： ｌ＋、１」間（【）を示ず３．波形Ａは
電圧印加時及び波形１３は上用−の印加を・停＋Ｌ Ｌ
、短絡した時のそれぞれの微分波形をノＪりず。The measurement results are shown in Figure 23. Figure 2 t'' shows a differential curve, vertical 111+ is low! 5 resistance 1 (both ψ1 of
1. ; is the differential value (L) of the voltage generated at horizontal 11'l
ll it: l+, 1'' (without parentheses) 3. Waveform A is when voltage is applied, and waveform 13 is when voltage is applied.
, the respective differential waveforms when short-circuited.
この微分曲線によれば、′ｌＩＪ、ｌｌ二卵加’Ｂ」（
’ ｌ” ’ １ ）における微分信号の大きさ及び上
用コ印加後倣分イ１）号の最大ピークを示す捷での時間
（ｔ ；＋ ７ ＋＋）と、電圧の印加を停止し、短絡
時（１２以後）の倣分信弼の大きさ及び短絡後微分信号
の最大１″−りを示−Ｊ−までの時間（ｔｂ−ｔ２）は
、それぞれほぼ一致した値を示しており、それ故、この
試料に関して微分曲線で示される過渡現象は物質の可逆
現象を示し、そして、この現象は両電極間に電位差を与
えることによって発生ずるものであることから、物質の
分極性に起因するものであることがわかる。According to this differential curve, 'lIJ, ll2 egg addition'B' (
The magnitude of the differential signal at 'l''1) and the time (t; The magnitude of the imitation signal at the time (after 12) and the maximum 1"-reduction of the differential signal after the short circuit (tb-t2) show almost the same value, respectively. Therefore, the transient phenomenon shown by the differential curve for this sample indicates a reversible phenomenon of the material, and since this phenomenon is caused by applying a potential difference between the two electrodes, it can be attributed to the polarizability of the material. It can be seen that it is.
以上のことから、第２図において、ピークの高さから分
極性の大きさ、そしてピークに達す“る時間から分極に
要する時間を求めることができる。From the above, in FIG. 2, the magnitude of polarizability can be determined from the height of the peak, and the time required for polarization can be determined from the time it takes to reach the peak.
分極性の検討を行う方法としてミ従来から誘電率の測定
を行う方法が用いられている。この方法によれば、試料
に有える電場として交流の電場を用いて測定が行われて
いる。このため、位相差の小さい信号と位相差の大きい
信号とは互に重なり、観測の結果では合成位相として観
測されるようになり、正確な位相差を分離観測すること
は困難となる。As a method for examining polarizability, a method of measuring dielectric constant has been conventionally used. According to this method, measurements are performed using an alternating current electric field as the electric field present in the sample. For this reason, signals with a small phase difference and signals with a large phase difference overlap each other, and in the observation results, they are observed as a composite phase, making it difficult to separate and observe the accurate phase difference.
これに対し、本発明による測定法は、前記の誘電率の測
定とは異なり、単発発振法とも言われるものであること
から、スタートしてからの分極時間並びに消滅時間を直
接的に求めることができる。On the other hand, the measurement method according to the present invention is different from the above-mentioned dielectric constant measurement and is also called a single oscillation method, so it is not possible to directly determine the polarization time and extinction time after the start. can.
また、第２図に示され／こ微分向ｉｊｇｄにおいて、ピ
ークＡの積分値ＣＡ’Ｊとビ゛−り１３の積分値ＵＪと
を・求めて両者を比較し、両者の１的が一致すれば、両
者の現象は完全な可逆現象となり、この過渡現象は物質
の分極性にのみ起因、するととからこの微分曲線に示さ
れた測定結果は、絶縁破壊現象を伴わないことがわかる
。−ノブ１イ、′「分（１１’１’、 ＣＡ ］とイ、
１１、分値〔Ｂ〕との間に（（１−（１，＋ ’］ ）
が認められれし１：、この差は、過渡現象のうちの小用
逆現象、即ち、絶縁破壊成分に起因することがわかり、
絶縁破壊成分の、ｏラメータを求めることが１１」ゴ市
となる。In addition, in the differential direction ijgd shown in FIG. 2, calculate the integral value CA'J of peak A and the integral value UJ of beam 13, compare them, and check if they match. For example, both phenomena are completely reversible, and this transient phenomenon is caused only by the polarizability of the material.Therefore, it can be seen that the measurement results shown in this differential curve are not accompanied by dielectric breakdown phenomena. -Knob 1, 'min (11'1', CA] and i,
11. Between the minute value [B] ((1-(1,+'])
1: It turns out that this difference is caused by the inverse phenomenon of transient phenomena, that is, the dielectric breakdown component.
Obtaining the o parameter of the dielectric breakdown component is 11".
第１図は本発明の方法の実施のだめの測定装置系統図を
示し、第２図ＵＬ１本発明でイ（ｔられる微分曲線を示
す。
１・・・高入力微分装置Ｎｉ、２・・・ｌｌ′ｌ流定電
月０上用、３・・・手動型リレー回路、４ ・１．１録
、￥１、ｌ’：１．Ｉ・）２・接触電極、Ｒ・・ロード
抵抗。Fig. 1 shows a system diagram of a measuring device used to carry out the method of the present invention, and Fig. 2 shows a differential curve obtained by UL1 according to the present invention. 1... High input differentiator Ni, 2... 'l Current constant current for 0 and above, 3... Manual relay circuit, 4 ・1.1 record, ¥1, l': 1.I・) 2. Contact electrode, R... Load resistance.
Claims (1)
間にはロー１抵抗を介して直流定電圧を印加し、それに
よって試料及びロード抵抗に直流電流を流すと共に、該
ロード抵抗の両端に電圧を発生させ、この電圧を微分処
理し、得られた微分値を試料の分極性及び絶縁破壊性の
関数として測定し、次いでその測定終了後、該直流定電
圧の印加を停止させると共に、両電極間をロー１？抵抗
を介して短絡させ、その際に流れる電流によりロード抵
抗の両端に電圧を発生させ、この電圧を微分処理し、得
られた微分値を試料の分極性として測定することを特徴
とする物質の分極性及び絶縁破壊性の測定方法。(1) A sample is brought into contact between two electrodes, and a constant DC voltage is applied between the electrodes via a low 1 resistor, thereby causing a DC current to flow through the sample and the load resistor, and both ends of the load resistor. generate a voltage, differentiate this voltage, measure the obtained differential value as a function of the polarizability and dielectric breakdown property of the sample, and then, after completing the measurement, stop the application of the constant DC voltage, and Low 1 between both electrodes? A material characterized by short-circuiting through a resistor, generating a voltage across the load resistor by the current flowing at that time, differentially processing this voltage, and measuring the obtained differential value as the polarizability of the sample. Method for measuring polarizability and dielectric breakdown properties.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15853382A JPS5946845A (en) | 1982-09-11 | 1982-09-11 | Method for measuring polarization and dielectric breakdown of material |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP15853382A JPS5946845A (en) | 1982-09-11 | 1982-09-11 | Method for measuring polarization and dielectric breakdown of material |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPS5946845A true JPS5946845A (en) | 1984-03-16 |
| JPH0244015B2 JPH0244015B2 (en) | 1990-10-02 |
Family
ID=15673801
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP15853382A Granted JPS5946845A (en) | 1982-09-11 | 1982-09-11 | Method for measuring polarization and dielectric breakdown of material |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPS5946845A (en) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04504991A (en) * | 1989-02-18 | 1992-09-03 | ホピ アンシュタルト | Packing method and equipment |
| US6745544B2 (en) | 2000-04-04 | 2004-06-08 | Matsumoto System Engineering Co., Ltd. | Method of and apparatus for wrapping loadable objects |
| US7827766B2 (en) | 2001-10-24 | 2010-11-09 | Matsumoto System Engineering Co., Ltd. | Method and device for packaging load body |
| CN110672992A (en) * | 2019-09-27 | 2020-01-10 | 清华大学 | Electrode material discharge performance testing device and method |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56153746A (en) * | 1980-04-30 | 1981-11-27 | Fujitsu Ltd | Measuring method for transient response characteristic |
-
1982
- 1982-09-11 JP JP15853382A patent/JPS5946845A/en active Granted
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS56153746A (en) * | 1980-04-30 | 1981-11-27 | Fujitsu Ltd | Measuring method for transient response characteristic |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04504991A (en) * | 1989-02-18 | 1992-09-03 | ホピ アンシュタルト | Packing method and equipment |
| US6745544B2 (en) | 2000-04-04 | 2004-06-08 | Matsumoto System Engineering Co., Ltd. | Method of and apparatus for wrapping loadable objects |
| US7827766B2 (en) | 2001-10-24 | 2010-11-09 | Matsumoto System Engineering Co., Ltd. | Method and device for packaging load body |
| CN110672992A (en) * | 2019-09-27 | 2020-01-10 | 清华大学 | Electrode material discharge performance testing device and method |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0244015B2 (en) | 1990-10-02 |
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