JPS5943349A - Metal piece selector - Google Patents

Metal piece selector

Info

Publication number
JPS5943349A
JPS5943349A JP57153385A JP15338582A JPS5943349A JP S5943349 A JPS5943349 A JP S5943349A JP 57153385 A JP57153385 A JP 57153385A JP 15338582 A JP15338582 A JP 15338582A JP S5943349 A JPS5943349 A JP S5943349A
Authority
JP
Japan
Prior art keywords
signal
phase
metal piece
piece
coil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP57153385A
Other languages
Japanese (ja)
Other versions
JPH0415414B2 (en
Inventor
Nobuyasu Ezawa
江沢 信泰
Masaaki Wakimoto
涌本 正明
Hisao Horibe
堀部 久夫
Yoji Wada
洋二 和田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
HARA DENSHI SOKKI KK
Tanaka Kikinzoku Kogyo KK
Eddio Corp
Original Assignee
HARA DENSHI SOKKI KK
Tanaka Kikinzoku Kogyo KK
Eddio Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by HARA DENSHI SOKKI KK, Tanaka Kikinzoku Kogyo KK, Eddio Corp filed Critical HARA DENSHI SOKKI KK
Priority to JP57153385A priority Critical patent/JPS5943349A/en
Publication of JPS5943349A publication Critical patent/JPS5943349A/en
Publication of JPH0415414B2 publication Critical patent/JPH0415414B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables

Abstract

PURPOSE:To identify the composition of a sample metal piece by removing components attributable to errors in the outer diameter dimensions thereof, deviation in the setting position and the like. CONSTITUTION:A sample piece is set on one of sensors 1 and 1' each equipped with a drive coil and a detection coil and a reference piece on the other thereof. The drive coils are driven with an AC source 3 and outputs of the detection coils are applied to a detector 7 through a differential amplifier 4. Then, the detector 7 fetches a signal at the phase position designated by two reference phase signals formed with a phase signal generator 6 from a differential signal from the amplifier 4. On receiving the signal, a phase shifter 9 re-evaluate it on the coordinate rotated in the shift according to the preset value of a phase setting device 10. This removes components attributable to errors in the outer diameter dimensions of the sample piece, deviation in the setting position and the like thereby enabling identification in the composition of a sample metal piece.

Description

【発明の詳細な説明】 木光明は渦゛市流を用い−(シu rjl金6Bのオ(
1或′8を選別する金属片選別装置11に関するムので
ある。
[Detailed Description of the Invention] Kikomei uses the whirlpool Ichiryu - (Shirjl gold 6B o (
This section relates to a metal piece sorting device 11 that sorts metal pieces.

従来、渦電流を用いC試料金属ハを)パ別づる゛装置と
しては、例^ぽ第′1図に示:1(Att負jtイが知
られCいた。同図に於て、A M 1)ti JM 幅
’A’A ’N jlうり、CI、C2はセン(ノーと
し−CC21τIJ4τン−1,1’ルでf(う’i’
:) QごのコイルC1、C21τIJ−の−、−’、
+(ンX(4)が正方向(,11二次巻線が逆方向(ご
4I−る(kに夫Zが直列に接崎され、][層蒸器いM
l:〕の出力昭(子(13よび人力1)婿子(・=接続
さイ11℃いる。これによ)C1増幅に(/\M F)
の人力には]イルC1とC2の出力111号の不拘Mi
分が正帰;h! 、:5ンし、全体とじC差動をの発振
;摺を34+’:成し“(いる。
Conventionally, as an example of a device for separating sample metals using eddy current, an example is shown in Figure 1. 1) ti JM Width 'A'A 'N
:) Coils C1, C21τIJ- for each Q, -',
+(N
l:]'s output Akira (child (13 and human power 1) son-in-law (・= connection is 11℃. This) to C1 amplification (/\M F)
[For human power] Ir C1 and C2 output No. 111 unrestricted Mi
The minute is positive; h! , :5, and the entire C differential oscillates; the slide is 34+': completed.

この様に]1り成された差動発振器は〕イルC1ど02
との出力が等しい揚台には互いに相殺し合って、増幅器
A M Pの入力端子には信号が与えられず、発振動作
は起らないが、両者の出力に差があると、その差分が増
幅器ΔN11つで増幅されて正帰]7されるため、発振
が始まる。ここcl一方のコイルC1に4ffl tl
aどなる試料金属片をセン1〜し、他りの=1イルC2
に被選別試料金属J1をセン1〜すれば、試It金属片
の金属組成、外形等に応じて夫々の試料金属片に特有の
渦電流が流れる。従っで、2つの試11金屈片が同一で
あれば、両者に流れる渦電流に必要は4ラーク、コイル
C1、C2の出力に差が生じず、装置が発振ザることは
ないが、2つの試料金属片の金属組成、外形寸法等に差
があると、渦電流の流れ方が変4つり、コイルc i 
、c 2の111力にも差が生じ、この差分によって装
嵌は発振を開始づる。即ち、装置が発振りれば両シ“(
わ1金属ハの間に差異があり、発振しなければ同一であ
ることが識別できる。
The differential oscillator constructed in this way is
If the outputs of the two are equal, they cancel each other out, so no signal is given to the input terminal of the amplifier AMP, and no oscillation occurs. However, if there is a difference in the outputs of the two, the difference Since it is amplified by the amplifier ΔN11 and given a positive feedback, oscillation begins. Here cl 4ffl tl to one coil C1
a The sample metal piece is sen 1~, and the other = 1 il C2
When the sample metal J1 to be sorted is separated from the sample metal J1, a unique eddy current flows through each sample metal piece depending on the metal composition, external shape, etc. of the sample metal piece. Therefore, if the two test pieces are the same, the eddy current flowing in both will be 4 Lakh, and there will be no difference in the outputs of coils C1 and C2, and the device will not oscillate, but 2 If there are differences in the metal composition, external dimensions, etc. of the two sample metal pieces, the way the eddy current flows will change, causing the coil c i
, c2, and this difference causes the fitting to start oscillating. In other words, when the device oscillates, both “(
There is a difference between W1 and metal C, and if they do not oscillate, it can be recognized that they are the same.

しかしながら、(二の仔4′i:合1;’K J’I−
・式別装嵌に於C(よ、差1(Ilシ3 ’l’l? 
+’::4の感Qj ’j:l汀二かI端がしく、例え
(、[,99,9%の金3412と99 、09 ’、
6の6ン13;λどの選別などの@属の(1・CIQを
判定りる住ン:ζ1譜′2選別装j3j7には適用でき
ず、また試料台1菖j1の外形ス1汰の誤差、あるいは
試料金属片の内部の(Fl、表面状f比等に起因づる不
平i0i 0ぞの11、ま(1・1〆・1■:)にパノ
ノされ(しま−うため、同−nr立の試料金属片C゛あ
るに6がか4)らf、差動発j!i f、、”rが発振
(5・てI)、1、うどいゞ)欠点t)i!F)った。
However, (two children 4'i: 1;'K J'I-
・C(yo, difference 1(Ilshi3 'l'l?
The feeling of +'::4 Qj 'j:l 怀2 or I seems to be extreme, for example (,[,99,9% gold 3412 and 99,09',
6 of 6 13; λ Which sorting etc. @ genus (1・CIQ judgment unit: ζ 1 stave' 2 sorting device j 3 j 7) cannot be applied, and the external shape of sample stage 1 iris j 1 Errors or imperfections caused by internal (Fl, surface condition f ratio, etc.) of the sample metal piece, etc. A vertical sample metal piece C゛6 is 4) to f, differential oscillation j!i f,,"r oscillates (5 te I), 1, annoying t) i!F) It was.

本95案1Jこれらの点に着目しく4「された1)の−
C1試オ′:1金属片に生り゛る渦7E流の微妙な[(
θ化’、? +:’?:知し、その中から試オ″〕1金
凪片の外形用法の誤ニテ:、あるいはこれをセンリに近
接あるいは仲人(jストレッl−という)illる際の
位置ずれ等に4、d囚すイシ不平(51成分を除去し、
朴粋に金属組成の)0いにJ、る不平Fli成分のみを
抽出して試11−′3′i、バ片の1):同を選別りる
金属片選別具Fイを捏1jUるものCあっ−(、イの要
旨とづるどころは、電磁的に結合しくいイ〉駆動子1イ
ルと検出コイルを右し、その近傍にレッl−される試才
8I金属片によって生ずる両コイル間の電磁結合の変化
を読取る少くとも2個のセン1)と、各セン1ノの駆動
=1(ルを励磁駆動づるための交流信号源と、この駆動
信号から所定の位相差を有する2つの位相j、t N、
を信号を作成する位相基11(信号発生器と、前記呂セ
ンリ゛中の2個から検出コイルの検出信号を受け一ζそ
の差分信号を出力り−る差動増幅器と、イの差分信号か
ら前記位相基準信号が指定Jる位相位置での信号を取り
出す°検波器と、この検波出力を予め設定された値に従
って位相回転さ、せた座標十−C71T評価でる移相器
とを備えて成る金属片選別装置に存りる。以下図面に示
づ実施例に従って詳細に説明する。
Book 95 Proposal 1J Focusing on these points, 4 "1) -
C1 Trial O': 1 Subtle vortex 7E flow that forms on a piece of metal [(
θ-ization',? +:'? :I know, try it from among them''] 1 Misuse of the external shape of the piece:, or 4, d prisoner due to misalignment when bringing it close to the Senri or when illuminating the matchmaker (jstr-). Suishi complaint (removes 51 ingredients,
Simply extract only the components of metal composition ()0, J, and F, and use a metal piece sorter Fi to sort out the same. The gist of (and the gist of (a) and (b) is that the two coils are electromagnetically coupled.) The two coils are connected to the drive element 1 and the detection coil, and are created by a metal piece placed near them. At least two sensors 1) for reading changes in electromagnetic coupling between the sensors 1), an AC signal source for exciting and driving each sensor 1, and 2 sensors having a predetermined phase difference from this drive signal. three phases j, t N,
A phase base 11 (signal generator) that generates a signal; a differential amplifier that receives the detection signal of the detection coil from two of the sensors and outputs the difference signal; A detector for extracting a signal at a phase position designated by the phase reference signal, and a phase shifter for rotating the phase of this detection output according to a preset value and evaluating the rotated coordinates. The present invention relates to a metal piece sorting device.Hereinafter, it will be described in detail according to an embodiment shown in the drawings.

第2図は本発明0ルー実施例を示すブロックダイ髪7グ
ラムであり、第3図おに・び第71図はこれに用いるセ
ン」〕′の一例を示づ平面図および断面図である。
Figure 2 shows 7 grams of block-dyed hair showing an embodiment of the present invention. .

同図に於て、′1および1′はセンサであって、一対用
意され、第3図および第4図にその詳細を示−リように
、同心円状に巻回配回された駆動コイル1aと検出=」
−イル′11)とを((jlえ−Cいる。試料金汎片2
はこの検出コイル11)の中?J′!部内に人々[!ッ
トされるものであって、例えば、レンリ゛′1の検出コ
イル11)内には選別づべき試オ々1金屈片2がしッ1
−され、けン→ノ1−の検出コイルI b内には(票!
((となる試料金属片2が1=ツ1−される。
In the figure, '1' and '1' represent a pair of sensors, and as shown in detail in FIGS. 3 and 4, a drive coil 1a is wound concentrically. and detection=”
-Ile'11) and ((jlE-C.Sample piece 2
is inside this detection coil 11)? J′! There are people in the department [! For example, in the detection coil 11) of the sensor 1, there is a sample sample 1 to be sorted.
-, and in the detection coil Ib of Ken→No1- (vote!
((The sample metal piece 2 becomes 1 = 1 -.

3はこの一対のセンリ1おJ、び′1′の駆動ニドイル
1aを励磁駆動するための駆千]4信′;′3を供給り
る交流信号源であって、試利金島パ2の内部の閂、表面
の状態等によっ−c1生起する渦電流が影IAを受(プ
ず、また表皮効果の影響−す小さ4fbのとりるため、
50t−1z−500HZ稈ム”[の11(い周波数の
正弦波交流信号を定電流あるいは定電圧で供給し〕てい
る。
3 is an alternating current signal source for supplying the driving signal 14'; Because the eddy current generated by c1 is affected by the shadow IA due to the condition of the internal bolts and surface of the
50t-1z-500Hz culm" [supplies high-frequency sine wave alternating current signals with constant current or constant voltage].

4は、前記一対のロンザ1および1−の検出二1イル1
()が出力す°る検出信号を受()てその差分をとり、
これを例エバ10000 (f:i稈1.ff: 0’
)増幅−t”r増幅づる差動増幅器Cある。!=5はこ
の差動増幅器4の出力信号に含沫れでいる高調;1、v
成分を除去し、交流信号源3が送出りる駆動信号の周波
数成分のみを通過さ1!て差分イtDを作成り−る低域
フィルタである。
4 is the detection of the pair of Lonza 1 and 1-.
Receive the detection signal outputted by () and take the difference,
For example, Eva 10000 (f:i culm 1.ff: 0'
) There is a differential amplifier C with amplification −t”r amplification. !=5 is the harmonic included in the output signal of this differential amplifier 4; 1, v
components are removed, and only the frequency components of the drive signal sent by the AC signal source 3 are passed through! This is a low-pass filter that creates a difference tD.

6は前乙0交ン々信冗源33から受けた前記駆チカイ言
号と同−JKl波故の交流信丁シから所定の()“11
11差を有する位相量111!信号を作成づる位′I[
1信号発生冊である。
6 is the predetermined () "11" from the above-mentioned message received from the previous communication source 33 and the same message from the communication source 33.
Phase amount 111 with 11 difference! The position where the signal is created
1 signal generation book.

この位相1j 1.p信号は、例えば、駆i!lII信
号の位相角Oフジj′ンa3J:びπ、/2ラジアンに
夫々λI1.トシたπ7/25ジアンの位相差を持った
信号である。7は、この位相邊4準信号を用いて、前記
低域)rシタ5から転送されて来る差分信号を’ 4V
l即して、前記位相J11信号の位相位置に対応する信
号χおよびyを作成づる検波器である。例えば、前記位
相基Iiヤ信号の指定する位相位置、即ち、駆動信号の
位相角0ラジアンJ3よび7c/2ラジアンの位相位I
i2?て′の差分信号のIIセ幅(lαを検出して、こ
れを信号χあるいは(i号yとして送出するものである
This phase 1j 1. The p signal is, for example, the drive i! The phase angle of the lII signal is λI1. This signal has a phase difference of π7/25 dian. 7 uses this phase-side 4 quasi-signal to convert the differential signal transferred from the low-frequency (low-frequency) r-shita 5 to '4V.
In other words, it is a detector that generates signals χ and y corresponding to the phase position of the phase J11 signal. For example, the phase position specified by the phase base Ii signal, that is, the phase position I of the drive signal at a phase angle of 0 radian J3 and 7c/2 radian.
i2? The second width (lα) of the differential signal of t' is detected and sent as the signal χ or (i-y).

8は電気回路系のL O++ F!I整を行イ【うため
の自動バランリ゛で(しる。半導体部品のドリフト、部
品の値のバラツキ等が原因で、レンザ1,1′に同一の
試料金属J’lが正確に[?ツ1−されても、()(■
記構波器7が出力する信号χl13よぴ信号yが” 0
 ” lこ4′cらない車がある。この白【リバランリ
J314例え番、〔利4V? jl’J整が可能な2個
の増に、1器にJ−ってイj)成されていて前述の電気
回路系の小平v11(こJ、っC” 0 ”とならなか
った信号χd3よびyを前1ic増幅;):(の刊i′
’?調整を行って、自動的に打消し6行ない、これJ、
り出力される信すX 63よび)′が” O”となる(
トに初期設定される。
8 is electrical circuit system L O++ F! Due to the drift of semiconductor components, variations in component values, etc., the same sample metal J'l is accurately placed on the lenses 1 and 1'. 1- Even if it is done, ()(■
When the signal χl13 and the signal y output by the wave splitter 7 are "0"
"There is a car that does not have 4'c. This white [Rebalance J314 analogy, [4V? jl'J adjustment is possible, and J- is made in one device. Kodaira v11 of the above-mentioned electrical circuit system (the signals χd3 and y that did not become ``0'' were amplified by 1 IC;): (published by i'
'? Make adjustments and automatically cancel 6 lines, this is J.
63 and)' outputted as "O" becomes (
initialized to default.

9は本梵明による金属ハ)パ別4・ξ、置の核心部苓−
なJ移相器であり、10はその回転位相l1ljをPめ
設定してJj <位相設定器である。ここく゛、多くの
測定点を前述の信号X、Yに基いて平面11シ標にゾ(
]ッ1〜してゆく実験を打つへ二結果、 ■ 同一形状の試料金属片2を正確な位置決め4行なっ
てセンサ1内にけツ1へし、その金属組成を変えると、
その旧側値は第5図に△で示8+’ ”;cS1象限A
3J:び第3象限を通る直ぐ:ii l’ iIj似゛
(きる。
9 is the metal part according to this Bonmei.
10 is a phase setter which sets the rotational phase l1lj to Pth so that Jj<phase. Now, based on the aforementioned signals
] 1 to 2 Results of the experiment: ■ When a sample metal piece 2 of the same shape is accurately positioned 4 times and placed in the sensor 1 at the bottom 1, and its metal composition is changed,
Its old side value is indicated by △ in Figure 5. 8+'”; cS1 quadrant A
3J: Immediately passing through the third quadrant: ii l' iIj similar.

■ 金ms /f[成の同一な試t’l金Jiべ片2で
あってL)、ロンリ内の磁束密度が均一でないため、試
INl金属片2の外形寸法の誤差、Uンリ′1へのし・
ンティング位置の〕「れ等で影響を・受け、その測定1
f(fは第5図の[(で示づ第2象限および第4象限を
通る直線で近似できる。
■ Since the magnetic flux density inside the metal piece 2 is not uniform, the error in the external dimensions of the sample metal piece 2 and the unreli'1 Henoshi・
[of the printing position], and its measurement 1.
f(f can be approximated by a straight line passing through the second and fourth quadrants shown in [( in FIG. 5).

■ これらの)Lτ似rXKA /\および巳が元の座
49軸)<。
■ These) Lτ-like rXKA /\ and Snake are the original locus 49 axes) <.

Yど41′1j′角度0は、駆動信号のy(j波数ヤセ
〉ザ1.1′の形状等の条(’lで変化覆る。
The Y 41'1j' angle 0 varies depending on the shape of the drive signal y(j wave number 1.1').

等の事実を昇見した。He praised the facts such as:

従って、予め所定の条件で実験を行なっで、前述の近似
直線と座標軸とのなず角度θに対応するデータを1「U
3さ、検波器8の出ツノする信RX 1 。
Therefore, by conducting experiments under predetermined conditions in advance, data corresponding to the angle θ between the approximate straight line and the coordinate axes was obtained by
3, the signal RX 1 is output from the detector 8.

Y!で決められる測定点Cを、前)ホの角度θだけ回転
さセた座標上で再訂飾りれば、外形寸法、レッティング
位置賃の:!′I差に起因J゛る成分を除去−Cきるこ
とに%る。位相設定器10はごの座標軸ど予備実験によ
るMF似直線どのなり角度に;(j応するデータを回転
位相怜としで)′−め設定しでおくためのちのCあり、
移相器9はこの位相jl定器10に予め設定された回転
位相1カに応じて座標ii1!lを回転変換し、訓測値
をこの変換された外棟上でT(工評価して、第5図に矢
印りで示されるiif+、、[Illら、近似直線Bか
らの距き11を求め、試オ)1金属片2の金昼相成の着
具に対応した選別信号どして出力づるものである。
Y! If the measurement point C determined by is re-decorated on the coordinates rotated by the angle θ of E), the external dimensions and retting position will be:! % to remove the component caused by the difference in I and C. The phase setter 10 is used to set the coordinate axes to the MF approximate straight line based on preliminary experiments;
The phase shifter 9 coordinates ii1! according to the rotational phase 1 set in advance in the phase jl determiner 10! l is rotationally transformed, and the measured value is evaluated on this transformed outer building as T (iif+), [Ill et al., the distance 11 from the approximate straight line B is The method is to output a sorting signal corresponding to the Kimihiro Aisei outfit of 1 metal piece 2.

11は基準信号発生器であり、12はごの星I(可信号
発生器11が出力り−るtt、準信月ど前記移相器9の
出力覆る選別13号とを比較りる比較回路である。比較
の結果、例えば、)バ別信’:’47′J+ L、% 
Qt+++より小さければ、金属11戒は同一であると
判定し、逆に太き(プれば相違すると判定して、この判
定結果に塁づく判定信号を出力づる。13は表示駆動回
路であって、前記比較回路12か□らの判定信gに応動
じてディスプレイ14のランプL1あるいはL2を点灯
駆動するものである。
11 is a reference signal generator, and 12 is a comparison circuit that compares the signal generator 11's output tt with the output of the phase shifter 9 (semi-signal) and selection No. 13. Yes.As a result of the comparison, for example,)Babetsu':'47'J+L,%
If it is smaller than Qt+++, it is determined that the 11 metals are the same, and if it is thicker, it is determined that they are different, and a determination signal based on this determination result is output. 13 is a display drive circuit; , the lamp L1 or L2 of the display 14 is driven to turn on in response to the judgment signal g from the comparison circuit 12.

次に、この様に椙成された金属片選別装買を用いて金属
片の選別を行なう際の手順を説明りる。
Next, the procedure for sorting metal pieces using the metal piece sorting equipment prepared in this way will be explained.

J:ず、選別作?°1(に先立つ−C1金属片)パ別装
岡の初期3ポ定が行なわれる。これに(3″1.先ず、
2′つのヒンナ1J′3よび1′内に同一形状、同−組
成の試t’1金属片2をセツティング位置に充分1−1
′意を払ってセラ1−する。ここで間流信号源3によっ
て両センサ1 J3よび1′を駆動しても、差動振幅器
/1の出力は両センリ1および1′の検出信号が互いに
相殺し合って完全に1101+となり、従って検波器7
の出力イn号χ、yも本来゛OIIとなるへきものであ
る。しかしながら、半導体の1:リフト、部品の値のパ
ンツキ等で必ずしもII O11にはなりl!’? <
>い。
J: Is it a selective work? °1 (preceding -C1 metal piece) Initial 3-pot determination of Pa separate Oka is performed. To this (3″1. First,
Place the test t'1 metal pieces 2 of the same shape and composition in the 2' hinges 1J'3 and 1' at the setting position 1-1.
'I play Sera 1- with all my heart. Here, even if both sensors 1 J3 and 1' are driven by the intercurrent signal source 3, the output of the differential amplifier/1 becomes 1101+ because the detection signals of both sensors 1 and 1' cancel each other out. Therefore, the detector 7
The outputs n, χ, y are also inherently ``OII''. However, due to semiconductor 1: lift, component value shortcuts, etc., II O11 is not always possible! '? <
>Yes.

(・ηつで、自動バラシリ8内の増幅器の利+’7調整
等によって−その出力信6 Xお31;びYが1101
1となる様に、装置の電気系路の110 ++副調整行
なう。次に、予備実験を行なって所定の条イ′1の下で
の近似直線を求め、この近似直線と座標thi1とのな
す“角度を位相設定器’I O内に回転位相量として予
め設定しておく。この予備実、験4;l;、使用りるレ
ンIすを変える等)Z卒イ′[を蛮え−C秤々行4rっ
てa3き、各予備実験で111られた値をその条イ′1
とS、I応(=Jけて位相設定器10内に格納しておけ
ば、条件が変わる都度予11i実験をし−て回転位相聞
を求める必要はなくなる。
(・At η, the output signal 6 of
Perform the 110++ sub-adjustment of the electrical system of the device so that it becomes 1. Next, a preliminary experiment is conducted to find an approximate straight line under a predetermined stripe '1, and the angle between this approximate straight line and the coordinate thi1 is set in advance as the rotational phase amount in the phase setting device 'IO. For this preliminary experiment, experiment 4; l;, change the lens used, etc.) Z graduate A' That line a'1
If the values S and I (=J) are stored in the phase setter 10, there is no need to perform a preliminary experiment each time the conditions change to determine the rotational phase.

このよう様にして初1’ll設定の行なわれた金属片選
別装置の一方のセンサ1には、これから選別を行なう試
石金厄J″i2がレッ1へされ、他方のセンサ1′には
標I((となる試料金属片2がし・ツ1−され?)。
In this way, one sensor 1 of the metal piece sorting device, which has been set for the first time, receives the test stone Kinyaku J''i2, which will be sorted from now on, and the other sensor 1' Mark I

ここで、交流信号源3を動作さl!、駆動信号をセンサ
ー183 Jこび′1′の駆戸11−1イル1a l−
、’)云ると二、菖[3動コイル1aの作る磁束が検出
二1イル11〕に用量してこれに検出信号が誘起1Jる
。この検出信r! (J、検出コイル11)内(こレッ
1−された試X’l金属;腎2の組成の違い、外形−=
1法、レフ1−位+r10)誤差等によって、前述の磁
束によ−) T ’rK 11 企L’7. I’+ 
2 内i: 牛−Jる渦電流が微妙に異41す、し・シ
リ1ど1′ど−(”(,1゜多少異なったものと4rる
Here, the AC signal source 3 is operated l! , the drive signal is sent to the sensor 183.
,') Then, the magnetic flux produced by the moving coil 1a is applied to the detection coil 11, and a detection signal of 1J is induced therein. This detection signal! (J, detection coil 11)
1 method, Ref 1-position + r10) Depending on the error, etc., the above-mentioned magnetic flux -) T'rK 11 plan L'7. I'+
2 Inside i: The eddy current of the cow is slightly different.

差動増幅器4はこの両IIンリ″I J3よび′l′″
の検出信号の差分をとって10000 (1′1稈度に
増幅し、低域フィルタ5によって高調波成分を除]てし
、差分信号を作成しで検波器7にノjλ、る。(会&’
1iiii 7 i。i。
The differential amplifier 4 connects these two
The difference between the detection signals of 10000 and 10000 (amplified to 1'1 and the harmonic components removed by the low-pass filter 5) is created, and the difference signal is sent to the detector 7. &'
1iii 7 i. i.

位相信号梵生器6が発1t−yる、7r/2ラジアンの
位相差を持った2つの位相17口1’= (A弓に応W
h L、r 。
Phase signal generator 6 emits 1t-y, two phase 17 ports 1' with a phase difference of 7r/2 radians = (corresponding to A bow)
h L, r.

その各々の位相角に於ける前記差分信号の値にス・]応
した信号χ、yを出力づる。この検波器7の出力は自動
バランサ8によって信に″iXおよびYに変換されて移
相器9へ送られる。
It outputs signals χ and y corresponding to the value of the difference signal at each phase angle. The output of the detector 7 is converted into signals iX and Y by an automatic balancer 8 and sent to a phase shifter 9.

ここで、2つのセンサ1,1′にセラi−された試料金
属片2の組成が同一τあった場合、信号×およびYの値
を第5図に示づ1小標上にブ[lツ1〜!1れは、外形
寸法の誤差等に起因丈るもののみであるため測定点ti
t近似直線B上に乗り、矢印りで示J成分は11011
となる。従って、移相器9に於て座標軸を位相設定器1
0に設定された回転位相聞に応じて回転変)色し、この
変K(!座標上で前記測定点を再訂価すると、そのX軸
方向の成分は11011となる。また、舎属組成に差が
ある場合には、この回転変換された座標軸上で再訂11
i1i シた測定(10のX 1Iib方向成分がII
 OIIとはなら−f、金属;41成の差に応じたある
(IC1を持つことにに′3・る。移用器っけこれらの
値を選別信号どして比11イト回rat i 2 l\
送出づ゛る。
Here, if the composition of the sample metal piece 2 soldered to the two sensors 1 and 1' is the same τ, the values of the signals Tsu1~! 1. Since this is only due to the error in the external dimensions, the measurement point ti
It rides on the t approximation straight line B, and the J component shown by the arrow is 11011
becomes. Therefore, the phase shifter 9 sets the coordinate axis to the phase setter 1.
The color changes (rotation change) according to the rotational phase set to 0, and when the above measurement point is revised on the coordinate K (!), its component in the X-axis direction becomes 11011. If there is a difference, re-revise 11 on this rotationally transformed coordinate axis.
i1i Shit measurement (10 x 1Iib direction component is II
OII is -f, metal; there is a value according to the difference in the 41 composition (it is '3.) to have IC1. l\
I'm sending it out.

比較回路12では、送られで来た選別信号を基準信号光
く1三器1′1の光4にづ゛る遥jいj’j (tm弓
と止車々して金層組成のy4同の判定を行i、−=、う
。即ち、)パ別1n号110 !1であれ(3I:同一
、値を持てば’!fj 3’呈と判定するものであるが
、R11l定誤差等を考j、りし゛C決定した適当な値
のヰtit;信号と選別信号どの比較を(jない、これ
よりも小さ7,7値で85ればl1iJ−4rl成、大
きな1Nどなれば異組成と判定し、この判定結果9ご応
した判定信号を表示駆動回路13へ送出りる。表示駆動
回路13はこの判定信号が同一7tl成を示すものであ
れば、ディスプレイ111の例えばランプL1を駆動し
て点灯させ、異組成を示81bのであれ)、f、例えば
ランプL2の点灯駆動を行4i:う。
In the comparator circuit 12, the sent selection signal is converted into a reference signal and a far-off beam based on the light 4 of the 13 1'1. Perform the same determination as i, -=, u. That is,) Pa-by-1n No. 110! 1 (3I: Same, if it has the value, it is judged as '! Which comparison is made (j is not present, if it is smaller than 7, 7 value is 85, it is determined that l1iJ-4rl is formed, if it is larger than 1N, it is determined that the composition is different, and the judgment signal corresponding to this judgment result 9 is sent to the display drive circuit 13. If this determination signal indicates the same 7tl composition, the display drive circuit 13 drives, for example, the lamp L1 of the display 111 to light it, and displays the signal 81b), f, for example, the lamp L2, indicating a different composition. 4i: U.

ノズ上、図示の実施例に従っr iiT創に説明したが
、本発明これにのみ限定されるものでないことはいうま
でもない。
Although the description has been made regarding the riiT wound on the nozzle according to the illustrated embodiment, it goes without saying that the present invention is not limited thereto.

例えば、センサの数はノビ一り”しb 21111に限
られるものではなく、多数個用形、して、13き、9昌
21を用いて、試N’l金属片の形状等に対応さ1!、
”(切替使用しても良い。このjf5合、各センサfu
に予(・11゛1実験を行なって近似直線を求め、位相
設定E3にての回転位相量を設定しておく必要がある。
For example, the number of sensors is not limited to 21111, but 13, 9, and 21 sensors can be used to accommodate the shape of the metal piece. 1!,
” (You may use switching. In this jf5 case, each sensor fu
It is necessary to perform one experiment in advance to obtain an approximate straight line and set the amount of rotational phase in the phase setting E3.

;した、使用されている一対のセンサの一方に標)1こ
と4Yる試料金属片をセラ1〜したものでイIくとも間
代;にし4jT:別覆ることができる。即ち、一方に適
当な試j′31金属片をセットし、他方に標準どなる試
料金属片をセラ1〜1ノで選別系の初期設定を行ない、
その後、標準となる81(料金底片をi71!選別試利
金属片に変えれば、被測定試料金属j−1と標準試料金
属片の組成の異同の選別が可能となる。この場合、比較
回路での判定は” o ”との比較ではなく、ある所定
の(11■との比較になり、この値に測定誤差等を考慮
した幅を設定し、その範囲に入るか否かで金属組成の異
同を判定することになる。この事を更に拡張づれば、一
方のセンサに何もセラ1−シてJ3かない?P心状態で
あっても全く同様に金属組成の異同を選別りることがで
き、比較回路を工夫゛す゛れば、金属組成を段階的に多
数1ii選別することも可能どなる。
4jT: It is possible to separately cover a sample metal piece of 1~4Y with a ceramic plate 1 to 1, which is marked on one of the pair of sensors used. That is, an appropriate sample metal piece is set on one side, a standard sample metal piece is placed on the other side, and the initial setting of the sorting system is performed using Cera 1 to 1.
After that, if you change the standard 81 (fee bottom piece) to the i71! sorting sample metal piece, it becomes possible to sort out the difference in composition between the sample metal j-1 to be measured and the standard sample metal piece. In this case, the comparison circuit The judgment is not a comparison with "o", but a comparison with a certain predetermined value (11■), and a range is set for this value taking measurement errors etc. into account, and whether or not it falls within that range is used to determine the difference in metal composition. Extending this further, even if one sensor is in the J3 state, it is possible to distinguish between different metal compositions in exactly the same way. If the comparison circuit is improved, it will be possible to select a large number of metal compositions step by step.

更に、センサ′の4iG造も実施例のものにのみ限定さ
れるしのではなく、駆動コイルと検出コイルを重ねたも
のでし良く、試料金属片を検出コイル内にtzツ1〜せ
ず、センサの上に載置するもの等、駆動コイルの発生づ
る磁束が試料金か1片を有効に4通するものであれば良
い。さらに、閑心コイルで(苫成したもののみではなく
、E形、壺型等の付表路が閉じていない鉄心に駆動二1
イルど検出コイル4巻いで、隘路の問い(−いる部分に
試料金属片をL′!ッ(−づる形式にりれ(」゛効率の
良いしンリを1!’7ることもできる。
Furthermore, the 4iG structure of the sensor' is not limited to that of the embodiment, but may be one in which the drive coil and the detection coil are stacked, and the sample metal piece is not inserted into the detection coil. It is sufficient that the magnetic flux generated by the drive coil, such as one placed on a sensor, can effectively pass through one piece of the sample four times. In addition, with a blank core coil (not only those with a tampered core, but also E-type, pot-shaped, etc.), drive 21
With 4 windings of the irradiation detection coil, it is also possible to move the sample metal piece to the part of the bottleneck (-) in an efficient manner.

また、交流信号源の発生リーる駆動信号の周波数は、表
皮効果、試オ;1金属片内の酉等にJ、って渦電流の流
れ方に影響が出るのを防止りるため、50[−(l〜5
001−1 z程度の低周波どしく、試料金属)1全体
に大きく渦電流が流れる様にしているが、試料金属片の
大きさ等の条件が異4rればより高い周波数にしでも良
いことはいう;Lでtつ6泊「い。
In addition, the frequency of the drive signal generated by the AC signal source is set at 50°C to prevent the skin effect and the effect on the flow of eddy currents due to [-(l~5
001-1 At a low frequency of about z, a large eddy current is made to flow throughout the sample metal (1), but if the conditions such as the size of the sample metal piece are different, it may be possible to use a higher frequency. 6 nights in L.

以上詳細に説明した保に、本発明の金属選別装置によれ
ば、外形Xi法の誤差、レット位置のずれ等の影響を完
全に除き、金属組成の74同のみを紗枠に判定できるも
のであるため、例えば、jQ ffiはシビアに管理さ
れるが夕1形X1法等は比較的ラフ41−金塊の糺度が
99.99%であるのか99.9%であるのかの選別判
定等に)^用して(うめて有効4)−ものどなる。
As explained in detail above, according to the metal sorting device of the present invention, it is possible to completely eliminate the effects of errors in the external shape Xi method, deviations in the let position, etc., and to judge only 74 pieces of metal composition as gauze frames. Therefore, for example, jQ ffi is strictly managed, but Y1 type ) \ (useful 4) - yell.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の金属片選別装置の一例を示づブロックダ
イヤグラム、第2図は本発明の一実施例を示づ゛ブロッ
クダイヤグラム、第3図および第4図はこれに用いる、
センサの一例を示す平面図および断面図、第5図は本発
明の詳細な説明するための図である。 1.1′・・・・・・センサ゛、1a・・・・・・駆動
コイル、111・・・・・・検出コイル、2・・・・・
・試料金5片、2・・・・・・交流信8源、 4・・・
・・・差動増幅器、5・・・・・・低域フィルタ、6・
・・・・・位相信@発生器、7・・・・・・検波器、 
  8・・・・・・自動バランサ、9・・・・・・移相
器、  10・・・・・・位相設定器、11・・・・・
・1;(準信丹発生器、12・・・・・・比較回路、1
3・・・・・・表示駆動回路、14・・・・・・ディス
プレイ。 特許出願人 IYI中負金属工系株式会礼同   原電
子測器株式会社 第3図 第4図 第5図
Fig. 1 is a block diagram showing an example of a conventional metal piece sorting device, Fig. 2 is a block diagram showing an embodiment of the present invention, and Figs. 3 and 4 are used for this purpose.
A plan view and a sectional view showing an example of the sensor, and FIG. 5 are diagrams for explaining the present invention in detail. 1.1'...Sensor, 1a...Drive coil, 111...Detection coil, 2...
・Sample fee: 5 pieces, 2... Exchange letter: 8 sources, 4...
... Differential amplifier, 5 ... Low-pass filter, 6.
... Phase signal @ generator, 7 ... Detector,
8... Automatic balancer, 9... Phase shifter, 10... Phase setter, 11...
・1; (quasi-shintan generator, 12...comparison circuit, 1
3...display drive circuit, 14...display. Patent applicant: IYI Nakanei Metal Engineering Co., Ltd., Hara Denshi Sokki Co., Ltd. Figure 3 Figure 4 Figure 5

Claims (2)

【特許請求の範囲】[Claims] (1)電磁的に結合しでいる駆動コイルと検出コイルを
有し、ぞの近(力にヒツトされる試料金属片によって生
ずる両コイル間の電磁結合の変化を読取る少くとも2個
のセン1)と、各センサの駆動コイルを励磁駆動するた
めの交流信号源と、この駆動信号1)11ろ所定の位相
差を右する2つの位相基t(を信号を作成づる位相信号
発生器と、前記各センサ中の2個から検出子コイルの検
出信号を受けてその差分信号を′出力りる差動増幅器と
、その差分信号から@記位相基T11(信号が指定する
位相位置での信号を取り出!j検波器と、この検波出力
を予め設定された(IC1に符−) −T’ <C1相
回転さけた座標上で再計測りる移相器とを備えて成る金
属片選別装置。
(1) At least two sensors having a drive coil and a detection coil that are electromagnetically coupled and reading changes in the electromagnetic coupling between the two coils caused by a sample metal piece being hit by a force in the vicinity of each other. ), an alternating current signal source for exciting and driving the drive coil of each sensor, and a phase signal generator that generates a signal from two phase bases t(1) and (11) for generating a predetermined phase difference from this drive signal. A differential amplifier receives the detection signal of the detector coil from two of the sensors and outputs the difference signal; A metal piece sorting device comprising a take out! .
(2)  交流信号源が発生°する駆動信号の周波数を
50t−1z −500Hzの低周波どしたことを特徴
とする性情請求の範囲第(1)項に記載の金属片選別装
置。 (J センサの駆動コイルと検出=]コイルを同心円状
に配置し、その中心部分に試料金1爪片をレッ[−する
形式とし、′1つのセンυには)りi lll;どなる
試料金属片がセン1−され、他のレンジ′にはン/!!
選別試第1金属片がレットされることを特徴どりる待t
i’F iil〜求の範囲第(1)項あるいは第(2)
項に記載の金属片選別具fNY。
(2) The metal piece sorting device according to claim (1), wherein the frequency of the drive signal generated by the AC signal source is set to a low frequency of 50t-1z to 500Hz. (J Sensor drive coil and detection =) The coils are arranged in a concentric circle, and one specimen claw piece is placed in the center of the coil, and each sample metal is The piece is placed in the microwave and placed in the other microwave. !
A waiting period characterized by the fact that the first metal piece of the sorting test is let.
The range (1) or (2) of i'F iil ~
The metal piece sorter fNY described in Section 1.
JP57153385A 1982-09-04 1982-09-04 Metal piece selector Granted JPS5943349A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP57153385A JPS5943349A (en) 1982-09-04 1982-09-04 Metal piece selector

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP57153385A JPS5943349A (en) 1982-09-04 1982-09-04 Metal piece selector

Publications (2)

Publication Number Publication Date
JPS5943349A true JPS5943349A (en) 1984-03-10
JPH0415414B2 JPH0415414B2 (en) 1992-03-17

Family

ID=15561318

Family Applications (1)

Application Number Title Priority Date Filing Date
JP57153385A Granted JPS5943349A (en) 1982-09-04 1982-09-04 Metal piece selector

Country Status (1)

Country Link
JP (1) JPS5943349A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008001417A (en) * 2006-06-26 2008-01-10 Ishiyama:Kk Foam container
KR101365003B1 (en) * 2012-12-31 2014-02-21 제이에스스틸(주) Core classification apparatus
JP2019174298A (en) * 2018-03-28 2019-10-10 住友金属鉱山株式会社 Method and device for determining composition

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52116290A (en) * 1976-03-02 1977-09-29 Nippon Steel Corp Quantitative determination method of magnetite and metal iron in granu lar or powdery non-metallic substances

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS52116290A (en) * 1976-03-02 1977-09-29 Nippon Steel Corp Quantitative determination method of magnetite and metal iron in granu lar or powdery non-metallic substances

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2008001417A (en) * 2006-06-26 2008-01-10 Ishiyama:Kk Foam container
KR101365003B1 (en) * 2012-12-31 2014-02-21 제이에스스틸(주) Core classification apparatus
JP2019174298A (en) * 2018-03-28 2019-10-10 住友金属鉱山株式会社 Method and device for determining composition

Also Published As

Publication number Publication date
JPH0415414B2 (en) 1992-03-17

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